Entries |
Document | Title | Date |
20080205742 | Generation of randomly structured forms - A computer system and method for generating a plurality of unique, randomly structured forms, such as invoices, that may be populated with data to produce test forms for testing automatic document processing systems. The forms may have major blocks such as a header, a body and a footer, and the major blocks may have randomly selected sizes. For each block, the locations of data fields and the ordering of the data fields within the block are defined randomly, the data locations within the fields and the data formats are randomly defined, and a blank image and an XML file of the randomly structured form are produced. The forms generated may be populated with data for the testing document processing system. | 08-28-2008 |
20080219544 | FACTOR ESTIMATING SUPPORT DEVICE AND METHOD OF CONTROLLING THE SAME, AND FACTOR ESTIMATING SUPPORT PROGRAM - A factor estimating support device supports estimation of factor from a result generated in a production system. In the factor estimating support device, material/environment history data and test history data acquired from the production system, and the causality structure data indicating causality between the plurality of variables are stored in the storage unit, where when determined that the final quality characteristic is abnormal in the final quality abnormal detecting part, determination is made on whether each variable other than the final quality characteristic is abnormal in the variable abnormality detecting part, and the determination result is reflected on a visible image in which the causality structure data is visualized in the visible image creating part. | 09-11-2008 |
20080226152 | Determining Image Blur in an Imaging System - The invention relates to a method of determining a parameter relating to image blur in an imaging system (IS) comprising the step of illuminating an object having a test pattern (MTP) by means of the imaging system (IS), thereby forming an image of the test pattern. The test pattern (MTP) has a size smaller than the resolution of the imaging system (IS), which makes the image of the test pattern independent of illuminator aberrations. The test pattern (MTP) is an isolated pattern, which causes the image to be free of optical proximity effects. The image is blurred due to stochastic fluctuations in the imaging system and/or in the detector detecting the blurred image. The parameter relating to the image blur is determined from a parameter relating to the shape of the blurred image. According to the invention, resist diffusion and/or focus noise may be characterized. In the method of designing a mask, the parameter relating to the image blur due to diffusion in the resist is taken into account. The computer program according to the invention is able to execute the step of determining the parameter relating to the image blur from a parameter relating to a shape of the blurred image. | 09-18-2008 |
20080226153 | ANALYZING APPARATUS, PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT REVIEW APPARATUS, ANALYSIS SYSTEM, AND ANALYSIS METHOD - In order to allow to easily specify inspection recipe with which defects desired to be detected can be detected efficiently, a defect inspection apparatus performs defect inspection of a substrate in accordance with a plurality of inspection recipes and produces defect information associated with position of defect in the substrate and attribute data of the defect for each of the inspection recipes and a defect review apparatus produces review result information specifying a kind of defect selected from defects contained in the defect information. An analyzing apparatus obtains defect information and review result information and totalizes the number of defects having attribute data similar to attribute data possessed in defects corresponding to kind of defects to be analyzed for each inspection recipe. | 09-18-2008 |
20080226154 | SYSTEMS AND METHODS FOR PRODUCING CARBONACEOUS PASTES USED IN THE PRODUCTION OF CARBON ELECTRODES - Systems and methods for producing a carbonaceous paste are provided. The systems and methods may include a paste control system that obtains an image of the carbonaceous paste and determines whether operational parameters associated with paste production require adjustment. One or more operational variables may be adjusted based on the obtained images to facilitate production of the carbonaceous paste. | 09-18-2008 |
20080226155 | SHEET METAL PROCESSING EXAMINATION - For examining a metal sheet processing operation, a method includes scanning a detection beam along a processed metal sheet by causing a relative movement between the detection beam and the processed metal sheet, during the scanning, determining a position of an edge of the metal sheet hole by monitoring the detection beam, determining, from the determined hole edge position, a geometric configuration of the metal sheet hole, performing a comparison of the determined geometric configuration of the metal sheet hole with a corresponding desired hole configuration; and then sending a signal indicating information about the metal sheet processing operation, based upon the comparison. | 09-18-2008 |
20080226156 | Defect detection apparatus and defect detection method - A primary defect detecting section performs a primary defect detection process for detecting a severe defect of more than a predetermined size on an inspection object. A secondary defect detecting section performs a secondary defect detection process for detecting a defect on the inspection object using image data of the inspection object. A process controller omits the secondary defect detection process upon detection of the severe defect in the primary defect detection process before starting the secondary defect detection process, or stops the secondary defect detection process upon detection of the severe defect in the primary defect detection process after starting the secondary defect detection process. | 09-18-2008 |
20080232670 | METHOD FOR CALCULATING A BAD-LOT CONTINUITY AND A METHOD FOR FINDING A DEFECTIVE MACHINE USING THE SAME - A method for finding a defective machine comprises the steps of selecting a searching period in which a plurality of wafer lots including good wafer lots and bad wafer lots passes through machines, acquiring a lot-passing information related to the passing sequence of the wafer lots through the machines, calculating a bad-lot continuity by taking the lot-passing information into account, and determining a defective machine by taking the bad-lot continuity into account. The bad-lot continuity is calculated by the steps of determining an impact period based on the aggregation degree of the bad wafer lots, calculating a bad-lot distribution probability in the impact period, and calculating the bad-lot continuity by taking the bad-lot distribution probability into account. | 09-25-2008 |
20080240540 | APPEARANCE MANIFOLDS FOR MODELING TIME-VARIANT APPEARANCE OF MATERIALS - A method for modeling a time-variant appearance of a material is described. A sample analysis of a material sample is performed, wherein the sample analysis orders surface points of the material sample with respect to weathering from data captured at a single instant in time. An appearance synthesis using the sample analysis is performed, wherein the appearance synthesis generates a time-variant sequence of frames for weathering an object. | 10-02-2008 |
20080240541 | Automatic optical inspection system and method - An automatic optical inspection system includes a rotary device for driving an object to rotate. At least one line-scan camera is implemented for generating two-dimensional planar images of cylindrical surfaces of the object. A device for detecting defects is operable to generate the two-dimensional planar images of the cylindrical surfaces of the object according to a normalized grayscale absolute difference inspection method. | 10-02-2008 |
20080240542 | DROPLET DETECTION SYSTEM - A system for a droplet detection device to monitor the dispensing operation in an ultra high throughput (uHTS) system. The system includes a microtitre plate with a defined number of wells and well walls, a dispenser for dispensing fluids into the wells, an illuminating sensor to extract image features from the wells and well walls, and a controller for analyzing the extracted image features to determine the presence or absence of the dispensing fluid on the wells and well walls. | 10-02-2008 |
20080240543 | Calibration and normalization method for biosensors - Calibration and normalization methods for a grating-based sensor design are disclosed. The sensor may be constructed in a manner optimized for both label-free and luminescence, e.g. fluorescence, amplification detection in a single device. Such a sensor, based on grating or another periodical structure with appropriate coating, dramatically increases the diversity of applications and allows realizing novel concepts that provide qualitative and quantitative information/data for each location or capture element in the sensor surface. The invention takes advantage of these different modes to carry out a quality control (QC) step and a calibration of each individual location of the sensor. Thus, the assay data can be flagged according to their quality and local density variations, batch variations and variations in the printed deposition of probes or the materials to the surface can be compensated. | 10-02-2008 |
20080247630 | Defect inspecting apparatus and defect-inspecting method - An image pickup section | 10-09-2008 |
20080247631 | Painting process color compensator - A method and implementing computer system are provided for enabling a user to paint a surface a desired final color while using a paint, the color of which appears in raw form different from the desired final color for the painted surface. In an exemplary embodiment, a tile painting application is illustrated and includes a camera arranged to take an image of a bisque tile. When a user applies a glaze to the tile, the camera-computer system analyzes the glaze color among other factors affecting the painting process and an image showing a final color of the tile after firing is presented on the display of the computer system such that by looking at the computer screen, the user is able to see the actual final color of the tile after firing while applying the initial glaze to the bisque tile before firing. | 10-09-2008 |
20080267487 | Process and System for Analysing Deformations in Motor Vehicles - Process for identifying, analysing and estimating deformations particularly in motor vehicles and wherein the following steps are provided in the so called manual selection mode: providing a database of sample vehicle images, that is not damaged vehicles calling up a sample vehicle image corresponding to the damaged vehicle in a vehicle image memory from a database of sample vehicle images displaying said image on a monitor selecting regions corresponding to damaged or deformed regions of the damaged vehicle, on the displayed vehicle image by inputting graphic and/or alphanumeric commands by means of graphic and/or alphanumeric command input means. by inputting graphic and/or alphanumeric commands by means of graphic and/or alphanumeric command input means entering in the work program alternatively or in combination a quality and/or quantitative estimation degree of the deformation depth proportional to the deformation gravity. computing perimeter. area and/or volume and/or identifying the locution in space of the damage on vehicle by means of algorithms implemented by the work program. | 10-30-2008 |
20080273790 | MEASUREMENT DEVICE FOR MEASURING THE PARAMETERS OF A BLADE ROTOR AND MEASUREMENT PROCESS FOR MEASURING WITH SAID DEVICE - The invention relates to a measurement device for measuring the parameters of a blade rotor and a measurement process for measuring with said device, consisting of an element ( | 11-06-2008 |
20080285840 | Defect inspection apparatus performing defect inspection by image analysis - A defect inspection apparatus obtains a color image signal of an inspection target. Based on a plurality of signal components forming this color image signal, a plurality of analysis images are obtained. Defect detection of an inspection target is implemented for each of the a plurality of analysis images. A differential is detected for a defect nomination detected for each of the analysis images, and thereby whether a plurality of defects exist or not in successive defect positions of the inspection target is determined. | 11-20-2008 |
20080304734 | Alignment correction prio to image sampling in inspection systems - A method and apparatus, and variations of each, for inspecting a wafer defining at least one die thereon is disclosed. The present invention first obtains the electronic image equivalent of two die, and then determines the x and y offset between those electronic images. Prior to inspection for defects, those two electronic images are aligned by adjusting the x and y positions of one electronic image of one die with respect to the electronic image of the other die. Once that is accomplished, the those electronic images are compared to detect any defects that may exist on one of the die. | 12-11-2008 |
20080310700 | Article Visual Inspection Apparatus - An article visual inspection apparatus capable of detecting that the surface conditions of an article are so inferior as to render the article unusable as a product and rejecting the same as a defective article by inspecting the article for external defects, occurring on the surface of the article, such as streaks, dice marks and rough surfaces of an aluminum extruded shape. The visual inspection apparatus comprises an imaging device ( | 12-18-2008 |
20080310701 | Method and Apparatus for Visually Inspecting an Object - A method comprises projecting a light and shade pattern defined by preset optic parameters through a body, detecting an image of the light and shade pattern through the body to obtain a detected image, processing the detected image to highlight any irregularities of the light and shade pattern in the detected image; an apparatus comprises a light-source for projecting a light and shade pattern defined by preset optic parameters through a body, an image-detecting device for detecting an image of the light and shade pattern through the body to obtain a detected image and a processing device for processing the detected image in such a way as to highlight any irregularities of the light and shade pattern in the detected image. | 12-18-2008 |
20080310702 | Defect inspection device and defect inspection method - In an apparatus for photographing an image of a product to judge whether or not a defect is present, a manufacturing desirable image is formed from data acquired when the product was designed, which could be obtained if no defect was present when the product was photographed, an inspection portion where a defect may occur is selected from the formed manufacturing desirable image, a defect pattern is superimposed on the selected inspection portion so as to form a template equipped with the defect pattern. The image of the product is photographed, a template matching operation is carried out as a template having the defect pattern, and judgement is made whether or not a defect is present based upon a matched evaluation value. As a result, the judgement for judging whether or not the defect is present can be directly carried out based upon the evaluation value. | 12-18-2008 |
20090003682 | Pattern inspection method and its apparatus - In a pattern inspection apparatus for comparing images of corresponding areas of two patterns, which are formed so as to be identical, so as to judge that a non-coincident part of the images is a defect, the influence of unevenness in brightness of patterns caused by a difference of thickness or the like is reduced, whereby highly sensitive pattern inspection is realized. In addition, high-speed pattern inspection can be carried out without changing the image comparison algorithm. For this purpose, the pattern inspection apparatus operates to perform comparison processing of images in parallel in plural areas. Further, the pattern inspection apparatus operates to convert gradation of an image signal among compared images using different plural processing units such that, even in the case in which a difference of brightness occurs in an identical pattern among images, a defect can be detected correctly. | 01-01-2009 |
20090010521 | SYSTEM AND METHOD FOR DETERMINING WHETHER THERE IS AN ANOMALY IN DATA - A system and method for identifying objects of interest in image data is provided. The present invention utilizes principles of Iterative Transformational Divergence in which objects in images, when subjected to special transformations, will exhibit radically different responses based on the physical, chemical, or numerical properties of the object or its representation (such as images), combined with machine learning capabilities. Using the system and methods of the present invention, certain objects that appear indistinguishable from other objects to the eye or computer recognition systems, or are otherwise almost identical, generate radically different and statistically significant differences in the image describers (metrics) that can be easily measured. | 01-08-2009 |
20090010522 | Optically Measuring Interior Cavities - A method of measuring the three-dimensional volume or perimeter shape of an interior cavity includes the steps of collecting a first optical slice of data that represents a partial volume or perimeter shape of the interior cavity, collecting additional optical slices of data that represents a partial volume or perimeter shape of the interior cavity, and combining the first optical slice of data and the additional optical slices of data to calculate of the three-dimensional volume or perimeter shape of the interior cavity. | 01-08-2009 |
20090010523 | METHOD OF INSPECTING OUTER WALL OF HONEYCOMB STRUCTURE BODY - There is disclosed a method of inspecting the outer wall of a honeycomb structure body which can be performed without relying on human sensory functions and in which a defect detection level and an inspection time per honeycomb structure body are constant, so that stable inspection can be performed. In a method of inspecting the outer wall of a honeycomb structure body | 01-08-2009 |
20090010524 | METHODS AND APPARATUS FOR DETECTION OF FLUORESCENTLY LABELED MATERIALS - Fluorescently marked targets bind to a substrate | 01-08-2009 |
20090022391 | Method and Product for Detecting Abnormalities - A new method for processing image data in order to detect abnormalities in a web is provided. The web is monitored by at least one camera, whereby an image comprising of plurality of pixels is generated. The data of the image is stored in a memory. Image data is filtered by a processor by creating a filtered image data by weighting the image data and at least one of earlier image data and earlier filtered image data; and combining the weighted image data and at least one of the weighted earlier image data and the weighted earlier filtered image data; and controlling filtering by at least one nonlinear algorithm; and thresholding the created filtered image data. | 01-22-2009 |
20090022392 | Method and Apparatus for Utilizing Representational Images in Commercial and Other Activities - In a method and apparatus for an object using a representational image, positioning the object at a predetermined position relative to the representational image, illuminating the representational image, presenting information from the representational image to an operator, at least one of controlling the illuminating of the representational image and presenting of information from the representational image to an operator, using a processing arrangement, and processing the object using the information obtained from the representational image. | 01-22-2009 |
20090028416 | MULTI-UNIT PROCESS SPATIAL SYNCHRONIZATION - A conversion control system is described for spatially synchronizing data gathered from a plurality of operations performed on a web. The conversion control system applies a set of fiducial marks to a web, performs a plurality of operations on the web, generates a first and a second set of digital information for first and second operations, respectively, in accordance with respective first and second coordinate systems using the set of fiducial marks such that the each of the sets of digital information includes position data for respective first and second sets of regions on the web. The conversion control system may then register the position data of the first set of regions and the position data for the second set of regions to produce aggregate data and outputting a conversion control plan. | 01-29-2009 |
20090028417 | FIDUCIAL MARKING FOR MULTI-UNIT PROCESS SPATIAL SYNCHRONIZATION - A device for applying fiducial marks to a web for spatially synchronizing data from a plurality of processes is described. The device includes a fiducial mark reader to read fiducial marks of at least two formats on a web of material, a fiducial mark writer to write fiducial marks of at least two formats on the web, and an encoder to measure distance along the web. The device may provide several advantages. For example, the device may apply fiducial marks to a web that indicate the process line that applied the fiducial mark to the web or the date on which the fiducial mark was applied. | 01-29-2009 |
20090028418 | SYSTEM AND METHOD FOR INSPECTING ELECTRONIC DEVICE - The invention discloses a method for inspecting an electronic device to reduce the consumption of testers' labor and time and testers' erroneous or careless judgment, and increase the test efficiency and reliability. Furthermore, the method of the invention can help to maintain or modify the test standard immediately and feedback the condition of the electronic device to the production line. The method of the invention includes the steps of: (A) storing a plurality of standard parameters related to the electronic device; (B) measuring a plurality of inspecting parameters, wherein each inspecting parameter corresponds to one of the standard parameters; (C) comparing each of the inspecting parameters with the corresponded standard parameter and setting a processing status of the electronic device according to a first criterion; and (D) receiving the comparison results of step (C) and generating an adjusting information according to the comparison results. | 01-29-2009 |
20090028419 | METHOD FOR MANUFACTURING PLASMA DISPLAY PANEL, INSPECTION METHOD FOR INSPECTING PHOSPOR LAYER AND INSPECTION APPARATUS FOR INSPECTING PHOSPHOR LAYER - A phosphor paste is applied to inner surfaces of a cell. Then, a conveyer moves a substrate relative to a CCD camera at a constant speed. Simultaneously, two LEDs radiate visible light onto a portion, to be inspected, of the substrate. The visible light is light configured to have a wavelength so as to be able to prevent the phosphor of the phosphor paste from being excited and emitting light and reflected by a liquid surface of the phosphor paste to produce reflected light. Thereafter, the CCD camera captures an image of the phosphor paste and a data processor processes the received image data, and determines whether a phosphor layer formed by drying the phosphor paste will normally be formed, prior to formation of phosphor layer. | 01-29-2009 |
20090034827 | Inspection device, inspection method, method of manufacturing color filter, and computer-readable storage medium containing inspection device control program - An inspection device of the present invention includes: a linear irregularity detecting section for detecting linear irregularities individually in an image L of dots on a substrate being inspected by projecting light from a first direction and in an image R of the dots by projecting light from a second direction, which differs from the first direction; a specific-cycle irregularity extracting section for extracting linear irregularities detected at predetermined intervals T in the individual mages L and R, the intervals being taken vertical to the linear irregularities on the substrate; and a detection-target-irregularity extracting section for extracting a linear irregularity detected in both the images L and R as a detection-target linear irregularity. The device therefore is capable of detecting only linear irregularities of a specific cycle which are caused by the presence of dots having irregular thickness when compared to a dot with normal thickness. | 02-05-2009 |
