Entries |
Document | Title | Date |
20080198365 | TIME AND SPACE RESOLVED STANDOFF HYPERSPECTRAL IED EXPLOSIVES LIDAR DETECTION - A system and method for standoff detection of explosives and explosive residue. A laser light source illuminates a target area having an unknown sample producing luminescence emitted photons, scattered photons and plasma emitted photons. A first optical system directs light to the target area. A video capture device outputs a dynamic image of the target area. A second optical system collects photons, and directs collected photons to a first two-dimensional array of detection elements and/or to a fiber array spectral translator device which device includes a two-dimensional array of optical fibers drawn into a one-dimensional fiber stack. A spectrograph is coupled to the one-dimensional fiber stack of the fiber array spectral translator device, wherein the entrance slit of the spectrograph is coupled to the one dimensional fiber stack. | 08-21-2008 |
20080198366 | Apparatus for measuring defects in a glass sheet - A method of measuring the topography of a large, thin, non-flat specular substrate in a production environment with minimal movement of a majority of the measurement apparatus. A gimbal-mounted reflecting element is used to steer a short coherence length probe beam such that the probe beam is substantially perpendicular to a local surface of the substrate. The probe beam and the reference beam are combined and the resulting interference pattern used to characterize defects on the local surface. | 08-21-2008 |
20080198367 | Interferometric System for Complex Image Extraction - The invention provides an interferometric system and method for quadrature detection of optical characteristics of a sample. The system includes a Mach-Zehnder interferometer providing a variable optical delay between light collected from the sample and reference light. The Mach-Zehnder interferometer has an output M×N coupler with N≧3 output ports. Two differential detectors, each having two input ports coupled to a different two of the N output ports of the M×N coupler, produce first and second electrical signals having an interferometric phase shift. A processor is provided for computing real and imaginary parts of a complex refractive index of the sample from the first and second electrical signals by using complex deconvolution. | 08-21-2008 |
20080198368 | FLUORESCENCE DETECTION APPARATUS - Fluorescence detection apparatus detects fluorescence from a fluorescent object. The apparatus includes a light source configured to irradiate the fluorescent object with light, a shutter configured to block the light, from the light source, directed to the fluorescent object, an optical output measuring unit arranged in an optical path between the shutter and the light source, an image pickup element configured to detect the fluorescence from the fluorescent object and to capture a noise image, and a changing unit configured to change at least one of an accumulation time of the image pickup element and an open-close time of the shutter. The changing unit calculates the accumulation time for capturing the noise image using the measurement result of the optical output measuring unit, and corrects a captured fluorescent image generated by detecting the fluorescence, using the noise image captured during the accumulation time calculated by the calculation unit. | 08-21-2008 |
20080198369 | Interferometer air-fluctuation monitors and systems comprising same - Sensors and monitors are disclosed for monitoring density fluctuations in an atmosphere, particularly an atmosphere through which interferometer beam(s) are propagating. An exemplary sensor includes multiple interferometers that produce respective beams propagating in a direction through the atmosphere. The interferometers are of a quantity that is at least one more than necessary for determining position of an object in the direction. A processor is connected to the interferometers so as to receive respective signals from the interferometers. The processor determines, from the interferometer signals, a mutual signal fluctuation that is a function of atmosphere-density fluctuations encountered by the propagating beams in their respective beam paths and sensed by the interferometers. | 08-21-2008 |
20080204715 | Method and Device For Producing and Detecting a Raman Spectrum - The invention relates to a method and a device for producing and detecting a Raman spectrum. The problem addressed by the present invention is that of devising a method and a device for producing and detecting a Raman spectrum of a medium under investigation, whereby the Raman spectrum of a medium that is under investigation can be examined with a high degree of sensitivity while requiring relatively little equipment. The method is characterized by the coupling of excitation radiation into a medium ( | 08-28-2008 |
20080204716 | METHODS AND APPARATUS FOR DETERMINING CHARACTERISTICS OF PARTICLES - An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range. If all of the particles pass through a single beam, then many small particles must be counted for each large one because typical distributions are uniform on a particle volume basis, and the number distribution is related to the volume distribution by the particle diameter cubed. | 08-28-2008 |
20080204717 | METHODS AND APPARATUS FOR DETERMINING CHARACTERISTICS OF PARTICLES - An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range. If all of the particles pass through a single beam, then many small particles must be counted for each large one because typical distributions are uniform on a particle volume basis, and the number distribution is related to the volume distribution by the particle diameter cubed. | 08-28-2008 |
20080204718 | METHODS AND APPARATUS FOR DETERMINING CHARACTERISTICS OF PARTICLES - An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range. If all of the particles pass through a single beam, then many small particles must be counted for each large one because typical distributions are uniform on a particle volume basis, and the number distribution is related to the volume distribution by the particle diameter cubed. | 08-28-2008 |
20080204719 | METHODS AND APPARATUS FOR DETERMINING CHARACTERISTICS OF PARTICLES - An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range. If all of the particles pass through a single beam, then many small particles must be counted for each large one because typical distributions are uniform on a particle volume basis, and the number distribution is related to the volume distribution by the particle diameter cubed. | 08-28-2008 |
20080204720 | Two Line Gas Spectroscopy Calibration - A method of calibrating an absorption spectroscopy measurement wherein the calibration method includes projecting laser light through a sample of a first quantity of a gas of interest and a second irrelevant quantity of a spectroscopically identical or similar gas (10). The first and second spectroscopic absorptions of the laser light are measured over specific first and second absorption lines. A functional relationship is determined between the first and second measured spectroscopic absorptions and two unknown variables. The function relationships may then be simultaneously solved to determine one or both unknown variables and thereby obtain a measurement relating to the first quantity of the gas of interest, calibrated for the second irrelevant quantity of gas. | 08-28-2008 |
20080204721 | Thin films measurement method and system - A method and system are presented for use in controlling the processing of a structure. First measured data is provided being indicative of at least one of the following: a thickness (d | 08-28-2008 |
20080204722 | Process for monitoring the functioning and/or adjustment of an optoelectronic sensor arrangement, as well as an optoelectronic sensor arrangement - The invention relates to a process for monitoring the functioning and/or adjustment of an optoelectronic sensor arrangement ( | 08-28-2008 |
20080204723 | Mask defect inspection apparatus - The mask defect inspection apparatus including an illumination optical system for illuminating a mask on which a pattern is formed; an objective lens facing the mask; at least a pair of detection optical systems having a detection sensor for obtaining an image of the pattern, respectively, and which receive illumination light from illumination areas different from each other through the objective lens, respectively; and focusing changing means for changing a position of focusing between sites of the pattern in a film-thickness direction of the mask and the pattern images obtained by the detection sensors, such that the pattern images obtained by the detection sensors are changed corresponding to the film-thickness direction of the mask. | 08-28-2008 |
20080204724 | Method Of Apparatus For Detecting Particles On A Specimen - A method and apparatus of detecting a defect by inspecting a specimen in which a surface of a specimen on which plural patterns are formed is illuminated with an elongated shape light flux from one of plural directions which are different in elevation angle by switching an optical path of the light flux emitted from an illuminating light source in accordance with a kind of defect to be detected. Plural optical images of the specimen illuminated by the elongated shape light flux are captured with plural image sensors installed in different elevation angle directions by changing an enlarging magnification in accordance with a density of the pattern formed on the sample in an area irradiated with the illuminating elongated shape light flux. A defect on the specimen is detected by processing the images captured by the plural image sensors. | 08-28-2008 |
20080204725 | Lamination status inspecting apparatus, lamination status inspecting method, and recording medium storing lamination status detecting program - A lamination status inspecting apparatus inspects a lamination status of adjacent sheets, and includes a first illumination unit that irradiates a portion where sheets are adjacent to each other with light from a predetermined direction, a second illumination unit that irradiates with light from a direction opposite to a direction of the first illumination unit, an imaging unit that picks up an image of the portion, and an imaging control unit that controls the imaging unit to pick up a first image of the portion by lighting the first illumination unit, and controls the imaging unit to pick up a second image of the portion by lighting the second illumination unit. | 08-28-2008 |
20080212077 | Spectroscopic Lance for Bulk Sampling - A lance assembly for spectroscopically sampling bulk product ( | 09-04-2008 |
20080212078 | ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION ON A PROBER - The invention relates to a system and a method for capturing images in a prober. According to the invention, the surface of a test object is illuminated in succession with light of a first, second and third color; and an image capturing device records a gray scale image of the surface; and a composite image is produced from the three gray scale images by means of an image evaluating device. The object of the invention is to qualitatively improve the image capturing, in order to raise the positioning accuracy by means of an improved display, as a result of which, finely structured test objects can be used. This object of the invention is achieved in that the lighting device is designed as a unit, which can be controlled by the image evaluating unit and which produces at least three colors and which exhibits at least one light emitting diode (LED) as the lighting means. | 09-04-2008 |
20080212079 | SINGLE DETECTOR BASED DUAL EXCITATION WAVELENGTH SPECTRA DISPLAY - A single detector based spectroscopy system using FAST (fiber array spectral translator) fibers and two excitation sources in conjunction with a holographic spectrum analyzer (HSA) to obtain simultaneous and selective display of spectroscopic regions of interest. A sample can be illuminated with different laser excitation wavelengths and resulting multiple spectra can be comparatively observed on a single display screen for more fruitful analysis of sample spectral responses (and, hence, sample chemical or physical properties) under different excitations. The HSA may be configured to focus on user-selected spectral regions of interest from different such spectra and a single CCD detector may be configured to collect spectral data from all selected spectral regions of interest in corresponding portions of the CCD pixel array, thereby allowing subsequent simultaneous display of such selected spectral regions of interest. The HSA may also allow simultaneous collection and display of portions of a single spectrum from a single excitation wavelength. A user can perform better comparative analysis when spectral regions of interest are juxtaposed with each other on a single electronic display. | 09-04-2008 |
20080212080 | MEASURING A PROCESS PARAMETER OF A SEMICONDUCTOR FABRICATION PROCESS USING OPTICAL METROLOGY - To measure a process parameter of a semiconductor fabrication process, the fabrication process is performed on a first area using a first value of the process parameter. The fabrication process is performed on a second area using a second value of the process parameter. A first measurement of the first area is obtained using an optical metrology tool. A second measurement of the second area is obtained using the optical metrology tool. One or more optical properties of the first area are determined based on the first measurement. One or more optical properties of the second area are determined based on the second measurement. The fabrication process is performed on a third area. A third measurement of the third area is obtained using the optical metrology tool. A third value of the process parameter is determined based on the third measurement and a relationship between the determined optical properties of the first and second areas. | 09-04-2008 |
20080212081 | HIGH SPEED LASER SCANNING INSPECTION SYSTEM - An optical inspection system rapidly evaluates a substrate by illumination of an area of a substrate larger than a diffraction-limited spot using a coherent laser beam by breaking temporal or spatial coherence. Picosecond or femtosecond pulses from a modelocked laser source are split into a plurality of spatially separated beamlets that are temporally and/or frequency dispersed, and then focused onto a plurality of spots on the substrate. Adjacent spots, which can overlap by up to about 60-70 percent, are illuminated at different times, or at different frequencies, and do not produce mutually interfering coherence effects. Bright-field and dark-field detection schemes are used in various combinations in different embodiments of the system. | 09-04-2008 |
20080218741 | Optical Inspection Apparatus and Method - In one embodiment, a modulation spectroscopy method comprises the steps of directing a probe beam and a pump beam at a sample, modulating the pump beam, and the probe beam is reflected from the sample into a detector. The sample may include a strained semiconductor. The detector may produce as output an electrical signal which comprises a large d.c. signal proportional to reflectance R of the probe beam and a small a.c. modulated signal at the modulation frequency proportional to the modulation of the reflectance ΔR of the probe beam. Both the reflectance R of the probe beam and the modulation of the reflectance ΔR of the probe beam are measured at a multiplicity of probe beam photon energies arising from different wavelengths of the probe beam, to provide a photoreflectance spectrum comprising at least one photoreflectance lineshape. The photoreflectance spectrum is analysed to measure energy differences between interband electronic transitions of the strained semiconductor, and the strain of the strained semiconductor is determined according to said energy differences. | 09-11-2008 |
20080218742 | Apparatus and method for detecting tire shape - A tire shape detecting apparatus includes a projector that applies a plurality line light beams in a continuously joined manner, from a direction different from the detection height direction (Z-axis direction) in one light section line, or that applies one line light beam in a condensed manner in the line length direction thereof in order that the one light section line may be formed on the one line Ls on the surface of the tire; and a camera for picking up images of the plurality of line light beams applied to the tire surface in the direction in which the principal ray of each of the plurality of line light beams performs specular reflection with respect to the tire surface, or in the direction in which the principal ray of the condensed one line light beam performs specular reflection with respect to the tire surface. | 09-11-2008 |
20080218743 | COMBINING TOMOGRAPHIC IMAGES IN SITU WITH DIRECT VISION IN STERILE ENVIRONMENTS - A device for combining tomographic images with human vision using a half-silvered mirror to merge the visual outer surface of an object (or a robotic mock effector) with a simultaneous reflection of a tomographic image from the interior of the object. The device maybe used with various types of image modalities including ultrasound, CT, and MRI. The image capture device and the display may be enclosed in a sterile container (e.g., a probe bag) and a mirror and mirror housing may be separately attachable to the image capture device and display. In these embodiments, the mirror may be disposable and the sterility of the overall imaging device is maintained. | 09-11-2008 |
20080218744 | TEMPERATURE MEASURING APPARATUS AND TEMPERATURE MEASURING METHOD - A temperature measuring apparatus includes a light source, a first splitter, a second splitter, a reference beam reflector, an optical path length adjuster, a reference beam transmitting member, a first to an nth measuring beam transmitting member and a photodetector. The temperature measuring apparatus further includes a controller that stores, as initial peak position data, positions of interference peaks respectively measured in advance by irradiating the first to the nth measuring beam onto the first to the nth measurement point of the temperature measurement object, and compares the initial peak position data to positions of interference peaks respectively measured during a temperature measurement to thereby estimate a temperature at each of the first to the nth measurement point. | 09-11-2008 |
20080218745 | METHOD AND SYSTEM TO COMPENSATE FOR LAMP INTENSITY DIFFERENCES IN A PHOTOLITHOGRAPHIC INSPECTION TOOL - An after develop inspection tool considers tool-to-tool variability when determining confidence score for wafers under inspection. A golden wafer is used to calculate a RGB signature as well as the slope of the individual RGB curves for different lamp intensities. These slopes are normalized in order to generate a compensation factor for red values and blue values within a signature. When a wafer is subsequently inspected at an ADI station using a different lamp, the test wafer RGB signature is likely captured at a different lamp intensity. Consequently, when comparing the signatures, the golden wafer RGB signature is adjusted by the compensation factors, based on the different lamp's intensity setting, and this adjusted RGB signature is then used to determine whether a defect exists on the test wafer. | 09-11-2008 |
20080218746 | OPTICAL DETECTOR FOR THE PRESENCE OF GAS BUBBLES IN A LIQUID - The invention concerns a method for detecting gas bubbles in a liquid adapted to a device comprising a light source, a light detector and a data controlling and processing unit connected to a client system comprising the following steps: emitting light from the light source, acquiring successive measurements of the light intensity sensed by the light detector and calculating a variation between two successive measurements of said light intensity. In accordance with a first embodiment of the invention, the method further comprises a step which consists in comparing the variation between two successive measurements of light intensity to a threshold S. Advantageously, a warning counter is incremented by a value A when variation between two successive measurements is higher than the threshold S and decremented by a value B in the opposite case. A proportion of bubbles higher than a maximum authorized rate is detected when said warning counter exceeds a warning value C. In a second embodiment of the invention, the method further comprises a step which consists in calculating an average value between the variations between two successive measurements of light intensity. The client system is made aware of said average value proportional to said bubble content in the liquid. | 09-11-2008 |
20080218747 | Method and Apparatus for Detecting Surface Characteristics on a Mask Blank - An optical system and method configured to detect surface height variations on a mask blank. The optical system comprises a Wollaston prism, optics and first and second detectors. The Wollaston prism splits an incident beam of radiation into a first beam and a second beam. The first beam has a first polarization. The second beam has a second polarization. The optics directs the first and second beams along first and second paths onto first and second illuminated areas on a surface of the mask blank. The first and second illuminated areas reflect or transmit portions of the first and second beams to produce first and second reflected or transmitted beams. The first and second detectors detect the first and second reflected or transmitted beams and produce first and second signals in response to the first and second reflected or transmitted beams. A multiple way coupler may also be used for detecting height variation or other features on a mask blank. Two substantially parallel optical incident radiation beams are transmitted to the mask blank. The multiple way coupler mixes portions of the two beams after they have been reflected or transmitted by two different areas of said mask blank to provide three or more outputs which can be analyzed to provide information on height variation or other features on the mask blank. | 09-11-2008 |
20080225272 | FLUORESCENCE SPECTROSCOPY APPARATUS - A fluorescence spectroscopy apparatus includes an excitation optical system, a fluorescence detector, a signal processor, and a computer. The excitation optical system alternately applies light beams with different wavelengths or different intensities to a specific region of a sample at shifted times. The fluorescence detector detects fluorescence generated from the sample. The signal processor performs signal processing for a signal detected by the fluorescence detector. The computer performs correlation analysis on a signal generated by the signal processor. | 09-18-2008 |
20080225273 | Mobile Remote Detection of Fluids by a Laser - Apparatus for remote laser-based detection of a analyte in a remote target region; comprising a reference container for housing a reference substance identical with the analyte; a laser unit which constituted to emit a laser beam of a tuneable wavelength towards the target region to be analysed and along a reference path which passes through the reference container for detecting the reference substance; a laser control means constituted to control wavelength of the laser beam during detection periods such that the laser wavelength is changed to allow detection of an optical absorption profile of the analyte during detection periods; an analytical detection unit which detects light from the target region and generates analytical signals during the detection periods, a reference detection unit which detects laser light passed through the reference container and generates reference signals during the detection periods; and an analysing means constituted to analyse the similarity of the analytical and reference signals or of one or more calculated functions respectively calculated from the analytical and reference signals for determining the concentration of the analyte in the target region. | 09-18-2008 |
20080225274 | Vibration detection device - A vibration detection device includes: a light source emitting a laser beam; an interferometer including a vibrating body and a reflecting body both capable of reflecting the laser beam, a polarizing beam splitter splitting a laser beam emitted from the light source into beams traveling along first and second optical paths, a first ¼ wave plate arranged between the polarizing beam splitter and the vibrating body in the first optical path, and a second ¼ wave plate arranged between the polarizing beam splitter and the reflecting body in the second optical path, the interferometer causing interference between a reflected beam reflected by the vibrating body and a reference beam reflected by the reflecting body to form a interference pattern; and a detection means quantizing the vibration of the vibrating body on the basis of the formed interference pattern to detect the vibration. | 09-18-2008 |
