Class / Patent application number | Description | Number of patent applications / Date published |
356520000 | Having shearing | 11 |
20090021748 | Method and system for wavefront measurements of an optical system - A wavefront measurement system includes a source of electromagnetic radiation. An illumination system delivers the electromagnetic radiation to an object plane. A source of a diffraction pattern is in the object plane. A projection optical system projects the diffraction pattern onto an image plane, which includes a mechanism (e.g., a shearing grating) to introduce the lateral shear. A detector is located optically conjugate with the pupil of the projection optical system, and receives an instant fringe pattern, resulting from the interference between sheared wavefronts, from the image plane. The diffraction pattern is dynamically scanned across a pupil of the projection optical system, and the resulting time-integrated interferogram obtained from the detector is used to measure the wavefront aberration across the entire pupil. | 01-22-2009 |
20100002242 | INTERFEROMETRIC TRACKING DEVICE - An interferometric tracking device is disclosed. A first grating is optically coupled to a second grading such that the second grating is rotationally offset from the first grating. Imaging optics are adapted to image light passing through the first and second gratings onto a focal plane array. A plurality of wedge plates are optically disposed between the imaging optics and the second grating, such that the wedge plates generate a plurality of spots on the FPA when light from a point source is incident upon the first grating. | 01-07-2010 |
20100177323 | WAVEFRONT-ABERRATION-MEASURING DEVICE AND EXPOSURE APPARATUS - A wavefront-aberration-measuring device measures wavefront aberration of a to-be-tested optical system and includes a diffraction grating that splits light transmitted through the optical system, a detecting unit that detects interference fringes produced by beams of the split light, an arithmetic unit that calculates the wavefront aberration from the detected interference fringes, an image-side mask insertable into and retractable from an image plane of the optical system, and an illuminating unit that incoherently illuminates the image-side mask. The image-side mask has an aperture with a diameter larger than λ/2NA, where λ denotes a wavelength of the illuminating unit and NA denotes a numerical aperture of the to-be-tested optical system. The arithmetic unit calculates the wavefront aberration of the optical system from the interference fringes detected with the image-side mask being retracted from the image plane and the interference fringes detected with the image-side mask being in the image plane. | 07-15-2010 |
20110317170 | WEDGE PAIR FOR PHASE SHIFTING - The invention provides a wedge pair suitable for use in interferometers. The wedge pair produces a phase shift between beams of light propagating in the interferometer. The invention includes a wedge pair and a mechanism for translating a first wedge of the pair with respect to a second wedge of the pair, where the first wedge has the same wedge angle and material of the second wedge and where the vertex of the first wedge and the vertex of the second wedge are pointed in opposite directions. | 12-29-2011 |
20120120410 | ALL-REFLECTIVE, RADIALLY SHEARING INTERFEROMETER - A radially shearing interferometer which includes a beam splitter configured to form two optical beams from entering light, the optical beam including a magnified beam and a demagnified beam; a plurality of mirrors arranged so as to generate the magnified beam and the demagnified beams and provide a common optical path with the magnified and demagnified beams traversing the plurality of mirrors in the opposite direction back to the beam splitter, the plurality of mirrors including a pair of parabolic mirrors, the first of the pair configured to first receive one of the magnified and demagnified beams, and reflect the first received beam to a flat mirror configured to reflect the first received beam to the other pair. In some implementations, an imaging device may be positioned at a pupil plane of the magnified beam and the demagnified beam so as to record the interference of both beams. A method for recording an interferogram is also disclosed. | 05-17-2012 |
20130114088 | METHOD AND APPARATUS FOR THE REMOTE NONDESTRUCTIVE EVALUATION OF AN OBJECT - A method and apparatus for the remote nondestructive evaluation of an object such as a wind turbine blade involves applying mechanical and/or thermal stress to the object and then scanning the object using long-range thermographic and/or laser interferometric imaging. The laser interferometric imaging is preferably performed by a long range shearography camera capable of imaging deformation derivatives at long distances coupled with a blade stressing mechanism incorporating either thermal or internal blade pressurization for the purpose of detecting remotely and at high speed, changes in the structural integrity of an installed wind turbine blade. | 05-09-2013 |
20140368833 | FOCUSING DEVICE - A focusing device that includes a differential interference prism used in differential interference observation in a focusing detection optical system includes: a light source that emits light with which a measurement surface of an observation sample is irradiated; a photo detection unit that detects light from the measurement surface; a focusing detection unit that detects an error signal near a focusing point of the measurement surface on the basis of an output signal from the photo detection unit; and a condition changing unit that changes an acquisition condition of the error signal. | 12-18-2014 |
20150146213 | OPERATING METHOD OF FIRST DERIVATIVE MEASURING APPARATUS - Provided is an operating method of a measuring apparatus measuring a wavefront of a target. The operating method includes measuring a measurement wavefront on the basis of the wavefront of the target, measuring reference slope information and first to third slope information respectively corresponding to a reference direction and first to third directions on the basis of the measurement wavefront, obtaining first to third rotation angles on the basis of the measured reference slope information and first to third slope information, and outputting a wavefront of which an error is corrected, which is generated by rotation errors on the basis of the obtained first to third rotation angles, wherein the first to third rotation angles are differences in angle between the reference direction and the first to third directions. | 05-28-2015 |
20150338208 | PHASE RESOLVED SHEAROGRAPHY FOR REMOTE SENSING - A shearography system and method provide advances allowing for rapid processing to produce shearograms which provide surface motion information which may be helpful in multiple fields. For instance, amongst virtually endless possibilities, the system and method may allow for detection of underground structures or ordnance and or be used in the medical field to provide non-contact sensing of a person's internal structures or movements. | 11-26-2015 |
20160004058 | LIGHTSHEET MICROSCOPY WITH ROTATIONAL-SHEAR INTERFEROMETRY - Devices and methods for lightsheet microscopy using rotational-shear interferometry are provided. Advantages include improved lateral spatial resolution and easier alignment. | 01-07-2016 |
20170234736 | DEVICE AND METHOD FOR CHARACTERIZATION OF A LIGHT BEAM | 08-17-2017 |