20090052764 | System and Method for Detecting Foreign Objects in a Product - The present invention relates to a system for detecting a change in material composition in a product. The system comprises a microwave transmitter emitting a microwave signal at a predetermined microwave frequency composition, and an ultrasonic transmitter emitting an ultrasound signal at a predetermined ultrasound frequency composition into at least a part of said product to create a density displacement within the product. The system further comprises means to receive a microwave signal and/or an ultrasonic signal having passed through at least a part of said product, means to measure the attenuation and/or runtime between each emitted signal and each received signal, respectively, under the influence of the created density displacement, and means to compare the measured attenuation and/or runtime with a previously determined attenuation and/or runtime to determine a change in material composition. The invention further relates to a method for detecting a possible change in material composition in a product. | 02-26-2009 |
20090060315 | METHOD AND APPARATUS FOR INSPECTING OBJECTS USING MULTIPLE IMAGES HAVING VARYING OPTICAL PROPERTIES - An automated object inspection system is presented. The inspection system includes an imaging system to produce at least two images of said object having different optical properties and an analyzer coupled to the imaging system to receive the images and to perform a variety of inspection operations on said images. The imaging system may produce images of the object under inspection in the visible range having varying exposure values. A vision engine included in the analyzer may combine said images through an algorithmic process into one image having high light dynamic range. Alternatively, the imaging system may produce images of the object in the visible or non-visible electromagnetic range. The analyzer may perform inspection routines on said images. An imaging system capable of producing digital video is presented, wherein each frame of video produced by said camera is composed of multiple images having different optical properties. | 03-05-2009 |
20090060316 | Method for Monitoring a Rapidly-Moving Paper Web and Corresponding System - The invention relates to a method for monitoring a rapidly-moving paper web. In the method, images of the rapidly-moving web are taken with cameras at several consecutive positions, of the same cross-direction point of the web. The images are analysed in real time in order to detect deviations, and the position data of the deviations are determined. Each deviation found in the analysis is connected to an event chain in real time using a selected criterion on the basis of the position data of each deviation. Images containing a deviation are shown to the operator immediately as event chains. | 03-05-2009 |
20090067701 | SYSTEM AND METHOD FOR DETECTING BLEMISHES ON SURFACE OF OBJECT - A system for detecting blemishes on a surface of an object includes at least an image capturing apparatus, at least a light source assembly, and a data processing device. The image capturing apparatus is configured for an image of a surface of an object and acquiring a brightness value of each of pixels of the image. The light source assembly is configured for light the surface. The data processing device is electrically connected to the image capturing apparatus and configured for calculating sum of all of the brightness value to obtain a mean value of the brightness values, comparing the brightness value of each pixel with the mean value and marking the pixels as a blemish whose brightness value is greater than the mean value. The system and method avoid errors that may otherwise occur due to the interference of noise, and avoid the subjective factors of viewers. | 03-12-2009 |
20090074285 | Surface inspection device - A surface inspection device, including an illumination light source that irradiates a surface of a wafer with an inspection illumination light; a camera that receives a scattered light from the wafer irradiate with the inspection illumination light, and captures an image of the surface; a display device that displays the image of the wafer surface captured by an image sensing element of the camera; and an image expansion processing device that expands a portion having a high luminance in the image of the surface of the wafer captured by the image sensing element and causes the display device to display the expanded image. | 03-19-2009 |
20090080759 | SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FOR USING PERSISTENT DATA FOR INSPECTION-RELATED FUNCTIONS - Various systems and methods for creating persistent data for a wafer and using persistent data for inspection-related functions are provided. One system includes a set of processor nodes coupled to a detector of an inspection system. Each of the processor nodes is configured to receive a portion of image data generated by the detector during scanning of a wafer. The system also includes an array of storage media separately coupled to each of the processor nodes. The processor nodes are configured to send all of the image data or a selected portion of the image data received by the processor nodes to the arrays of storage media such that all of the image data or the selected portion of the image data generated by the detector during the scanning of the wafer is stored in the arrays of the storage media. | 03-26-2009 |
20090080760 | ANTI-COUNTERFEITING MARK AND METHODS - An anti-counterfeiting mark is formed on a surface of an object, preferably by engraving with a laser at the point of manufacture. The mark includes a padlock symbol visible to a person without magnification for informing the person that anti-counterfeiting techniques are in use. The mark also includes a microscopic pattern. Preferably, the microscopic pattern is varied from object to object for uniqueness. The microscopic pattern must be magnified to properly discern its intricacies. The mark further includes a bar code containing data relating to the microscopic pattern. The microscopic pattern may be compared against the data stored by the bar code to verify authenticity. | 03-26-2009 |
20090087078 | DISPLAY TESTING APPARATUS AND METHOD - A display testing method applied on an apparatus is provided, the apparatus being connected with an image capturing device. The method includes: controlling the image capturing device to capture and store images of displays to be tested; determining a first vertex of a test area on the captured image, determining a test area according to the determined first vertex; and testing parameters of the display according to the test area. | 04-02-2009 |
20090087079 | DEFECT DETECTING APPARATUS AND METHOD - A front side surface of a cover glass of a solid state imaging device is focused, and a front side image is captured. Next, a rear side surface of the cover glass is focused, and a rear side image is captured. The front side image and the rear side image are combined with each other to create a composite image. A first threshold value is set for each pixel in the composite image by dynamic thresholding. An image composed of pixels whose gray values exceed the first threshold value is identified as a defect candidate image. The maximum gray value of the defect candidate image is multiplied by a constant rate to set a second threshold value. An image composed of pixels whose gray value is less than the second threshold value is eliminated as a blurred image from the defect candidate image. Thereby, only a spot defect image, an allowable defect image, and a stain defect image remain in the composite image. | 04-02-2009 |
20090087080 | VISION INSPECTION SYSTEM AND METHOD FOR INSPECTING WORKPIECE USING THE SAME - A vision inspection system and a workpiece inspection method are used in inspecting a workpiece. The vision inspection system includes a level block having an upper surface whose opposite end regions are defined as a first position and a second position. A first transfer device has a table for supporting the workpiece. The first transfer device is installed on the upper surface of the level block for rectilinearly moving the table between the first position and the second position. A camera is arranged above the level block for taking an image of the workpiece to output image data. A second transfer device is installed on the upper surface of the level block for rectilinearly moving the camera between the first position and the second position. A computer is connected to the first transfer means, the camera and the second transfer means to control them in a specified manner. | 04-02-2009 |
20090092310 | SYSTEM AND METHOD FOR PRECISION FIT ARTIFICIAL FINGERNAILS - A system and method for creating precision fit artificial fingernails is disclosed. Specifically, a system is disclosed that utilizes a scanned and digitized nail surface to form a precision fit three dimensional digitized artificial nail object that can be used to direct a machining device that either creates an artificial fingernail from blank stock, or to machine a custom mold that can be used to make multiple artificial fingernails having the same shape. | 04-09-2009 |
20090097735 | SAMPLE INSPECTION, MEASURING METHOD AND CHARGED PARTICLE BEAM APPARATUS - An image for measuring a pattern or an image for making positioning for measurement is formed by scanning a sample with a focused electron beam and an estimation value of the image is compared with an image estimation value of a previously gotten reference image, so that focusing of the electron beam is performed again when it is judged that the formed image does not satisfy a predetermined condition by the comparison with the reference image. | 04-16-2009 |
20090097736 | Method and Apparatus for Approving Color Samples - A color approval system that facilitates the use of electronic color submissions. The electronic color submissions contain reflectance values for a physical color sample to be submitted for approval. The system includes a data storage area accessible by a submitter of the electronic color sample and a reviewer of the color sample. The submitter upload the submission to the data storage area, from which the reviewer retrieves the submission and replies with an acceptance or rejection, typically via email. The system provides tools for the analysis of the electronic color sample and automatic formation of acceptances and rejections. | 04-16-2009 |
20090123056 | METHOD OF INSPECTING GRANULAR MATERIAL AND INSPECTION DEVICE FOR CONDUCTING THAT METHOD - A method of inspecting granular material and an inspection device for conducting that method, wherein agents ( | 05-14-2009 |
20090129662 | SHAPE INSPECTION APPARATUS, SHAPE INSPECTION METHOD AND COMPUTER READABLE MEDIUM - A shape inspection apparatus includes a shape display unit that displays a three-dimensional shape specified by three dimensional shape data on a screen; a direction designating unit that specifies a drawing direction in molding the three-dimensional shape on the screen; a face designating unit that specifies one face of a protruding or recessed shape portion of the three-dimensional shape on the screen; a dimension calculating unit that calculates a shape dimensional value of the shape portion based on the specified drawing direction and the specified one face; and a determination unit that determines whether or not the shape portion having the shape dimensional value satisfies a shape condition by comparing the calculated shape dimensional value with a standard value. | 05-21-2009 |
20090136114 | MULTI-MODALITY INSPECTION METHOD WITH DATA VALIDATION AND DATA FUSION - An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component. | 05-28-2009 |
20090136115 | DEVICE AND METHOD FOR INSPECTING RECHARGEABLE BATTERY CONNECTION STRUCTURE - An inspection apparatus for inspecting a rechargeable battery electrode plate-connected structure to check whether electrode plates are properly connected to a current collector plate by filters. The apparatus includes an imaging device arranged on one side of the rechargeable battery electrode plate-connected structure, a first lighting device which illuminates the rechargeable battery electrode plate-connected structure at the same side of the rechargeable battery electrode plate-connected structure as the first lighting device, a second lighting device which illuminates the rechargeable battery electrode plate-connected structure from the opposite side of the rechargeable battery electrode plate-connected structure, and an inspection circuit connected to the imaging device which inspects the connection state of the fillets by analyzing a front lighting image captured by the imaging device when only the first lighting device emits light and a back lighting image captured when only the second lighting device emits light. | 05-28-2009 |
20090141963 | METHOD AND APPARATUS FOR MEASURING DEPOSITION OF PARTICULATE CONTAMINANTS IN PULP AND PAPER SLURRIES - A method and an apparatus for measuring the depositability of particulate contaminants present in a pulp or paper mill fluid stream and evaluating interactions of such particulate contaminants with other contaminants collects the particulate contaminants on a suitable substrate, such as a plastic film coated with an adhesive or coated with organic contaminate, placed in contact with the pulp or paper mill fluid stream for at least five minutes up to several hours. The amount of contaminants collected on the substrate is quantified and evaluated by taking one or more scanned images of the substrate with a resolution of at least 2,000 dots per inch (DPI) and analyzing the scanned images with image analysis technique. | 06-04-2009 |
20090141964 | APPEARANCE INSPECTION APPARATUS, APPEARANCE INSPECTION SYSTEM, AND APPEARANCE INSPECTION APPEARANCE - An appearance inspection apparatus, wherein an image inspection result based on a result of image-taking and image-analyzing a product to be inspected can be displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected is provided. An appearance inspection method includes: performing image inspection of a product to be inspected by image-taking the product to be inspected and image-analyzing the product to be inspected in an image-treating section. An inspector is capable of inspecting the product to be inspected with an eye in the state that a result of the image inspection is displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected. | 06-04-2009 |
20090148030 | METHOD AND SYSTEM FOR DETERMINING CUMULATIVE FOREIGN OBJECT CHARACTERISTICS OF A COMPOSITE STRUCTURE - Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure. Images of sequential segments of a composite structure may be recorded during placement of the composite structure. The recorded images may be analyzed for detecting foreign objects on the composite structure. Cumulative foreign object characteristics of the foreign objects detected on the composite structure may be determined, and the cumulative foreign object characteristics may be provided to a user. | 06-11-2009 |
20090148031 | SURFACE INSPECTION APPARATUS - A surface inspection apparatus, which includes a detecting device of scanning a surface of an inspection object with an inspection light and outputting a signal corresponding to a light amount of refection light from the surface, generates a two-dimensional image of the surface of the inspection object on the basis of the output signal of the detecting device (S | 06-11-2009 |
20090148032 | Alignment Using Moire Patterns - Methods of determining relative spatial parameters between two substrates in a process of alignment are described. Generally, multiple alignment data may be collected from phase information using a pair of alignment marks. | 06-11-2009 |
20090154789 | SYSTEM AND METHOD FOR DETECTING OPTICAL DEFECTS - A system and method for detecting optical defects on a surface of a transparent or semi-transparent structure, tube or article is provided. Defects are identified and analyzed by using a digital camera to capture an image of a target having a pattern of light and dark areas through a portion of the article. The images are processed to enhance the visibility of the defects, and the distribution of the defects as function of their location on the surface of the article is determined. This determination is used as part of a statistical process control method for controlling the level of defects present on the surface of the article. | 06-18-2009 |
20090161940 | SYSTEM AND METHOD FOR ANALYZING IMPURITIES OF AN OBJECT - A computer-implemented method for analyzing impurities of an object is provided. The method includes selecting a region from an image of the object, pre-treating the region to calculate a threshold, processing the region and deleting the points from an outer layer of the region. The method further includes setting a starting point and search directions, determining a point before a first boundary point as an origin of the region and searching the next boundary points if the first boundary point has been searched. The method also includes searching all the boundary points in the region, forming an impurity if the last boundary point coincides with the first boundary point, seed filling the impurity and calculating an area value, and comparing the area value with an allowable area value to determine whether the impurity satisfies impurity specifications. | 06-25-2009 |
20090161941 | Mixed Injection Inspection System - Provided is a system for reducing burden on an inspector by making it possible to evaluate the operation of a mixed injection worker which is difficult to evaluate numerically at a place remote from the mixed injection work place. Provided is a mixed injection inspection system for inspecting a mixed injection work for mixing an injection drug by an inspector different from a mixed injection worker, the mixed injection inspection system including: a mixed injection work photographing device provided in a mixed injection work place and used to photograph the mixed injection work; an inspector side mixed injection work monitor provided in a place remote from the mixed injection work place and used to display the mixed injection work photographed by the mixed injection work photographing device; an inspector side input device provided in a place remote from the mixed injection work place and used to input instructions for the worker working at the mixed injection work place; and a mixed injection worker side display means for displaying to the mixed injection worker what has been input by the inspector side input device. | 06-25-2009 |
20090169091 | Method for performing a quality control on the processing of products and device applied thereby - Method for performing a quality control of a processed product, characterised in that it mainly consists in first storing images of a product ( | 07-02-2009 |
20090169092 | Quality Validation Method - A quality validation method to improve inspection and validation processes by increasing their quality, efficiency, and positive impact. This method automatically prompts operators at one or more validation stations to follow a validation path comprising one or more validation items configurable by part number. It allows for automatic or manual feedback on the result of each item checked, the ability to enforce a particular pack-out consist based upon user provided specifications, and the ability of historically storing inspection results comprising container, part and inspection item information and results. It additionally provides an easily accessible interface to configure validation items and areas by part number, configure validation paths comprising of a variable quantity and order of validation items, and obtain information in a variety of useful formats. | 07-02-2009 |
20090169093 | PATTERN INSPECTION METHOD AND ITS APPARATUS - In a pattern inspection apparatus for comparing images of corresponding areas of two patterns, which are formed so as to be identical, so as to judge that a non-coincident part of the images is a defect, the influence of unevenness in brightness of patterns caused by a difference of thickness or the like is reduced, whereby highly sensitive pattern inspection is realized. In addition, high-speed pattern inspection can be carried out without changing the image comparison algorithm. For this purpose, the pattern inspection apparatus operates to perform comparison processing of images in parallel in plural areas. Further, the pattern inspection apparatus operates to convert gradation of an image signal among compared images using different plural processing units such that, even in the case in which a difference of brightness occurs in an identical pattern among images, a defect can be detected correctly. | 07-02-2009 |
20090180679 | METHOD AND APPARATUS FOR PARTS MANIPULATION, INSPECTION, AND REPLACEMENT - Improved method and apparatus for machine vision. One embodiment provides automated imaging and analysis, optionally including Scheimpflug's condition on the pattern projector, telecentric imaging and projecting, an IR filter, a mask to constrain observed illumination, and/or a sine-wave projection pattern for more accurate results. Another embodiment provides circuitry for a machine-vision system. Another embodiment provides a machine-vision system, optionally including accommodation of random orientation of parts in trays, irregular location of features being inspected, crossed pattern projectors and detectors for shadow reduction, detection of substrate warpage as well as ball-top coplanarity, two discrete shutters (or flash brightnesses) interleaved (long shutter for dark features, short shutter for bright features). Another embodiment provides parts inspection, optionally including a tray elevator that lifts trays to an inspection surface, moves trays in short tray dimension, provides first tray inspection at a major surface of the elevator, and/or provides a tray flipper. | 07-16-2009 |
20090190824 | Inspection apparatus and inspection method - An inspection apparatus according to the present invention comprises: a one-dimensional imaging unit for imaging a workpiece which is a three-dimensionally shaped test object; a first lens for causing light incident thereon from the test object to emerge as converging light; and a second lens, disposed between the first lens and the one-dimensional imaging unit, for focusing the light emerging from the first lens, wherein a chief ray of a bundle of rays incident on the first lens from the test object is parallel to the optical axis of the first lens, and the light containing the chief ray, incident from the test object, is focused through the first lens and the second lens onto the one-dimensional imaging unit for imaging. | 07-30-2009 |
20090190825 | Performance Analyses of Micromirror Devices - The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields. | 07-30-2009 |
20090196486 | Automatic Method and System for Visual Inspection of Railway Infrastructure - The present invention relates to a visual inspection system and method for the maintenance of infrastructures, in particular railway infrastructures. It is a system able to operate in real time, wholly automatically, for the automatic detection of the presence/absence of characterizing members of the infrastructure itself, for example the coupling locks fastening the rails to the sleepers. | 08-06-2009 |
20090202132 | CABINET DOOR FINISH REPLICATION SYSTEM - Cabinet doors are compared to color samples as a quality control check on the colors of the manufacture doors. The color samples are obtained by selecting doors which have acceptable color, and capturing those images into a computer readable format. These captured images may then be printed, stored, transmitted, etc. | 08-13-2009 |