20080225275 | Detection system for nanometer scale topographic measurements of reflective surfaces - A linear position array detector system is provided which imparts light energy to a surface of a specimen, such as a semiconductor wafer, receives light energy from the specimen surface and monitors deviation of the retro or reflected beam from that expected to map the contours on the specimen surface. The retro beam will, with ideal optical alignment, return along the same path as the incident beam if and only if the surface is normal to the beam. The system has a measurement device or sensor within the path of the retro or reflected beam to measure deviation of the retro beam from expected. The sensor is preferably a multiple element array of detector-diodes aligned in a linear fashion. A unique weighting and summing scheme is provided which increases the mechanical dynamic range while preserving sensitivity. The system further includes a bright field Nomarski Differential Interference Contrast sensor used to split the beam into two beams and for scanning in an orientation orthogonal to the orientation of the optical lever created by the system. | 09-18-2008 |
20080231840 | Methods and Apparatus For Measuring Wavefronts and For Determining Scattered Light, and Related Devices and Manufacturing Methods - Methods and apparatus for measuring wavefronts and for determining scattered light, and related devices and manufacturing methods. 2.1. The invention relates to a method and apparatus for spatially resolved wavefront measurement on a test specimen, a method and apparatus for spatially resolved scattered light determination, a diffraction structure support and a coherent structure support therefor, and also to an objective or other radiation exposure device manufactured using such a method, and an associated manufacturing method. 2.2. An embodiment of the invention involves carrying out, for the wavefront measurement, a first shearing measuring operation, which comprises a plurality of individual measurements with at least two first shearing directions and spatially resolved detection of shearing interferograms generated, and an analogous second shearing measuring operation with at least one second shearing direction, at least one second shearing direction being non-parallel to at least one first shearing direction. From the shearing interferograms detected, it is possible e.g. to determine a wavefront spatial frequency spectrum and/or a point response of the test specimen and to carry out a spatially resolved scattered light determination by means of the point spread function. 2.3. Use e.g. for the spatially resolved scattered light determination of projection objectives for microlithography. | 09-25-2008 |
20080231841 | METHOD AND APPARATUS FOR GAS CONCENTRATION QUANTITATIVE ANALYSIS - An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F]. A double synthetic absorbance spectrum DSAbs of the sample gas as expressed by the following formula (Step T9) is calculated to obtain a concentration of a trace component (impurity) contained in the sample gas: | 09-25-2008 |
20080239287 | Inspection of Wood Surface Roughness - The invention relates to a method for optical inspection of the hirsuteness of a surface. The method comprises directing a light beam (B) to the surface ( | 10-02-2008 |
20080239288 | 3D shape measurement apparatus and method using stereo moire technique - Disclosed herein is a 3D shape measurement method and apparatus using a stereo moiré technique. The 3D shape measurement method measures the 3D shape of an object to be measured using a digital pattern projector and first and second cameras. The method includes a first step of projecting a phase-shifted fringe pattern onto the object to be measured using the digital pattern projector, a second step of acquiring four fringe images using each of the first and second cameras, and then acquiring two pieces of phase information using a moiré technique, and a third step of acquiring a pair of corresponding points, which satisfy stereo phase conditions for making all 2π ambiguity constants as integers, using the two pieces of phase information and then measuring the 3D shape of the object using the corresponding points. | 10-02-2008 |
20080239289 | METHOD AND APPARATUS FOR INSPECTING A SEMICONDUCTOR DEVICE - A semiconductor defect inspection apparatus using a method of comparing an inspected image with a reference image includes the following: (1) a light source and an illuminating optical system, (2) plural defect optical imaging systems and photo detectors for scattered light detection, (3) a substrate holder and a stage for a scan, (4) means for obtaining the misalignment information on an adjacent die image using the inspection image of a defect optical imaging system with the highest spatial resolution, and means for transmitting the misalignment information to all the defect inspection image processing units, (5) means for correcting misalignment information so that a design and adjustment condition of each optical imaging system may be suited, and means for calculating a difference image between dies based on the corrected misalignment information, and (6) a defect detection and image processing unit for performing defect determination and detection processing based on the difference image between the dies. | 10-02-2008 |
20080239290 | RETICLE DEFECT INSPECTION APPARATUS AND RETICLE DEFECT INSPECTION METHOD - A reticle defect inspection apparatus that can carry out a defect inspection with high detection sensitivity are provided. The apparatus includes an optical system of transmitted illumination for irradiating one surface of a sample with a first inspection light, an optical system of reflected illumination for irradiating another surface of the sample with a second inspection light, and a detecting optical system that can simultaneously detect a transmitted light obtained by the first inspection light being passed through the sample and a reflected light obtained by the second inspection light being reflected by the sample. And the optical system of transmitted illumination includes a focusing lens driving mechanism for correcting a focal point shift of the transmitted light resulting from thickness of the sample. | 10-02-2008 |
20080239291 | Inspection apparatus and inspection method - An elevating drive mechanism and an advancing drive mechanism are controlled, by means of control processing of the start of photomultiplier tube idling, such that the vertical irradiation position of a laser beam falls on a reflective plate and, during idling, laser beam is irradiated via reflective plate on photodetectors, which are photomultiplier tubes. When idling has come to an end and the inspection start of the following wafer occurs, a diagnosis of photomultiplier tubes is carried out. In case, as a result of the diagnosis, it is determined that photomultiplier tubes have degraded, an alarm is given that the photomultiplier tubes have degraded. | 10-02-2008 |
20080239292 | Apparatus and method for inspecting defects - To provide a defect inspection apparatus and defect inspection method adapted to make it possible to easily assign threshold levels to a plurality of scattered-light detectors and to appropriately acquire data detected by each of the scattered-light detectors. | 10-02-2008 |
20080239293 | Portable Meter to Measure Chlorophyll, Nitrogen and Water and Methods - Methods for determining chlorophyll content comprise providing a sample, subjecting the sample to light at a first wavelength and detecting a first wavelength response, subjecting the sample to light at a second wavelength and detecting a second wavelength response, and calculating a chlorophyll content of the sample based on at least the first wavelength response and the second wavelength response. Optional approaches include detecting the nitrogen content and/or water content of the sample. Associated apparatus for determining chlorophyll content, which may comprise a handheld device, is also disclosed. | 10-02-2008 |
20080239294 | High efficiency balanced detection interferometer - An interferometer configured for use in optical coherence domain (OCT) reflectometry systems is disclosed. In the preferred embodiments, efficient routing of light and a balanced detection arrangement provide a high signal to noise ratio. In one set of embodiments, a pair of cascaded 2×2 couplers is used to split light along separate sample and reference paths and also for combining light returning from those paths and supplying the interfered collected light to the detection system. The interferometer can be used with various OCT modalities including time-domain and frequency domain approaches. | 10-02-2008 |
20080246955 | Method of detecting alcohol concentration and alcohol concentration detecting apparatus - In a detection of an alcohol concentration, a first light and a second light are irradiated to a mixed liquid including a fossil fuel, an alcohol, and water, and the alcohol concentration is calculated based on amounts of the first light and the second light permeated through the mixed liquid. In the detection, a difference of a transmittance of the fossil fuel with respect to the first light and each transmittance of the alcohol and water with respect to the first light is larger than a first value. In addition, a difference of a transmittance of water with respect to the second light and each transmittance of the fossil fuel and the alcohol with respect to the second light is larger than a second value. | 10-09-2008 |
20080246956 | Method Of Instrument Standardization For A Spectroscopic Device - In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and | 10-09-2008 |
20080252879 | OPTICAL SAMPLE MEASUREMENT DEVICE, OPTICAL CELL AND WATER QUALITY MEASUREMENT DEVICE - An optical sample measuring device such as a turbidity measurement instrument to isolate a portion of a fluid sample and isolate it from the influences of outside light. A sample cell in the instrument can include a cleaning unit that can contact transparent sections of the sample cell for an initial cleaning prior to a measurement cycle. A body member can further encompass a light source and one or more detectors for measuring the influence of the sample on light that is transmitted through and scattered by the fluid sample. The sample cell can be in a probe that can be immersed in the fluid and it can be operatively connected, for example, through a waterproof cable to a handheld measuring instrument body that can provide appropriate output of the measurement after processing the measurement signals. | 10-16-2008 |
20080259318 | Multi-channel array spectrometer and method for using the same - A multi-channel array spectrometer combines a spectral measurement system and a reference detector which measures photometric or radiometric qualities. High accuracy photometric or radiometric measurement of a wide dynamic range can be achieved by correcting measurement results of the reference detector with a spectral correction factor. The multi-channel array spectrometer comprises a bandpass filter wheel holding a set of bandpass filters and an open hole. The wheel is placed between an entrance slit and gratings. A test light beam passes through a turret of the bandpass filters. The test light beam can be precisely measured band by band. The spectrometer can also quickly and accurately measure a plurality of test light sources having similar spectral characteristics by using the stray light correction factor. | 10-23-2008 |
20080259319 | FOREIGN SUBSTANCE INSPECTION APPARATUS - A foreign substance inspection apparatus includes an irradiating unit and first and second detecting units. The irradiating unit is configured to emit irradiating light to be obliquely incident on a surface to be inspected to form a linear irradiation region on the surface to be inspected. The first and second detecting units are arranged on the same side as that provided with the irradiating unit with respect to the surface to be inspected, and they are configured to detect scattered light caused by a foreign substance on the surface to be inspected. The first and second detecting units are arranged at opposite positions with respect to a plane containing the linear irradiation region. | 10-23-2008 |
20080266547 | SCATTEROMETER-INTERFEROMETER AND METHOD FOR DETECTING AND DISTINGUISHING CHARACTERISTICS OF SURFACE ARTIFACTS - A scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts provides improved artifact detection and increased scanning speed in interferometric measurement systems. A scatterometer and interferometer are combined in a single measurement head and may have overlapping, concentric or separate measurement spots. Interferometric sampling of a surface under measurement may be initiated in response to detection of a surface artifact by the scatterometer, so that continuous scanning of the surface under measurement can be performed until further information about the size and/or height of the artifact is needed. | 10-30-2008 |
20080266548 | Method for characterizing transparent thin-films using differential optical sectioning interference microscopy - An imaging, differential optical sectioning interference microscopy (DOSIM) system and method for measuring refractive indices and thicknesses of transparent thin-films. The refractive index and thickness are calculated from two interferometric images of the sample transparent thin-film having a vertical offset that falls within the linear region of an axial response curve of optically sectioning microscopy. Here, the images are formed by a microscope objective in the normal direction, i.e., in the direction perpendicular to the latitudinal surface of the thin-film. As a result, the lateral resolution of the transparent thin-film is estimated based on the Rayleigh criterion, 0.61λ/NA. | 10-30-2008 |
20080266549 | Chemical Constituent Analyzer - The present invention relates to the use of Near-Infrared (NIR) spectroscopy to the application of the measurement of constituent concentrations of chemical based products typically having covalent bonding. Such constituent products may be fat, moisture, protein, and the like typically in liquid form or colloid suspensions. More specifically, the invention is directed toward an NIR analyzer with multiple detectors with no moving parts. The invention utilizes thermal control in conjunction with normalization algorithms to allow parallel processing of the measurements between a reference and at least one sample, which may provide more accurate results. In addition, this invention has the ability to use NIR in the third overtone and allows insitu processing, with no waste stream. | 10-30-2008 |
20080266550 | APPARATUS AND METHOD FOR MEASURING FILM THICKNESS - A film thickness measuring apparatus of the present invention includes: a light source that emits white light to be irradiated onto a multilayer thin film; a spectroscope that disperses reflected light obtained as a result of irradiating the white light onto the multilayer thin film in order to obtain reflectance spectrums; and a computation section, said computation section including: a setting section that sets a plurality of wavelength ranges for the reflectance spectrums; a first conversion section that obtains wavenumber range reflectance spectrums by re-sequencing, among the reflectance spectrums, reflectance spectrums in the plurality of wavelength ranges set in said setting section at equal intervals, respectively; a second conversion section that converts the wavenumber range reflectance spectrums in the plurality of wavelength ranges obtained in said first conversion section into power spectrums, respectively; and a calculation section that obtains a film thickness of the multilayer thin film based on the power spectrums. | 10-30-2008 |
20080266551 | Multiphoton-excitation laser scanning microscope - A multiphoton-excitation laser scanning microscope capable of efficiently collecting fluorescence emitted from a specimen to acquire a brighter multiphoton-excitation fluorescence image is provided. This multiphoton-excitation laser scanning microscope includes a multiphoton-excitation laser light source for emitting ultrashort pulsed laser light, a light-scanning unit configured to scan a specimen with the ultrashort pulsed laser light emitted from the multiphoton-excitation laser light source in two dimensions, an objective lens configured to focus the ultrashort pulsed laser light scanned by the light-scanning unit on the specimen, a collector lens disposed opposite the objective lens, with the light-scanning unit disposed therebetween, to collect fluorescence emitted from the specimen, and a light detector configured to detect the fluorescence collected by the collector lens. The collector lens has a higher numerical aperture and a larger field number than the objective lens. | 10-30-2008 |
20080273192 | Vibration detection device - A vibration detection device capable of improving detection sensitivity when optically performing vibration detection is provided. A vibration detection device includes: a light source emitting a laser beam; an interferometer including a vibrating body and a first reflection body both capable of reflecting the laser beam, and a second reflection body capable of at least partially reflecting the laser beam, the interferometer splitting the laser beam emitted from the light source into beams traveling along first and second optical paths, the interferometer causing interference between a reference beam reflected by the first reflection body in the first optical path and reflected beams multiply reflected between the vibrating body and the second reflection body in the second optical path to form interference patterns; and a detection means for detecting the vibration of the vibrating body on the basis of the formed interference patterns. | 11-06-2008 |
20080273193 | PATTERN DEFECT INSPECTION APPARATUS AND METHOD - A pattern defect inspection apparatus capable of detecting minute defects on a sample with high sensitivity without generating speckle noise in signals is realized. Substantially the same region on a surface of a wafer is detected by using two detectors at mutually different timings. Output signals from the two detectors are summed and averaged to eliminate noise. Since a large number of rays of illumination light are not simultaneously irradiated to the same region on the wafer, a pattern defect inspection apparatus capable of suppressing noise resulting from interference of a large number of rays, eliminating noise owing to other causes and detecting with high sensitivity minute defects on the sample without the occurrence of speckle noise in the signal can be accomplished. | 11-06-2008 |
20080278710 | Integrated Optical Vapor Cell Apparatus for Precision Spectroscopy - An optical waveguide is provided comprising a non-solid core layer surrounded by a solid-state material, wherein light can be transmitted with low loss through the non-solid core layer. A vapor reservoir is in communication with the optical waveguide. One implementation of the invention employs a monolithically integrated vapor cell, e.g., an alkali vapor cell, using anti-resonant reflecting optical waveguides, or ARROW waveguides, on a substrate. | 11-13-2008 |
20080285014 | DEVICE AND METHOD FOR MEASURING OPTICAL PARAMETERS OF LIQUID CRYSTAL DISPLAY - A device for measuring an optical property of a liquid crystal display is provided. The device has a light source providing a light, a first polarizer pervious to the light, a second polarizer pervious to the light, a detector receiving the light, and a calculating module. The first polarizer and the second polarizer are mounted between the light source and the detector, a first transmittance spectrum is obtained while the liquid crystal display is mounted between the first polarizer and the second polarizer, and a second transmittance spectrum is obtained while the liquid crystal display is mounted between the detector and the first and second polarizers. | 11-20-2008 |
20080285015 | Sensing System - In a first aspect according to the invention there is provided a sensing system | 11-20-2008 |
20080291430 | DISPLAY DEVICE AND DETECTION METHOD - A display device includes display pixels that display an image on a display screen. First and second optical sensors correspond to one or more of the display pixels and detect the amount of incident light. An optical member allows light coming from a first direction to enter the first optical sensors and light coming from a second direction to enter the second optical sensors. A memory circuit stores a first detection result that is detected in a first time period by means of the first optical sensors and stores a second detection result that is detected in the first time period by means of the second optical sensors. A comparison circuit compares sequential detection results to permit a judgment circuit to determine whether the display screen has been touched with a detection target medium. | 11-27-2008 |
20080297768 | Polarization Mode Dispersion Analyzer - A polarization mode dispersion analyzer having a light source, a sensor, an output phase signal analyzer, and a controller. The light source generates a probe light signal that is intensity modulated and also polarization modulated, the light source being adapted to apply the light signal to a device under test. The sensor generates an output phase signal related to the phase of the intensity modulation of an output optical signal leaving the device under test. The output phase signal analyzer measures an amplitude and phase of at least one frequency component of the output phase signal at a frequency related to the polarization modulation. The controller generates a signal indicative of a differential group delay of the device under test utilizing the measured amplitude and phase. The controller also measures a group delay associated with the device under test. | 12-04-2008 |
20080297769 | Through-container optical evaluation system - An apparatus, and method of its use, to determine a characteristic of a fluid sample contained inside a closed container. The ratio of intensity for detected radiation (e.g., light), subsequent to its transmission through the container's walls and fluid in the container, at each of a reference wavelength and a measurement wavelength is compared to a predetermined value to make a determination of the fluid's characteristic. Desirably, the wavelengths are applied to the same location on the container to minimize a source of signal error. The reference wavelength is selected for its substantial lack of attenuation when transmitted through a known fluid composition. The measurement wavelength is selected for its predictive interaction (e.g., absorption) with the fluid. | 12-04-2008 |
20080297770 | Method for determining physical properties of a multilayered periodic structure - There is provided a method of calculating physical properties of a periodic structure. At least one physical property related to reflectivity or transmittance of a periodic structure is measured, and then, at least one physical property related to reflectivity or transmittance of a virtual periodic structure is calculated to obtain corresponding physical properties from the virtual periodic structure. The at least one calculated physical property is compared with the at least one measured physical property. When the virtual periodic structure is horizontally divided into a plurality of layers, at least three substances can have horizontally repeated periods in the middle layers of the divided structure. In accordance with an embodiment of the present invention, the microscopic formation of the periodic structure including a native oxide layer formed on the periodic structure or an intentionally formed surface coating layer thereon can be nondestructively and accurately tested. | 12-04-2008 |
20080297771 | Optical measuring system with a high-speed optical sensing device abling to sense luminous intensity and chromaticity - A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for concentrating light beams toward a color analyzer. The beam splitter is aligned to the illuminating device to be detected and is utilized to separate the light beam generated by the illuminating device to the optical detector and the lens set simultaneously. | 12-04-2008 |
20080304049 | Goniophotometer - A goniophotometer includes two independent towers: a main support tower and an upright mirror tower. A swing arm is connected to the main support tower and can be rotated around a main horizontal axis. An elliptic flat rotation mirror, a first detector and a second detector are fixed to the swing arm. A test light source that is also connected to the main support tower can be rotated around a vertical axis. An upright round mirror is connected to the upright mirror tower. A far-field measurement can be achieved when a light beam from the test light source travels into the rotation mirror then is reflected to the upright mirror, and then is reflected by the upright mirror to the first detector. A near field measurement is achieved when the second detector receives a test light beam directly form the test light source. | 12-11-2008 |
