Class / Patent application number | Description | Number of patent applications / Date published |
378043000 | Telescope or microscope | 9 |
20080240347 | METHOD, APPARATUS, AND SYSTEM FOR EXTENDING DEPTH OF FIELD (DOF) IN A SHORT-WAVELENGTH MICROSCOPE USING WAVEFRONT ENCODING - A lens assembly for enhancing the depth of field of a short-wavelength microscopic system is disclosed. The lens assembly includes an objective zone plate lens, an encoding lens, an imaging detector and a decoding component connected to the imaging detector. The objective zone plate lens is oriented to receive short-wavelength radiation that has passed through a sample in a microscopic system. The encoding lens is oriented to receive the short-wavelength radiation that has passed through the objective zone plate lens and encode the radiation to output an encoded short-wavelength radiation. The imaging detector is oriented to receive the encoded short-wavelength radiation and convert it to a digital signal which is subsequently decoded by the decoding component to decode the encoding applied to the short-wavelength radiation. | 10-02-2008 |
20090052619 | Fresnel zone plate and x-ray microscope using the fresnel zone plate - [Object] To provide a Fresnel zone plate having a complex irradiation function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel zone plate. | 02-26-2009 |
20120321037 | SPECIMEN SUPPORTING MEMBER FOR X-RAY MICROSCOPE IMAGE OBSERVATION, SPECIMEN CONTAINING CELL FOR X-RAY MICROSCOPE IMAGE OBSERVATION, AND X-RAY MICROSCOPE - A specimen supporting member ( | 12-20-2012 |
20140037052 | X-ray photoemission microscope for integrated devices - An apparatus is disclosed for the examination and inspection of integrated devices such as integrated circuits. X-rays are transmitted through the integrated device, and are incident on a photoemissive structure that absorbs x-rays and emits electrons. The electrons emitted by the photoemissive structure are shaped by an electron optical system to form a magnified image of the emitted electrons on a detector. This magnified image is then recorded and processed. | 02-06-2014 |
20140064445 | High speed x-ray inspection microscope - The invention discloses an x-ray system that produces highly magnified images of objects such as integrated circuits (ICs), printed circuit boards (PCBs), and other IC packaging technologies. | 03-06-2014 |
20140126691 | Fourier Ptychographic X-ray Imaging Systems, Devices, and Methods - Methods, systems, and devices of Fourier ptychographic X-ray imaging by capturing a plurality of variably-illuminated, low-resolution intensity X-ray images of a specimen and computationally reconstructing a high-resolution X-ray image of the specimen by iteratively updating overlapping regions in Fourier space with the variably-illuminated, low-resolution intensity X-ray images. | 05-08-2014 |
20140286473 | ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS - A method for inspection includes capturing an optical image of one or more features on a surface of a sample and irradiating an area of the sample containing at least one of the features with an X-ray beam. An intensity of X-ray fluorescence emitted from the sample in response to the irradiating X-ray beam is measured. The optical image is processed so as to extract geometrical parameters of the at least one of the features and to compute a correction factor responsively to the geometrical parameters. The correction factor is applied to the measured intensity in order to derive a property of the at least one of the features. | 09-25-2014 |
20180020996 | X-RAY LASER MICROSCOPY SYSTEM AND METHOD | 01-25-2018 |
20190148029 | 3-DIMENSIONAL X-RAY IMAGER | 05-16-2019 |