20090202133 | APPARATUS AND METHOD FOR GENERATING A TWO-DIMENSIONAL REPRESENTATION OF AN OBJECT PORTION ARBITRARILY ARRANGED WITHIN AN OBJECT - For generating a two-dimensional representation of an object portion arbitrarily arranged within an object, a first image comprising the object, and subsequently a second image comprising the object are generated by means of an imaging device while the object and the imaging device are moving relative to each other. By means of a signal processor, information about a position and a shape of the object portion of interest within the object and its relative motion is received so as to combine, on the basis of the information received, image portions, within the first and second images, which are associated with the object portion of interest. | 08-13-2009 |
20090202134 | PRINT INSPECTING APPARATUS - A print inspecting apparatus capable of identifying a page of a form corresponding to a clipped image without requiring a special barcode or printing, is provided. A print inspecting apparatus | 08-13-2009 |
20090202135 | Defect Detection Apparatus, Defect Detection Method and Computer Program - There are provided a defect detection apparatus, a defect detection method, and a computer program, which are capable of setting an appropriate reference line with respect to a plurality of edge points, to accurately detect a defect based upon a difference of each edge point, and in which a plurality of edge points are detected from an image including an edge of the object, a representative edge point representing the edge points present within a reference range having a prescribed width is calculated in each shifted position of the reference range while the reference range is sequentially shifted, residuals between a plurality of calculated representative edge points and corresponding edge points are calculated, a position and a size of the defect are specified based upon the calculated residuals, and the residuals are weighted and a representative edge point is repeatedly calculated, to obtain an apparent approximate curve (representative-edge-point sequence). | 08-13-2009 |
20090232383 | Method and Device for Inspecting a Traveling Wire Cable - In a first embodiment, a picture is taken of the traveling wire cable in a stationary position at intervals that are equal to the ratio produced from the lay length or a multiple of the lay length and the travel speed of the wire cable, at least op one lay length or the above-mentioned multiple of the lay length, and the successive images are compared on at least one lay length or the above-mentioned multiple of the lay length and are monitored for changes in the image which are indicative of damages. In a second embodiment, the wire cable is instead of taking pictures exposed to flashes and the exposed image is detected on at least one lay length or the above-mentioned multiple of the lay length and monitored for changes in the image. Preferably, the respective repetition of the same outer stranded wire of the traveling wire cable is detected in the same location and every repetition or every other repetition or every third repetition is used for triggering the taking of a picture or for triggering the flash. In a third embodiment, a picture is taken of a large portion of the wire cable using a specialized camera and the image is split up into recurring units of length that correspond to the size of a lay length or a multiple of the lay length and the successive units of length are compared and inspected for changes in the image. | 09-17-2009 |
20090245614 | METHOD AND APPARATUS FOR DETECTING DEFECTS USING STRUCTURED LIGHT - An improved method and apparatus for detecting problems with fit and finish of manufactured articles is presented which uses structured light. Two or more structured light images acquired from opposing directions is used to measure the fit of mating surfaces while avoiding false positives caused by small defects near the seam. | 10-01-2009 |
20090245615 | VISUAL INSPECTION SYSTEM - This solution relates to machine vision computing environments, and more specifically relates to a system and method for selectively accelerating the execution of image processing applications using a cell computing system. The invention provides a high performance machine vision system over the prior art and provides a method for executing image processing applications on a Cell and BPE3 image processing system. Moreover, implementations of the invention provide a machine vision system and method for distributing and managing the execution of image processing applications at a fine-grained level via a PCIe connected system. The hybrid system is replaced with the BPE3 and the switch is also eliminated from the prior in order to meet over 1 GB processing requirement. | 10-01-2009 |
20090245616 | Method and apparatus for visiometric in-line product inspection - A method and an apparatus for grouping individual products such as industrially baked products that travel past a visiometry station into lots for counting them. In a viewing zone of a conveyor belt, a laser triangulation visiometry system is used. The method and apparatus also uses a signal processor associated with the camera that deduces from the images acquired thereby at least one piece of information on the location of the products on the conveyor belt as well as height information thereon. This information is then used by the signal processor to automatically distinguish between the presence of a product and the presence of contaminating material (for example flour or chocolate particles) on the conveyor belt and to distinguish the presence of several partially or fully overlapping products from the presence of a single product on said conveyor belt. Preferably, two cameras are disposed symmetrically relative to a laser plane substantially perpendicular to the plane of the viewing zone. | 10-01-2009 |
20090245617 | System and method for processing image data - Embodiments of the present invention recite a system for providing product consulting using a transmitted image. In one embodiment, the present invention comprises an image capture device for capturing an image of a user and a reference color set. In embodiments of the present invention, the image capture device does not require a provided infrastructure when capturing the image. The system further comprises a categorizing system for determining at least one data category from data comprising the image. A result generator generates a result based upon the determining of the categorizing system. The system further comprises a result reporting system for conveying the product consultation to the user when the result is conveyed. | 10-01-2009 |
20090252400 | METHOD FOR MOUNTING ELECTRONIC COMPONENT - In order to recognize grid-like reference marks on a jig plate positioned in a mounting area by means of a substrate recognizing camera respectively, to obtain a positional shift amount of a mounting head with respect to XY coordinates on an apparatus of each of the reference marks, and to correct a mounting position, thereby carrying out a mounting operation, a jig component positioned and mounted sequentially on each of the reference marks formed on the jig plate by means of a nozzle head is recognized by the substrate recognizing camera, a shift amount of XY coordinates acquired by the camera recognition of the jig component from XY coordinates on the apparatus of the corresponding reference mark is obtained as corrected data on the nozzle head with respect to the reference mark, and a correction is carried out based on the corrected data when an electronic component is to be mounted on a substrate by means of the nozzle head. | 10-08-2009 |
20090252401 | Methods, Objects and Apparatus Employing Machine Readable Data - The present invention relates generally to steganography and data hiding. One claim recites an object including: electronic processing circuitry having an operating or performance metric associated therewith; and steganographic indicia carried by the object, the steganographic indicia is usable as an index to verify the operating or performance metric. Another claim recites an apparatus including: electronic memory; and machine-readable indicia usable as a registry index including data that provides an indication regarding an expected capacity of the electronic memory. Other combinations are described and claimed as well. | 10-08-2009 |
20090257643 | METHOD AND SYSTEM FOR REMOTE REWORK IMAGING FOR PART INCONSISTENCIES - A system and method for remote rework imaging a part for an inconsistency is provided. The part is scanned with a nondestructive inspection device. An image of a part inconsistency is communicated from the nondestructive inspection device to a programmable device. The image of the part inconsistency is viewed with the programmable device. The image of the part inconsistency is edited with the programmable device using an input device in communication with the programmable device. The edited image is communicated from the programmable device to a visible light projector. The edited image is projected onto the part inconsistency using the visible light projector. | 10-15-2009 |
20090263005 | IMPURITY MEASURING METHOD AND DEVICE - An impurity measuring device includes a table (T) on which a sample (S) is to be placed with its fracture surface (h) facing up, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an image sensing means for sensing an image of the fracture surface (h) irradiated with the light (L), continuous tone color image processing means for processing the sensed image into a continuous tone color image, and a binarizing means for binarizing the continuous tone color image through comparison between the result of the continuous tone color image processing and a threshold value. As the fracture surface (h) is irradiated with the light (L) from the plurality of directions, the image obtained by sensing the image of the fracture surface (h) is free from shading or optical irregularities caused by minute irregularities on the fracture surface (h). Therefore, impurities in the sample (S) can be accurately detected from the fracture surface (h) by subjecting the image to the continuous tone color image processing and binarization. | 10-22-2009 |
20090268957 | DEVICE FOR MEASURING THE THICKNESS OF PRINTED PRODUCTS - An apparatus for measuring a thickness of a printed product conveyed in a conveying direction at a conveying speed. The apparatus includes a conveying device having a guide arrangement along which the printed product is conveyed at the conveying speed in the conveying direction, the guide arrangement including a measuring region that extends in the conveying direction of the guide arrangement. The apparatus further includes a measuring element operative to act on printed sheets of the printed product to measure the thickness of the printed product while the printed product is conveyed across the measuring region and through a measuring gap located between the measuring element and the guide arrangement. The measuring element is arranged to move toward the guide arrangement with a process timing and to move synchronously with the printed product at the conveying speed across the measuring region of the guide arrangement. The apparatus additionally includes an evaluation unit connected to the measuring element. | 10-29-2009 |
20090279772 | Method and System for Identifying Defects in NDT Image Data - An anomaly detection method includes acquiring image data corresponding to nondestructive testing (NDT) of a scanned object. The NDT image data comprises at least one inspection test image of the scanned object and multiple reference images for the scanned object. The anomaly detection method further includes generating an anomaly detection model based on a statistical analysis of one or more image features in the reference images for the scanned object and identifying one or more defects in the inspection test image, based on the anomaly detection model. | 11-12-2009 |
20090279773 | IMAGING APPARATUS AND METHOD - Apparatus for inspecting an article comprising: a controller configured to generate a drive signal having a periodic amplitude variation; a source, the source being operable by the controller to emit a source beam thereby to irradiate an article, the source beam comprising a beam of electromagnetic radiation having a periodic amplitude variation corresponding to that of the drive signal; and a detector, the detector being configured to detect a portion of the source beam that has been transmitted through at least a portion of the article, and to generate a detector signal having an amplitude variation corresponding to the amplitude variation of said portion of the source beam, the controller being further configured to generate a difference value corresponding to a difference between the amplitude of the detector signal and the amplitude of a reference signal. | 11-12-2009 |
20090279774 | ACOUSTOGRAPHIC DIAGNOSIS OF ABNORMALITIES - An arrangement and method are provided for acoustographic diagnosis of abnormalities of a product, such as motor vehicle, that includes associating psychoacoustic vector beam data with a three-dimensional graphic surface model, and analyzing the three-dimensional graphic surface model to identify at least a portion thereof associated with unacceptable psychoacoustic levels. | 11-12-2009 |
20090290781 | ILLUMINATING DEVICE FOR CYLINDRICAL OBJECTS, SURFACE INSPECTION METHOD IMPLEMENTED THEREWITH AND COMPUTER PROGRAM PRODUCT - An illuminating device is provided that includes, but is not limited to a cylindrical lighting unit with a cylindrical slit diaphragm arranged in the interior thereof. The lighting unit includes, but is not limited to a cylindrical light source with a cylindrical diffusor arranged therein, and the slit diaphragm has a cylinder with axially extending slits that are arranged in such a way that incident beams coupled in perpendicular to the slit diaphragm axis (O) converge in a point (M) that is spaced apart from the cylinder axis in the interior of the slit diaphragm through the slits. | 11-26-2009 |
20090297017 | HIGH RESOLUTION MULTIMODAL IMAGING FOR NON-DESTRUCTIVE EVALUATION OF POLYSILICON SOLAR CELLS - A non-destructive evaluation system for evaluating an article such as a test sample, the system comprising:
| 12-03-2009 |
20100008560 | Substrate-check Equipment - A substrate-check equipment has a conveyer, at least two lamps, at least two image acquisition units and a control unit. The conveyer conveys a substrate. The lamps are mounted respectively above and below the conveyer to respectively shine light onto the substrate. Each lamp has an adjusting unit for adjusting intensity of the lamp. The image acquisition units correspond to the lamps and are mounted respectively above and below the conveyer to respectively capture images of the substrate and generate image signals. The control unit is electronically connected to the lamp and the image acquisition units. Emitted light intensity of the lamps is adjusted to ensure consistent image quality and speed up procedures for checking the substrate. | 01-14-2010 |
20100014745 | INSPECTING METHOD AND INSPECTING EQUIPMENT - An inspecting method and an inspecting equipment including a dividing unit, a determining unit, a transferring unit and an inspecting unit for inspecting a disk are provided. The inspecting method includes the following steps. First, a plane is divided into several zones with equal area. Next, several measuring locations are determined within these zones. Next, these measuring locations are transferred into several sets of measuring locations corresponding to the disk through a coordinate transfer. Then, the disk is inspected according to these sets of measuring locations. | 01-21-2010 |
20100014746 | INTERACTIVE USER INTERFACES AND METHODS FOR VIEWING LINE TEMPERATURE PROFILES OF THERMAL IMAGES - An interactive graphical user interface includes a moveable pointer, which may be activated to select points of a computer-generated thermal image of an object, as the pointer is moved over a display of the image, so that line temperature profiles, which correspond to predetermined lines extending through the selected points, may be viewed, for example, on a line temperature profile chart of the interface, for each selected point as the pointer is moved. Each predetermined line extends between the corresponding selected point and another, predetermined, point of the image. The other predetermined point may either coincide with an origin of an x-axis or a y-axis of an orthogonal coordinate system, in which the image is aligned, or may be any other point of the thermal image, for example, one that is pre-selected by a user, with the moveable pointer. | 01-21-2010 |
20100014747 | Stent Inspection System - Apparatus, systems, and methods for inspecting longitudinal surfaces and sidewalls of cut tubes are disclosed. In some embodiments, the apparatus includes a line camera, the line camera being configured to capture images of longitudinal surfaces of the cut tubes, an area camera joined with the line camera, the area camera being configured to capture images of sidewalls of the cut tubes, a mandrel and drive, a multi-axis motion stage, a vertical motion stage, and a rotating motion stage. In some embodiments, the system includes a camera module, a tube positioning module, a motion control module, and an analysis module. In some embodiments, the method includes positioning a line and area cameras, moving the cut tubes, capturing images of the longitudinal surfaces and sidewalls of the cut tubes, providing comparable images of a template cut tube, and comparing the images of the cut tubes to those of the template cut tube. | 01-21-2010 |
20100021040 | PATTERN EVALUATION APPARATUS AND PATTERN EVALUATION METHOD - A method of evaluating a pattern includes: generating a first reference pattern as evaluation reference of an inspection pattern; varying a process parameter for manufacturing the first reference pattern and generating a variation pattern group comprising patterns varied in shape from the first reference pattern according to varied process parameters; defining a second reference pattern as reference in calculating a shape variation amount in the variation pattern group; obtaining coordinates of edge points of the second reference pattern and the variation pattern group; conducting association between the edge points of the second reference pattern and of the variation pattern group; calculating a shape variation amount in the variation pattern group; adding the calculated shape variation amount to information of the edge points of the second reference pattern; and conducting matching between the inspection pattern and the second reference pattern with the shape variation amount being added. | 01-28-2010 |
20100021041 | PATTERN DEFECT INSPECTION METHOD AND APPARATUS - The pattern defect inspection apparatus is operable to detect defects by comparing a detection image, which is obtained through scanning by an image sensor those patterns that have the identical shape and are continuously disposed on the object under tested at equal intervals in row and column directions, with a reference image obtained by scanning neighboring identical shape patterns in the row and column directions. This apparatus has a unit for generating an average reference image by statistical computation processing from the images of identical shape patterns lying next to the detection image including at least eight nearest chips on the up-and-down and right-and-left sides and at diagonal positions with the detection image being intermediately situated. The apparatus also includes a unit that detects a defect by comparing the detection image to the average reference image thus generated. | 01-28-2010 |
20100027869 | Optical Carriage Structure of Inspection Apparatus and its Inspection Method - An optical carriage structure of the inspection apparatus and its inspection method are disclosed herein. A plurality of CCD arrays configured at different heights in the optical carriage are utilized, so as a plurality of individual images can be simultaneously captured in one scanning step to obtain a preferred inspection image for image comparison; therefore, precise inspection can be effectively achieved. Furthermore, those CCD arrays are configured at different heights and have enlarged focusing ranges, and the depth of field is thus enhanced. | 02-04-2010 |
20100027870 | METHOD FOR MEASURING COATING APPEARANCE AND THE USE THEREOF - The present invention is directed to a method for obtaining appearance characteristics of a target coating containing effect pigments. The present invention is also directed to a method for comparing appearances of two or more coatings by comparing the appearance characteristics. The present invention is further directed to a system for obtaining appearance characteristics of one or more coatings and comparing said coating appearances. | 02-04-2010 |
20100027871 | Method and system for inspection of tube width of heat exchanger - An appearance inspection method and system of a core of a heat exchanger provided with fins and tubes including identifying a region in which an image of a single tube is captured, performing averaging and dynamic binarization of the image data in this region to extract only the image of the tube, dividing this region into a plurality of blocks, finding the smallest rectangle surrounding a tube at each divided block to find a width dimension of the tube, comparing the tube width dimension at each block found with a predetermined threshold value, and judging a part as good when all of the tube width dimensions at the blocks are the predetermined threshold value or less. | 02-04-2010 |
20100027872 | Method and system for inspection of tube width of heat exchanger - A method and system for appearance inspection of a core of a heat exchanger provided with fins and tubes, performing averaging and dynamic binarization on the imaging data to extract an image of only a tube, then calculating, with respect to the extracted tube image, a center axis across a long direction of the tube comprised of the center coordinates of the tube width direction, comparing the discovered center axis with a reference value to find the maximum displacement across the long direction of the tube, and judging the tube is a defect when the maximum displacement is greater than a predetermined threshold. | 02-04-2010 |
20100034455 | SOLAR BATTERY MODULE EVALUATION APPARATUS, SOLAR BATTERY MODULE EVALUATING METHOD, AND SOLAR BATTERY MODULE MANUFACTURING METHOD - Management of a manufacturing process also in assembling a solar battery module is facilitated. A solar battery module evaluation apparatus includes a power supply unit, a camera, and a processing unit. The power supply unit supplies electric power. The processing unit outputs pattern information indicating whether a solar battery module is defective or not, based on data of an image picked up by the camera, the image being an optical image that appears as a result of supply of electric power to the solar battery module for light emission through electroluminescence phenomenon. | 02-11-2010 |
20100040277 | PANEL INSPECTION DEVICE AND INSPECTION METHOD OF PANEL - A panel inspection device and inspection method is provide. At least an image capturing element is disposed above or below a spacing between a first conveyer and a second conveyer. During a panel is conveyed from the first conveyer to the second conveyer, the image capturing element captures the image of the panel as the panel passes through the spacing. | 02-18-2010 |
20100040278 | APPARATUS AND METHOD FOR THE AUTOMATED MARKING OF DEFECTS ON WEBS OF MATERIAL - A system for the characterization of webs that permits the identification of anomalous regions on the web to be performed at a first time and place, and permits the localization and marking of actual defects to be performed at a second time and place. | 02-18-2010 |
20100046825 | AUTHENTICATION AND ANTICOUNTERFEITING METHODS AND DEVICES - Methods and devices for marking objects include the use of a dimensionally hierarchical series of submicron sized features to emboss, mold, and/or print markings into objects. The markings may include security features, codes, numbers, symbols, signs and any combinations thereof. The markings may be used for identification, authentication or attribution of the item. | 02-25-2010 |