20080304050 | STAGE APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION METHOD - A stage apparatus comprising a first stage and second stage configured to be able to move between a first area and second area on a stage moving surface of a base, a first mirror and second mirror arranged on the first stage and second stage, respectively, to measure positions of the stages in a first direction parallel to the stage moving surface, and a control unit configured to control to move one of the first stage and the second stage to a position where measurement light beams from a first interferometer and second interferometer do not strike the one of the first stage and the second stage, and to measure the positions of the first mirror and second mirror arranged on the other stage by the first interferometer and the second interferometer. | 12-11-2008 |
20080309920 | Method and System for Optoelectronic Detection and Location of Objects - Disclosed are methods and systems for optoelectronic detection and location of moving objects. The disclosed methods and systems capture one-dimensional images of a field of view through which objects may be moving, make measurements in those images, select from among those measurements those that are likely to correspond to objects in the field of view, make decisions responsive to various characteristics of the objects, and produce signals that indicate those decisions. The disclosed methods and systems provide excellent object discrimination, electronic setting of a reference point, no latency, high repeatability, and other advantages that will be apparent to one of ordinary skill in the art. | 12-18-2008 |
20080309921 | Spectrophotometer - Embodiments of a spectrophotometer and methods of use a spectrophotometer are disclosed. | 12-18-2008 |
20080309922 | ATTENUATED TOTAL REFLECTION SENSOR - An attenuated total reflection (“ATR”) sensor ( | 12-18-2008 |
20080309923 | COMPACT CHEMICAL SENSOR - A differential calorimeter device for detection of one or more predefined chemicals. An example device includes an integrating device having an absorbing layer. Optical sources send beams of differing color light at the absorbing layer. An optical detector detects intensity of light reflected off of the absorbing layer and a processor detects presence of the predefined chemicals based on the detected intensity of light associated with the optical sources. The absorbing layer changes color in response to one of said one or more predefined chemicals. One of the optical sources has a color corresponding to the color change in the absorbing layer and another one of the optical sources does not have a color corresponding to the color change in the absorbing layer. | 12-18-2008 |
20080309924 | Apparatus and method for measuring optical characteristics of teeth - Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base. | 12-18-2008 |
20080316468 | SYSTEM AND METHOD FOR THE DEPOSITION, IMAGING, DETECTION AND IDENTIFICATION OF THREAT AGENTS - A system and method for depositing a sample of a threat agent onto a substrate. The deposition of the threat agent onto the substrate is visually observed by analyzing the elastic scattered photons produced by the threat agent using elastic scatter imaging to form an image of the threat agent on the substrate, wherein depositing of the threat agent is substantially coincident in time with visually observing of the deposition of the threat agent. | 12-25-2008 |
20080316469 | Device and method for beam adjustment in an optical beam path - A device for beam adjustment in an optical beam path, having at least two mutually independent light sources ( | 12-25-2008 |
20090002686 | Sheet Metal Oxide Detector - An apparatus for detecting residual oxide or scale present on a metal surface following pickling or mechanical processing of the metal surface to remove scale makes use of laser light that is reflected off of the metal surface, a reflection detector that detects the absolute reflectivity and polarization of the reflecting laser light, a roughness measurement sensor, and a computerized control system that uses combinations of the information from the three sensors to provide an indication of the scale remaining on the metal surface. | 01-01-2009 |
20090002687 | Focus determination for laser-mask imaging systems - A system and method for calibrating the focal position of the imaging plane of a sequential lateral solidification (SLS) system. A test pattern is formed on a test substrate while varying the z-position of the focal position. Information concerning the z-position of the focal position is stored by a data processing system for various positions in the test pattern. An inspection light beam is directed onto the test pattern at a predetermined angle. The reflection of the inspection light beam is detected by an optical detector. The data processing system analyzes the reflection and determines whether the reflected light is substantially specular or substantially scattered. The data processing system uses the analysis of the reflected light and the information concerning the z-position of the focal position to select an optimal focal position for calibrating the SLS system. | 01-01-2009 |
20090002688 | OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION SYSTEM - An optical semiconductor wafer inspection system and a method thereof are provided for classifying and inspecting defects such as scratches, voids and particles produced in a flattening process by a polishing or grinding technique used for semiconductor manufacturing. The present invention is an optical semiconductor wafer inspection system and a method thereof characterized by obliquely illuminating a scratch, void or particle produced on the surface of a polished or ground insulating film at substantially the same velocity of light, detecting scattered light at the time of oblique illumination from the surface of an inspection target at different angles and thereby classifying the scratch, void or particle. | 01-01-2009 |
20090015821 | SCATTEROMETRY TARGET AND METHOD - Embodiments of the invention include a SCOL targeting groups configured to increase target to target separation and thereby increase target utility to simultaneous exposures to multiple illumination dots and associated inspection methodologies. The embodiments of the invention further relate to apparatus for projection simultaneous illumination dots onto different targets of the same targeting group on a wafer to conduct multiple simultaneous target inspections. Embodiments of the invention further relate to methods used to inspect SCOL targets using simultaneous illumination dots directed onto different targets of the same targeting group to conduct multiple simultaneous target inspections. | 01-15-2009 |
20090021722 | Specimen optical information recognizing device and its recognizing method - A specimen optical information recognizing device comprises a specimen containing section ( | 01-22-2009 |
20090021723 | GENERATING MODEL SIGNALS FOR INTERFEROMETRY - A method is disclosed which includes, for each of multiple areas of a test surface on a test object having different reflectivities, using an interferometry system to measure each area in a first mode of operation that measures information about the reflectivity of the area over a range of angles and wavelengths; using the same interferometry-system to measure the test surface in a second mode of operation that interferometrically profiles a topography of the test surface over a range including at least some of the multiple areas; and correcting the profile based on the information about the reflectivity of the multiple areas to reduce errors. | 01-22-2009 |
20090021724 | COMBINED RAMAN SPECTROSCOPY-OPTICAL COHERENCE TOMOGRAPHY (RS-OCT) SYSTEM AND APPLICATIONS OF THE SAME - An apparatus for evaluating a target of interest of a living subject. In one embodiment, the apparatus has a first light source for generating a broadband light, a second light source for generating a monochromatic light, a beamsplitter optically coupled to the first light source for receiving the broadband light and splitting it into a reference light and a sample light, a reference arm optically coupled to the beamsplitter for receiving the reference light and returning it into the beamsplitter, and a probe having a working end placed proximal to a target of interest of a living subject, optically coupled to the beamsplitter and the second light source for receiving the sample light and the monochromatic light, delivering them from the working end to the target of interest, collecting from the working end a backscattering light and a Raman scattering light that are obtained from interaction of the sample light and the monochromatic light with the target of interest, respectively, and returning the backscattering light into the beamsplitter so as to generate an interference signal between the returned backscattering light and the returned reference light in the beamsplitter. | 01-22-2009 |
20090027656 | System and Method for Optical Time Domain Reflectometry Using Multi-Resolution Code Sequences - A system and method for time domain reflectometry (OTDR) using multi-resolution code sequences. One or more subsets of a set of predefined complementary code sequences may be transmitted as an OTDR signal to provide multi-resolution capability. | 01-29-2009 |
20090027657 | METHOD AND APPARATUS FOR VERIFYING PROPER SUBSTRATE POSITIONING - Embodiments of methods and apparatus for detecting the proper position of a substrate in a chamber are provided herein. In some embodiments, a substrate position detection apparatus includes a substrate support having a plurality of lift pins for supporting a substrate in an elevated position thereover; a light source for directing a beam of light upon a reflective upper surface of the substrate; and a light sensor for detecting a reflected beam of light from the upper surface of the substrate upon the substrate being aligned in a predetermined elevated position. | 01-29-2009 |
20090027658 | Free space WDM signal detector - A system can include a transmitter that produces an optical signal having a plurality of carrier frequencies and a receiver separated from the transmitter by free space through which the optical signal propagates. The receiver includes an array of detectors of multiple types, with the types being capable of detecting light respectively having the carrier frequencies. A location of an incident area where the optical signal is incident on the detector array generally depends on a misalignment of the receiver relative to the transmitter, but the detectors in the detector array are arranged so that at least one detector of each of the types detects light from the optical signal regardless of where the incident area is on the detector array. | 01-29-2009 |
20090033916 | System and Method for Measuring Interferences - A system and method for measuring interferences are disclosed. The system is based on the concept of a composite interferometer. The sample is measured while a simultaneous compensation of the phase deviation due to the relative displacement of the optical delay component between the measurements at different pixels of the sample is performed. In the application of profilometry, the information of the surface profile of a material is obtained from the phase shift of the interference signal. By using the proposed compensation mechanism, an axial resolution at nanometer scale can be achieved. For the measurement of a thin film, a polarized probe beam is oblique incident on the sample. The system can perform a simultaneous measurement of the refractive index and the thickness of the thin film. From the ratio of the intensities of the interferograms of TE and TM waves as well as the phase shifts of the interferograms, the refractive index and the thickness of the thin film can then be obtained simultaneously. | 02-05-2009 |
20090033917 | Optical Object Detection System for Non-Circular Orbits - Systems and methods for dynamically positioning a detector relative to an object are provided. In one respect, a light source may project a light energy forming at least one projected plane onto a light rail, and more particularly, a light guide embedded in the light rail. The light energy of the projection may be obtained and may be differentially compared to a reference light energy obtained by a photo detector. Based on the differentially comparison, a detector may be positioned, i.e., closer to the object, away from the object, or maintaining the current position. | 02-05-2009 |
20090033918 | METHOD AND APPARATUS FOR ROBUST DETECTION OF THE DENSITY OF A PIGMENTED LAYER - Aspects of the disclosure can provide a method of detecting a density of a pigmented layer on an object. The method can include emitting a first modulated light onto a first portion of the object having the pigmented layer, detecting a first reflected light of the first modulated light from the first portion of the object, and determining the density of the pigmented layer according to the first reflected light. Furthermore, the method can include emitting a second modulated light onto a second portion of the object, detecting a second reflected light of the second modulated light from the second portion of the object, and determining the density of the pigmented layer according to a relative ratio that is related to the first reflected light and the second reflected light. | 02-05-2009 |
20090040506 | REFLECTIVITY/EMISSIVITY MEASUREMENT PROBE INSENSITIVE TO VARIATIONS IN PROBE-TO-TARGET DISTANCE - Apparatuses and methods for accurately measuring the reflectivity of a target surface, under conditions where the distance between a measuring probe and the target surface is not fixed. At least two measurements of the target reflectivity are taken under different conditions, and then these two or more measurements are combined in order to calculate the target reflectivity in a way which is independent of the probe-to-target distance. In particular, the different conditions are such that each measurement samples radiation reflected from the target surface at a different distribution of angles. The apparatus can also be used to accurately measure the distance between the probe measurement head and a target surface. | 02-12-2009 |
20090040507 | Surface Plasmon Resonance Sensor Apparatus Having Multiple Dielectric Layers - A surface plasmon resonance (SPR) spectrometer sensor apparatus for measuring a property of an analyte substance that can be adsorbed on a surface by directing a beam of incident radiation on the apparatus at an incident angle relative thereto, receiving a beam of reflected radiation off the apparatus, and measuring dips in reflected radiation as a function of incident angle or wavelength, the dips being indicative of resonances in the apparatus. The SPR spectrometer comprises a conductive layer having a first side which receives incident radiation, and having a second side opposite to the first side; and a dielectric stack having first and second sides opposite to each other, the first side being in contact with the conductive layer, the second side for receiving an analyte sample to be disposed thereon. The dielectric stack includes a plurality of dielectric layers having respective thicknesses and indices of refraction, each successive one of the plurality of dielectric layers having an index of refraction which is alternatingly higher than, and lower than, the indices of refraction of adjacent ones of the plurality of dielectric layers. The plurality of dielectric layers including a first dielectric layer at the first side of the dielectric stack, and a last dielectric layer at the second side of the dielectric stack, the last dielectric layer having a boundary surface for contacting the received analyte sample, and having an index of refraction so as to achieve total internal reflection (TIR) at the boundary surface. | 02-12-2009 |
20090046275 | METHOD AND SYSTEM FOR ESTIMATING SURFACE PLASMON RESONANCE SHIFT - A surface plasmon measurement instrument measures a change in a property (e.g., refractive index) of a material layer. The method includes providing a prism with a rear surface having a metal layer disposed thereon; providing the material layer on the metal layer on the rear surface of the prism; directing a source beam through the prism toward the rear surface in a vicinity of the material layer; performing at least two sampled measurements to detect light reflected from the rear surface and to produce two corresponding data sets; transforming the data sets to a transform domain; processing the transformed data sets to estimate a sample shift between the two data sets; and determining a change in a property of the material layer using the estimated sample shift. | 02-19-2009 |
20090051901 | INTEGRATED MICROFLUIDIC OPTICAL DEVICE FOR SUB-MICRO LITER LIQUID SAMPLE MICROSPECTROSCOPY - The present disclosure relates to the fields of microchips with microfluidic optical chambers for multiplexed optical spectroscopy. Embodiments of the present invention allow for ultra small sample volume, as well as high detection speed and throughput, as compared to conventional optical sample cuvettes used in optical spectroscopy. Particular embodiments relate specifically to the spectroscopic detection of many biochemical assays for disease diagnosis or other suitable analysis. | 02-26-2009 |
20090051902 | SYSTEMS AND METHODS FOR CHARACTERIZING LASER BEAM QUALITY - A measure of the quality of a laser beam is obtained by comparing the power of a theoretical Gaussian beam through a (certain sized area) pinhole to the power of a test beam through a same sized (area) pinhole. The theoretical surrogate Gaussian beam with the same second moment of intensity as the test beam is used to determine the “bucket size” used in “power-in-the-bucket” techniques. The bucket size is an interaction area determined by the wavelength of the laser light, the focusing distance, and the | 02-26-2009 |
20090051903 | LENS REPLACING METHOD AND MANUFACTURING METHOD FOR ALTERNATIVE LENS - A method for replacing a lens having refractive power in a first projection optical system includes measuring a wavefront of measuring light passing through the first projection optical system in a state in which the lens having refractive power or a master lens is mounted in the first projection optical system, measuring a wavefront of measuring light passing through a second projection optical system in a state in which the master lens or an alternative lens is mounted in the second projection optical system, processing the alternative lens in accordance with measurement results, and replacing the lens having refractive power in the first projection optical system with the processed alternative lens. | 02-26-2009 |
20090059207 | METHOD AND DEVICE FOR MEASURING PHOTOLUMINESCENCE, ABSORPTION AND DIFFRACTION OF MICROSCOPIC OBJECTS IN A FLUID - The invention relates to a device and to a method for measuring photoluminescence in a fluid present in a measurement vessel. According to the invention, the fluid in the measurement vessel simultaneously receives at least two excitation beams coming from two optical systems. The optical systems are positioned so that their axes form between them a non-zero obtuse angle other than 180° around the measurement vessel. A measurement of light emission is deduced according to the invention from coupling data obtained from emission beams picked up simultaneously by the pickup elements. The optical systems are also positioned in such a manner that there exists at least one partial overlap beam between the excitation beam from the source of a first optical system and the emission beam picked up by the pickup element of a second optical system. The device is also provided with at least one extinction pickup element in the vicinity of at least one of the sources for picking up light at the excitation wavelength in the partial overlap beam, a measurement of absorbance and/or diffraction being deduced from data obtained from the light picked up by the extinction pickup element. | 03-05-2009 |
20090059208 | Apparatus and method for a combined interferometric and image based geometric determination, particularly in the microsystem technology - The apparatus and method according to the invention includes an objective ( | 03-05-2009 |
20090066934 | OPTICAL DEVICES FOR BIOLOGICAL AND CHEMICAL DETECTION - A biological and chemical detection system is provided that detects and identifies biological and/or chemical particulates of interest. The biological and chemical detection system comprises a collector, a first optical device, a second optical device and a processor. The collector is configured to deposit particulates drawn from a fluid stream onto a sample substrate to define a sample area. The first optical device derives first data relative to at least a portion of the sample area, which is analyzed to determine at least one field of view and/or specific target location. The second optical device then interrogates the sample area at each determined target location, e.g., using Raman spectroscopy, to produce interrogation data. The processor determines whether the sample area includes predetermined biological or chemical particulates of interest based upon an analysis of the interrogation data and triggers an event such as an alarm or message if the predetermined biological or chemical particulates of interest are identified. | 03-12-2009 |
20090066935 | OPTICAL SHEET AND METHOD FOR MANUFACTURING THE SAME - The present invention provides an optical sheet that excels in a light convergence function or a light diffusion function, has excellent brightness increase ratio in the desired angular direction, in particular the front surface direction, and greatly inhibits the side lobe, and a method for manufacturing such an optical sheet with good efficiency and high accuracy. The optical sheet has a substrate that has a first surface having formed thereon a peak-valley portion that converges and scatters light and an optical adjustment portion that differs in an optical property from the substrate. A plurality of the optical adjustment portions are formed at least in part of a non-passage portion for the light in the substrate in the case where a parallel beam falls from the first surface in a direction normal to a surface located opposite the first surface. | 03-12-2009 |
20090066936 | THREE-DIMENSIONAL (3D) HYDRODYNAMIC FOCUSING USING A MICROFLUIDIC DEVICE - A microfluidic device comprises inlets for a sample flow and an out-of-plane focusing sheath flow, and a curved channel section configured to receive the sample flow and out-of-plane focusing sheath and to provide hydrodynamic focusing of the sample flow in an out-of-plane direction, the out-of-plane direction being normal to a plane including the curved channel. | 03-12-2009 |
20090073419 | DUAL RESOLUTION, DUAL RANGE SENSOR SYSTEM AND METHOD - A distance detecting arrangement employs at least two sensors having different ranges and resolutions of operation. Embodiments disclosed contemplate at least four modes of operation. In a first mode, only one sensor is employed. In a second mode, a longer range and lower resolution sensor is employed until a threshold value of distance is reached, at which point a shorter range and higher resolution sensor is employed. In a third mode, both the longer range and shorter range sensors are employed simultaneously. In a fourth mode, a low resolution profile is used to rescan the object with the high resolution sensor to provide a high resolution profile measurement. Embodiments facilitate the method disclosed by including a beam redirecting apparatus and preferably include a servo position system that can move the sensors and the object relative to each other. | 03-19-2009 |
20090073420 | Optical waveguide surface plasmon resonance sensor - An optical waveguide SPR sensor is adapted for differential measurement. The optical waveguide SPR sensor includes a base, a bottom layer, and at least one set of optical waveguide layers. The set of the optical waveguide layers includes a measuring optical waveguide channel and a reference optical waveguide channel. The measuring optical waveguide channel includes an SPR sensing film layer. The measuring optical waveguide channel and the reference optical waveguide channel are independently configured and substantially parallel one to another. The bottom layer has a refractive index higher than a refractive index of the optical waveguide layer. | 03-19-2009 |
20090073421 | Apparatus and method for measuring optical characteristics of an object - Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics preferably are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base. Such methods and implements may be desirably utilized for purposes of detecting and preventing counterfeiting or the like. | 03-19-2009 |
20090073422 | Apparatus and method for measuring optical characteristics of an object - Color/optical characteristics measuring systems and methods are disclosed. Perimeter receiver fiber optics/elements are spaced apart from a central source fiber optic/element and received light reflected from the surface of the object is measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the color measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. | 03-19-2009 |
