Class / Patent application number | Description | Number of patent applications / Date published |
327097000 | With logic or bistable circuit | 9 |
20080297205 | SWITCH DE-BOUNCING DEVICE AND METHOD - A switch de-bouncing device includes a majority counter that counts samples generated by a sampler sampling a switch output where a counter value is incremented for each sample indicating a first switch state and decremented for each sample indicating a second switch state of the switch. A controller determines that the switch is in the first switch state when the counter value is above a first state threshold and is in the second switch state when the counter value is below a second state threshold. | 12-04-2008 |
20110133786 | SEMICONDUCTOR DEVICE - A speed performance measurement circuit that may perform speed performance measurement is provided between a first logic circuit and a second logic circuit. The speed performance measurement circuit includes a first flip flop that stores first data, a first delay circuit that delays the first data and generates second data, and a second flip flop that stores the second data. Furthermore, the speed performance measurement circuit includes a first comparator circuit that compares output of the first flip flop to output of the second flip flop, and a third flip flop that stores output data from the first comparator circuit in accordance with timing of the first clock signal. Data in a normal path is compared to data in a path delayed by a certain time to measure speed, and power voltage of a circuit is determined based on such comparison. Thus, change in speed with respect to power voltage in a critical path can be measured. | 06-09-2011 |
20110227609 | SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF EVALUATING THE CHARACTERISTICS OF A TRANSISTOR - According to one embodiment, a test circuit comprises a function block, a test circuit, and a signal generation circuit. The test circuit is arranged in an area close to the function block having a plurality of transistors. The test circuit comprises a first flip-flop circuit, a second flip-flop circuit, and a logic circuit connected between the output of the first flip-flop circuit and the input of the second flip-flop circuit. The signal generation circuit generates clock pulses including a first clock pulse and a second clock pulse. The signal generation circuit is capable of controlling a pulse interval between the first clock pulse and the second clock pulse. In a test, the first flip-flop circuit outputs data in synchronization with the first clock pulse of the signal generation circuit and the second flip-flop circuit latches data in synchronization with the second clock pulse of the signal generation circuit. | 09-22-2011 |
20110298500 | SINGLE CLOCK DYNAMIC COMPARE CIRCUIT - A compare circuit for comparing a first data word with a second data word includes a plurality of sub-circuits, each having a two-bit static compare stage and a dynamic complex logic stage; a dynamic compare node responsive to respective outputs of the sub-circuits; and an output latch that captures a comparison result in accordance with a logic state of the dynamic compare node. In an exemplary embodiment, a local clock generator provides a single controlling clock signal for clocking the output latch, precharging of the dynamic compare node, and clocking of the dynamic complex logic stage of the sub-circuits. | 12-08-2011 |
20120153994 | Methods and Implementation of Low-Power Power-On Control Circuits - Methods and implementation of low-power power-on control circuits are disclosed. In a particular embodiment, an apparatus includes a power detector circuit powered by a first voltage supply. At least one voltage level-shifting device is coupled to a second voltage supply and a test input is provided to the power detector circuit. An optional leakage self-control device may reduce unwanted leakage currents associated with the first supply and the second supply. | 06-21-2012 |
20130278294 | INTERPOLATION CIRCUIT, RECEPTION CIRCUIT AND METHOD OF GENERATING INTERPOLATED DATA - An interpolation circuit includes: a generation circuit configured to generate interpolated data based on a plurality of pieces of input data in time sequence; a first analog digital converter configured to convert first interpolated data at a data point of the interpolated data into first digital data; and a second analog digital converter configured to convert second interpolated data at a change point into second digital data of the interpolated data, a second number of quantization bits of the second analog digital converter being smaller than a first number of quantization bits of the first analog digital converter. | 10-24-2013 |
20140111248 | LOW SUPPLY VOLTAGE ANALOG DISCONNECTION ENVELOPE DETECTOR - An analog disconnection envelope detection circuit having a low power supply detects a high speed, high differential voltage disconnect state on a data line. Level-shifting circuitry shifts the voltage level of two input signals by the value of a detection threshold voltage, generates differential signals used to indicate conditions of the input signals, and mitigates effects of input differential signal common-mode voltage on the detection operation. Circuitry is provided to equalize VDS of detecting tail current sources, thereby eliminating errors resulting from VDS mismatch of tail current sources. Comparator circuitry compares the sets of differential signals and indicates when the absolute difference between the two input signals is greater than a reference voltage. Output circuitry generates a disconnect signal corresponding to the disconnect condition. When compared to conventional disconnect detection circuitry, the disclosed circuit utilizes a relatively low supply voltage to detect high differential voltage disconnect conditions with improved accuracy. | 04-24-2014 |
20160020757 | HIGH-SPEED CLOCKED COMPARATOR AND METHOD THEREOF - A circuit includes a voltage-to-current converter receives a first voltage and a second voltage and outputs a first current and a second current in accordance with a clock signal. A first self-gated cascode circuit receives the first current and outputs a third current in accordance with the clock signal. A second self-gated cascode circuit receives the second current and outputs a fourth current in accordance with the clock signal. A latch circuit receives the third current and the fourth current and establishes a third voltage and a fourth voltage representing a resolution of a comparison between the third current and the fourth current, wherein the first self-gated cascode circuit is conditionally shut off based on a level of the third voltage, and the second self-gated cascode circuit is conditionally shut off based on a level of the fourth voltage. | 01-21-2016 |
20160087607 | Bias Circuit for Comparators - Pumping current into a regeneration latch of a comparator, including: a first transistor configured to receive a first constant current from a first constant current source; a first current mirror coupled to the first transistor and configured to provide a first bias current, wherein the first transistor substantially mirrors the first constant current into the first bias current in the first current mirror; a second transistor configured to receive a second constant current from a second constant current source; a second current mirror coupled to the second transistor and configured to provide a second bias current, wherein the second transistor substantially mirrors the second constant current into the second bias current in the second current mirror; and a third transistor configured to combine the first bias current and the second bias current, wherein the third transistor pumps the combined bias current into the regeneration latch. | 03-24-2016 |