20100046826 | METHOD AND SYSTEM FOR USE IN INSPECTING AND/OR REMOVING UNSUITABLE OBJECTS FROM A STREAM OF PRODUCTS AND A SORTING APPARATUS IMPLEMENTING THE SAME - Disclosed is a method and system for inspecting and sorting unsuitable or irregular objects in a stream of products, the system includes means for scanning the stream of products along a scan line. The scan line is formed by means of at least one light source directing light along the scan line, and means for detecting light beams reemitted by the product stream upon scanning. The scanning means includes a focusing means for concentrating the light in at least one dimension. The detecting means includes a focusing means for forming an image in an image plane. The detecting means is oriented towards the scan line such that points on the scan line form a projected scan line in the image plane and the image substantially located in the image plane is substantially focused in at least one dimension by the focusing means. The detecting means also includes a spatial filtering means that filters the image in substantially the direction perpendicular to the direction of the projected scan line. | 02-25-2010 |
20100046827 | APPARATUS AND SYSTEMS FOR COUNTING CORN SILKS OR OTHER PLURAL ELONGATED STRANDS AND USE OF THE COUNT FOR CHARACTERIZING THE STRANDS OR THEIR ORIGIN - Apparatus and systems for relatively high throughput counting of elongated strands including silks of a plant are disclosed. One apparatus or system includes segregating similar sized pieces of silks from a section of the plant's silk brush using a tool adapted to obtain uniform samples and system quantitatively counting the pieces by automation. The automated system can be a digital image of the pieces distributed across or above a surface, and image analysis to derive a count of individual pieces. An alternative automated system moves the pieces sequentially and substantially singulated past a detector. | 02-25-2010 |
20100061619 | METHOD AND DEVICE FOR THE RECOGNITION OF AN AUTHENTICATING MARK ON AN ENVELOPED SURFACE OF AN OBJECT - A method for the recognition of an authenticating mark on the surface of a packaging foil or an article by visual and/or electronic recognition through an envelope, where ultrasonic or X-ray techniques are performed. The authenticating mark includes at least one embossed authenticating mark having finest structures in the micrometer range, and the surface of the packaging foil or of the area of the article in which the authenticating mark is embossed being metallized or made of metal. | 03-11-2010 |
20100074511 | MASK INSPECTION APPARATUS, AND EXPOSURE METHOD AND MASK INSPECTION METHOD USING THE SAME - The present invention provides a mask inspection apparatus and method capable of inspecting masks used in double patterning with satisfactory accuracy. | 03-25-2010 |
20100086191 | EVALUATION OF OPTICAL DISTORTION IN A TRANSPARENCY - A system for evaluating optical distortion in an aircraft transparency, such as a windshield, is disclosed. The system utilizes high resolution digital images (a reference image and a test image) of a test grid structure having a pattern of visible index locations. In one embodiment, the test image is taken through the transparency under test, and the reference image is taken without the transparency. The two images are processed and analyzed by a computing device to determine displacement of each index location, relative to the reference image. The displacement data is further processed to obtain vector divergence field data that represents a quantitative measurement of the optical distortion. The optical distortion measurement data is then rendered in a suitable format that allows the transparency to be rated against certain quality criteria. | 04-08-2010 |
20100086192 | PRODUCT IDENTIFICATION USING IMAGE ANALYSIS AND USER INTERACTION - An apparatus, system, and method are disclosed for product identification using image analysis and user interaction. The method may include comparing a retail product image to a plurality of candidate retail product images. In addition, the method may include generating a candidate product set containing candidate retail product images satisfying image comparison criteria. The method may determine one or more product identity queries configured to solicit additional product identity information from a user. In addition, the product identity queries may eliminate one or more members of the candidate product set. The method may query the user with these inquiries and determine a product match based on the user's response. Therefore a user may obtain information about a product using only a picture and a user's knowledge of the product. | 04-08-2010 |
20100086193 | Making sealant containing twist-on wire connectors - A system and a method of identifying, accepting or rejecting faulty sealant containing twist-on wire connectors wherein an image sensor generates an output image signal of a partly assembled twist-on wire connector or an assembled twist-on wire connector and compares the output image signal to a reference image signal to identify or reject a twist-on wire connector if the output image signal of the twist-on wire connector is outside an acceptable range and accept the twist-on wire connector if the output image signal is within the acceptable range. | 04-08-2010 |
20100092067 | Gem pattern matching algorithm to determine the percentage match of a target gem pattern to a database of gem patterns - A method and gem pattern matching technique to analyze a target gemstone by analyzing a pattern created by transmitting a light source such as a laser beam through the gemstone to create a visual optical pattern and comparing the pattern to a database of known gemstone patterns to determine the percentage likelihood that the target gemstone will match a gemstone in the database. The matching is based on the weight of the heaviest spot in the pattern and its location in the gemstone image and comparing it to the weight and location of the heaviest spots in each gemstone image in the database to determine a percentage matching. | 04-15-2010 |
20100092068 | DEVICE FOR DETERMINING THE POSITION AND/OR THE TRANSVERSE DIMENSION OF A DRILL HOLE IN A PRESENTATION LENS FOR RIMLESS EYEGLASSES - The device includes: bearing element ( | 04-15-2010 |
20100092069 | IMAGE PROCESSING METHOD, PAINT INSPECTION METHOD AND PAINT INSPECTION SYSTEM - An image processing method that differentiates image data using an image processing system that includes a processing unit and a storage unit includes: acquiring image data; sequentially picking up pixels one by one at a predetermined pitch from among the pixels that constitute the image data and setting the picked up pixels as reference pixels; setting a close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the close regions; setting a wide region larger than the close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the wide regions; and calculating a difference between the density of each of the reference pixels and a corresponding one of the average values of the densities of the pixels of the wide regions. | 04-15-2010 |
20100098319 | METHOD AND SYSTEM FOR THE PRODUCTION OF VARIABLE-DIMENSIONAL PRINTED SUBSTRATES - A method and system for generating a customized, printed, three-dimensional object accesses a data record for a selected recipient and prints objects on a substrate based on the data record. The method and system then generates die lines based on the data record, and finishes the substrate by cutting, perforating, creasing, folding or otherwise finishing the substrate along the die lines to yield a customized, three-dimensional printed object. | 04-22-2010 |
20100098320 | METHOD AND DEVICE FOR INSPECTING PATTERNED MEDIUM - An inspection region is specified using the design information to perform region division for measurement through a scatterometry method. The obtained detection data is classified by pattern into a periodic region and a non-periodic region. A spectroscopic characteristic is detected by an optical sensor to extract features. The extracted features are compared with features stored in a feature map database for each region to evaluate a state of a patterned medium. | 04-22-2010 |
20100098321 | TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD - Feature points ( | 04-22-2010 |
20100104172 | METHOD AND SYSTEM FOR CALCULATING WEIGHT OF VARIABLE SHAPE PRODUCT MANUFACTURED FROM PRODUCT BLANK - A computerized system, method, and computer-readable media implementing a method for determining a weight of a product, and optionally its shipping weight and postage are described. A product having a variable shape in two dimensions wherein the shape is defined in the two dimensions by a set of cutlines is manufactured from a product blank of known weight. The weight of the product is determined from the number of pixels in a scaled image of the cutlines, the image having the same aspect ratio as the product blank. The weight of the product blank and the ratio of the pixels corresponding to product surface area relative to the total number of pixels in the image are used to calculated the actual weight of the product. | 04-29-2010 |
20100119142 | Monitoring Multiple Similar Objects Using Image Templates - Computer-readable media having corresponding apparatus embodies instructions executable by a computer to perform a method comprising: capturing, with a first camera, a first image of a first one of a plurality of similar objects each having a common feature; generating an image template file based on the first image, wherein the image template file identifies a location of the feature of the first one of the plurality of similar objects in the first image; capturing, with a second camera, a second image of a second one of the plurality of similar objects; and controlling the second camera based on the second image and the image template file. | 05-13-2010 |
20100124369 | METHODS AND APPARATUS FOR MEASURING 3D DIMENSIONS ON 2D IMAGES - A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the XID pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix. | 05-20-2010 |
20100124370 | PATTERN SHAPE INSPECTION METHOD AND APPARATUS THEREOF - This invention relates to a pattern shape inspection method and an apparatus thereof for conducting a first step of irradiating wideband illuminating light which contains far ultraviolet light to a sample from a perpendicular direction, inspecting a shape of the pattern based on a spectral waveform of reflecting light detected from the sample, and detecting an edge roughness of the pattern based on the spectral waveform of the reflecting light detected from the sample, and a second step of irradiating a laser beam to the sample from an oblique direction, and detecting the edge roughness of the pattern based on scattered light detected from the sample. | 05-20-2010 |
20100128966 | PATTERN SHAPE EVALUATION METHOD AND PATTERN SHAPE EVALUATION APPARATUS UTILIZING THE SAME - The present invention provides a pattern shape evaluation method that can securely decide whether patterns are connected or disconnected and, further, evaluate a pattern shape qualitatively. | 05-27-2010 |
20100128967 | Hands-free Inspection Systems - An inspection system comprising one or more foot switches, one or more data sources and computer software for the purpose of reducing manual procedures in an inspection process. Said inspection system is interfaced to a host computer and an inspection apparatus such that information regarding inspection of articles- or features-of-interest can be recorded in an inspection report. Said inspection system data sources may include, but are not limited to, position determination devices, information reading devices, voice input devices in combination with voice recording or voice recognition software, image capture devices and/or their associated software, and foot switches. Said computer software being a standalone application, with or without associated files, or a file executed by a separate software application, again, with or without associated files. | 05-27-2010 |
20100128968 | SYSTEM AND A METHOD FOR INSEPCTING AN OBJECT - An inspection method and an inspection system, the inspection system includes: (i) a first group of sensors, for sensing light components of a first light band of an image of an area of an inspected object, and for generating first detection signals reflecting sensed light components of the first light band; (ii) a second group of sensors, for sensing light components of a second light band of the image of the area of the inspected object, wherein the second light band differs from the first light band, and for generating second detection signals reflecting sensed light components of the second light band; (iii) optics, for projecting the image of the area of the inspected object towards the first group of sensors and towards the second array of sensors; and (iv) a processing unit, coupled to the first and second group of sensors, for detecting defects based on the first or second detection signals. | 05-27-2010 |
20100142796 | Inspection method and apparatus for substrate - An inspection method and apparatus for a substrate are provided. The inspection apparatus includes an optical unit generating a light illuminating the substrate to generate an image, a sensor array receiving the image having a light wave comprising a wave-band within a range between 700 nm to 1500 nm, and an image processing unit capturing the image. | 06-10-2010 |
20100142797 | Method and Apparatus for Utilizing Representational Images in Commercial and Other Activities - In a method and apparatus for an object using a representational image, positioning the object at a predetermined position relative to the representational image, illuminating the representational image, presenting information from the representational image to an operator, at least one of controlling the illuminating of the representational image and presenting of information from the representational image to an operator, using a processing arrangement, and processing the object using the information obtained from the representational image. | 06-10-2010 |
20100142798 | NON-CONTACT MEASUREMENT APPARATUS AND METHOD - A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images. | 06-10-2010 |
20100150425 | METHOD FOR OPERATING AND/OR MONITORING A FIELD DEVICE, AND CORRESPONDING FIELD DEVICE - The invention relates to a method for servicing and/or monitoring a field device ( | 06-17-2010 |
20100158343 | SYSTEM AND METHOD FOR FAST APPROXIMATE FOCUS - Fast approximate focus operations providing an approximately focused image that is sufficiently focused to support certain subsequent inspection operations. The operations are particularly advantageous when used to provide images for successive inspection operations that predominate when inspecting planar workpieces. Improved inspection throughput is provided because, in contrast to conventional autofocus operations, the fast approximate focus operations do not acquire an image stack during a run mode as a basis for determining a best focused image. Rather, during learn mode, a representative feature-specific focus curve and a focus threshold value are determined and used during run mode to provide an approximately focused image that reliably supports certain inspection operations. In one embodiment, an acceptable approximately focused inspection image is provided within a limit of two focus adjustment moves that provide two corresponding images. The adjustment moves are based on the representative feature-specific focus curve provided in learn mode. | 06-24-2010 |
20100177951 | METHOD AND APPARATUS FOR SCANNING SUBSTRATES - A method and apparatus for scanning and acquiring 3D profile line data of an object, illustratively for use in an optical inspection system. A 3D scanning subsystem is provided in relative movement to the object being scanned. The subsystem is capable of simultaneously scanning different regions of the object with different exposure lengths. | 07-15-2010 |
20100177952 | DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD - A defect inspection method includes: acquiring an image of an inspection pattern obtained by an imaging device, detecting an edge of the inspection pattern in the image, dividing the image into an inspection region and a non-inspection region, using the detected edge as a boundary thereof, performing image processing only on the inspection region to determine the intensity value distribution in the image, and detecting a defect in the inspection pattern based on the obtained intensity value distribution. | 07-15-2010 |
20100215246 | System and method for monitoring and visualizing the output of a production process - A system for monitoring and visualizing the output of a production process, whose output materials or items are inspected by one or more inspection units, may include a communication module to receive data from the one or more inspection units. The received data may be associated with a measured or extrapolated value of at least one parameter of the inspected materials or items. A comparator module may compare at least one of the measured or extrapolated values against a corresponding stored value to determine a difference value, and a visualization module may generate an image representing the inspected items or materials. An area or section of the image corresponding to an area or section of the item or material associated with the at least one of the measured or extrapolated values which was compared to the stored value may be visually coded to indicate a corresponding difference value. | 08-26-2010 |
20100220918 | INSPECTION APPARATUS AND INSPECTION METHOD - Aims to provide an inspection apparatus which precisely detects an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. The inspection apparatus includes: an infrared-light illuminator ( | 09-02-2010 |
20100226560 | Method for detecting defects in a plastic fuel bank by radiography - Method for detecting defects in a plastic vehicle tank equipped with internal accessories located inside the tank. The method comprises at least the following steps: a) providing the tank equipped with said internal accessories; b) making a digitized X-ray image of said tank; c) providing a reference image of said tank; d) comparing the digitized X-ray image and the reference image by means of a computer vision software; e) deciding on the presence of defects when differences exist between the digitized X-ray image and the reference image. | 09-09-2010 |
20100226561 | PARAMETER DETERMINATION ASSISTING DEVICE AND PARAMETER DETERMINATION ASSISTING PROGRAM - This invention provides a parameter determination assisting device and a parameter determination assisting program enabling a more rapid and easy determination of a parameter to be set in a processing device, which obtains a processing result by performing a process using a set of parameters defined in advance on image data obtained by imaging a measuring target object. A user can easily select an optimum parameter set when a determination result and a statistical output are displayed in a list for each of a plurality of trial parameter candidates. For instance, while trial numbers “2”, “4”, and “5”, in which the number of false detections is zero, can perform a stable process, the parameter set of the trial number “2” is comprehensively assumed as optimum since the trial number “2” can perform the process in the shortest processing time length. | 09-09-2010 |
20100232677 | GLAZING INSPECTION METHOD - Methods of determining the divergence angle between a primary image and a secondary image generated by a glazing are disclosed. In a first method, a glazing is illuminated with a light source and a primary and a secondary image of the light source, generated by the glazing, are captured using an image capture device. The distance between the primary and the secondary image is determined, and the divergence angle determined from this distance. In a second method, the primary and secondary images are viewed on a target marked with a scale indicating the divergence angle. The divergence angle is read from the scale and the positions the primary and secondary image. In this second method, the light source is located at the center of the target. In both methods, the light source comprises at least one light emitting diode. Preferably, the method is used to examine the edge region of a glazing. | 09-16-2010 |
20100232678 | SYSTEM AND METHOD FOR MONITORING OF WELDING STATE - A system and method for monitoring the molten state for enabling a molten state, butting state, or other state of electric-resistance-welded pipe on-line more accurately than in the past are provided. That is, a mirror | 09-16-2010 |
20100239154 | INFORMATION PROCESSING APPARATUS AND METHOD - An information processing apparatus for selecting, from a plurality of feature amounts that are extracted from input data items, feature amounts that are to be used to classify the input data items is provided. The information processing apparatus includes generating means for generating a plurality of combinations by generating combinations of feature amounts that are selected from the plurality of feature amounts; first calculating means for calculating, for each of the plurality of combinations, a first evaluation value for evaluating a suitability for classification of the input data items; and second calculating means for obtaining, on the basis of the first evaluation values, for each of the plurality of feature amounts, a second evaluation value for evaluating a suitability for classification of the input data items. | 09-23-2010 |
20100239155 | ABNORMALITY DETECTING APPARATUS FOR DETECTING ABNORMALITY AT INTERFACE PORTION OF CONTACT ARM - An abnormality detecting apparatus includes an imaging device for obtaining image data of a TIM, a failure detecting section for detecting appearance failures of the TIM on the basis of the image data of the TIM obtained by the imaging device, and a determining device for determining whether an abnormality occurs at the TIM on the basis of a detection result by the failure detecting section. | 09-23-2010 |
20100246929 | METHOD AND SYSTEM FOR DETERMINING A DEFECT DURING CHARGED PARTICLE BEAM INSPECTION OF A SAMPLE - A method for determining a defect during charged particle beam inspection of a sample locates at least one examination region within a charged particle microscopic image of the sample by making reference to a database graphic of the sample corresponding to the charged particle microscopic image. Each located examination region concerns at least one element of the sample, and each element has at least one characteristic in common. At least one point response value is then generated for each point in the located examination regions. The presence of a defect at the location of the concerned point is then determined by applying at least one decision tree operator to the generated point response values of the concerned point. Applications of the proposed method as a computing agent and a charged particle beam inspection system are also disclosed. | 09-30-2010 |
20100246930 | INSPECTION APPARATUS AND METHOD USING PENETRATING RADIATION - Products in multiple lanes are passed side-by-side through X-ray inspection apparatus and an image is acquired. Different parts of the image corresponding to the different product lanes are subjected to different numerical processing, so that product anomalies are in each case readily visible or reliably detected using automatic threshold discrimination. The same X-ray power may therefore be used to inspect products having widely different X-ray attenuation characteristics. | 09-30-2010 |
20100246931 | INSPECTION METHOD - In order to set an inspection area, a measurement target is disposed onto a stage, a reference data of the measurement target is summoned, and a measurement data of the measurement target is acquired. Then, at least one feature object is selected in the measurement data and the reference data of the measurement target, and at least one feature variable for the selected feature object is extracted from each of the reference data and the measurement data. Thereafter, a change amount of the measurement target is produced by using the feature variable and a quantified conversion formula, and the produced change amount is compensated for to set an inspection area. Thus, the distortion of the measurement target is compensated for to correctly set an inspection area. | 09-30-2010 |