20090073423 | Apparatus and method for measuring optical characteristics of an object - Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics preferably are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base. Such methods and implements may be desirably utilized for purposes of detecting and preventing counterfeiting or the like. | 03-19-2009 |
20090079966 | Apparatus and method for measuring optical characteristics of an object - Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of an object are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a data base. | 03-26-2009 |
20090086191 | OPTICAL GAS DETECTOR - A gas detector is provided. The gas detector includes a measurement source of optical radiation, a reference source of optical radiation, a measurement detector configured to provide an output signal indicative of a gas of interest, a reference detector configured to provide an output signal at least partially independent of the gas of interest, a measurement optical path extending from the measurement source to the reference and measurement detectors, and a sample region for receiving a gaseous sample. The sample region is located along the measurement optical path. A window is positioned in the measurement optical path downstream from the measurement source and upstream from the reference and measurement detectors. The window is partially transparent to optical radiation and partially reflective to optical radiation. The window is positioned to either reflect a portion of the optical radiation emitted by the reference source into the measurement optical path or to allow a portion of the optical radiation emitted by the reference source to pass through the window into the measurement optical path. | 04-02-2009 |
20090086192 | Spectrum Verification Imaging System and Method | 04-02-2009 |
20090091745 | Method and system to measure the concentration of constituent elements in an inhomogeneous material using LIBS - A system and method to improve the accuracy of the measure of constituent element(s) in a sample containing domains potentially including the constituent element(s) are described herein. For each domain, the volume of the domain is estimated and the concentration of the constituent element(s) in the domain is determined using LIBS. When all the domains have been analyzed, the volumetric concentration of the domains is summed and divided by the total volume of the sample. Accordingly, by limiting the concentration analysis to separate domains, it is possible to improve the accuracy of the concentration analysis. | 04-09-2009 |
20090091746 | Cell analyzer and cell analyzing method - The present invention is to present a cell analyzer capable of measuring cells which are approximately 20 to 100 μm in size with high precision via flow cytometry. The cell analyzer | 04-09-2009 |
20090097013 | System and method for microplate image analysis - A system and a method as defined herein for scan interrogation of, for example, a label-independent-detection (LID) biosensor, such as for monitoring a surface change or an event on a biosensor for use, for example, in microplate image analysis. | 04-16-2009 |
20090109423 | Dual Cavity Displacement Sensor - An optical displacement sensor is disclosed comprising a beam splitter having two optically coupled and mechanically coupled optically resonant cavities. The respective cavity lengths of the optically resonant cavities are functions of an environmental stimulus. By virtue of the optically coupled optically resonant cavities, the output of the beam splitter is less sensitive to input wavelength variation yet retains high sensitivity to the environmental stimulus. | 04-30-2009 |
20090115998 | DIFFUSION MATERIAL, DIFFUSION MATERIAL EVALUATING METHOD, BLENDING METHOD FOR FINE PARTICLES IN THE DIFFUSION MATERIAL, AND PRODUCTION METHOD FOR THE DIFFUSION MATERIAL - The method of evaluating a diffusion material that determines the total cross-sectional area of scattering S | 05-07-2009 |
20090128802 | Time and Space Resolved Standoff Hyperspectral IED Explosives LIDAR Detector - A system and method for standoff detection of explosives and explosive residue. A laser light source illuminates a target area having an unknown sample producing luminescence emitted photons, scattered photons and plasma emitted photons. A first optical system directs light to the target area. A video capture device outputs a dynamic image of the target area. A second optical system collects photons, and directs collected photons to a first two-dimensional array of detection elements and/or to a fiber array spectral translator device which device includes a two-dimensional array of optical fibers drawn into a one-dimensional fiber stack. A spectrograph is coupled to the one-dimensional fiber stack of the fiber array spectral translator device, wherein the entrance slit of the spectrograph is coupled to the one dimensional fiber stack. | 05-21-2009 |
20090141265 | Method and Apparatus for Measuring Color of a Moving Web - A method and an apparatus for measuring color of a moving web. The web is measured by reflectance measurement and transmittance measurement, wherein the reflectance measurement is carried out by illuminating a surface of the web in a measuring area, where on the other side of the web at the measuring area resides a solidly attached backing element and measuring the radiation reflected from the web. The transmittance measurement is carried out by illuminating the web and measuring the radiation transmitted through the web. The radiation measured in the transmittance measurement is transmitted through the backing element. | 06-04-2009 |
20090141266 | Analyzing tunable optical filters using tunable source - The specification describes an optical wavelength monitor/analyzer that uses a cost effective wavelength reference source. The wavelength reference source is a nominally fixed wavelength laser with inherent tunability over a very limited wavelength range, i.e. a few nanometers. Tuning is effected by changing the temperature of the laser. The limited range is useful for making multiple wavelength measurements in the context of analyzing wavelength drift in tunable optical filters. | 06-04-2009 |
20090147242 | SYSTEM AND METHOD FOR THE COINCIDENT DEPOSITION, DETECTION AND IDENTIFICATION OF THREAT AGENTS - A system and method for depositing a sample of a threat agent is deposited onto a substrate. The threat agent is identified substantially coincident in time with the depositing of the sample of the threat agent onto the substrate. | 06-11-2009 |
20090147243 | MINIATURIZED SYSTEM AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS - A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems. | 06-11-2009 |
20090153842 | OPTICAL MEASUREMENT SYSTEM WITH SYSTEMATIC ERROR CORRECTION - An optical measurement system and wafer processing tool for correcting systematic errors in which a first diffraction spectrum is measured from a standard substrate including a layer having a known refractive index and a known extinction coefficient by exposing the standard substrate to a spectrum of electromagnetic energy. A tool-perfect diffraction spectrum is calculated for the standard substrate. A hardware systematic error is calculated by comparing the measured diffraction spectrum to the calculated tool-perfect diffraction spectrum. A second diffraction spectrum from a workpiece is measured by exposing the workpiece to the spectrum of electromagnetic energy, and the measured second diffraction spectrum is corrected based on the calculated hardware systematic error to obtain a corrected diffraction spectrum. | 06-18-2009 |
20090168051 | PARTICLE COUNTING AND DNA UPTAKE SYSTEM AND METHOD FOR DETECTION, ASSESSMENT AND FURTHER ANALYSIS OF THREATS DUE TO NEBULIZED BIOLOGICAL AGENTS - The Nebulized Airborne Biohazard Stage Alert (NABSA) is a method utilizing an optical particle counter in conjunction with a fluorometer as triggers to detect and assess potential biohazard threats infused into surrounding air. In the first stage an optical particle counter is constantly passing sampled air in front of an energy source, in turn scattering light. This scattered light is evaluated to establish if the particles are above one micrometer in concentrations, and thus potentially an aerosolized threat. Such detection triggers the secondary stage in which the sample particles are tested for viability via processing through a dye with fluorescent properties affected when bonded with an entity universally found in all biological substances and a UV light source. The detection of concentrations of oversized, viable particles triggers the third stage to compare a sample of the particles to known biowarfare agents to delineate the specific agent species. | 07-02-2009 |
20090168052 | SYSTEM AND METHOD FOR IMPROVED BIODETECTION - A portable substance identification system and method are configured to identify at least one detection target faster and with greater accuracy than is possible using prior substance identification systems and/or prior substance identification techniques. An embodiment of the portable substance identification system includes a portable substance identification device containing a Raman spectrometer, and a collection stem that includes a dry collector. One or more reservoirs for a liquid medium and /or a reagent can be formed in a cartridge that is configured to couple with a portable substance identification device. The cartridge has a chamber in which the reagent, liquid medium, and a detection target picked up by the dry collector are mixed. A magnet, positioned at a slant angle, can be used to form at least one pellet of aggregated magnetic particles within a pellet forming area of the chamber. The pellet is formed to maximize its surface area. | 07-02-2009 |
20090168053 | OPTICAL DETECTOR FOR A PARTICLE SORTING SYSTEM - An optical system for acquiring fast spectra from spatially channel arrays includes a light source for producing a light beam that passes through the microfluidic chip or the channel to be monitored, one or more lenses or optical fibers for capturing the light from the light source after interaction with the particles or chemicals in the microfluidic channels, and one or more detectors. The detectors, which may include light amplifying elements, detect each light signal and transducer the light signal into an electronic signal. The electronic signals, each representing the intensity of an optical signal, pass from each detector to an electronic data acquisition system for analysis. The light amplifying element or elements may comprise an array of phototubes, a multianode phototube, or a multichannel plate based image intensifier coupled to an array of photodiode detectors. | 07-02-2009 |
20090185167 | IMAGE SCANNING APPARATUS AND METHOD - An image scanning apparatus comprises a time delay integration sensor for obtaining first image information from a target and a scan device for causing relative motion between the time delay integration sensor and the target. The image scanning apparatus is characterized by detector array for obtaining second image information from a target, wherein the first image information corresponds to a first portion of light received from the target and the second image information corresponds to a second portion of light received from the target. | 07-23-2009 |
20090185168 | OPTICAL MEASUREMENT USING FIXED POLARIZER - Optical measurement method and systems employing a fixed polarizer are disclosed. In one embodiment, the method includes providing at least one optical detection system having a fixed polarizer having a first type polarization; providing a first target on a substrate and a second target on the substrate; optically measuring the first target and the second target using the at least one optical detection system with the first target being positioned at a right angle relative to the second target to obtain a first measurement with the first type polarization and a second measurement with a second type-equivalent polarization; and combining the first measurement and the second measurement to obtain the optical measurement. | 07-23-2009 |
20090185169 | Monofibre Optical Meter For Chemical Measurement - Apparatus for determining a parameter of a sample has an optical sensor in the form of a monofibre waveguide having a distal end coated with a film that is placed in a sample. The waveguide has an input channel connected to a radiation light source and an output channel connected to a photodiode and amplifier to receive signals representative of the interference patterns created at the interface between the film and the sample. A computer receives the signals via an analogue to digital converter for processing the information and providing a measurement of the parameter. The measurement of the parameter may be used to control a process or system. | 07-23-2009 |
20090195772 | Method for Three-Dimensional Imaging Using Multi-Phase Structured Light - A method for mapping height of a feature upon a test surface is provided. The method includes projecting patterned illumination upon the feature, the patterned illumination having a plurality of distinct fringe periods. A first image of the feature is acquired while the patterned illumination is projected upon the feature. Relative movement is then generated between a sensor and the feature to cause relative displacement of a fraction of a field of view of a detector, the fraction being equal to about an inverse of the number of distinct regions of a reticle generating the pattern. Then, a second image of the feature is acquired while the patterned illumination is projected upon the feature. The height map is generated based, at least, upon the first and second images. | 08-06-2009 |
20090195773 | Transmitting/Reflecting Emanating Light With Time Variation - A filter arrangement can transmit and/or reflect light emanating from a moving object so that the emanating light has time variation, and the time variation can include information about the object, such as its type. For example, emanating light from segments of a path can be transmitted/reflected through positions of a filter assembly, and the transmission functions of the positions can be sufficiently different that time variation occurs in the emanating light between segments. Or emanating light from a segment can be transmitted/reflected through a filter component in which simpler transmission functions are superimposed, so that time variation occurs in the emanating light in accordance with superposition of two simpler non-uniform transmission functions. Many filter arrangements could be used, e.g. the filter component could include the filter assembly, which can have one of the simpler non-uniform transmission functions. Time-varying waveforms from sensing results can be compared to obtain spectral differences. | 08-06-2009 |
20090195774 | ANALYZER - A parallax calculator sets a plurality of target points in each standard image and calculates parallaxes of the individual target points. An optical flow calculator calculates two-dimensional optical flows of the individual target points by searching for points corresponding to the target points set in the standard image captured in a frame immediately preceding a current frame. A movement calculation block calculates a forward moving speed of the moving body and angular velocities thereof in both a pitch direction and a pan direction. | 08-06-2009 |
20090219515 | Interferometic Measuring Device - An interferometric measuring device for measuring layer structure of a plurality of layers has: a scanning apparatus for displacing an interference plane relative to the layer structure; an interferometer part having a wavelength scanning interferometer; an image recorder recording the interfering radiation returning from a reference arm on an object arm, and producing electrical signals as output; and a downstream evaluation device for making available the measuring results. | 09-03-2009 |
20090244520 | LIGHT BEAM RECEIVER WITH INTERFERENCE SIGNAL SUPPRESSION - An improved laser light beam receiver rejects unwanted pulses of optical energy, such as strobe lights or other flashes of light, that can occur on a jobsite. The receiver analyzes a light beam reception by using a photosensitive light beam detector arrangement and a separate photoelectric detector serving as an interference signal detector. This additional detector is not easily able to detect the light beams needed in normal operation. On the other hand, the additional detector does detect mostly all interfering light flashes—caused by flash lamps and other similar devices—whose threshold limit is either at the same level or below that of the light beam detector arrangement. An evaluating circuit such as a microcontroller correlates the time of reception of the light beam detector arrangement and the interference signal detector in order to discard the result if the times of reception correspond to a major extent. | 10-01-2009 |
20090244521 | SYSTEM AND METHOD FOR MULTI-MODE OPTICAL IMAGING - A technique is provided for multi-mode optical imaging. The technique includes directing a visible light and an excitation light towards a specimen. The excitation light is configured to induce luminescence in the specimen. The technique also includes detecting visible light scattered or reflected from the specimen and luminescent light emitted via luminescence simultaneously via a single detector. | 10-01-2009 |
20090251688 | DEVICE FOR MEASURING THE DIFFUSION AND/OR ABSORPTION AND/OR REFRACTION OF A SAMPLE - Device for measuring at least one of diffusion, absorption and refraction of a sample, having a radiation source, at least one receiving element, an optical imaging element and a protection element, the radiation source and the receiving element being arranged on the sensor side of the optical imaging element, the protection element being arranged on the sample side of the imaging element and adjacent to the imaging element and the radiation source. A refraction radiation source and a refraction receiver are arranged on the sensor side of the imaging element and arranged relative to the imaging element so that the refraction radiation of the sample specularly reflected by the sample side interface of the protection element can essentially be received by the refraction receiver and the radiation specularly reflected by the imaging element side interface of the protection element essentially cannot be received by the refraction receiver. | 10-08-2009 |
20090262335 | HOLOGRAPHIC SCATTEROMETER - Exemplary embodiments provide a system and method for holographic scatterometry by using holography in a scatterometry system to record amplitude and phase of scattered light from a featured object in order to measure geometries and/or feature dimensions of the object. The amplitude and phase information can be obtained simultaneously and instantaneously in a single tool with incident and azymuthal angular resolution. Specifically, the holographic scatterometry can include a splitter for producing two coherent beams including a test beam and a reference beam. The test beam can be focused on and scattered, diffracted and/or reflected from the featured object and interfered with the reference beam on an image sensor (e.g., a charge-coupled device (CCD) camera). The resulting holographic information on the camera plane can include all angular amplitude and phase information of the scattered light from the measured object. The holographic scatterometry can thus include a combined power of angular reflectometry and ellipsometry. | 10-22-2009 |
20090268195 | Asymmetric capillary for capillary-flow cytometers - The present invention provides improved capillaries that lead to increased resolution in conventional capillary-flow cytometers. The cross-sectional shape of capillaries made according to the present invention lack a center of symmetry. In some embodiments, capillaries have inner side walls that are tilted at angles with respect to the collection-system optical axis so that the widest dimension of the inner bore is closest to the collection optical system and have an outer wall closest to the collection optical system with a dimension large enough to minimize the contribution of outer-wall refraction to the collected light signal. Exemplary capillary embodiments include tubes with a rectangular outer wall and a trapezoidal inner wall, a rectangular outer wall and a triangular inner wall, triangular outer and inner walls, a triangular outer wall with a trapezoidal inner wall, and a hemispherical or rhomboid outer wall and trapezoidal or triangular inner wall. | 10-29-2009 |
20090273773 | Measurement Method for Determining Dimensions of Features Resulting from Enhanced Patterning Methods - A method includes measuring spectral responses of at least first and second sections of a measurement mark. In the first section, individual ones of primary lines of a first width are arranged at a first pitch and in alternating order with secondary lines spaced from the primary lines at a first distance. In the second section, individual ones of further primary lines of a second, different width are arranged at the first pitch and in alternating order with further secondary lines that are spaced from the further primary lines at the first distance. From at least the first and second spectra, information on a difference between target and actual widths of the primary and secondary lines may be obtained. | 11-05-2009 |
20090273774 | Oil-immersion enhanced imaging flow cytometer - A flow chamber, imaging objective, condenser and imaging light source as part of an optical system includes an oil-immersion objective and high numerical aperture condenser matched to a rectangular flow chamber. The oil-immersion objective and flow chamber include a high index of refraction immersion oil so as to enhance the optical resolution and optical coupling therethrough. The imaging light source generates light which passes through the condenser, the flow chamber and then the objective before being focused onto an imaging camera. Fluorescence excitation passes through the objective to the flow chamber where the oil immersion configuration enhances the focus and collection of the light back through the objective. | 11-05-2009 |
20090279073 | METHOD AND APPARATUS FOR SURFACE ENHANCED RAMAN SPECTROSCOPY - A method of analyzing an effect of a first substance on the behavior of a second substance comprises exposing a test material to the first substance, performing a first surface enhanced Raman spectroscopy analysis of the test material while it is exposed to the first substance, exposing the test material to the first substance and to the second substance, and performing a second surface enhanced Raman spectroscopy analysis of the test material while it is exposed to the first substance and to the second substance. Results of the first and second analyses are compared to identify a change in the behavior of the first substance. | 11-12-2009 |
20090279074 | OPTICALLY AMPLIFIED CRITICAL WAVELENGTH REFRACTOMETER - A critical wavelength refractometer is provided. A broadband light source ( | 11-12-2009 |
20090284733 | COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR SELECTING POLARIZATION SETTINGS FOR AN INSPECTION SYSTEM - Computer-implemented methods, carrier media, and systems for selecting polarization settings for an inspection system for inspection of a layer of a wafer are provided. One method includes detecting a population of defects on the layer of the wafer using results of each of two or more scans of the wafer performed with different combinations of polarization settings of the inspection system for illumination and collection of light scattered from the wafer. The method also includes identifying a subpopulation of the defects for each of the different combinations, each of which includes the defects that are common to at least two of the different combinations, and determining a characteristic of a measure of signal-to-noise for each of the subpopulations. The method further includes selecting the polarization settings for the illumination and the collection to be used for the inspection corresponding to the subpopulation having the best value for the characteristic. | 11-19-2009 |
20090284734 | MEASURING THE SHAPE AND THICKNESS VARIATION OF A WAFER WITH HIGH SLOPES - In one embodiment, an interferometer system comprises two unequal path interferometers assemble comprising; a first reference flat having a first length L | 11-19-2009 |
20090284735 | Optical sensor device for detecting ambient light - An optical sensor device for detecting ambient light is adapted to be coupled to a pane ( | 11-19-2009 |
20090290147 | DYNAMIC POLARIZATION BASED FIBER OPTIC SENSOR - An optical fiber sensor system includes an optical fiber. A linear polarizing component is configured to communicate with the optical fiber. The linear polarizing component includes a polarization sensing fiber to be disposed adjacent to and preferably collinear with the optical fiber. A light source communicates with the linear polarizing component for generating a light signal along the optical fiber. A reflector is disposed along the optical fiber for reflecting back the light signal along the optical fiber. An optical detector communicates with the linear polarizing component. A signal processor communicating with the optical detector and configured for determining from the reflected light signal dynamic events along the optical fiber. | 11-26-2009 |
20090296074 | METHOD AND SYSTEM FOR CORRECTING SPECTROPHOTOMETER DIFFERENCES - A method and system are provided to correct differences among multiple spectrophotometers. In one form, one spectrophotometer of a plurality that may be present in an image rendering system is treated as “primary”. Additional spectrophotometers are treated as “secondary”. The spectrum of a color from a secondary spectrophotometer is transformed by a linear transformation to an adjusted spectrum, which then is converted to L*a*b* (if desired) using standard techniques. The L*a*b* thus produced is, on average, substantially closer to the L*a*b* that the primary spectrophotometer would have produced when measuring the same color than it is to the L*a*b* that the secondary spectrophotometer would have produced without any correction. The linear transformation is generated by linear regression to minimize the spectral error, followed by non-linear optimization to minimize the error relative to a color difference metric—such as DeltaE 2000. | 12-03-2009 |
20090296075 | Imaging Diffraction Based Overlay - An overlay error is determined using a diffraction based overlay target by generating a number of narrow band illumination beams that illuminate the overlay target. Each beam has a different range of wavelengths. Images of the overlay target are produced for each different range of wavelengths. An intensity value is then determined for each range of wavelengths. In an embodiment in which the overlay target includes a plurality of measurement pads, which may be illuminated and imaged simultaneously, an intensity value for each measurement pad in each image is determined. The intensity value may be determined statistically, such as by summing, finding the mean or median of the intensity values of pixels in the image. Spectra is then constructed using the determined intensity value, e.g., for each measurement pad. Using the constructed spectra, the overlay error may then be determined. | 12-03-2009 |
20090310128 | Novel optical sensor for the instantaneous detection and identification of bioaerosols - A novel apparatus comprising three main systems: air sampling, detection and computerized electric system; and method of using the same in the sampling, detection and identification of bioaerosols, wherein the identification of the said bioaerosol is base on a multiphoton laser diagnostic technique along with the velocity and aerodynamic size of the particular bioaerosol. After exposing the said bioaerosols with near infrared wavelength laser, the obtained fluorescence spectra has been shown to be unique and particular for each bioaerosol, thus allowing the characterization of the said particles. | 12-17-2009 |
20100020312 | SIMULTANEOUS DETECTION APPARATUS OF RAMAN AND LIGHT SCATTERING - Provided is a detection apparatus of Raman scattering and light scattering, and more particularly, a simultaneous detection apparatus of Raman scattering and dynamic light scattering and a detection method using the same. The simultaneous detection apparatus of Raman scattering and light scattering includes: a detection unit for applying incident light to a sample, and detecting Raman scattering in 90° or 180° geometry and light scattering in 90° or 180° geometry in order to simultaneously collect Raman scattering and light scattering; and a computer connected to the detection unit to obtain at least one of the size and distribution of particles from the detected light scattering, and to obtain information of the molecular structure from the detected Raman scattering. This apparatus may simultaneously observe the size of nano-sized or larger material and molecular information thereof, and phenomena accompanying changes in molecular environment according to material variation and changes of the material in size and distribution, and thus is very useful for studying nano materials and protein antigens and antibodies. | 01-28-2010 |
20100091269 | SURFACE MEASURING DEVICE HAVING TWO MEASURING UNITS - An apparatus ( | 04-15-2010 |
20100134786 | INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE - Disclosed is a system including: (i) an interferometer configured to direct test electromagnetic radiation to a test surface and reference electromagnetic radiation to a reference surface and subsequently combine the electromagnetic radiation to form an interference pattern, the electromagnetic radiation being derived from a common source; (ii) a multi-element detector; and (iii) one or more optics configured to image the interference pattern onto the detector so that different elements of the detector correspond to different illumination angles of the test surface by the test electromagnetic radiation. The apparatus is configured to operate in a first mode in which the combined light is directed to the detector so that the different regions of the detector correspond to the different illumination angles of the test surface by the test light, and a second mode in which the different regions of the detector correspond to the different regions of the test surface illuminated by the test light to enable a profiling mode of operation. | 06-03-2010 |
20100182593 | Surface state detecting apparatus - A surface inspection apparatus includes units illuminating repetitive patterns formed on a surface of a suspected substance and measuring a variation in an intensity of regular reflection light caused by a change in shapes of the repetitive patterns, units illuminating the repetitive patterns with linearly polarized light, setting an angle formed between a repetitive direction of the repetitive patterns and a direction of a plane of vibration of the linearly polarized light at a tilt angle, and measuring a variation in a polarized state of the regular reflection light caused by the change in the shapes of the repetitive patterns, and a unit detecting a defect of the repetitive patterns based on the variation in the intensity and the variation in the polarized state of the regular reflection light. | 07-22-2010 |
20100182594 | APPARATUS FOR AUTOMATED REAL-TIME MATERIAL IDENTIFICATION - An apparatus is described for the real-time identification of one or more selected components of a target material. In one embodiment, an infrared spectrometer and a separate Raman spectrometer are coupled to exchange respective spectral information of the target material preferably normalized and presented in a single graph. In an alternative embodiment, both an infrared spectrometer and a Raman spectrometer are included in a single instrument and a common infrared light source is used by both spectrometers. In another embodiment, a vibrational spectrometer and a stoichiometric spectrometer are combined in a single instrument and are coupled to exchange respective spectral information of the target material and to compare the spectral information against a library of spectra to generate a real-time signal if a selected component is present in the target material. | 07-22-2010 |
20100188651 | OPTICAL PROPERTY SENSOR - An apparatus that can measure both haze and clarity on a web moving at conventional manufacturing speeds. The apparatus uses an integrating sphere and a novel mirror arrangement. With this arrangement, the invention can utilize a calibration curve created using known samples over the range of measurement desired to convert in real time, and the response of two photo detectors that measure the wide and low angle scattering signals, to deduce the desired optical property values. This approach significantly increases the speed and response of sensor and enables either on-line single point or full web scanning for uniformity measurement and control. | 07-29-2010 |
20100201969 | Polarization Imaging Apparatus with Auto-Calibration - A polarization imaging apparatus measures the Stokes image of a sample. The apparatus consists of an optical lens set, a first variable phase retarder (VPR) with its optical axis aligned 22.5°, a second variable phase retarder with its optical axis aligned 45°, a linear polarizer, a imaging sensor for sensing the intensity images of the sample, a controller and a computer. Two variable phase retarders were controlled independently by a computer through a controller unit which generates a sequential of voltages to control the phase retardations of the first and second variable phase retarders. A auto-calibration procedure was incorporated into the polarization imaging apparatus to correct the misalignment of first and second VPRs, as well as the half-wave voltage of the VPRs. A set of four intensity images, I | 08-12-2010 |
20100214556 | APPARATUS FOR OPTICAL MEASUREMENT OF SUBSTANCE CONCENTRATIONS - An apparatus for optical measurement of substance concentrations has at least one transmitter arranged in or on a housing and at least one receiver for optical radiation, and a deflection device, which is at a distance from the at least one transmitter and the at least one receiver and is arranged within the substance when the apparatus is being used correctly, for deflection of the optical radiation from the at least one transmitter to the at least one receiver. The distance between the deflection device and the at least one transmitter and/or the at least one receiver can be varied by means of an adjusting device. | 08-26-2010 |
20100214557 | ABSORPTION SPECTROMETRIC APPARATUS FOR SEMICONDUCTOR PRODUCTION PROCESS - This absorption spectrometric apparatus for semiconductor production process includes a flow passageway switching mechanism connected to a discharging flow passageway of a processing chamber for a semiconductor production process and a multiple reflection type moisture concentration measuring absorption spectrometric analyzer that allows a laser beam from a laser light source to undergo multiple reflection within a cell, detects a light absorbancy change by a gas within the cell, and measures a moisture concentration within the gas. The flow passageway switching mechanism connects the discharging flow passageway by switching between a measuring flow passageway through which the gas is discharged by passing through the cell and a bypass flow passageway through which the gas is discharged without passing through the cell. | 08-26-2010 |
20100220315 | Stabilized Optical System for Flow Cytometry - A particle analyzer that includes optical waveguides, a support, and a detector. The optical waveguides direct spatially separated beams from a source of radiation to produce measuring beams in a sample flow measuring area. The support maintains each of the optical waveguides in a fixed relative position with respect to each other and maintains the positioning of the measuring beams within the measuring area. The detector senses light produced from the measuring beams interacting with a particle flowing through the measuring area. At least one of the support and the detector can be coupled to the core stream sample system. The coupling can use an optical waveguide device configured to convey optical radiation arising from sample interaction to the detector. In another example, a particle analyzer comprises an optical system configured to be fixedly coupled to a sample system and configured to direct beams along independent beam paths from a source of radiation to produce measuring beam spots in a sample flow measuring area of the sample system and a detection system configured to sense radiation delivered from the sample flow measuring area. | 09-02-2010 |
20100220316 | METHOD AND APPARATUS FOR THIN FILM QUALITY CONTROL - Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source. The source forms on the thin film an illuminated line. The light collected from discrete sampled points located on the illuminated line is transferred to a photo-sensitive sensor through an optical switch. The spectral signal of the light reflected, transmitted or scattered by the sampled points is collected by the sensor, processed and photovoltaic thin film parameters applicable to the quality control are derived e.g. thin film thickness, index of refraction, extinction coefficient, absorption coefficient, energy gap, conductivity, crystallinity, surface roughness, crystal phase, material composition and photoluminescence spectrum and intensity. Manufacturing equipment parameters influencing the material properties may be changed to provide a uniform thin film layer with pre-defined properties. | 09-02-2010 |
20100225899 | Chemical Imaging Explosives (CHIMED) Optical Sensor using SWIR - A sample is illuminated to thereby generate a plurality of first interacted photons selected. The first interacted photons are assessed using a visible imaging device to thereby determine an area of interest in the sample. The area of interest is illuminated to thereby generate a plurality of second interacted photons. The second interacted photons are assessed using a spectroscopic device to thereby generate a SWIR data set representative of said area of interest. A database is searched wherein said database comprises a plurality of known SWIR data sets associated with an explosive material. The data sets comprise at least one of: a plurality of SWIR spectra and a plurality of spatially accurate wavelength resolved SWIR images. An explosive material in the area of interest is thereby identified as a result of the search. | 09-09-2010 |
20100231896 | QUANTITATIVE PHASE-CONTRAST AND EXCITATION-EMISSION SYSTEMS - An optical system includes an optical interferometer that generates interference phenomena between optical waves to measure multiple distances, thicknesses, and indices of refraction of a sample. An excitation-emission device allows an electromagnetic excitation and emission to pass through an objective in optical communication with the sample. An electromagnetic detector receives the output of the optical interferometer and the excitation-emission device to render a magnified image of the sample. A digital delay generator synchronizes the optical interferometer and excitation-emission device to operate in substantially unison to generate a noninvasive depth of field of the portion of the sample that corrects a plurality of optical aberrations in real-time. | 09-16-2010 |
20100231897 | WEB INSPECTION CALIBRATION SYSTEM AND RELATED METHODS - Systems and methods for calibrating a web inspection system. | 09-16-2010 |
20100271620 | Detection system and user interface for a flow cytometer system - The detection system of the first preferred embodiment includes a detector, having a wide dynamic range, that receives photonic inputs from the interrogation zone and produces an analog signal; and an analog-to-digital converter (ADC), having a high bit resolution, that is coupled to the detector and converts an analog signal to a digital signal. The digital signal includes an initial data set of the full dynamic range of the input signals from the flow cytometer sample. The method of extracting and analyzing data from a flow cytometer system of the first preferred embodiment preferably includes the steps of: collecting a full dynamic range of input signals from a flow cytometer sample; recognizing and annotating aggregate particle events; and storing an initial data set and an annotated data set of the full dynamic range of the input signals from the flow cytometer sample. | 10-28-2010 |
20100271621 | METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLAY OF A SPECIMEN - Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including: but not limited to, critical dimension and overlay misregistration; defects and thin film characteristics; critical dimension and defects; critical dimension and thin film characteristics; critical dimension, thin film characteristics and defects; macro defects and micro defects; flatness, thin film characteristics and defects; overlay misregistration and flatness; an implant characteristic and defects; and adhesion and thickness. In this manner, a measurement device may perform multiple optical and/or non-optical metrology and/or inspection techniques. | 10-28-2010 |
20100283995 | SYSTEM AND METHOD FOR THE AUTOMATED ANALYSIS OF SAMPLES - The present invention pertains to a system for the automated analysis of samples, comprising: a first optical device including at least one receptacle for receiving at least one of said samples and a receptacle-associated optical unit including at least one receptacle-associated light source for emitting light adapted for determining a colour of said sample and generating a light beam for irradiating said sample contained in said receptacle and at least one receptacle-associated light detector for detecting light transmitted through said sample and generating a receptacle-associated detection signal; a second optical device including at least one test element provided with at least one test zone for applying said sample, said test zone being subject to an optically detectable change in response to at least one characteristic of said sample being different from said colour and a test element-associated optical unit. | 11-11-2010 |
20100328649 | MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD - This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic. | 12-30-2010 |
20110013176 | METHOD AND DEVICE FOR DETERMINING PROPERTIES OF TEXTURED SURFACES - A method of determining properties of textured surfaces with the steps:
| 01-20-2011 |
20110032516 | Optical Absorbance Measurements With Self-Calibration And Extended Dynamic Range - Detector data representative of an intensity of light that impinges on a detector after being emitted from a light source and passing through a gas over a path length can be analyzed using a first analysis method to obtain a first calculation of an analyte concentration in the volume of gas and a second analysis method to obtain a second calculation of the analyte concentration. The second calculation can be promoted as the analyte concentration upon determining that the analyte concentration is out of a first target range for the first analysis method. | 02-10-2011 |
20110080576 | DEVICE AND METHOD FOR OPTICAL 3D MEASUREMENT AND FOR COLOR MEASUREMENT - The invention relates to a device and a method for optical 3D measurement, wherein said device can be switched between a first mode for optical 3D measurement using a chromatic confocal measurement method or the triangulation measurement method and a second mode for colorimetric measurement. In the first mode, a broad-band illuminating beam is focused onto a first plane and in the second mode the broad-band illuminating beam is focused onto a second plane other than the first plane at a distance d from the surface of the object to be measured. | 04-07-2011 |
20110080577 | System and Method for Combined Raman, SWIR and LIBS Detection - A system and method for the detection and identification of explosives and explosive residues using a combination of SWIR, Raman, and LIBS spectroscopy techniques, including imaging. A region of interest may be surveyed to identify a target area, wherein the target area comprises at least one unknown material. This surveying may be accomplished using visible imagery or SWIR imagery. The target area may be interrogated using Raman spectroscopy and LIBS spectroscopy to identify the unknown material. SWIR techniques may also be used to interrogate the target area. Fusion algorithms may also be applied to visible images, SWIR data sets, Raman data sets, and/or LIBS data sets. | 04-07-2011 |
20110199606 | Apparatus and method for measuring optical characteristics of an object - Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics preferably are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base. Such methods and implements may be desirably utilized for purposes of detecting and preventing counterfeiting or the like. | 08-18-2011 |
20110211189 | APPARATUS AND METHOD FOR DETERMINATION OF TEAR OSMOLARITY - An apparatus comprises a spectrophotometer system configured to measure light absorbance by a tear sample, a refractometer system configured to measure refractive index of the tear sample, and an evaluation unit programmed to calculate an osmolarity of the tear sample based on the measured absorbance and refractive index and stored calibration curves. The spectrophotometer and refractometer systems may share a common prism contacted by the tear sample during measurement. The evaluation unit may be programmed to carry out steps of a method for determining osmolarity of the tear sample in accordance with the invention. The osmolarity of the tear sample may be used as an indicator in diagnosing dry eye. | 09-01-2011 |
20110222051 | MICROASSEMBLED IMAGING FLOW CYTOMETER - A microassembled imaging cytometer includes a sensing location that undergoes relative motion with a cell. Light from a light source is focused by a focusing element to a plurality of focused illumination spots or lines at the sensing location, illuminating the cell as the cell traverses the sensing location. A collection lens collects light emanating from the cell and refocuses the collected light onto an array light sensor. The focusing element may include an array of microlenses having spherical or aspheric surfaces. The system may include a processing unit that constructs a digital image of the cell based at least in part on signals produced by the array light sensor indicating the intensity and distribution of light falling on the array light sensor. The system may characterize cells using light emanating from the cells by fluorescence. | 09-15-2011 |
20110255076 | METHOD FOR DETERMINING A PARTICLE CONCENTRATION AND MEASURING APPARATUS - To provide an improved method and an improved measuring apparatus for determining a particle concentration with which the disadvantages of the transmission measurement principle and of the scattered light measurement principle can be compensated to a certain degree to achieve a higher precision in the particle concentration measurement, a method and a measuring apparatus are proposed in accordance with the invention, wherein
| 10-20-2011 |
20110261350 | Apparatus and method for measuring optical characteristics of an object - Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of an object are disclosed. Perimeter receiver fiber optics are spaced apart from a source fiber optic and receive light from the surface of the object being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a data base. | 10-27-2011 |
20110261351 | SYSTEM AND METHOD FOR DETECTING EXPLOSIVES USING SWIR AND MWIR HYPERSPECTRAL IMAGING - A system and method for detection of explosive agents using hyperspectral imaging. A system comprising an illumination source, a spectral encoding device, and at least one imaging detector configured for at least one of SWIR and MWIR hyperspectral imaging of a target comprising an unknown material. A method comprising illuminating a target comprising an unknown material, assessing interacted photons using a spectral encoding device, and detecting interacted photons using at least one of SWIR hyperspectral imaging and MWIR hyperspectral imaging. Algorithms and chemometric techniques may be applied to assess the MWIR hyperspectral image to identify the unknown material as comprising an explosive agent or a non-explosive agent. A video imaging device may also be configured to provide a video image of an area of interest, which may be assessed to identify a target for interrogation using SWIR and MWIR hyperspectral imaging. | 10-27-2011 |
20110261352 | Scan Device - A probe needle is successively moved to a plurality of measurement points set in a measurement region on a sample so as to measure a z-displacement amount. An excitation control unit feedback-controls a piezoelectric element so that a vibration amplitude of a cantilever is constant in accordance with the detection output by a displacement detection unit. Moreover, a vertical displacement control unit feedback-controls a vertical position scan unit so as to obtain a constant distance between the probe needle and the sample according to a frequency shift by a frequency detection unit. When changes of outputs of two feedback loops at a certain measurement point are both within a predetermined range, a main control unit issues an instruction to a horizontal position control unit to rapidly move to the next measurement point. As a result, it is possible to adaptively decide such a measurement time that both of the two feedback controls at respective measurement points are established. This eliminates an unnecessary measurement time, which in turn reduces the time required for creating one convex/concave image as compared to the conventional technique and improves the throughput. | 10-27-2011 |