20100260409 | IMAGING MEASUREMENT SYSTEM WITH PERIODIC PATTERN ILLUMINATION AND TDI - A patterned TDI sensor comprising an array of pixels having respective sensitivities to light that varies according to a periodic pattern across said array of pixels, for high throughput applications of imaging and measurement with patterned illumination such as structured illumination, Moire techniques, 3D imaging and 3D metrology. An object is measured by scanning the object with illumination that varies periodically across the object, imaging the object with a patterned TDI sensor having a repetition length matched with the repetition length of the illumination and analyzing the output signal of the TDI sensor to extract information such as height or image of the object. | 10-14-2010 |
20100260410 | Closed-Loop Process Control for Electron Beam Freeform Fabrication and Deposition Processes - A closed-loop control method for an electron beam freeform fabrication (EBF | 10-14-2010 |
20100266193 | ELECTRONIC PART RECOGNITION APPARATUS AND CHIP MOUNTER HAVING THE SAME - An electronic part recognition apparatus and a chip mounter having the same are provided. The apparatus includes a part conveyor unit for moving an electronic part along a path and mounting the part at a mounting position, a position recognition portion for continuously recognizing position information of the part conveyor unit moving along the path, a controller for receiving the position information from the position recognition portion and generating a photographing signal, and an image processing unit for receiving the photographing signal from the controller and time-exposing the part to light to photograph an image of the part when the part is located at a part recognition region while the conveyor unit moves. The apparatus can capture an image of an part suctioned by a nozzle installed in a head of a chip mounter and moved without stoppage of the head to recognize a state of the suctioned electronic part. | 10-21-2010 |
20100272346 | SYSTEM AND METHOD FOR MEASURING FORM AND POSITION TOLERANCES OF AN OBJECT - A method for measuring form and position tolerances of an object receives a preselected feature element to be fitted from an image of a measured object, obtains a reference feature element from an image of a reference object corresponding to the measured object. The method further fits a feature element corresponding to the preselected feature element so as to obtain a fitted feature element, and calculates form and position tolerances between the fitted feature element and the reference feature element thereby generating the form and position tolerances of the measured object. | 10-28-2010 |
20100278415 | METHOD AND SYSTEM FOR PRODUCING FORMATTED INFORMATION RELATED TO DEFECTS OF APPLIANCES - The method and a system for producing formatted information related to defects of appliances of a chain of appliances. To produce the formatted information related to the defects of an image-capture appliance of the chain, the method includes a first calculation algorithm with which there can be chosen, within a set of parameterizable transformation models, within a set of parameterizable reverse transformation models, within a set of synthesis images, within a set of reference scenes, and within a set of transformed images: a reference scene, and/or a transformed image, and/or a parameterizable transformation model with which a reference image of the reference scene can be transformed to the transformed image, and/or a parameterizable reverse transformation model, with which the transformed image can be transformed to the reference image, and/or a synthesis image obtained from the reference scene and/or obtained from the said reference image. The formatted information is at least partly composed of the parameters of the chosen parameterizable transformation model and/or of the parameters of the said chosen parameterizable reverse transformation model. | 11-04-2010 |
20100290694 | Method and Apparatus for Detecting Defects in Optical Components - A method is disclosed for detecting defects in an optical component to be tested, such as a lens comprising the steps of: providing a structured pattern, recording the reflected or transmitted image of the pattern on the optical component to be tested, phase shifting the pattern and recording again similarly the reflected or transmitted image, calculating the local phase and amplitude images of the optical component to be tested, calculating a model image of a defect free optical component and determining corresponding phase and amplitude images of the defect free model optical component, comparing phase and amplitude images of both optical component to be tested and defect free model optical component, determining suspect zones in the optical component to be tested, and applying a metrics to separate dust and noise from other defects. | 11-18-2010 |
20100296721 | INSPECTION APPARATUS AND INSPECTION METHOD - An object of the present invention is to provide an inspection apparatus and an inspection method for precisely detecting an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. An inspection apparatus according to an implementation of the present invention detects an amount of misalignment, from a predetermined mounting position, of a component mounted on a surface of a panel through an ACF. The inspection apparatus includes: an infrared light illuminator which illuminates with an infrared light a panel recognition mark and a component recognition mark, the panel recognition mark being formed on the surface of the panel, and the component recognition mark being formed on a surface of the component; an IR camera which is provided opposite the infrared light illuminator in relation to the panel, and captures an image of the panel recognition mark and an image of the component recognition mark which are illuminated with the infrared light; and an amount of misalignment calculation unit which calculates, using the images captured by the IR camera, an amount of misalignment in a positional relationship between the panel recognition mark and the component recognition mark from a predetermined positional relationship, and an optical axis of the infrared light illuminator is inclined with respect to a normal found on the surfaces of the panel or the component. | 11-25-2010 |
20100303334 | PATTERN INSPECTION APPARATUS AND METHOD - A fine pattern, such as a semiconductor integrated circuit (LSI), a liquid crystal panel, and a photomask (reticle) for the semiconductor or the liquid crystal panel, which are fabricated based on data for fabricating the fine pattern such as design data is inspected by a pattern inspection apparatus. The pattern inspection apparatus for inspecting a pattern to-be-inspected uses an image of the pattern to-be-inspected and data for fabricating the pattern to-be-inspected. The pattern inspection apparatus includes a reference pattern generation device configured to generate a reference pattern represented by one or more lines from the data, an image generation device configured to generate the image of the pattern to-be-inspected, a detecting device configured to detect an edge of the image of the pattern to-be-inspected, and an inspection device configured to inspect the pattern to-be-inspected by comparing edges of the image of the pattern to-be-inspected with the one or more lines of the reference pattern. | 12-02-2010 |
20100310149 | DEVICE AND METHOD FOR DETECTING THE JOINTED PARTS OF STRIP IN AN ENDLESS HOT ROLLING PROCESS - There are provided a device and method for detecting joint parts of a steel strip in an endless hot rolling process. The device for detecting joint parts of a steel strip in an endless hot rolling process includes an image signal collection block receiving image signals, each having information on gray level pixels of a steel strip, from a charge coupled device (CCD) camera; an edge line detection block receiving the image signals from the image signal collection block to detect an edge line of the steel strip; a profile calculation block receiving information on the detection of the edge line from the edge line detection block to calculate the sum of gray levels up to an edge line of the steel strip in a traverse direction of the steel strip when the edge line is detected by the edge line detection block; a joint part judgement block receiving information on the sum of the gray levels, which shows a current profile value, from the profile calculation block to judge the edge line as a joint part when a ratio of a mean value of the current profile and a mean value of the previous profile is less than a predetermined value; and an output block receiving information on the judgement of the edge line as the joint part from the joint part judgement block to output a joint part-detecting signal when the edge line is judged to be a joint part. | 12-09-2010 |
20100329538 | Cell Feature Extraction and Labeling Thereof - Embodiments of the present invention determine the surface profile of certain classes of work surface. More specifically, embodiments of the invention measure the three-dimensional locus of points that define the “virtual” continuous surface fitted to the ends of the walls of a cellular core. | 12-30-2010 |
20100329539 | SYSTEM AND METHOD FOR INSPECTING A COMPOSITE COMPONENT - The present disclosure includes a system for inspecting a manufactured composite component. In some embodiments, the system includes an inspection assembly having master camera assembly and a slave camera assembly. The master camera assembly and the slave camera assembly each include a machine vision camera and a lighting system. The lighting assembly may include back lights and spot lights. In some embodiments, the master camera and the slave camera are each connected to a telecentric lens. The composite component is inspected by moving it through the inspection assembly, taking images, and processing the images to measure features on the component. | 12-30-2010 |
20110002527 | BOARD INSPECTION APPARATUS AND METHOD - An inspection method includes photographing a measurement target to acquire image data for each pixel of the measurement target, acquiring height data for each pixel of the measurement target, acquiring visibility data for each pixel of the measurement target, multiplying the acquired image data by at least one of the height data and the visibility data for each pixel to produce a result value, and setting a terminal area by using the produced result value. Thus, the terminal area may be accurately determined. | 01-06-2011 |
20110013823 | Method of Evaluation by Comparison of an Acquired Image with a Reference Image - A method for evaluating the surfaces of a tire, said surfaces being molded with rigid elements, wherein a collection of N images of a given zone of the tire is constituted based on the images originating from one or more tires, each of the images of the collection being constituted by the values of physical magnitudes measured by a sensor sensitive to the reflection of the light at each of the points with coordinates i, j of said surface, and then the images of said collection are made to correspond by superposition, and the image of the zone of a tire from said collection to be evaluated is compared with a reference image. The value of the physical magnitudes of the reference image is calculated based on the value of each of these physical magnitudes measured on the N images of said collection. | 01-20-2011 |
20110019902 | PHOTOGRAMMETRIC METHODS AND APPARATUS FOR MEASUREMENT OF ELECTRICAL EQUIPMENT - A method is disclosed comprising: imaging a feature of a component of an electrical power transmission system for example in combination with a reference component or feature of known dimensions, the reference component or feature comprising a reference, to produce one or more images; analyzing the one or more images with a photogrammetry algorithm to measure the feature of the component; and placing a protector at least partially over the component, the protector being selected to fit the component based on the measurement of the feature. In some embodiments the method may further comprise making the protector based on the measurement of the feature. A method is also disclosed comprising: remotely placing a reference object into a position that is inside a safe Limit of Approach and in the vicinity of a feature of a component of an energized live electrical power transmission system, the reference object comprising a reference; imaging a combination of the reference and the feature of the component to produce one or more images; and analyzing the one or more images with a photogrammetry algorithm to measure the feature of the component. | 01-27-2011 |
20110019903 | Method for Processing a Three-Dimensional Image of the Surface of a Tire so That It Can be Used to Inspect the Said Surface - Method for inspecting a zone of the surface of a tire, said surface comprising markings in relief, wherein the three-dimensional profile of the surface to be inspected is determined, characteristic points on the surface to be inspected are located and these points are matched with the corresponding points originating from the three-dimensional data of a reference surface, so as to create a set of pairs of matched points, in an iterative manner, a first affine transformation function is sought, applied to the characteristic points of the reference surface, so that the value representing the sum of the distances between each of the characteristic points of the reference surface, which points are transformed with the aid of said first transformation function, and the points of the surface to be inspected that are matched with them, is minimal, and said first transformation function is applied to all of the points of the reference surface in order to obtain a transformed reference surface. | 01-27-2011 |
20110026804 | Detection of Textural Defects Using a One Class Support Vector Machine - Method for detecting textural defects in an image. The image, which may have an irregular visual texture, may be received. The image may be decomposed into a plurality of subbands. The image may be portioned into a plurality of partitions. A plurality of grey-level co-occurrence matrices (GLCMs) may be determined for each partition. A plurality of second-order statistical attributes may be extracted for each GLCM. A feature vector may be constructed for each partition, where the feature vector includes the second order statistical attributes for each GLCM for the partition. Each partition may be classified based on the feature vector for the respective partition. Classification of the partitions may utilize a one-class support vector machine, and may determine if a defect is present in the image. | 02-03-2011 |
20110026805 | IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD - An image processing apparatus includes: an image extracting section that extracts a template image from blade images which form a streaming video obtained by capturing blades periodically arrayed in a jet engine; an image comparing section that compares the blade images with the template image; an image selecting section that selects an image as a record image from the blade images based on a result of the image comparison of the image comparing section; and a display section that displays the surface shape of the blade calculated based on the record image. | 02-03-2011 |
20110033103 | Glass Container Stress Measurement Using Fluorescence - An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in glass containers. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of the side walls of glass containers throughout the circumference of the glass containers. The apparatus and method are adapted for large scale glass container manufacturing, and are capable of high speed measurement of the stress in and the thickness of the side walls of glass containers. | 02-10-2011 |
20110038525 | METHOD FOR QUANTIFYING THE MANUFACTURING COMPLEXITY OF ELECTRICAL DESIGNS - A method and system for quantifying manufacturing complexity of electrical designs randomly places simulated defects on image data representing electrical wiring design. The number of distinct features in the image data without the simulated defects and the number of distinct features in the image data with the simulated defects are determined and the differences between the two obtained. The difference number is used as an indication of shorting potential or probability that shorts in the wiring may occur in the electrical wiring design. The simulating of the defects in the image data may be repeated and the difference value from each simulation or run may be used to obtain a statistical average or representative shorting potential or probability for the design. | 02-17-2011 |
20110038526 | Method and Device for Testing Cigarette Packages Wound with Film - A method for testing moving products having at least two layers, such as cigarette packages wrapped with film, wherein at least one layer of the product, namely an inner layer which is arranged further inwards, is covered at least regionally by at least one, at least partially transparent product layer, namely an outer layer which is arranged further outwards, wherein the outer layer of the product is illuminated under an angle of incidence of about 35°, with light, in which the light that is reflected at this layer comprises at least 70%, at least 90%, or at least 95%, of linearly s-polarized light, the s-polarized component of the light reflected by the outer layer and/or of the light reflected by the inner layer and/or the p-polarized component of the light reflected by the outer layer and/or of the light reflected by the inner layer are recorded in each case using at least one suitable electrooptic recording element in the form of an image or partial image of the product and wherein the recorded s-polarized and/or the recorded p-polarized light component are evaluated in order to be able to draw conclusions relating to features of the outer layer and/or of the inner layer. | 02-17-2011 |
20110052039 | METHOD AND APPARATUS FOR INSPECTING APPEARANCE OF LONG-LENGTH OBJECTS - An apparatus for inspecting appearance of long-length object takes images of lighted line every predetermined timing while making the hose move in the long-length direction. By this, the contours of the hose are taken continuously and correctly over the length direction of the hose (H). The height direction position data of the lighted line corresponding to each of the width direction position of the hose are extracted, and the height direction position data are subtracted by the base data provided so as to correspond to each of the width direction position. Thus, the arc shape of the outer surface of the hose is canceled from the height direction position data. Also, the height direction position data of each taken image which are given the subtracting is put in image-taking order, and an inspection image is made on the basis of the predetermined color | 03-03-2011 |
20110064297 | MONITORING APPARATUS, MONITORING METHOD, INSPECTING APPARATUS AND INSPECTING METHOD - An inspecting apparatus according to the present invention has: an imaging section | 03-17-2011 |
20110091093 | METHOD OF APPEARANCE DEFORMATION INDEXING - A method to detect and rank appearance distortions includes creating virtual models of a reference panel and a processed panel, including a first reference patch and the processed panel, respectively. Projecting a first simulated light pattern on the reference panel and the processed panel, and viewing the first reference patch and the first processed patch from a first viewpoint with respect to the first simulated light pattern. The method compares a first reference reflection at the first reference patch with a first processed reflection at the first processed patch, and creates a first index value from optical variations between the appearance of the reference and processed reflections. The first index value is output in a computer readable format. The method may compare the first index value to a predetermined index value and determine whether the processed panel is within an acceptable appearance quality threshold. | 04-21-2011 |
20110091094 | METHOD OF TESTING THE INTEGRITY OF SPIRAL WOUND MODULES - Methods for testing the integrity of spiral wound modules including the introduction of pressurized gas within a sealed permeate collection tube and the detection of gas exiting at least one of the scroll faces of the module. The location(s) of gas exiting the scroll face can be correlated to defects in the module. In preferred embodiments, the subject test methods are non-destructive and can be applied to modules in either a dry or wet condition. | 04-21-2011 |
20110096978 | Off-Axis Sheet-Handling Apparatus and Technique for Transmission-Mode Measurements - An apparatus ( | 04-28-2011 |
20110116704 | High-Resolution Large-Field Scanning Inspection System For Extruded Ceramic Honeycomb Structures - A high-resolution, large-field scanning inspection system for inspecting extruded ceramic honeycomb structures is disclosed. The system allows for inspecting cells at an endface of a cellular ceramic substrate by capturing, along an optical axis, line images of illuminated cells as a line illumination scans over at least a portion of the plurality of cells. The inspection method includes centering the line illumination on the optical axis to make the line illumination normally incident upon the endface. The inspection method also includes forming from the line images a composite image of the cells, and determining from the composite image at least one parameter of at least one cell. | 05-19-2011 |
20110135187 | PHOTOVOLTAIC CELL MANUFACTURING METHOD AND PHOTOVOLTAIC CELL MANUFACTURING APPARATUS - A photovoltaic cell manufacturing method includes: detecting a structural defect existing in compartment elements; obtaining an image by capturing a region including the structural defect and the scribe line with a predetermined definition; specifying first number of pixels on the image, the first number of pixels corresponding to a distance between the scribe lines adjacent to each other or corresponding to a width of the scribe line; referring to an actual value indicating the distance between the scribe lines adjacent to each other or indicating the width of the scribe line, the distance being preliminarily stored, and the width of the scribe line being preliminarily stored; calculating an actual size of one pixel on the image by comparing the first number of pixels with the actual value; specifying second number of pixels on the image, the second number of pixels corresponding to the distance between the structural defect and the scribe line; comparing the second number of pixels with the actual size of one pixel, thereby calculating defect position information; and electrically separating the structural defect by irradiation with the laser light based on the defect position information. | 06-09-2011 |
20110150315 | Replacement of Build to Order Parts with Post Configured Images in any Manufacturing Environment - An embedded imaging system for addressing burn rack time issues. The embedded imaging system focuses on flexibility, control, and the ability to run without manufacturer specific IT capabilities (which allows the use of the embedded imaging system at outside manufacturing facilities). | 06-23-2011 |
20110150316 | Can Seam Inspection - A method of determining integrity of a can seam including disposing the can seam between an X-ray source and an X-ray detector, exposing an overlap region of the can seam to radiation from the source, and determining an indication of integrity of the overlap region from a measure of variation in radiation intensity readings taken by the detector over a series of circumferential intervals of the can seam. | 06-23-2011 |