20110292376 | APPARATUS AND METHOD FOR DETECTING RAMAN AND PHOTOLUMINESCENCE SPECTRA OF A SUBSTANCE - An apparatus and method for detecting Raman and photoluminescence spectra of a substance and identifying said substance by Raman and/or photoluminescence spectral characteristics of said substance are disclosed. An apparatus comprises a replaceable laser source aggregate with a laser source, a collimating system, a socket for receiving said replaceable laser source aggregate, while ensuring the operation of said apparatus with no further adjustment of a positioning of said collimating system or said laser source, a filtering system, a light dispersing system optimized for a spectral resolution and a spectral range sufficient to simultaneously obtain Raman and photoluminescence spectra of said substance, a detector, and at least one controller for processing electrical signals. The disclosed and claimed method provides for obtaining Raman and photoluminescence spectra of a substance simultaneously, for separating said spectra into components based on Raman and photoluminescence contents, for analyzing said Raman and photoluminescence contents, and for identifying said substance by utilizing a set of spectral processing methods. | 12-01-2011 |
20110292377 | FIBER OPTIC MEASURING APPARATUS - The invention relates to a fibre-optic measuring apparatus ( | 12-01-2011 |
20110304846 | UNIVERSAL LED TESTING DEVICE - Apparatus for optically testing LEDs or other light-emitting components in a wide variety of test environments and to the degree necessary pertinent to the type(s) of faults encountered. In one embodiment, the present invention includes one or more fiber optic probes coupled to a multi-mode sensor unit, incorporating a photo-sensor coupled to a processor which may be programmed to provide a variety of test modes including simple on/off testing, color determination, color matching, wavelength and relative intensity among others. An extremely high sensitivity test mode is also provided for testing LEDs which emit very low intensity light in the microcandela range in products such as automobile/aircraft cockpit control panel lighted push-buttons for night-time viewing. The multi-mode sensor unit operates over a wide dynamic range and is capable of accurately testing LEDs that may be very dim to very bright without adjustment. In another embodiment, a voltage protection circuit is provided which enables the multi-mode sensor unit to safely operate from a supply voltage in the range of approximately 5 volts DC to approximately 40 volts DC while protecting the multi-mode sensor unit from a potentially damaging overvoltage condition. The voltage protection circuit also protects the multi-mode sensor unit against potential damage caused by reverse polarity voltage spikes, or accidental steady-state reverse polarity voltages. | 12-15-2011 |
20110317150 | METHOD AND DEVICE FOR MEASURING OPTICAL PROPERTIES OF AN OPTICALLY VARIABLE MARKING APPLIED TO AN OBJECT - A method for measuring optical properties of an optically variable marking applied on an object, the method including the steps of illuminating the optically variable marking so as to form a first light reflected by the marking at a first view angle and a second light reflected by the marking at a second view angle, the first and second lights having different spectral compositions as a result of the optically variable marking, refracting the second reflected light through a optical unit so as to redirect the second reflected light toward an optical sensor, capturing the first light and the second refracted light with the optical sensor simultaneously; and determining optical properties of the optical variable marking based on the captured first and second lights. | 12-29-2011 |
20120008133 | SYSTEM AND METHOD FOR HYPERSPECTRAL AND POLARIMETRIC IMAGING - Embodiments of a system and method for collecting hyperspectral and polarimetric data that are spatially and temporally coincident include a dispersive element configured to receive incident electromagnetic radiation. The dispersive element is configured to disperse a non-zero order of the electromagnetic radiation into its constituent spectra, which is directed to a first focal plane array, and may be read out as hyperspectral data. The dispersive element is also configured to reflect a zero order of the electromagnetic radiation, which is directed through a polarity discriminating element to a second focal plane array, which may be read out as polarimetric data. By synchronously reading out the first and second focal plane arrays, the hyperspectral and polarimetric data may be both spatially and temporally coincident. | 01-12-2012 |
20120008134 | METHOD TO MATCH EXPOSURE TOOLS USING A PROGRAMMABLE ILLUMINATOR - Programmable illuminators in exposure tools are employed to increase the degree of freedom in tool matching. A tool matching methodology is provided that utilizes the fine adjustment of the individual source pixel intensity based on a linear programming (LP) problem subjected to user-specific constraints to minimize the difference of the lithographic wafer data between two tools. The lithographic data can be critical dimension differences from multiple targets and multiple process conditions. This LP problem can be modified to include a binary variable for matching sources using multi-scan exposure. The method can be applied to scenarios that the reference tool is a physical tool or a virtual ideal tool. In addition, this method can match different lithography systems, each including a tool and a mask. | 01-12-2012 |
20120008135 | FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM - An optical inspection system includes a fluorescence channel that detects fluorescent behavior (or lack thereof) of artifacts present on a surface under inspection and at least one other optical channel for determining a characteristic of the surface under inspection in an illuminated spot. The other optical channel may be a height measuring channel, such as an interferometric channel or a deflectometric channel, the other optical channel may be a scatterometric channel, or both height measurement and scatterometry may be employed in combination as a three channel system. The presence of absence of fluorescent behavior may be used to correct assumptions about or determine a type of artifact detected by scatterometry, and may be used to correct the polarity of a height measurement made by a height-measuring channel. | 01-12-2012 |
20120044480 | Detector Arrangement for a Flow Cytometry System - Systems and methods for regarding a cytometry system are disclosed. The system can include a plurality lasers which are spatially separated from each other. Each laser can be assigned to a single detector. The single detector can process multiple events from each laser by digital switching of signal processing circuitry. Additional detectors can be assigned to receive light in a similar manner. | 02-23-2012 |
20120069326 | INTERFEROMETRIC METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRUCTURES - A method for determining information about a test object includes combining two or more scanning interference signals to form a synthetic interference signal; analyzing the synthetic interference signal to determine information about the test object; and outputting the information about the test object. Each of the two or more scanning interference signals correspond to interference between test light and reference light as an optical path length difference between the test and reference light is scanned, wherein the test and reference light are derived from a common source. The test light scatters from the test object over a range of angles and each of the two or more scanning interferometry signals corresponds to a different scattering angle or polarization state of the test light. | 03-22-2012 |
20120092650 | BIOSENSORS BASED ON OPTICAL PROBING AND SENSING - Apparatus, sensor chips and techniques for optical sensing of substances by using optical sensors on sensor chips. | 04-19-2012 |
20120120388 | System for Performing Scattering and Absorbance Assays - An optical system for performing scattering and absorbance assays in clinical diagnostics comprises a light source for emitting collimated light parallel to an optical axis in an optical path, a sample holding unit comprising at least one sample holding position located in the optical path and an optical detector for measuring light transmitted through a sample located in a sample holding position. The optical system further comprises an adjustable light angle selector adjusted to prevent light transmitted through the sample and diverging from the optical axis with an angle greater than a certain value from reaching the detector when a scattering assay is performed, and wherein the light angle selector is adjusted to allow light transmitted through the sample and diverging from the optical axis with an angle smaller than a certain value to reach the detector when an absorbance assay is performed. | 05-17-2012 |
20120127458 | MULTI-FUNCTION OPTICAL MEASUREMENT DEVICE - A multi-function optical measurement device having an optical wavelength and power measurement function, a ferrule/fiber scoping function, and a ferrule/fiber cleaning function includes a path select unit separating an optical signal for transmission and an optical signal for scoping from a ferrule/fiber; a wavelength and power measurement unit measuring a wavelength and a power of the optical signal for transmission from the path select unit; and a ferrule/fiber scoping unit converting an optical signal for scoping from the path select unit into an electrical signal. It is possible to perform a wavelength and power measurement and a ferrule/fiber scoping by one connection. Since a ferrule/fiber cleaning may be additionally included in one measurement device, it is easy to handle and carry an optical measurement device. A time required to perform a work using an optical measurement device may be reduced. | 05-24-2012 |
20120133924 | Measurement of the Positions of Centres of Curvature of Optical Surfaces of a Multi-Lens Optical System - A method measures the positions of centres of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centres of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the centre of curvature of a surface situated within the optical system, the measured positions of the centres of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon. | 05-31-2012 |
20120147359 | COMBINING TOMOGRAPHIC IMAGES IN SITU WITH DIRECT VISION IN STERILE ENVIRONMENTS - A device for combining tomographic images with human vision using a half-silvered mirror to merge the visual outer surface of an object (or a robotic mock effector) with a simultaneous reflection of a tomographic image from the interior of the object. The device maybe used with various types of image modalities including ultrasound, CT, and MRI. The image capture device and the display may be enclosed in a sterile container (e.g., a probe bag) and a mirror and mirror housing may be separately attachable to the image capture device and display. In these embodiments, the mirror may be disposable and the sterility of the overall imaging device is maintained. | 06-14-2012 |
20120162638 | METHOD FOR ASSESSING AN INTERACTION OF A SAMPLE WITH LIGHT BEAMS HAVING DIFFERENT WAVELENGTHS AND APPARATUS FOR PERFORMING SAME - A method for assessing an interaction of a sample with light beams having different wavelengths, the method comprising: generating a light beam having a wavelength and being intensity modulated according to a modulation function to create an intensity modulation in the light beam; irradiating the sample with the light beam; detecting a response light from the sample, the response light being released by the sample when the sample is irradiated with the light beam, the response light having intensity fluctuations caused by the intensity modulation; using the intensity fluctuations in the response light to identify the modulation function and associate the wavelength and the response light to each other; assessing the interaction of the sample with the light beam using the response light; stopping irradiating the sample with the light beam and performing the previous step with at least one other light beam having a different wavelength. The modulation functions provide wavelength information in the light beams by encoding the wavelengths in the light beams, the wavelength information being conveyed in the response lights to allow association of the response lights respectively with a respective wavelength. | 06-28-2012 |
20120176604 | Combining Normal-Incidence Reflectance and Transmittance with Non-Normal-Incidence Reflectance for Model-Free Characterization of Single-Layer Films - Optical systems and methods are described that provide greater solving power for thin-film measurements in general, and provide a unique model-free solution for single-layer films in particular. | 07-12-2012 |
20120176605 | METHOD AND DEVICE FOR CHECKING THE DEGREE OF SOILING OF BANK NOTES - The invention relates to a method and device for checking the degree of soiling of bank notes. To this end, the bank notes are conveyed along a transport path and illuminated by at least one light source with visible light of the blue spectral range. The light reflected and/or emitted by the bank notes, and/or the light having penetrated the bank notes due to transmission, is detected by means of at least one sensor and evaluated. | 07-12-2012 |
20120182544 | AIRBORNE LIDAR FOR DETECTING MATTER SUSPENDED IN AIR - An object of the present invention is to provide a device which detects matter suspended in air, represented by, for example, ice crystals, volcanic ash, in the forward direction of the flight of an aircraft. A method of detecting matter suspended in air of this invention is characterized in that, in airborne Doppler LIDAR using laser light, components of matter subjected to laser light reflection and scattering are remotely measured on a basis of an angular difference in planes of polarization of transmitted light which is laser light radiated into the atmosphere, and received light scattered by matter suspended in air in a remote region. | 07-19-2012 |
20120182545 | METHOD AND DEVICE FOR MEASURING OPTICAL CHARACTERISTIC VARIABLES OF TRANSPARENT, SCATTERING MEASUREMENT OBJECTS - A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in an inline coating system, and particularly the turbidity of the measurement object during a relative movement between the measurement object and measuring device. Transmission fractions are measured in two different radiation directions of a lighting source emitting diffuse light by two photodetectors, by which a fraction of diffuse light of the lighting source is suppressed in one direction. | 07-19-2012 |
20120182546 | METHOD AND DEVICE FOR SIMULTANEOUS MEASUREMENTS OF A SAMPLE IN A MULTIPHASE SYSTEM - A method and a device for simultaneous and quantitative measurement of a carrier composition and a solids volume fraction in a gas/solid, liquid/solid, liquid/liquid, liquid/gas or gas/liquid/solid multiphase systems are presented. A first measurement identifies the phase of the sample and/or the solids fraction of the sample. A second measurement provides a liquid or gaseous chemical composition of the sample. The device comprises a generator of light that propagates through a sample of the multiphase system. A detector obtains a spectrum of absorbance of the light. The spectrum of absorbance is representative of measurements. | 07-19-2012 |
20120224166 | Device for Determining Particle Sizes - Method for measuring particle size distributions, in particular for the optical measurement of wide particle size distributions of bulk materials such as cereals, cereal milling products, cereal products and the like, which is intended to enable the measurement of particle size distributions which vary by orders of magnitude. To address this problem, a sample of isolated particles is optically detected in an arrangement by means of at least two measurement methods, wherein preferably detection of the contours of the particles and laser diffraction take place at the same time. | 09-06-2012 |
20120236293 | APPARATUS FOR DETECTING POSITION AND DEPTH AND A METHOD THEREOF - The present invention provides an apparatus for detecting the position and depth of a Device Under Test (DUT) having a surface and a method thereof. The apparatus comprises an electrically-controlled swing element whose swing angle is controlled by an electrically-driven actuator, a light source whose light beam is redirected to the surface by the electrically-controlled swing element to form a light point, an optical system configured to receive the projection information of the light point, a storage unit configured to store the default information of the light point projected onto a default plane (DP) and a computation unit for calculating the depth information of the DUT according to the projection information and the default information. | 09-20-2012 |
20120257192 | MICROBIAL DETECTION APPARATUS AND METHOD - A microbial detection apparatus is provided. The apparatus includes a parabolic reflector. A light source is configured to direct a beam of light toward the focal point of the parabolic reflector. A fluid flow tube passes through the focal point of the parabolic reflector, such that the light beam path and the flow tube intersect at the focal point of the parabola. The fluid flow tube is configured to contain a flow of fluid. A first detector is included for detecting fluorescence light emitted from microbes within the fluid passing through the flow tube. A second detector is included for detecting Mie scattered light from particles within the fluid passing through the flow tube. | 10-11-2012 |
20120268731 | SYSTEMS AND METHODS FOR PARTICLE DETECTION - A particle detection system is provided. The particle detection system includes at least one tapered optical fiber, a light source configured to transmit light through the at least one tapered optical fiber, a photodetector configured to measure a characteristic of the light being transmitted through the at least one optical fiber, and a computing device coupled to the photodetector and configured to determine whether a nanoparticle is present within an evanescent field of the at least one tapered optical fiber based on the measured light characteristic. | 10-25-2012 |
20120274925 | Axial light loss sensor system for flow cytometery - An axial light loss sensor system, and methods for measuring axial light loss with improved resolution are provided. Aspects of the present invention include an axial light loss sensor positioned along an axis of irradiation to detect axial light loss resulting from a particle passing a light source intersect in a fluid stream, and an obstruction positioned along the axis of irradiation between the light source intersect and the axial light loss sensor. The obstruction is further positioned so as to have an on-axis opaque surface. The obstruction allows for the measurement of a fringe signal in a far-field with respect to the irradiated particle, in order to measure the axial light loss produced by the particle. The systems and methods described herein find use in, for example, flow cytometery. | 11-01-2012 |
20120314207 | Authentication Apparatus and Methods - Authentication apparatus ( | 12-13-2012 |
20120314208 | MEASURING METHOD AND DEVICE FOR DETERMINING TRANSMISSION AND/OR REFLECTION PROPERTIES - The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates. According to the disclosure the transmission and reflection properties are determined in such a way that sequentially:
| 12-13-2012 |
20120320369 | OPTICAL MEASUREMENT SYSTEM AND THE DEVICE THEREOF - The invention discloses an optical measurement system for measuring the optical properties of a device under test (DUT). The optical measurement system includes a DUT, a light measuring module, a light guiding module and an analyzing module. The present invention utilizes the light guiding module to receive an axial ray of the rays emitted by the DUT so as to analyze the optical properties thereof. Thus, the present invention is not only capable of measuring the light intensity of the rays emitted by the DUT, but also capable of obtaining the properties of the axial ray emitted by the DUT. | 12-20-2012 |
20120327399 | UNEVENNESS INSPECTION APPARATUS AND UNEVENNESS INSPECTION METHOD - An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image; and an inspecting section performing unevenness inspection using the calculated evaluation parameter. The calculating section calculates the evaluation parameter in consideration of unevenness visibility for both color and luminance. | 12-27-2012 |
20120327400 | MEASUREMENT SYSTEM AND MEASUREMENT PROCESSING METHOD - This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic. | 12-27-2012 |
20130003050 | SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND THICKNESS OF DOPED SEMICONDUCTOR LAYERS - The disclosure is directed to nondestructive systems and methods for simultaneously measuring active carrier concentration and thickness of one or more doped semiconductor layers. Reflectance signals may be defined as functions of active carrier concentration and thickness varying over different wavelengths and over different incidence angles of analyzing illumination reflected off the surface of an analyzed sample. Systems and methods are provided for collecting a plurality of reflectance signals having either different wavelengths or different incidence angle ranges to extract active carrier density and thickness of one or more doped semiconductor layers. | 01-03-2013 |
20130010286 | METHOD AND DEVICE OF DIFFERENTIAL CONFOCAL AND INTERFERENCE MEASUREMENT FOR MULTIPLE PARAMETERS OF AN ELEMENT - The present invention relates to the field of optical precision measurement technologies, and in particular, to a method and a device of differential confocal (confocal) and interference measurement for multiple parameters of an element. The core concept of the invention lies in that: the concurrent high-precision measurement of multiple parameters of an element may be realized by measuring the surface curvature radius of an element with spherical surface, the back focal length of a lens, the refractive index of a lens, the thickness of a lens and the axial spaces of an assembled lenses by using a differential confocal (confocal) measuring system and measuring the surface profile of the element by using a figure interference measuring system. In the invention, a differential confocal (confocal) detection system and a figure interference measuring system are combined for the first time, the method covers more measured parameters, and during the measurement of multiple parameters of an element, it is not essential to readjust the optical path or disassemble the test element, thus no damage will be caused on the test element, and the measurement speed will be fast. | 01-10-2013 |
20130027688 | SURFACE PLASMON RESONANCE DETECTION SYSTEM - A system for detecting the presence of an analyte in a moving substrate or sample handling device is disclosed, providing means ( | 01-31-2013 |
20130033701 | Systems and Methods for Monitoring a Flow Path - Disclosed are systems and methods for analyzing a flow of a fluid at two or more discrete locations to determine the concentration of a substance therein. One method of determining a characteristic of a fluid may include containing a fluid within a flow path that provides at least a first monitoring location and a second monitoring location, generating a first output signal corresponding to the characteristic of the fluid at the first monitoring location with a first optical computing device, generating a second output signal corresponding to the characteristic of the fluid at the second monitoring location with a second optical computing device, receiving first and second output signals from the first and second optical computing devices, respectively, with a signal processor, and determining a difference between the first and second output signals with the signal processor. | 02-07-2013 |
20130033702 | Systems and Methods for Monitoring Oil/Gas Separation Processes - Disclosed are systems and methods for analyzing an oil/gas separation process. One method includes conveying a fluid to a fluid separator coupled to a flow path, the fluid separator having an inlet and a discharge conduit, generating a first output signal corresponding to a characteristic of the fluid adjacent the inlet with a first optical computing device, generating a second output signal corresponding to the characteristic of the fluid adjacent the discharge conduit with a second optical computing device, receiving the first and second output signals with a signal processor communicably, and generating a resulting output signal with the signal processor indicative of how the characteristic of the fluid changed between the inlet and the discharge conduit. | 02-07-2013 |
20130033703 | CHARACTERISTIC DETERMINATION - Embodiments of the present invention provide a method of determining at least one characteristic of a target surface, comprising providing a phase map for a first region of a target surface via radiation having a first wavelength, providing n further phase maps for the first region via radiation having a further n wavelengths each different from the first wavelength, and determining at least one characteristic at the target surface responsive to the first and further phase maps. | 02-07-2013 |
20130038863 | OPTICAL DEVICE AND METHOD FOR INSPECTING STRUCTURED OBJECTS - A microscope device for inspecting structured objects, including: a camera; an optical imager capable of producing, on the camera, an image of the object according to a field of view, and including a distal lens arranged on the side of the object; and a low-coherence infrared interferometer including a measurement beam capable of producing measurements by means of interferences between retroreflections of the measurement beam and at least one separate optical reference. The device also includes coupler for injecting the measurement beam into the optical imaging means in such a way that the beam passes through the distal lens, and the low-coherence infrared interferometer is balanced in such a way that only the measurement beam retroreflections, taking place at optical distances close to the optical distance covered by the beam to the object, produce measurements. | 02-14-2013 |
20130050684 | APPARATUS AND METHOD FOR MEASURING OPTICAL PROPERTIES OF TRANSPARENT MATERIALS - An apparatus for measuring optical properties of transparent materials with a first illumination device which illuminates the material to be investigated along a pre-set illumination path with a pre-set radiation, with a radiation recording space which records radiation passed on by the material to be investigated. The radiation recording space is arranged so that radiation emitted by the first illumination device first strikes the material and then at least for a time an inner wall of the radiation recording space. A radiation detector device is arranged to record radiation reflected and/or scattered essentially only from the inner wall. A second illumination device suitable for emitting modulated radiation also illuminates the inner wall. | 02-28-2013 |
20130070235 | MULTIPLE SPECTRUM CHANNEL, MULTIPLE SENSOR FIBER OPTIC MONITORING SYSTEM - A multiple sensor fiber optic sensing system includes an optical fiber having at least first fiber optic sensors and second fiber optic sensors deployed along its length. In response to an interrogating pulse, the first fiber optic sensors generate responses in a first optical spectrum window, and the second fiber optic sensors generate responses in a second, different optical spectrum window. The responses in the first optical spectrum window are measured in a first optical spectrum channel, and the responses in the second optical spectrum window are measure in a second, different optical spectrum channel and provide simultaneous indications of one or more parameters, such as temperature and pressure, in the environment in which the sensors are deployed. | 03-21-2013 |
20130070236 | METHOD FOR DETERMINING THE PATH LENGTH OF A SAMPLE AND VALIDATING THE MEASUREMENT OBTAINED - A for traceably determining an unknown optical path length of a sample in an optical measuring device comprises the steps of: providing a drop analyser connected to a standard spectrophotometer; providing a certified reference material contained in first and second closed high accuracy cuvettes; measuring absorbance of the certified reference material to obtain a first absorbance measurement for the first specified path length; measuring absorbance of the certified reference material for a second path length to obtain a second absorbance measurement; using a dropping device to drop a specified volume of the solvent on an optical surface so that the path length of the specified volume can be determined by reference to the first and second absorbance measurement; and using the dropping device to drop the same volume of sample as the specified volume of solvent on the optical measuring device. | 03-21-2013 |
20130083315 | FLUIDIC FLOW CYTOMETRY DEVICES AND METHODS - Devices, systems and methods facilitate analyzing, identifying and sorting particles in fluids, including cytometry devices and techniques. The described techniques can be used in a variety of applications such as in chemical or biological testing and diagnostic measurements. One exemplary flow cytometry device includes a channel that is capable of conducting a fluid containing at least one particle and also capable of allowing light be transmitted to and from the channel. The flow cytometry device also includes a lens that is positioned between the channel and a color filter. The lens directs at least a portion of light transmitted from the channel to the color filter. The color filter includes a plurality of zones, where each zone is adapted to allow transmission of only a particular spectral range of light. The flow cytometry device further includes a detector configured to receive the light that is transmitted through the color filter. | 04-04-2013 |
20130083316 | 3D OPTICAL DETECTION SYSTEM AND METHOD FOR A MOBILE STORAGE SYSTEM - A mobile storage having a mobile storage unit having a detection side; an opposing component having an aisle side facing the detection side; the mobile storage unit being movable between a closed position and an open position wherein an aisle is defined; at least one detection module having an optical pulse emitter and an optical detector both provided at an end, facing the aisle, the optical pulse emitter emitting a light pulse, the optical detector detecting a reflection of the light pulse. An object detection method for a mobile storage comprising comparing a temporal reflection signal to a background temporal reflection signal to detect the presence of an object; and indicating a status of the aisle to be presence of an object if the object is detected to be present. | 04-04-2013 |
20130100439 | SMART FIBER OPTIC SENSORS SYSTEMS AND METHODS FOR QUANTITATIVE OPTICAL SPECTROSCOPY - Smart fiber optic sensors, systems, and methods for performing quantitative optical spectroscopy are disclosed. In one embodiment, smart fiber optic sensor can include a sensing channel, a calibration channel, and a pressure sensing channel. External force or pressure can be calculated at pressure sensing channel for monitoring and controlling pressure at a sensor-specimen interface thereby ensuring more accurate specimen spectral data is collected. Contact pressure can be adjusted to remain within a specified range. A calibration light of the calibration channel and an illumination light of the sensing channel can be generated simultaneously from a shared light source. Pressure sensing channel can transmit light from a second light source and collect pressure spectral data. | 04-25-2013 |
20130107247 | Inspecting Method and Inspecting Apparatus For Substrate Surface | 05-02-2013 |
20130114070 | Targeted Agile Raman System for Detection of Unknown Materials - The present disclosure provides for a system and method for detecting unknown materials. A test data set, which may comprise a hyperspectral data set, is generated representative of a first location. The test data set may be analyzed to determine a second location which may be interrogated using a Raman spectrocscopic device to generate a Raman data set. The Raman data set may be analyzed to associated an unknown material with a known material such as: a chemical material, a biological material, an explosive material, a hazardous material, a drug material, and combinations thereof. | 05-09-2013 |
20130128262 | DEFOCUSED OPTICAL ROTATION MEASUREMENT APPARATUS, OPTICAL ROTATION MEASUREMENT METHOD AND DEFOCUSED OPTICAL FIBER SYSTEM - There is provided an optical rotation measurement apparatus and a measuring system which are user-friendly, capable of measuring glucose concentration in drawn blood and living bodies with high accuracy in real time such that it is available for use at an actual medical site without depending on a reagent, and capable of measuring glucose concentration in a living body noninvasively with high accuracy, a new polarized light converting optical system that can be used for the measuring system, and an optical rotation measurement method using the optical system. | 05-23-2013 |
20130135611 | OPTICAL CONSTANT MEASURING APPARATUS AND METHOD THEREOF - Disclosed is an optical constant measuring method which includes applying light to a sample including a target material; measuring a first optical signal from light reflected from the sample; grasping a structure of the sample based on the first optical signal; measuring a second optical signal from light penetrating the sample; grasping an overall optical property of the sample based on the second optical signal; and measuring an optical constant of the target material based on the measured structure and optical property of the sample. | 05-30-2013 |
20130148107 | MULTI-SOURCE SENSOR FOR ONLINE CHARACTERIZATION OF WEB PRODUCTS AND RELATED SYSTEM AND METHOD - A system includes a first sensor unit having multiple solid-state light sources each configured to generate light at one or more wavelengths, where different light sources are configured to generate light at different wavelengths. The first sensor unit also includes a mixer configured to mix the light from the light sources and to provide the mixed light to a web being sampled. The first sensor unit further includes a controller configured to control the generation of the light by the light sources. The system also includes a second sensor unit comprising a detector configured to measure mixed light that has interacted with the web. The second sensor unit could also include a second controller configured to determine one or more characteristics of the web (such as moisture content and fiber weight) using measurements from the detector. | 06-13-2013 |
20130162982 | SPECTROSCOPIC DETECTION DEVICE AND CONFOCAL MICROSCOPE - A spectroscopic detection device including: a stop in which an aperture is formed; a first and second photodetectors which detect detection light; a collimator which converts the detection light emitted from the stop into substantially parallel light, and emits light to at least one of the first and second photodetectors; a dispersive element which is arranged between the collimator and the first photodetector, and disperses the detection light; a condensing optical system which condenses the detection light dispersed by the dispersive element to the first photodetector; and a wavelength selection filter which is arranged between the collimator and the second photodetector, and allows light in a specified wavelength range to enter the second photodetector. The collimator is configured so that the focal distance for the detection light emitted to the first photodetector may be different from the focal distance for the detection light emitted to the second photodetector. | 06-27-2013 |
20130176556 | Multiwell plate lid for improved optical measurements - A lid for multiwell plates, allowing improved optical measurement of liquid samples within its wells, while mitigating evaporation from said samples, is disclosed. A surface element protrudes from the bottom of the lid into the fluid within a well. The protruding element may be hollow or solid such that light directed into the element may act to capture or direct the beam while preventing backscatter from reaching one or more detectors. The protruding element may direct the beam from the well without requiring the beam to pass through a fluid/air interface. The angle and shape of the lid surfaces and/or light absorbing/blocking colorization may be employed to minimize or eliminate back reflection. Evaporation is controlled by physically capping the well with the lid, either sealing against the face at the top of the well or the inside surface of the well. | 07-11-2013 |
20130188173 | WIDE FIELD OF VIEW OPTICAL TRACKING SYSTEM - An optical tracking system for determining the pose of a moving object in a reference coordinate system includes light emitters, optical detectors, and a pose processor. The processor is coupled with an optical detector and also with a light emitter. The processor determines the object's pose according to detected light. An optical detector and a light emitter are situated at a fixed position in the reference coordinate system. Other ones of the optical detectors and light emitters are attached to the object. One optical detector is a (WFOV) detector comprising an optical sensor and optical receptors. The receptors are spaced apart and optically coupled with the optical sensor. The sensor senses light received from a light emitter. Each receptors projects a different angular section of scene on the sensor. The pose processor associates the representation on the sensor, with a respective receptors which projected the light on the sensor. | 07-25-2013 |
20130194565 | APPARATUS AND METHOD FOR MEASURING RETROREFLECTIVITY OF A SURFACE - An apparatus for measuring the retroreflectivity of a surface. The apparatus comprises a light source for illuminating an area of said surface at an incident angle relative to the surface; a detector for detecting light reflected back from the surface at an observation angle relative to the surface; a signal processing unit adapted to receive a detector signal from the detector and to determine, from at least the received detector signal, a measure of retro reflectivity of the surface; a range finder for measuring a distance between the apparatus and the illuminated area. The signal processing unit is further adapted to adjust the measure of retroreflectivity responsive to the measured distance. | 08-01-2013 |
20130201471 | OPTICAL IMAGING SYSTEM FOR AIR BUBBLE AND EMPTY BAG DETECTION IN AN INFUSION TUBE - An optical imaging system for use with an infusion tube having a drip chamber and an output tube. The drip chamber includes a first portion with a drip tube, a second portion with an exit port, and a third portion between the first and second portions. The optical imaging system includes: an illumination system with at least one light source for emitting light, an optical system, and a memory element storing computer executable instructions. The optical system receives the light transmitted by the output tube or the second portion and transmits data characterizing the received light. The system includes at least one processor configured to execute the computer executable instructions to: detect, using the data, an air bubble in the output tube or the second portion; and determine a volume of the detected air bubble. | 08-08-2013 |
20130229648 | TESTING OF PASSIVE OPTICAL COMPONENTS - Methods and devices provide for transmitting a series of optical signals within a range of an O-band through a U-band into a device under test comprising one or more passive optical components; measuring powers of the optical signals that propagated through the device under test; calculating wavelength-dependent insertion loss values based on the measured power of the optical signals; measuring powers of reflected portions of the optical signals that propagated through the device under test; and calculating wavelength-dependent return loss values based on the measured powers of the reflected portion of the optical signal. | 09-05-2013 |
20130258320 | METHOD AND APPARATUS FOR INSPECTING SURFACE OF A MAGNETIC DISK - In a method and an apparatus for inspecting a surface of a disk, a disk that is a sample is rotated, and a light beam is applied to the sample while moving the sample in the direction perpendicular to the center axis of rotation. Light reflected and scattered from the sample in a first direction is detected to obtain a first detection signal while applying the light beam. Light reflected and scattered from the sample in a second direction is detected to obtain a second detection signal while applying the light beam. The first detection signal and the second detection signal are processed to detect a defect on the sample. A preset threshold is compared with the output level of the first detection signal or the output level of the second detection signal to determine whether the material of the disk that is the sample is a predetermined material. | 10-03-2013 |
20130258321 | METHOD AND MONITORING DEVICE FOR THE DETECTION AND MONITORING OF THE CONTAMINATION OF AN OPTICAL COMPONENT IN A DEVICE FOR LASER MATERIAL PROCESSING - A method and device for the detection and monitoring of the contamination of an optical component in a device for laser material processing, which emits a process laser beam through or onto the optical component. A measurement beam emitted by a light source is projected under an angle of incidence onto an optical surface of the optical component. The beam reflected from the outer surface of the protective window under the angle of reflection corresponding to the angle of incidence is conducted through an aperture stop onto a first light-sensitive detector so as to record the intensity of the reflected beam. The intensity of the scattered radiation, scattered diffusely from the optical surface of the component under a scattering angle, is recorded by a second light-sensitive detector. The degree of the contamination of the component is determined from the recorded intensities of the reflected beam and the scattered radiation. | 10-03-2013 |
20130271752 | SYSTEM AND METHOD FOR INTERROGATION OF TARGET MATERIAL IN SITU - A system for remotely sensing a target material in situ include a broad-band laser source, at least one tunable filter coupled to the source laser for generating a swept-frequency signal an optical device for splitting the swept-frequency signal into a first illumination signal and second illumination signal, a first optical path for directing the first illumination signal unto the target material and receiving a reflected signal from the target material, a second optical path for receiving the second illumination signal and generating a spectral reference signal, and a controller coupled to the first optical path and the second optical path for adjusting the frequency and spatial resolution of the laser source based at least in part on a comparison of the spectral reference signal and the reflected signal. | 10-17-2013 |
20130293871 | SENSOR FOR SPECTRAL-POLARIZATION IMAGING - A sensor is provided that combines monolithically-integrated pixelated aluminum nanowires with vertically stacked photodetectors. The aluminum nanowires are arranged as a collection of 2-by-2 pixels, or super-pixels. Each super-pixel includes nanowires at four different orientations, offset by 45°. Thus, the optical field is sampled with 0°, 45°, 90°, and 135° linear polarization filters. Due to the spatial subsampling, interpolation may be applied to reconstruct the full 0°, 45°, 90°, and 135° arrays. | 11-07-2013 |
20130293872 | MONITORING APPARATUS AND METHOD PARTICULARLY USEFUL IN PHOTOLITHOGRAPHICALLY PROCESSING SUBSTRATES - Apparatus for processing substrates according to a predetermined photolithography process includes a loading station in which the substrates are loaded, a coating station in which the substrates are coated with a photoresist material, an exposing station in which the photoresist coating is exposed to light through a mask having a predetermined pattern to produce a latent image of the mask on the photoresist coating, a developing station in which the latent image is developed, an unloading station in which the substrates are unloaded and a monitoring station for monitoring the substrates with respect to predetermined parameters of said photolithography process before reaching the unloading station. | 11-07-2013 |
20130293873 | MONITORING SYSTEM - A monitoring system ( | 11-07-2013 |
20130335731 | SYSTEM AND METHOD FOR ANALYZING WATER SAMPLES IN A WATER PROCESSING FACILITY - A system and method for isolating and analyzing a water sample in a water processing facility are disclosed. The system uses a chamber for receiving and isolating the water sample from the main water treatment process. An optical detector views and characterizes the particles in a region of the chamber. An analyzer coupled to the optical detector compares the characterized suspended particles at a first time and at with the characterized suspended particles at a second time to produce a report showing suspended particle size as a function of time. | 12-19-2013 |
20130335732 | METHOD OF AUTHENTICATING A POLYMER FILM - A method of authenticating a polymer film comprises measuring the thickness of a layer therein by white light interferometry and/or measuring the birefringence of a layer therein. The method, and devices to carry out the method, may be used in security applications, for example to test for counterfeit bank notes. | 12-19-2013 |
20140055775 | MATERIAL IDENTIFICATION AND DISCRIMINATION - A material is illuminated with one or more light sources including at least one light source which emits light of controlled coherence properties. Both of a spectral characteristic and a speckle statistic are derived using light reflected from the illuminated material. The spectral characteristic and the speckle statistic are compared against plural entries in a database. Each entry in the database correlates the identity of a material against a corresponding spectral characteristic and a corresponding speckle statistic for the material. At least one candidate for the identity of the illuminated material is determined based at least in part on the comparison. | 02-27-2014 |
20140085625 | SKIN AND OTHER SURFACE CLASSIFICATION USING ALBEDO - A system and method are disclosed relating to a pipeline for generating a computer model of a target user, including a hand model of the user's hands and fingers, captured by an image sensor in a NUI system. The computer model represents a best estimate of the position and orientation of a user's hand or hands. The generated hand model may be used by a gaming or other application to determine such things as user gestures and control actions. | 03-27-2014 |
20140092379 | METHOD AND DEVICE FOR MEASURING GAS COMPONENT CONCENTRATION INSIDE A GLASS UNIT - A non-invasive method for determining a concentration of a gas component in a gas mixture contained in a spacing of a glass unit having at least two glass sheets spaced apart from each other and forming the spacing. One or more light beams is applied at an angle to the surface of the glass unit, wherein the wavelength of the emitted light beam is varied around or over the at least one absorption line of the interest gas component. The light beams transmitted through or reflected from at least one surface or interface locating at the opposite side of the spacing are collected by a detector and non-linear variations in the intensity of the transmitted or reflected light beams over an absorption line of the interest gas is then component determined. The concentration of the gas component to be measured is determined based on the non-linear variations in the intensity. | 04-03-2014 |
20140111793 | WAFER LEVEL TESTING OF OPTICAL DEVICES - A wafer includes multiple optical devices that each includes one or more optical components. The optical components include light-generating components that each generates a light signal in response to application of electrical energy to the light-generating component from electronics that are external to the wafer. The optical components also include receiver components that each outputs an electrical signal in response to receipt of light. The wafer also includes testing waveguides that each extends from within a boundary of one of the optical devices across the boundary of the optical device and also provides optical communication between a first portion of the optical components and a second portion of the optical components. The first portion of the optical components includes one or more of the light-generating components and the second portion of the optical components include one or more of the receiver components. | 04-24-2014 |
20140146311 | METHOD OF DETERMINING MASK PATTERN AND EXPOSURE CONDITION, STORAGE MEDIUM, AND COMPUTER - A determining method includes the steps of setting a first parameter to define the shape of the plurality of pattern elements of the mask, setting a second parameter to define the effective light source distribution; and repeating the process of calculation of the image of the mask pattern and calculation of a value of an evaluation item while varying the value of the first parameter and the second parameter to thereby determine the effective light source distribution and the mask pattern, wherein parameters of pattern elements are set as one parameter by using a value of an index representing the proximity effect. | 05-29-2014 |
20140152978 | Optical Detection and Analysis of Particles - The present invention provides a method of analysing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis; determining second information about average particle size of particles in the sample by dynamic light scattering; determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size. | 06-05-2014 |
20140168637 | SIMULTANEOUS REFRACTIVE INDEX AND THICKNESS MEASUREMENTS WITH A MONOCHROMATIC LOW-COHERENCE INTERFEROMETER - A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques. | 06-19-2014 |