20110150317 | SYSTEM AND METHOD FOR AUTOMATICALLY MEASURING ANTENNA CHARACTERISTICS - An apparatus for automatically measuring characteristics of an antenna recognizes an object of the antenna based on an antenna image received from an external image capturing device, and extracts a parameter by using the recognized object of the antenna. The apparatus then authentically controls the position and direction of the image capturing device and an antenna characteristic measurement instrument by using the extracted parameter to thus automatically measure the characteristics of the antenna. | 06-23-2011 |
20110164806 | METHOD AND SYSTEM FOR LOW COST INSPECTION - A method for macro inspection, the method includes: (i) concurrently illuminating a current group of spaced apart object sub areas; wherein light reflected in a specular manner from a certain object sub area of the current group of object sub areas is expected to be detected by a certain sensor element of a current group of spaced apart sensor elements that correspond to the current group of spaced apart object sub areas; wherein the object sub areas are spaced apart so as to reduce a probability of a detection of non-specular light from the object; wherein each image sub area comprises multiple pixels; (ii) obtaining image information from the current group of spaced apart sensor elements; and (iii) processing at least a portion of the image information to provide an inspection result. | 07-07-2011 |
20110170762 | OPTICAL WEB-BASED DEFECT DETECTION USING INTRASENSOR UNIFORMITY CORRECTION - Techniques are described in which an image capture device captures image data from web material. The image data comprises pixel values for the cross-web field of view of the image capture device. An analysis computer includes a computer-readable medium that stores parameters for a plurality of different normalization algorithms to normalize a cross-web background signal for the image capture device to a common desired value. The computer-readable medium further stores coefficients specifying a weighting for each of the plurality of normalization algorithms. The analysis computer computes a normalized value for each of the pixels of the image data as a weighted summation of results from application of at least two of the pixel normalization algorithms using the stored parameters. | 07-14-2011 |
20110170763 | RAPID COLOR VERIFICATION SYSTEM USING DIGITAL IMAGING AND CURVE COMPARISON ALGORITHM - A system for monitoring paint color across regions of a vehicle and for identifying color mismatches and for dynamically determining the acceptability of an identified mismatch is disclosed. The system includes a vehicle image acquisition array of one or more digital cameras for digitally scanning selected regions of the vehicle and an image analyzer connected to the vehicle image acquisition system. The image analyzer is initially programmed with upper and lower standard confidence color curves. The image analyzer includes software programmed with an analysis algorithm to convert an image of one of the scanned regions acquired by the vehicle image acquisition array into a standard image format from which actual individual color curves are extracted and to compare the extracted color curves against the standard confidence color curves to determine whether or not the extracted color curves fall within the upper and lower standard confidence color curves by establishing a percentage match for one of the scanned regions. The initially programmed upper and lower standard confidence color curves may be adjusted during color testing based upon accumulated extracted color curves of the selected regions. | 07-14-2011 |
20110182495 | SYSTEM AND METHOD FOR AUTOMATIC DEFECT RECOGNITION OF AN INSPECTION IMAGE - A method for an anomaly detection method is provided. The method includes acquiring at least one two-dimensional or three-dimensional or n-dimensional inspection test image data of a scanned object. The method further includes partitioning the inspection test image data of the scanned object into multiple sub-regions. The method also includes computing one or more texture metrics for each sub-region. Finally, the method includes discriminating between an anomalous and a non-anomalous region in the scanned object according to one or more values of the computed texture metrics and identifying one or more anomalies in the inspection test image data. | 07-28-2011 |
20110188730 | SYSTEM AND METHOD FOR VERIFYING MANUFACTURING CONSISTENCY OF MANUFACTURED ITEMS - In a method and system for verifying manufacturing consistency of manufactured items, N point clouds of the manufactured items are read. A first point cloud is selected from the N point clouds, and each point of the first point cloud is projected onto a predetermined ideal outline for obtaining a nearest point in the ideal outline of each point of the first point cloud. Intersections of the N point clouds and each line formed by a point in the first point cloud and the nearest point of the point are further determined, and a vertical distance between each of the intersections and the ideal outline is calculated for obtaining a deviation value of each of the intersections. At least one outline is fitted according to the deviation values of each of the intersections and the at least one fitted outline is output to a display device. | 08-04-2011 |
20110188731 | METHOD AND APPARATUS FOR DETECTING SURFACE UNEVENNESS OF OBJECT UNDER INSPECTION - Minute surface unevenness formed on the surface of an object under inspection is detected, thereby improving the accuracy of an appearance inspection. A target surface in the sidewall region ( | 08-04-2011 |
20110200245 | INTEGRATION OF MANUFACTURING CONTROL FUNCTIONS USING A MULTI-FUNCTIONAL VISION SYSTEM - A manufacturing control system comprises a vision system for viewing operations within a manufacturing area and for producing vision data representing the viewed operations. A systems control analyzes the vision data, and controls at least two control functions related to the manufacturing operations based on the analyzed vision data. | 08-18-2011 |
20110200246 | Method of Measuring Overlay Error and a Device Manufacturing Method - The overlay error of a target in a scribelane is measured. The overlay error of the required feature in the chip area may differ from this due to, for example, different responses to the exposure process. A model is used to simulate these differences and thus a more accurate measurement of the overlay error of the feature determined. | 08-18-2011 |
20110206269 | METHODS OF EVALUATING THE QUALITY OF TWO-DIMENSIONAL MATRIX DOT-PEENED MARKS ON OBJECTS AND MARK VERIFICATION SYSTEMS - Methods and mark verification systems for evaluating the quality of a two-dimensional matrix dot peen mark on an object are provided. An exemplary embodiment of the methods includes scanning a two-dimensional matrix dot peen mark disposed on a surface of an object with a laser displacement sensor to generate three-dimensional scanned data for the mark, the mark including a plurality of dots disposed in a plurality of rows and columns on the surface; and determining whether the mark passes a verification test based on the scanned data. | 08-25-2011 |
20110211747 | APPARATUS AND METHOD FOR THE AUTOMATED MARKING OF DEFECTS ON WEBS OF MATERIAL - A system for the characterization of webs that permits the identification of anomalous regions on the web to be performed at a first time and place, and permits the localization and marking of actual defects to be performed at a second time and place. | 09-01-2011 |
20110222754 | SEQUENTIAL APPROACH FOR AUTOMATIC DEFECT RECOGNITION - A method of automatic defect recognition includes receiving a initial set of inspection image data of a scanned object from a scanning machine; applying a first image analysis algorithm to this set of inspection image data; then removing from the set of inspection image data any defect-free image regions, so as to retain a set of analyzed inspection image data; applying an additional image analysis algorithm(s) to the set of analyzed inspection image data, wherein the additional algorithm(s) has a higher computational cost than the first image analysis algorithm; and based on the applying of the additional image analysis algorithm(s), removing from the first set of inspection image data a second set of defect-free image regions, thereby retaining a set of twice-analyzed inspection image data. | 09-15-2011 |
20110222755 | DEVICE, METHOD AND COMPUTER READABLE MEDIUM FOR EVALUATING SHAPE OF OPTICAL ELEMENT - A method for evaluating a shape of an optical element, including: executing polynomial approximation to obtain a deviation shape of a testing surface of an optical element with respect to an ideal surface; calculating an evaluation shape by extracting a rotationally symmetric irregularity component of the deviation shape from a result of the polynomial approximation; adding a 2 | 09-15-2011 |
20110235894 | METHOD FOR DETECTING OPTICAL DEFECTS IN TRANSPARENCIES - A method of detecting optical defects in a transparency may comprise the steps of providing a digital image of the transparency having a plurality of image pixels and detecting at least one candidate defect. The candidate defect may be detected by determining a grayscale intensity of each one of the image pixels and calculating an intensity gradient across adjacent pairs of the image pixels. Each image pixel may be assigned a gradient value comprising a maximum of the absolute value of the intensity gradients associated with the image pixel. A gradient image may be constructed comprising the gradient values assigned to corresponding ones of the image pixels. Image pixels may be identified as candidate pixels if such image pixels have a gradient value exceeding a gradient threshold. The candidate pixels may comprise the optical defect. | 09-29-2011 |
20110243423 | SYSTEM AND METHOD FOR INSPECTING ELECTRICAL STIMULATION LEADS - In one embodiment, a method of inspecting a lead body comprising a plurality of wire conductors helically wound in groups separated by respective gaps, the system comprises: providing a lead body comprising a plurality of wire conductors, helically wound in groups separated by respective gaps, in transparent insulative material, in a channel of a fixture; providing a sensor module; scanning the sensor module along a substantial length of the lead body to obtain image, interferometric, or other data of the lead body; electronically processing the data to calculate respective distances from given turns within a group of the wire conductors from an other sheath of the lead body; determining whether the calculated respective distances correspond to expected values within defined tolerances; and generating an inspection report for the lead body based on the determining. | 10-06-2011 |
20110249884 | CHECKING APPARATUS AND METHOD FOR CHECKING HOLES POSITION AND SIZE IN A PLATE - A checking apparatus for checking holes position and size in a plate. The checking apparatus includes a memory, an image obtaining unit and a processor. The memory stores a file. The file records an expected number, size and placement of pixels representing the holes and a pixel value. The image obtaining unit obtains an image of the plate. The processor determines a target region in the image according to the values recorded in the file, scans the target region to obtain the number and placement of pixels representing the hole in the target region with a value equal to a pixel value. In addition, the processor compares the obtained number and placement of pixels representing the hole with the expected number and placement of pixels, and generates a signal to indicate the holes defined in the target region are defective if the obtained number and placement of pixels do not match the expected number and placement of pixels. A method for checking holes position and size in a plate is also disclosed. | 10-13-2011 |
20110255768 | Method and System for Automated Ball-Grid Array Void Quantification - A method and system for identifying voids in solder balls in a ball-grid array (BGA) using an image of the BGA include localizing an image of a solder ball on the BGA image, the solder ball image having a radius and having multiple points each having an image intensity, and producing a void-free model image of the solder ball based on the radius of the solder ball image, the void-free model image having multiple points each having an image intensity. The method and system also include computing a difference between the image intensities of the points of the solder ball image and the image intensities of the points of the void-free model image to produce a residual image, and identifying a void using the residual image. | 10-20-2011 |
20110255769 | MACHINE PERFORMANCE TESTING METHOD AND DEVICE - A transparent panel is used to acquire a test sample from a machine to be tested; where the test sample includes at least one object placed on the transparent panel by the machine to be tested. A scanning device is used to scan the transparent panel to obtain image data and a computing device is used to determine the operation accuracy of the machine to be tested according to the image data from the scanning device. These devices may be used for machine performance testing and acquiring an image of the test sample. | 10-20-2011 |
20110262026 | INSPECTION APPARATUS AND DEFECT DETECTION METHOD USING THE SAME - An inspection apparatus includes: a feature detection section for detecting first feature portions of at least two objects among a plurality of objects from images based on a first condition; a feature discrimination section for discriminating a first feature portion of a first object and a first feature portion of a second object based on the first feature portions of the at least two objects; a defect detection section for detecting a first defect portion of the first object and a first defect portion of the second object based on the first feature portions of the first object and the second object; and a display section for displaying information indicative of the first defect portion of the first object and information indicative of the first defect portion of the second object together with the images. | 10-27-2011 |
20110268343 | METHOD FOR THE NONDESTRUCTIVE TESTING OF PIPES - The invention relates to a method for the nondestructive testing of pipes made of ferromagnetic steel for flaws by means of stray flux, wherein the pipe is magnetized by a constant field and the discontinuities present in the near-surface region of the outer or inner surface of the pipe cause magnetic stray fluxes, which exit the pipe surface and are detected by probes of a test unit each for longitudinal and/or transversal flaw testing, wherein the association of the detected amplitude signals is performed on the basis of the amplitude height and/or the frequency spectrum with respect to an external or internal flaw via defined flaw thresholds respectively. To this end, prior to associating the detected amplitude signals to an external or internal flaw, the angular position of the flaw relative to the respective magnetic field direction is determined, and a correction of the signals is carried out via a previously determined correction factor for amplitudes and/or frequencies of a perpendicular angular position. | 11-03-2011 |
20110293166 | METHOD AND SYSTEM FOR DETERMINING THE QUALITY OF PHARMACEUTIAL PRODUCTS - Thermographic imaging is used to monitor quality parameters of pharmaceutical products ( | 12-01-2011 |
20110317906 | AUTOMATICALLY DETERMINING MACHINE VISION TOOL PARAMETERS - A method for automatically determining machine vision tool parameters is presented, including: marking to indicate a desired image result for each image of a plurality of images; selecting a combination of machine vision tool parameters, and running the machine vision tool on the plurality of images using the combination of parameters to provide a computed image result for each image of the plurality of images, each computed image result including a plurality of computed measures; comparing each desired image result with a corresponding computed image result to provide a comparison result vector associated with the combination of machine vision tool parameters, then comparing the comparison result vector associated with the combination of machine vision tool parameters to a previously computed comparison result vector associated with a previous combination of machine vision tool parameters using a result comparison heuristic to determine which combination of machine vision tool parameters is best overall. | 12-29-2011 |
20110317907 | Optimized Distribution of Machine Vision Processing - A system and method is provided for remotely analyzing machine vision data. An indication of a choice of vision software is sent from a first computer to a remote second computer. The second computer, using the selected vision software, processes image data to provide a result that is transmitted from the second computer to a designated location. | 12-29-2011 |
20120020545 | COMPONENT PRESENCE/ABSENCE JUDGING APPARATUS AND METHOD - A component presence/absence judging apparatus judges the presence/absence of components through a registration step and an inspection step. The registration step includes an ante-mounting feature acquisition step, a post-mounting feature acquisition step and a classifier configuration step. At the ante-mounting and post-mounting feature acquisition steps, ante-mounting features and post-mounting features are respectively acquired from an ante-mounting image and a post-mounting image taken at each of predetermined places on an ante-mounting board and a post-mounting board. At the classifier configuration step, a classifier is configured by registering the ante-mounting features and the post-mounting features as training data to a support vector machine. Then, at the inspection step, the presence/absence of a component at each of the predetermined places on each post-mounting operation board to be inspected is judged by inputting post-mounting operation features acquired from each of the predetermined places on each post-mounting operation board to the support vector machine configured as the classifier. | 01-26-2012 |
20120057773 | INSPECTION RECIPE GENERATION AND INSPECTION BASED ON AN INSPECTION RECIPE - System, computer readable medium and method. The system includes (i) a data obtaining module arranged to obtain data about at least one portion of an inspected article; and (ii) a processor arranged to perform at least one processing operation of the data out of: (a) processing the data to provide the inspection recipe; and (b) processing the data, while utilizing the inspection recipe, to detect defects; wherein the inspection recipe comprises multiple zones of multiple types of zones; wherein a zone of a first type of zones differs from a zone of a second type of zone. | 03-08-2012 |
20120070063 | INSPECTION METHOD AND INSPECTION APPARATUS - The application relates to a method of inspecting an object and an inspection apparatus. The object has a plurality of features and the method includes the step of identifying a current primary feature on the object. Once the current primary feature has been selected, one or more additional features are selected, each of the one or more additional features selected having at least one common attribute with the current primary feature. The method also includes the step of capturing an image of the selected features on an image capture module. | 03-22-2012 |
20120076392 | Fault Detection of a Printed Dot-Pattern Bitmap - Embodiments of the present invention enable fault detection in a printed dot-pattern image. Certain applications of the present invention are its use in various embodiments of a system for inspection of a printed circuit board (“PCB”) substrate. In embodiments, a generated distortion map is based on a comparison of a reconstructed dot-pattern image, a simulated reference bitmap, and an error map representing differences between the reconstructed dot-pattern image and the reference bitmap. In embodiments, the pixels of the distortion map are color coded to identify the locations and types of aberrations that were discovered as a result of the comparison. | 03-29-2012 |
20120087566 | APPARATUS AND METHOD FOR INSPECTING SURFACE STATE - A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain. | 04-12-2012 |
20120087567 | HARDNESS TESTER - A hardness tester includes a monitor capable of displaying a main screen and assistant screen. A first test location setter sets a coordinate point of an indentation formation location, and stores a setting condition of the set coordinate point and the surface image of a first test specimen. A second test location setter displays the surface image of the first test specimen in the assistant screen when a surface image of a second test specimen is displayed on the main screen, and, when a reference coordinate is set on the surface image of the second test specimen, determines a coordinate point of an indentation formation location based on the set reference coordinate and the setting condition of the coordinate point stored by the first test location setter. | 04-12-2012 |
20120093391 | METHOD AND SYSTEM FOR REMOTE REWORK IMAGING FOR PART INCONSISTENCIES - A system and method for remote rework imaging a part for an inconsistency is provided. The part is scanned with a nondestructive inspection device. An image of a part inconsistency is communicated from the nondestructive inspection device to a programmable device. The image of the part inconsistency is viewed with the programmable device. The image of the part inconsistency is edited with the programmable device using an input device in communication with the programmable device. The edited image is communicated from the programmable device to a visible light projector. The edited image is projected onto the part inconsistency using the visible light projector. | 04-19-2012 |
20120106824 | Methods and Systems Involving Measuring Complex Dimensions of Silicon Devices - A method for measuring a dimension of a device includes receiving an image of a portion of the device, receiving a first offset value and a second offset value, processing the image to define a least one graph of a line of pixels, the at least one graph including the brightness level of each pixel in a line of pixels, identifying a location of a first peak and a second peak in the graph, defining a first exclusion area boundary, defining a second exclusion area boundary, setting the brightness level of the pixels between the first exclusion area boundary and the second exclusion area boundary to zero, identifying a first portion of the feature of interest and a second portion of the feature of interest, and measuring a distance between the first portion of the feature of interest and the second portion of the feature of interest. | 05-03-2012 |
20120106825 | Dimple position dectection device and dimple position detecting method for disk drive suspension - A dimple position detection device for detecting a position of a dimple formed on a load beam is provided with an illumination device, imaging device, and image processing section. The illumination device directs illumination light toward the dimple. The imaging device receives reflected light from the dimple. The image processing section binarizes an image obtained by the imaging device. The image processing section maximizes a binarization level, binarizes the reflected light image, determines whether an area of a light spot region or on-region above the binarization level has a predetermined value, reduces the binarization level when the area of the light spot region is less than the predetermined value, and calculates the gravitational position of the light spot region with the predetermined value reached by the light spot region area. | 05-03-2012 |
20120163698 | Method for Inspection and Detection of Defects on Surfaces of Disc-Shaped Objects and Computer System with a Software Product for Carrying out the Method | 06-28-2012 |
20120183199 | SUBSTRATE IDENTIFICATION AND TRACKING THROUGH SURFACE REFLECTANCE - A method of identifying individual silicon substrates, and particularly solar cells, is disclosed. Every solar cell possesses a unique set of optical properties. The method identifies these properties and stores them in a database, where they can be associated to a particular solar cell. Unlike conventional tracking techniques, the present method requires no dedicated space on the surface of the silicon substrate. This method allows substrates to be tracked through the manufacturing process, as well as throughout the life of the substrate. | 07-19-2012 |