20140176936 | SENSOR ASSEMBLY AND METHOD FOR DETERMINING THE HYDROGEN AND MOISTURE CONTENT OF TRANSFORMER OIL - A sensor assembly senses hydrogen and moisture content of insulation liquid of a liquid-filled electrical equipment. The sensor assembly includes a radiation source for emitting electromagnetic radiation, a water detection section for receiving a water-containing component of the liquid when the assembly is in operational connection with the electrical equipment and for being illuminated by electromagnetic radiation from the radiation source, a first detector for detecting electromagnetic radiation from the water detection section at a wavelength indicative of an amount of water present at the water detection section, a hydrogen detection section for receiving a hydrogen-containing component of the liquid when the assembly is in operational connection with the electrical equipment and for being illuminated by electromagnetic radiation from the radiation source, and a second detector for detecting electromagnetic radiation from the hydrogen detection section at a wavelength indicative of an amount of hydrogen present at the hydrogen detection section. | 06-26-2014 |
20140185035 | METHOD FOR MEASURING CONCENTRATION OF A GAS COMPONENT IN A MEASUREMENT GAS - A method in which the wavelength of the light of a tunable light source is varied periodically over an absorption line of interest for the gas component to measure the concentration of a gas component in a measurement gas based on one of two measurement methods of direct absorption spectroscopy and wavelength modulation spectroscopy and, where in the case of wavelength modulation spectroscopy, the wavelength of the light is additionally sinusoidally modulated at a high frequency and with a small amplitude, where the intensity of the light is detected after transradiation of the measurement gas and processed to yield a measurement result, and where in order to increase the accuracy and reliability of the measurement, the two measurement methods are applied simultaneously during each period, or alternately in consecutive periods, and their results are combined by averaging to form the measurement result. | 07-03-2014 |
20140185036 | CALIBRATION APPARATUS AND CALIBRATION METHOD - A calibration apparatus includes an insertion portion into which a measurement probe is inserted and a reference reflection plate that is arranged at a position away from a distal end of the measurement probe by a predetermined distance in a state in which the measurement probe has been inserted in the insertion portion and that has uniform reflectivity of light in a range of a wavelength to be measured in an irradiation plane of an illumination light, wherein a material forming the reference reflection plate has a scattering mean free path that is greater than a spatial coherence length at the predetermined distance. | 07-03-2014 |
20140211199 | MULTIPLE CONCURRENT SPECTRAL ANALYSES - According to an example, apparatuses for performing multiple concurrent spectral analyses on a sample under test include an optical system to concurrently direct a plurality of light beams onto analytes at multiple locations on the sample under test, in which the plurality of light beams cause light in either or both of a Raman spectra and a non-Raman spectra to be emitted from the analytes at the multiple locations of the sample under test. The apparatuses also include a detector to concurrently acquire a plurality of spectral measurements of the light emitted from the analytes at the multiple locations of the sample under test. Example methods of performing spectral analysis include use of the apparatuses. | 07-31-2014 |
20140253907 | APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS - An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed. | 09-11-2014 |
20140268109 | MULTIFUNCTION SOLID-STATE INSPECTION SYSTEM - An inspection system includes optical components for operating the inspection system in an interference fringe imaging mode and a microscope imaging mode. The inspection system further includes at least one optical light source configured to emit a first wavelength of light to operate the inspection system in the interference fringe imaging mode and configure to emit a second wavelength of light to operate the inspection system in the microscope mode. The first wavelength of light is different from the second wavelength of light. | 09-18-2014 |
20140285794 | MEASURING DEVICE - According to an embodiment, a measuring device includes an imaging unit to capture an object from a plurality of positions to obtain a plurality of images; a distance measuring unit to measure a distance to the object from each position to obtain a plurality of pieces of distance information; a position measuring unit to measure each position to obtain a plurality of pieces of position information; a first calculator to calculate three-dimensional data of the object using the images; a second calculator to calculate a degree of reliability of each piece of distance information and each piece of position information; and a estimating unit to, among the pieces of distance information and the pieces of position information, make use of such pieces of distance information and such pieces of position information which have the degree of reliability greater than a predetermined value to estimate the scale of the three-dimensional data. | 09-25-2014 |
20140293273 | OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD - Disclosed herein is an optical measuring device including: a light applying section configured to apply exciting light to a sample flowing in a channel; and a scattered light detecting section configured to detect scattered light generated from the sample irradiated with the exciting light on the downstream side of the sample in the traveling direction of the exciting light; the scattered light detecting section including a scattered light separating mask for separating the scattered light into a low numerical aperture component having a numerical aperture not greater than a specific value and a high numerical aperture component having a numerical aperture greater than the specific value; a first detector for detecting the low numerical aperture component; and a second detector for detecting the high numerical aperture component. | 10-02-2014 |
20140300892 | TOTAL STATION HAVING SCANNING FUNCTIONALITY AND SELECTABLE SCANNING MODES - A total station including an electro-optical distance measuring unit and a scanning functionality is disclosed. The total station may include an analysis unit for analysis of the registered measuring signal data and conversion thereof into scanning points for a point cloud, whereby a point cloud having the scanning points can be generated. The distance measuring unit may be configured in such a manner that the distance measurement can be carried out by means of runtime measurement and/or waveform digitizing (WFD). In addition, the total station may have a program storage unit which may provide at least two scanning modes, wherein the at least two scanning modes differ at least in a measuring rate such as, for example, in the number of scanning points per unit of time. | 10-09-2014 |
20140375984 | HYBRID IMAGING AND SCATTEROMETRY TARGETS - Metrology targets, design files, and design and production methods thereof are provided. The metrology targets are hybrid in that they comprise at least one imaging target structure configured to be measurable by imaging and at least one scatterometry target structure configured to be measurable by scatterometry. Thus, the hybrid targets may be measured by imaging and scatterometry simultaneously or alternatingly and/or the measurement techniques may be optimized with respect to wafer regions and other spatial parameters, as well as with respect to temporal process parameters. The hybrid targets may be used to monitor process parameters, for example via comparative overlay measurements and/or high resolution measurements. | 12-25-2014 |
20150009490 | CHEMICAL AND MOLECULAR IDENTIFICATION AND QUANTIFICATION SYSTEM UTILIZING ENHANCED PHOTOEMISSION SPECTROSCOPY - An enhanced photoemission spectroscopy (EPS) system uses at least three photoelectric detection processes to identify a substance or substances in a target. The target can be in a container, and the EPS system accounts for this in the identification process. The photoelectric detection processes include Raman scattering, fluorescence and spectral reflection. The EPS system uses all three processes to generate spectral data that is then combined to derive a target signature. The target signature is then compared to stored signature data to determine the substance or substances in the target. | 01-08-2015 |
20150042982 | PORTABLE DEVICE FOR ANALYSING A PLURALITY OF WIDELY SPACED LASER BEAMS - A system and method for performing field measurement and testing of a plurality of widely spaced laser beams used in visual warning technology (VWT). VWT uses a combination of widely spaced laser beams, to warn civilians from approaching too close to military security areas. The widely spaced laser beams are displaced using rhomboidal prisms. Each rhomboidal prism receives a corresponding laser beam and displaces it toward a collecting lens. The lens focuses the displaced beams received thereon onto an imaging sensor for testing. Beam shutters may be used for selectively blocking one or more beams in order to test the beams separately and in different combinations. | 02-12-2015 |
20150042983 | MULTIPLE MODE SYSTEM AND METHOD FOR EVALUATING A SUBSTRATE - A multiple mode evaluation system that includes a multiple mode imager that is arranged to perform a single scan of a substrate while alternating between different optical modes thereby producing different sets of images of areas of the substrate, each set of images being associated with a single optical mode of image acquisition; wherein the different optical modes differ from each other by at least one optical characteristic. | 02-12-2015 |
20150049331 | METHOD AND DEVICE FOR ANALYSING PHASE DISTRIBUTION OF FRINGE IMAGE USING HIGH-DIMENSIONAL INTENSITY INFORMATION, AND PROGRAM FOR THE SAME - A fringe image phase distribution analysis technique that performs one-dimensional discrete Fourier transform using temporal intensity information or spatial intensity information to calculate the phase distribution of the fringe image. To improve the analysis accuracy of the phase distribution, a plurality of phase-shifted moiré fringe images is generated from high-dimensional intensity data by a thinning-out (down-sampling) process and an image interpolation process, and the phase distribution of the moiré fringe is calculated by a two-dimensional or three-dimensional discrete Fourier transform. In addition, the phase distribution of thinned-out is added to calculate the phase distribution of an original fringe image. Since high-dimensional intensity information which is present in both spatio-domain and temporal-domain is used, phase distribution analysis is less likely to be affected by random noise or vibration. In addition, even when measurement conditions are poor, it is possible to perform phase distribution analysis with high accuracy. | 02-19-2015 |
20150077739 | Multiwell plate lid for improved optical measurements - A lid for a multiwell plates which allows improved light scattering measurement of liquid samples within the wells of a multiwell plate, and which at the same time mitigates evaporation from said samples is disclosed. A surface element protrudes from the bottom of the lid into the fluid in a well. The protruding element may be hollow or solid, and the beam of light, directed into the element may act to capture or direct the beam while preventing backscatter from reaching the light scattering detector or detectors. The protruding element may thus direct the beam from the well without the beam having to pass through a fluid/air interface. The angle and shape of the lid surfaces may be optimized to minimize or eliminate back-reflection. Light absorbing and/or light blocking colorization may also be employed to minimize or eliminate back reflection. Evaporation is controlled by physically capping the well with the lid, either sealing against the face at the top of the well or the inside surface of the well. | 03-19-2015 |
20150085276 | METHOD FOR INSPECTING LENGTH-MEASURABLE PRODUCT, AND INSPECTION DEVICE - The method for inspecting a length-measurable product includes manufacturing the length-measurable product | 03-26-2015 |
20150124245 | Inspection Arrangement - The invention relates to an arrangement for analyzing an at least partially reflective surface of a wafer or other objects, containing a holder for holding the object; an inspection arrangement arranged at a distance in the region in front of the surface to be analyzed; and a measurement arrangement for determining the distance and/or inclination of the surface for the inspection arrangement; characterized be a radiation source, the radiation of which is directed towards the surface to be analyzed at an angle; and a spatially resolving detector for receiving the radiation from the radiation source that is reflected from the surface to be analyzed, wherein the radiation source and the detector are arranged outside the region necessary for the inspection between the inspection arrangement and the surface to be analyzed. | 05-07-2015 |
20150146194 | METHOD FOR DETERMINING THE QUALITY AND/OR COMPOSITION OF MILK, IN PARTICULAR DURING A MILKING PROCESS - A method is proposed for ascertaining the quality and/or the composition of milk, in particular during a milking operation, in which the fill level of the milk in a chamber is determined. After the fill level of the milk in the chamber has been determined, the milk is irradiated using at least one radiation of a predefined wavelength. The intensity of the reflected radiation is measured. The fill level and the intensity of the reflected radiation represent a value pair. Characteristic values are stored in a memory. A characteristic value is assigned to the ascertained value pair. A statement about the quality and/or the composition of the milk can be made from the characteristic value thus ascertained. | 05-28-2015 |
20150293487 | SHEET DISCRIMINATOR AND IMAGE FORMING APPARATUS INCORPORATING THE SHEET DISCRIMINATOR - A sheet discriminator, which can be included in an image forming apparatus, includes an optical information detector, a sheet distinguisher, and a sheet thickness detector. The optical information detector includes a light emitter to emit light to a recording medium and a light receiver to receive the light and detects information of the recording medium. The sheet distinguisher distinguishes a type of the recording medium based on the information detected by the optical information detector. The sheet thickness detector includes a displacement gauge to sandwich the recording medium with an opposing member disposed facing the displacement gauge and to move from an initial position thereof and a displacement detector to detect an amount of displacement of the displacement gauge. The sheet thickness detector detects a thickness of the recording medium based on detection results obtained by the displacement detector. | 10-15-2015 |
20150316442 | METHOD OF EVALUATING OPTICAL CHARACTERISTICS OF TRANSPARENT SUBSTRATE - The present invention is a method of evaluating optical characteristics of a transparent substrate that is disposed on a display device, wherein the optical characteristics of the transparent substrate are evaluated by selecting two values among a quantified resolution index value (T), a quantified reflection image diffusiveness index value (R), and a quantified sparkle index value of the transparent substrate. According to the present invention, a transparent substrate and an anti-glare process that is to be applied to it can be properly selected, depending on purpose and use. The present invention can be utilized, for example, for evaluating optical characteristics of a transparent substrate that is installed in various types of display devices, such as an LCD device, an OLED device, a PDP device, and a tablet type display device. | 11-05-2015 |
20150323471 | APPARATUS, TECHNIQUES, AND TARGET DESIGNS FOR MEASURING SEMICONDUCTOR PARAMETERS - In one embodiment, apparatus and methods for determining a parameter of a target are disclosed. A target having an imaging structure and a scatterometry structure is provided. An image of the imaging structure is obtained with an imaging channel of a metrology tool. A scatterometry signal is also obtained from the scatterometry structure with a scatterometry channel of the metrology tool. At least one parameter, such as overlay error, of the target is determined based on both the image and the scatterometry signal. | 11-12-2015 |
20150330905 | Methods and apparatus for surface classification - In illustrative implementations of this invention, light sources illuminate a surface with multi-spectral, multi-directional illumination that varies in direction, wavelength, coherence and collimation. One or more cameras capture images of the surface while the surface is illuminated under different lighting conditions. One or more computers take, as input, data indicative of or derived from the images, and determine a classification of the surface. Based on the computed classification, the computers output signals to control an I/O device, such that content displayed by the I/O device depends, at least in part, on the computed classification. In illustrative implementations, this invention accurately classifies a wide range of surfaces, including transparent surfaces, specular surfaces, and surfaces with few features. | 11-19-2015 |
20150355080 | SPECIES SPATIAL RECONSTRUCTION FOR EXHAUST SYSTEM USING SPECTROSCOPY AND TOMOGRAPHY - A system for species concentration spatial reconstruction for an exhaust system includes an emitter, a detector, and a controller. The emitter is coupled to a first portion of the exhaust system and tuned to a specific wavelength of a species to be measured. The detector is coupled to a second portion of the exhaust system opposite to the first portion such that the detector is positioned to detect a beam attenuation of a beam from the emitter. The controller is configured to receive a plurality of beam attenuation measurements from the detector and to generate a cross-sectional species concentration map based on the plurality of beam attenuation measurements. | 12-10-2015 |
20150369695 | DETECTING SYSTEM - A detecting system for detecting an under-test light of an under-test object includes a light spatial distribution unit, a chromatic-dispersion light-splitting unit and a detecting unit. The light spatial distribution unit is disposed on a side of the under-test object to receive the under-test light and form a plurality of point light sources. The chromatic-dispersion light-splitting unit is disposed on a side of the light spatial distribution unit to receive the point light sources and produce a light-splitting signal. The detecting unit is disposed on a side of the chromatic-dispersion light-splitting unit to receive the light-splitting signal and produce an optical field distribution of the under-test light. | 12-24-2015 |
20150377611 | Wire-Pull Test Location Identification on a Wire of a Microelectronic Package - A mechanism is provided for identifying a wire-pull test location on a wire of a microelectronic package. A first distance between a first terminating location of the wire on the microelectronic package and a second terminating location of the wire on the microelectronic package is determined. Based on the first distance, a second distance from either the first terminating location or the second terminating location is determined as the wire-pull test location for testing a strength of a connection of the wire to at least one of the first terminating location or the second terminating location. An adjustment is performed such that a visual guide is oriented on the wire at the wire-pull test location. | 12-31-2015 |
20150377653 | DEVICE FOR SURVEYING TRACKS - A device is proposed for measuring tracks, in particular for track laying machines, having two outer, one front and one rear, track-traveling measurement carriages ( | 12-31-2015 |
20160025642 | METHOD AND APPARATUS FOR AUTOMATIC MEASUREMENT OF VARIOUS QUALITIES OF PRINTED SHEETS - Embodiments of the invention relate to the automatic measuring of such qualities of a printed sheet as reflectance excluding specular reflectance, reflectance including specular reflectance, e.g. gloss, transmittance, half-tone coverage, and the like. | 01-28-2016 |
20160033420 | Inspection for Multiple Process Steps in a Single Inspection Process - Various embodiments for detecting defects on a wafer are provided. One method includes acquiring output generated by an inspection system for a wafer during an inspection process that is performed after at least first and second process steps have been performed on the wafer. The first and second process steps include forming first and second portions, respectively, of a design on the wafer. The first and second portions of the design are mutually exclusive in space on the wafer. The method also includes detecting defects on the wafer based on the output and determining positions of the defects with respect to the first and second portions of the design. In addition, the method includes associating different portions of the defects with the first or second process step based on the positions of the defects with respect to the first and second portions of the design. | 02-04-2016 |
20160061747 | APPARATUS AND METHOD FOR MEASURING CONTAMINATION OF FILTER - Provided are an apparatus and method for measuring contamination of a filter. The filter contamination measuring apparatus includes a light-emitting unit which provides light having, a predetermined wavelength to a filter adsorbs foreign materials, a light-receiving unit which receives light reflected by the filter and convert reflected light information into a digital code to output, and a contamination calculating unit which processes the digital code provided by the light-receiving unit and calculates a degree of contamination of the filter, wherein the contamination calculating unit calculates a degree, in which a wavelength of the light reflected by the filter is shifted from the predetermined wavelength, compares intensity of light provided by the light-emitting unit with intensity of the light reflected by the filter, and calculates the degree of contamination of the filter. | 03-03-2016 |
20160069746 | METHODS AND SYSTEMS FOR FORMING A MANDREL ASSEMBLY FOR USE WITH A LOCATING SYSTEM - A method of forming a mandrel assembly for use in fabricating a large scale component includes boring a plurality of cavities into an outer surface of the mandrel assembly and filling the plurality of cavities with a contrast color substrate to form a contrast target on the mandrel assembly. The method also includes curing the contrast color substrate such that an outer surface of the contrast color substrate is substantially flush with the outer surface of the mandrel assembly when the substrate is fully cured. | 03-10-2016 |
20160139032 | INSPECTION SYSTEM AND METHOD USING AN OFF-AXIS UNOBSCURED OBJECTIVE LENS - An inspection system is provided that can include a reflectometer having a light source for projecting light, and a light splitter for receiving the light projected by the light source, transforming at least one aspect of the light, and projecting the light once transformed. The reflectometer further has an off-axis unobscured objective lens through which the light transformed by the light splitter passes to contact a fabricated component, and has a detector for detecting a result of the transformed light contacting the fabricated component. The inspection system can additionally, or alternatively, include an ellipsometer having a light source similar to the reflectometer, and further a polarizing element to polarize the light of the light splitter. The polarized light passes through an off-axis unobscured objective lens to contact a fabricated component, and a detector detects a result of the polarized light contacting the fabricated component. | 05-19-2016 |
20160153902 | DEVICE FOR MEASURING THE SCATTERING OF A SAMPLE | 06-02-2016 |
20160169805 | COMBINED RAMAN SPECTROSCOPY AND LASER-INDUCED BREAKDOWN SPECTROSCOPY | 06-16-2016 |
20160197453 | SYSTEM, METHOD AND FIXTURE FOR PERFORMING BOTH OPTICAL POWER AND WAVELENGTH MEASUREMENTS OF LIGHT EMITTED FROM A LASER DIODE | 07-07-2016 |
20160202186 | Gas Sensor to Enhance Implementation of a Process-Based Leakage Monitoring Method | 07-14-2016 |
20160252425 | APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS | 09-01-2016 |
20220136950 | PORTABLE ATMOSPHERIC MONITOR - In certain embodiments, a portable atmospheric monitor comprises a housing at least partially enclosing an inner chamber. The housing comprises an inlet and an aperture. The monitor also includes at least one light sensor arranged within the housing. The light sensor that senses one or more wavelengths of sunlight received via the aperture. The monitor includes at least one light-scattering sensor that senses PM received via the inlet. The monitor includes a processor arranged within the housing and coupled to the at least one light sensor and the at least one light-scattering sensor. The processor is configured to: receive a light signal from the at least one light sensor; receive a PM signal from the at least one light-scattering sensor; determine the aerosol optical depth based upon the light signal; and determine the PM concentration based upon the PM signal. | 05-05-2022 |