20120207379 | Image Inspection Apparatus, Image Inspection Method, And Computer Program - The present invention provides an image inspection apparatus and a method which remove noise even when there is a change in brightness of a multi-valued image, and which inspect a defect, and relates to a computer program. A multi-valued image is acquired, and a reference intensity value based on intensity information for the image is calculated. A difference for each pixel between the intensity value and the reference intensity value is calculated, and a threshold value to track and change in response to a change in the reference intensity value is set and stored. Pixels that have a calculated difference that is larger than the threshold value is extracted, and an aggregate body of pixels based on a connectivity of the intensity value of the extracted pixels is specified, and a characteristic amount using the difference is calculated. A defect is discriminated based on the calculated characteristic amount. | 08-16-2012 |
20120207380 | METHOD FOR ANALYZING THE QUALITY OF A GLAZING UNIT - A method for analyzing quality of a glazing unit including: generating a digital image of a test chart produced in reflection by an outer surface of the glazing, the test chart presenting a pattern composed of a plurality of contrasted elements defining between them interface lines; calculating quantities representative of the glazing from the image generated, the calculation being carried out by a processing unit; and comparing the calculated values for the representative values relative to reference values. The representative quantities are representative of a deformation of the image of the test chart produced in reflection by the outer surface of the glazing. | 08-16-2012 |
20120213425 | COMBINING FEATURE BOUNDARIES - A method of forming a combined feature boundary based on boundaries of first and second overlapping features includes dividing the boundaries of the first and second overlapping features into line segments of known shape, identifying crossing points formed by the line segments, calculating parametric coordinates of the crossing points, and determining a sequence of crossing point evaluation based on the parametric coordinates. The method also includes calculating first and second cross products based on the line segments forming first and second crossing points in the determined sequence, and choosing first and second paths of the combined feature boundary according to mathematical signs of the cross products, wherein the combined feature boundary includes the first and second crossing points and portions of at least one of the first and second feature boundaries defining the first and second paths. | 08-23-2012 |
20120243770 | PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD - In accordance with an embodiment, a pattern inspection method includes: applying a light generated from a light source to the same region of a substrate in which an inspection target pattern is formed; guiding, imaging and then detecting a reflected light from the substrate, and acquiring a detection signal for each of a plurality of different wavelengths; and adding the detection signals of the different wavelengths in association with an incident position of an imaging surface to generate added image data including information on a wavelength and signal intensity, judging, by the added image data, whether the inspection target pattern has any defect, and when judging that the inspection target pattern has a defect, detecting the position of the defect in a direction perpendicular to the substrate. | 09-27-2012 |
20120243771 | THREE-DIMENSIONAL ULTRASONIC INSPECTION APPARATUS - A three-dimensional ultrasonic inspection apparatus | 09-27-2012 |
20120294506 | METHOD AND DEVICE FOR INSPECTING A TRAVELING WIRE CABLE - A wire cable is exposed to flashes and the exposed image is detected on at least one lay length or a multiple of the lay length and monitored for changes in the image. Preferably, the respective repetition of the same outer stranded wire of the traveling wire cable is detected in the same location and every repetition or every other repetition or every third repetition is used for triggering the flash. In another embodiment, a picture is taken of a large portion of the wire cable using a specialized camera and the image is split up, into recurring units of length that correspond to the size of a lay length or a multiple of the lay length and the successive units of length are compared and inspected for changes in the image. | 11-22-2012 |
20130004055 | AUTHENTICITY DETERMINATION SUPPORT DEVICE, AUTHENTICITY DETERMINATION DEVICE, COMPUTER READABLE MEDIUM, AND AUTHENTICITY DETERMINATION SUPPORT METHOD - An authenticity determination support device includes an acquiring unit and a compressing unit. The acquiring unit photographs, in a solid having a unique random feature in a surface thereof, a predetermined area in the surface such that continuity of the feature is generated in a predetermined direction, and thereby acquires feature information representing the feature included in the area. The compressing unit compresses the feature information in a direction in which continuity of the feature information acquired by the acquiring unit is high. | 01-03-2013 |
20130016894 | METHOD AND SYSTEM FOR CALCULATING WEIGHT OF VARIABLE SHAPE PRODUCT MANUFACTURED FROM PRODUCT BLANK - A computerized system, method, and computer-readable media implementing a method for determining a weight of a product, and optionally its shipping weight and postage are described. A product having a variable shape in two dimensions wherein the shape is defined in the two dimensions by a set of cutlines is manufactured from a product blank of known weight. The weight of the product is determined from the number of pixels in a scaled image of the cutlines, the image having the same aspect ratio as the product blank. The weight of the product blank and the ratio of the pixels to corresponding to product surface area relative to the total number of pixels in the image are used to calculated the actual weight of the product. | 01-17-2013 |
20130028503 | CONDUCTIVE FILM MANUFACTURING METHOD, CONDUCTIVE FILM, AND RECORDING MEDIUM - Disclosed is a method for manufacturing a conductive film in which a mesh pattern comprising a wire material is provided on a base material. Also disclosed are a conductive film and a recording medium. Image data representing a mesh pattern is created on the basis of a plurality of selected positions. On the basis of said image data, an evaluation value which quantifies noise characteristics of the mesh pattern is computed. On the basis of the computed evaluation value and prescribed evaluation conditions, one image datum is chosen as an output image datum. | 01-31-2013 |
20130028504 | PARTS MANIPULATION, INSPECTION, AND REPLACEMENT - Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a flipper mechanism. After being inspected at a first station, a tray-transfer device moves the tray from the first inspection station to a flipper mechanism. The flipper mechanism includes two jaws, a mover, and a rotator. The flipper mechanism turns the devices over and places the devices in a second tray so that another surface of the device can be inspected. A second tray-transfer device moves the second tray from the flipper to a second inspection station. The mover of the flipper mechanism removes the tray from the first inspection surface and places a tray at the second inspection surface. | 01-31-2013 |
20130034293 | SYSTEM FOR DEFECT DETECTION AND REPAIR - A system for identifying a repair cut location for a defect in a liquid crystal device includes receiving an input image, a defect mask image, and a landmark structure image. The system determines a repair cut location, based upon the input image, the defect mask image, and the landmark structure image, for a liquid crystal device proximate the defect. The determination may be based upon a type of said defect, a cause of said defect, a position of said defect, and a spatial relationship of the defect and a structure of the landmark image. | 02-07-2013 |
20130034294 | Method for the Linear Structuring of a Coated Substrate for the Production of Thin-Film Solar Cell Modules - Method for the linear structuring of a coated substrate for producing thin-film solar cell modules in which tracks are introduced in an upper structure plane so as to be adapted to the path of existing tracks in a lower structure plane in that a structuring tool is controlled in y direction by means of a control quantity which is derived from image recordings of the existing tracks, and the substrate is moved back and forth under the structuring tool. The image recordings for acquiring existing tracks are carried out only during the forward passes. The generation of tracks takes place during the forward passes and backward passes. | 02-07-2013 |
20130039563 | METHOD OF GENERATING INSPECTION PROGRAM - A method of generating an inspection program that does not have a gerber file is shown. To generate the inspection program, a first image information is acquired by scanning a bare board, a second image information is acquired by scanning a solder-pasted board that solder is pasted on a pad area of the bare board, and by analyzing the first image information and the second image information an inspection program is generated. The first image information and the second image information may include at least one of a two-dimensional image information and a three-dimensional image information. The step for generating an inspection program calculates a difference between the first image information and the second image information, after extracting a position and a size of an area in which the difference occurs, then generates the inspection program by using the extracted information. Therefore, a bare board and a solder-pasted board may be each inspected and the accurate position and size of the solder pasted area may be extracted through analyzing the acquired two-dimensional image information or a three-dimensional image information differences. | 02-14-2013 |
20130044936 | System and Method for Identifying Defects in a Material - Described are computer-based methods and apparatuses, including computer program products, for identifying defects in a material. A set of features is identified based on an image of a material, wherein each feature in the set of features is a candidate portion of a defect in the material. A set of chained features is selected based on the set of features, wherein each chained feature comprises one or more features that represent candidate portions of a same defect in the material. A defect in the material is identified based on the set of chained features and the image. | 02-21-2013 |
20130051652 | Method and Device for the Automatic Inspection of a Cable Spool - Method for detecting and evaluating the protrusions that appear on cords coming from a twisting/rubberizing process, by the digital processing of the image of a layer of cord formed by a number of turns wound around the core of a spool ( | 02-28-2013 |
20130071006 | Image Analysis of Processor Device Features - A method includes receiving an image of a scan area that includes a feature of interest, receiving and analyzing a design specification for features in the scan area, generating an intensity graph corresponding to a portion of the image, calculating with a processor, slopes of portions of the intensity graph to identify the feature of interest, applying portions of the design specification to the intensity graph to identify peaks that correspond to edges of the feature of interest, applying a logical function to the identified peaks to calculate a distance between the identified peaks, determining whether the calculated distance is within tolerances of the design specification, and outputting an error indication to a display responsive to determining that the calculated distance is not within tolerances of the design specification. | 03-21-2013 |
20130077849 | METHOD FOR INSPECTING MEASUREMENT OBJECT - An inspection method for inspecting a device mounted on a substrate, includes generating a shape template of the device, acquiring height information of each pixel by projecting grating pattern light onto the substrate through a projecting section, generating a contrast map corresponding to the height information of each pixel, and comparing the contrast map with the shape template. Thus, a measurement object may be exactly extracted. | 03-28-2013 |
20130083990 | Using Videogrammetry to Fabricate Parts - According to various embodiments, a stream of image frames depicting a structure in a scene are obtained. The stream of image frames may comprise first image frames from a first imaging device and second image frames from a second imaging device. Using the first image frames and the second image frames, a wireframe of at least a portion of the structure is generated. From the wireframe, as-built dimensions may be identified, materials estimates may be determined, and/or data for a fabrication device may be generated, for example. | 04-04-2013 |
20130083991 | PROCESS FOR PRODUCING AND DELIVERING MATCHING COLOR COATING AND USE THEREOF - The present invention is directed to a process for repairing one or more defects of a target coating of a vehicle. The process can repair target coatings at a repair facility using matching coating compositions provided from a supply center, where the matching coating compositions can be produced according to target repair data transmitted from one or more repair facilities to the supply center. The present invention is also directed to a system for repairing one or more defects of a target coating of a vehicle. The system can comprise one or more supply centers and one or more repair facilities. | 04-04-2013 |
20130101201 | IDENTIFYING AND LOCATING POSSIBLE LINES CORRESPONDING TO PALLET STRUCTURE IN AN IMAGE - A computer-implemented method is provided for finding a Ro image providing data corresponding to possible orthogonal distances to possible lines on a pallet in an image. The method comprises: acquiring a grey scale image including one or more pallets; determining, using a computer, a horizontal gradient image by convolving the grey scale image and a first convolution kernel; determining, using the computer, a vertical gradient image by convolving the grey scale image and a second convolution kernel; and determining, using the computer, respective pixel values of a first Ro image providing data corresponding to a possible orthogonal distance from an origin point of the grey scale image to one or more possible lines on one or more possible pallets in the grey scale image. | 04-25-2013 |
20130101202 | IDENTIFYING, EVALUATING AND SELECTING POSSIBLE PALLET BOARD LINES IN AN IMAGE SCENE - A method is provided for determining which of a plurality of possible lines is most likely to be an actual line passing through a possible corner of a pallet. The method may comprise: providing a Ro image comprising pixels valued to generally correspond to an orthogonal distance from an origin point in the Ro image to one or more possible lines in a corresponding grey scale image; providing, using a computer, a location in the Ro image corresponding to a possible pallet corner; defining, using the computer, a plurality of possible lines passing through the possible pallet corner, each of the possible lines being respectively oriented at one angle within a range of angles to an axis of the Ro image; and determining, using the computer, which of the plurality of possible lines is most likely to be the actual line passing through the possible pallet corner. | 04-25-2013 |
20130101203 | IDENTIFYING AND EVALUATING MULTIPLE RECTANGLES THAT MAY CORRESPOND TO A PALLET IN AN IMAGE SCENE - A method is provided for evaluating a possible pallet structure. The method comprises: providing a gray scale image comprising one or more possible lines; providing respective pixel locations in the gray scale image for an estimated upper left corner and an estimated upper right corner; calculating, using a computer, a value h based on the estimated upper left corner location and the estimated upper right corner location; estimating, using the computer, a first hole with a first rectangle having a height h; estimating, using the computer, a second hole with a second rectangle having the height h; and estimating, using the computer, the possible center stringer with a third rectangle having the height h. | 04-25-2013 |
20130101204 | GENERATING A COMPOSITE SCORE FOR A POSSIBLE PALLET IN AN IMAGE SCENE - A method is provided for evaluating a possible pallet object in a gray scale image including one or more pallets. The method may comprise: generating, by a computer, a first confidence score Score | 04-25-2013 |
20130108143 | COMPUTING DEVICE AND METHOD FOR ANALYZING PROFILE TOLERANCES OF PRODUCTS | 05-02-2013 |
20130108144 | ELECTRONIC DEVICE AND METHOD FOR LOCATING MARKED NUMBER IN IMAGE OF OBJECT | 05-02-2013 |
20130108145 | Intrinsic Physical Layer Authentication of Integrated Circuits | 05-02-2013 |
20130114878 | System and Method for Automated Defect Detection Utilizing Prior Data - A system and method for performing automated defect detection by utilizing data from prior inspections is disclosed. The system and method may include providing a image capture device for capturing and transmitting at least one current image of an object and providing a database for storing at least one prior image from prior inspections. The system and method may further include registering the at least one current image with the at least one prior image, comparing the registered at least one current image with the at least one prior image to determine a transformation therebetween and updating the database with the at least one current image. | 05-09-2013 |
20130129182 | Method of Monitoring the Appearance of the Surface of a Tire - Method for detecting an anomaly on the surface of a tire comprising the following steps in the course of which: A—the image of a given anomaly present on the surface of at least one tire is produced, B—with the aid of a collection of filters, a multivariate image of the said surface is constructed in a space of the filters, in which each pixel is represented in the form of a pixel vector, the components of each pixel vector having a value corresponding to the value of this pixel in the image transformed with the aid of each of the filters of the said collection, C—with the aid of a linear function, this multivariate image is transformed from the space of the filters into a spectral space of given dimension whose variables are the filters or combinations of filters of the said collection, so as to form a spectral image, D—a classifier is constructed by determining, for this anomaly, those zones representative of the spectral space which contain, in a statistically representative manner, the points of the spectral image of the said anomaly transformed into the said spectral space. | 05-23-2013 |
20130129183 | Image Processing Apparatus And Image Processing Method - Provided is an image processing apparatus capable of viewing even a characteristic portion of an inspection object even if partial image data of the inspection object is used for inspection. The image processing apparatus includes: an imaging portion for imaging an inspection object; a compression processing portion for executing compression processing on image data captured by the imaging portion, to generate compressed image data; and an image processing portion for executing image processing for an inspection. The image processing portion generates partial image data as part of the captured image data, and accepts a selection of any of the compressed image data and the partial image data as the image data for use in the image processing. The image processing portion executes the image processing for the inspection by use of the compressed image data or the partial image data, the selection of which has been accepted. | 05-23-2013 |
20130129184 | METHODS AND SYSTEMS FOR DIMENSIONAL INSPECTION OF COMPENSATED HARDWARE - A manufacturing method is adapted for materials that are susceptible to deformation during the manufacturing process, such as composite parts that change shape during curing. The method includes modifying a part design to compensate for changes in the shape of the part that occur during a curing phase of the manufacturing process. A manufacturing mold is created according to the modified part design, then a part is formed in the mold and cured in the mold. While the part is still in the mold after the curing phase, the part is finished according to the modified part design wherein excess material is removed and apertures are created. While the part is still in the mold after the finishing phase, the finished part is inspected using automated inspection equipment to confirm that the finished part conforms to the modified part design. | 05-23-2013 |
20130129185 | METHOD FOR DETECTING OPTICAL DEFECTS IN TRANSPARENCIES - A method of detecting optical defects in a transparency may comprise the steps of providing a digital image of the transparency having a plurality of image pixels and detecting at least one candidate defect. The candidate defect may be detected by determining a grayscale intensity of each one of the image pixels and calculating an intensity gradient across adjacent pairs of the image pixels. Each image pixel may be assigned a gradient value comprising a maximum of the absolute value of the intensity gradients associated with the image pixel. A gradient image may be constructed comprising the gradient values assigned to corresponding ones of the image pixels. Image pixels may be identified as candidate pixels if such image pixels have a gradient value exceeding a gradient threshold. The candidate pixels may comprise the optical defect. | 05-23-2013 |
20130129186 | DETECTION OF NON-COMPLIANCE PATTERNS IN PRESCRIBED MEDICATION DOSES - Apparatus for detecting non-compliance patterns on a series of used blister sheets previously returned by the same patient, reads a code ( | 05-23-2013 |
20130129187 | PERSISTENT FEATURE DETECTION - Methods are presented for improved detection of persistent or systematic defects induced during the manufacture of a product. In particular, the methods are directed to the detection of defects induced systematically in the manufacture of photovoltaic cells and modules. Images acquired from a number of samples are combined, enhancing the systematic defects and suppressing random features such as variations in material quality. Once a systematic defect is identified, steps can be taken to locate and rectify its cause. | 05-23-2013 |
20130148875 | METHODS AND SYSTEMS FOR PROCESSING IMAGES FOR INSPECTION OF AN OBJECT - Methods and systems for processing images are provided. One method includes obtaining a plurality of images corresponding to at least one area of an object and performing a rectification of at least some of the plurality of images using a reference structure. The method also includes performing a gradient vector field analysis on the rectified plurality of images of the object to identify anomaly regions within the object. | 06-13-2013 |
20130156292 | COMPUTING DEVICE AND METHOD FOR EXTRACTING DATA OF PRODUCT FOR USE IN CONSTRUCTION OF POINT CLOUD - In a method for extracting data of a product, an electronic design document related to the product and point cloud created using actual measurements of the product are received. The point cloud includes points of the product. The method aligns the curved surface of the product with the corresponding portion of the point cloud using a best-fit method, creates a maximum space box for a feature element of the product, and deletes points that are not within the maximum space box. According to an average distance between two neighboring points of the point cloud, the maximum space box can be divided into many small space boxes. Using the small space boxes, the points are filtered to form a feature element. | 06-20-2013 |
20130163847 | Method and Apparatus for Locating Objects - Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion. | 06-27-2013 |
20130163848 | METHOD AND APPARATUS FOR INSPECTION OF COMPONENTS - The quality of a dry film lubricant coating or molybdenum based undercoat coating provided on the root of a gas turbine fan blade is determined by a method which includes providing an image of the coating taken under controlled conditions which include diffusing light through a translucent screen. The difference between an RGB value of a group of pixels from the image compared with a known RGB value is determined and used to calculate the quality of the coating. | 06-27-2013 |
20130163849 | APPARATUS AND METHOD FOR AUTOMATIC INSPECTION OF THROUGH-HOLES OF A COMPONENT - An apparatus and a method for automatic inspection of through-holes of a component is provided. The proposed apparatus includes an imaging module, an image processing module and an analysis module. The imaging module generates a thermographic image of the component by passing a medium through the through-holes and capturing infra-red radiation emitted from the component while the medium is flowing through the through-holes. The image processing module fits the thermographic image on a digital image obtained from geometrical data of the component. The image processing module is further masks the fitted thermographic image using a digital image mask to extract regions corresponding to through-holes in the thermographic image. The digital image mask is computed based on a determination of positions of through-holes on the digital image. The analysis module evaluates the masked thermographic image to determine an irregularity or blockage in one or more of the through-holes. | 06-27-2013 |
20130170731 | Image Processing Device And Image Processing Method - A reference image to serve as a reference for a non-defective determination is previously stored in association with identification information for identifying an inspection object. An image of the inspection object is displayed side by side with the reference image of corresponding identification information. A drawn position of the reference image and a drawn position of the acquired image are aligned, adjustment is made so as to make brightness of the reference image coincide with brightness of the acquired image, and adjustment is made so as to make a focus on the reference image coincide with a focus on the acquired image. Adjustment is made so as to make a focus of the reference image coincide with a focus of the acquired image. | 07-04-2013 |
20130170732 | MEDICINE PACK INSPECTING SYSTEM - A medicine pack inspecting system includes a packing instruction unit that generates packing instruction information, a tablet packing unit that encloses tablets in a medicine pack, an image capturing unit that generates a medicine pack image, and a tablet inspecting unit that inspects the number of tablets enclosed in the medicine pack by performing pattern matching using the medicine pack image and a tablet pattern shown in the packing instruction information, wherein when the packing instruction information includes information on an irregular shaped tablet, the tablet inspecting unit inspects the number of an irregular shaped tablet by performing pattern matching using an irregular shaped tablet pattern of the irregular shaped tablet and the medicine pack image. | 07-04-2013 |
20130177232 | Visual Inspection Device, Visual Inspection Method, And Computer Program - Inputs of a plurality of images constituting a group of images of items regarded as non-defective items are accepted and stored, and a defect threshold for detecting a defective portion of an inspection object and a determination threshold for making a non-defective/defective determination are set based on the plurality of stored images. A defective item image which is an image of an item determined as a defective item is previously stored and when an input of an image newly acquired by capturing an inspection object is accepted, non-defective item learning processing is performed by use of a plurality of stored images including the image whose input has been accepted, to at least reset the defect threshold. A defective portion is re-detected based on the reset defect threshold, to determine whether or not the stored defective item image is an image of a defective item based on the set determination threshold. | 07-11-2013 |
20130188858 | ULTRASONIC MODELING FOR INSPECTION OF COMPOSITE IRREGULARITIES - A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity parameter. The first simulated inspection is conducted using a first evaluation setting. A first image is produced based on the first waveform set, and it is determined whether a quality of the first image satisfies a predetermined threshold. | 07-25-2013 |
20130195345 | INSPECTING APPARATUS, ROBOT APPARATUS, INSPECTING METHOD, AND INSPECTING PROGRAM - An inspecting apparatus includes an image pickup unit configured to pick up a plurality of images of an inspection target object with different exposure times and generate, image data of an inspection target object image including an inspection region, a weighted-image-data generating unit configured to weight, for each of the image data generated with the exposure times different from one another, data of pixels indicating a region where a difference in gradation of pixel values is relatively large among regions of pixels included in the image data and generate weighted image data, an image-data combining unit configured to generate combined image data obtained by combining the generated respective weighted image data, and a determining unit configured to determine a state of the inspection region on the basis of image data of a reference image set and the generated combined image data. | 08-01-2013 |
20130223722 | METHOD AND EVALUATION DEVICE FOR DETERMINING THE POSITION OF A STRUCTURE LOCATED IN AN OBJECT TO BE EXAMINED BY MEANS OF X-RAY COMPUTER TOMOGRAPHY - In a method and an evaluation device for determining the position of a structure located in an object to be investigated by means of X-ray computer tomography, a cutting data record, which images the object in a cutting plane, is determined from a volume data record of the object. The cutting data record is binarized to form a binary data record, in which the structure voxels imaging the structure and the surface voxels imaging an object surface are determined. To determine the position, a distance data record is produced in such a way that a distance value, which characterizes the smallest distance of the respective distance voxel from the surface voxels, is assigned to each distance voxel of the distance data record. The distance voxels corresponding to the structure voxels are then determined and the associated distance values evaluated. | 08-29-2013 |
20130230231 | Method for Inspecting Surface Defect of Metal Balls by Image Recognition - A method for inspecting surface defect of metal balls by image recognition includes the steps of feeding metal ball, capturing image for a first time, making metal ball rotate, capturing image for a second time, comparing images, and discharging metal balls. With the above steps, not only can the metal balls be sorted into the acceptable and the unacceptable metal balls, but the unacceptable metal balls can be sorted into different kinds according to the defects such as scratch, strain, and so on. Hence, effective data can be offered to improve the metal ball manufacturing process accurately. | 09-05-2013 |
20130236082 | RAPID PROCESSING AND DETECTION OF NON-UNIFORMITIES IN WEB-BASED MATERIALS - A computerized inspection system is described for detecting the presence of non-uniformity defects and providing output indicative of a severity of each type of non-uniformity defect. Techniques are described that increase the throughput of the inspection system. Algorithmic and hardware approaches are described to significantly decrease the average amount of time required to inspect a given quantity of material that is expected to be mostly uniform. The techniques described herein involve dynamic selection of which image features to compute by starting with a base feature set and only triggering additional feature computations as needed until the features are sufficient to compute a severity for each type of non-uniformity defect. The number of features extracted and the order in which the features are extracted is dynamically determined in real-time to reduce a cost associated with the feature extraction. | 09-12-2013 |
20130266204 | METHOD AND SYSTEM FOR MICROFLUIDIC DEVICE AND IMAGING THEREOF - A biological substrate, e.g., microfluidic chip. The substrate includes a rigid substrate material, which has a surface region capable of acting as a handle substrate. The substrate also has a deformable fluid layer coupled to the surface region. One or more well regions are formed in a first portion of the deformable fluid layer and are capable of holding a fluid therein. The one or more channel regions are formed in a second portion of the deformable fluid layer and are coupled to one or more of the well regions. An active region is formed in the deformable fluid layer. At least three fiducial markings are formed within the non-active region and disposed in a spatial manner associated with at least one of the well regions. A control layer is coupled to the fluid layer. | 10-10-2013 |
20130272599 | Method For Automatic Quantification Of Dendrite Arm Spacing In Dendritic Microstructures - A method to automatically quantify dendrite arm spacing in dendritic microstructures. Once a location of interest in a cast material specimen has been identified, the information contained in it is automatically analyzed to quantify dendrite cell size information that is subsequently converted into a quantified dendrite arm spacing through an empirical relationship or a theoretical relationship. In one form, the relationship between DCS and DAS is such that the DAS in dendritic structure of cast aluminum alloys may be automatically determined from the measurement of one or more of dendrite cell size and the actual volume fraction of the eutectic phases in the local casting microstructure. Non-equilibrium conditions may be accounted for in situations where a theoretical volume fraction of a eutectic phase of the alloy in equilibrium condition is appropriately modified. Thus, in situations where equilibrium conditions—such as those where the casting is cooled very slowly during solidification—does not apply (such as during rapid cooling and consequent solidification), the eutectic measured in the non-equilibrium condition, which can be smaller than the theoretical value in equilibrium, can be accounted for. | 10-17-2013 |
20130287285 | CIGARETTE INSPECTION DEVICE - A cigarette inspection device designed to obtain an image showing filter end faces of a bundle C of filtered cigarettes arranged side by side with their axes parallel to one another, analyze the image and determine whether the bundle is short of filtered cigarettes comprises a first determination section which determines how many filtered cigarettes are arranged side by side from contours of filter end faces in the image generated, and determines whether the bundle consists of a predetermined number of filtered cigarettes, and a second determination section which determines whether the first determination section has falsely recognized one cigarette as two. | 10-31-2013 |
20130287286 | Methods and Systems for Modifying a Parameter of an Automated Procedure - A variety of systems and methods are described which enable quantitative information to be extracted regarding automated procedures, including those performed at a high speed that may require a user input, without having to interrupt the procedure. In addition, these systems and methods serve to provide information on one or more parameters of the automated procedure, whereby they may be modified, if required, to improve the automated procedure or the results from such a procedure. The systems and methods provided are especially useful in automated hair transplantation procedures. | 10-31-2013 |
20130294677 | DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE - There is provided a defect inspection method including the steps of: acquiring image data sets of a sample under a plurality of imaging conditions; storing a plurality of image data sets acquired under the plurality of imaging conditions in an image storage unit; acquiring a defect candidate from each of the plurality of image data sets; cutting out, from the image data sets acquired under at least two imaging conditions and stored in the image storage unit, a partial images each including a position of the defect candidate detected in any of the plurality of image data sets and the periphery of the defect candidate position; and integrating the partial images acquired under at least two imaging conditions corresponding to the defect candidates, thereby classifying the defect candidates. | 11-07-2013 |
20130301902 | SYSTEM AND METHOD OF DISTRIBUTED PROCESSING FOR MACHINE-VISION ANALYSIS - A computer-implemented method for designating a portion of a machine-vision analysis to be performed on a worker. A set of machine-vision algorithms is obtained for analyzing a digital image of a product. An overall time estimate is determined that represents the processing time to analyze the digital image using the entire set of machine-vision algorithms. If the overall time estimate is greater than a threshold value, then an algorithm time estimate for each of two or more algorithms of the set of machine-vision algorithms is obtained. A rank associated with each of the two or more algorithms is computed based on the algorithm time estimates. A designated algorithm to be performed on the worker is selected based on the rank associated with each of the two or more algorithms. The digital image may then be analyzed on the worker using the designated algorithm. | 11-14-2013 |
20130322733 | SYSTEM FOR DETECTION OF NON-UNIFORMITIES IN WEB-BASED MATERIALS - A system is described for detecting the presence of non-uniformity patterns and providing output indicative of a severity of each type of non-uniformity pattern. The system includes a computerized rating tool that assists a user in efficiently and consistently assigning expert ratings (i.e., labels) to a large collection of training images representing samples of a given product. In addition, the rating software develops a model that allows a computerized inspection system to detect the presence of non-uniformity patterns in a manufactured web material in real time and provide output indicative of a severity level of each pattern on a continuous scale. The system also includes algorithmic and hardware approaches to significantly that increase the throughput of the inspection system. | 12-05-2013 |
20130322734 | METHOD AND DEVICE FOR THE SURFACE INSPECTION OF STRIP PIECES - The invention relates to a method for the surface inspection of strip pieces ( | 12-05-2013 |
20140023264 | VISUAL INDICATOR STATUS RECOGNITION - A system and technique for visual indicator status recognition includes an imaging system configured to capture a first optical data of an indicator, the imaging system configured to verify indicator code indicia is derivable from the first optical data. Responsive to verifying that the indicator code indicia is derivable from the first optical data, the imaging system is configured to capture a second optical data of the indicator. The system and technique also includes a detection module executable by a processing unit to analyze the second optical data and derive status information of the indicator. | 01-23-2014 |
20140044339 | FUSION SPLICER AND METHOD FOR DETERMINING AN OPTICAL FIBER TYPE - A fusion splicer includes an imaging unit configured to take a lateral transmission image by illuminating a target optical fiber from a lateral direction of the target optical fiber; a determination module configured to create a target luminance distribution in a direction perpendicular to an optical axis of the target optical fiber using the lateral transmission image so as to determine a type of the target optical fiber, by comparing the target luminance distribution with preliminarily registered data of a reference luminance distribution of a reference optical fiber; and a registration module configured to create a message when the target luminance distribution is determined to be outside a tolerance of the reference luminance distribution and to display the message to an operator so that the operator can decide whether or not to register the target luminance distribution of the target optical fiber as a new reference luminance distribution. | 02-13-2014 |
20140050387 | System and Method for Machine Vision Inspection - A computer-implemented method for use in machine vision systems is provided. The method can include receiving a source image and segmenting the source image into one or more segments. The method can further include receiving a selection of a first segment of the one or more segments associated with the source image and generating a first mask image, based upon, at least in part, the first segment. The method can also include determining at least one attribute associated with the first segment and normalizing a masked area of a runtime image using, at least in part, the at least one attribute. | 02-20-2014 |
20140050388 | METHOD FOR ANALYZING THE QUALITY OF A GLAZING - A method for analyzing quality of a glazing including: generating at least one digital image of a test chart produced in reflection by an external surface of the glazing on an outside of the glazing; computation by at least one processing unit of quantities representative of the quality of the glazing based on the at least one image generated; and comparing values computed for the representative quantities with respect to reference values. The test chart exhibits a pattern including elements of closed contours arranged periodically. The representative quantities are representative of a deformation of the image of the test chart produced in reflection by the external surface of the glazing on the outside of the glazing, and the computation of a representative quantity includes the computation of a density of the elements. | 02-20-2014 |
20140056506 | ELECTRONIC DEVICE AND METHOD FOR DETECTING STATE OF LAMPS - In a method for closely monitoring a state of a lamp using an electronic device, a plurality of images of the lamp are captured by an image capturing unit of the lamp and a specified number of captured images are sampled. A luminance value of each of the sampled images is calculated to determine a state of the lamp, the possible states of the lamp including a normal state and an abnormal state. The lamp is marked or indicated accordingly on a monitoring interface when the lamp is in the abnormal state. | 02-27-2014 |
20140064596 | DESCRIPTOR GUIDED FAST MARCHING METHOD FOR ANALYZING IMAGES AND SYSTEMS USING THE SAME - Methods and systems for descriptor guided fast marching method based image analysis and associated systems are disclosed. A representative image processing method includes processing an image of a microelectronic device using a fast marching algorithm to obtain arrival time information for the image. The arrival time information is analyzed using a targeted feature descriptor to identify targeted features. The detection of defects is facilitated by segmenting the image. The segmented image can be analyzed to identify targeted features which are then labeled for inspection. | 03-06-2014 |
20140064597 | MOBILE APPLICATION FOR EXTRACTING GEOMETRIC ELEMENTS AND MAPPING TO A MASTER KEY-CODE DATABASE - A method and application provide a universal key code for use when a key is lost. The code can be taken to a locksmith or retailer for duplication. The user can take a picture of their key and a software application can extract unique key geometries from the key, via, for example, edge detection technology and/or other mathematical methods, digital image processing methods and standard image processing methods. A key code can be determined from this extracted information and mapped to a known key code database. The software application can output, from a picture of an original key, the key blank and key cut code to allow a consumer to simply and conveniently obtain a duplicate key. | 03-06-2014 |
20140064598 | MOBILE AND DESKTOP APPLICATION FOR EXTRACTING GEOMETRIC ELEMENTS AND MAPPING TO A MASTER KEY-CODE DATABASE - A method and application provide a universal key code for use when a key is lost. The code can be taken to a locksmith or retailer for duplication. The user can obtain a digital image of their key and a software application can extract unique key geometries from the key, via, for example, edge detection technology and/or other mathematical methods, digital image processing methods and standard image processing methods. A key code can be determined from this extracted information and mapped to a known key code database. The software application can output, from a digital image of an original key, the key blank and key cut code to allow a consumer to simply and conveniently obtain a duplicate key. | 03-06-2014 |
20140086474 | UNIQUE PART IDENTIFIERS - A method of providing a unique identifier for a manufactured part includes defining a boundary area on at least one surface of the manufactured part, recording surface properties within a portion of the boundary area, interpreting the recorded surface properties with a pattern recognition algorithm to create the unique identifier, and storing the unique identifier in a database. | 03-27-2014 |
20140099015 | AUTOMATED VISION INSPECTION OF A SIDE CURTAIN AIRBAG ASSEMBLY - An automated vision inspection system detects whether a cushion of a side curtain airbag assembly system is twisted. The cushion is provided a plurality of markings arrayed along a longitudinal extent of the cushion. Each marking can be defined by a group of four distinct characters or indicia. Each indicium can be defined by polygonal shaped pixels which allow the inspection system to find clear edges of the marking and thereby determine marking orientation. By determining orientation, the inspection system can compare the inspected marking to a master image of the marking to determine if the cushion is in a twisted state or non-twisted state. | 04-10-2014 |
20140099016 | AUTOMATED VISION INSPECTION OF A SIDE CURTAIN AIRBAG ASSEMBLY - An automated vision inspection system detects whether a cushion of a side curtain airbag assembly system is twisted. The cushion is provided a plurality of markings arrayed along a longitudinal extent of the cushion. Each marking can be defined by a group of four distinct characters or indicia. Each indicium can be defined by polygonal shaped pixels which allow the inspection system to find clear edges of the marking and thereby determine marking orientation. By determining orientation, the inspection system can compare the inspected marking to a master image of the marking to determine if the cushion is in a twisted state or non-twisted state. | 04-10-2014 |
20140105481 | METHODS AND SYSTEMS FOR DETERMINING PART WEAR BASED ON DIGITAL IMAGE OF PART - Systems and methods are disclosed for determining part wear using a mobile device. One such exemplary method includes capturing, using the mobile device, at least one digital image of a wear part of a machine. The method further includes determining, by the mobile device and based on the at least one digital image, a degree of wear of the wear part. | 04-17-2014 |
20140126804 | EDGE MEASUREMENT VIDEO TOOL AND INTERFACE INCLUDING AUTOMATIC PARAMETER SET ALTERNATIVES - A user interface for setting parameters for an edge location video tool is provided. In one implementation, the user interface includes a multi-dimensional parameter space representation with edge zones that allows a user to adjust a single parameter combination indicator in a zone in order to adjust multiple edge detection parameters for detecting a corresponding edge. The edge zones indicate the edge features that are detectable when the parameter combination indicator is placed within the edge zones. In another implementation, representations of multiple edge features that are detectable by different possible combinations of the edge detection parameters are automatically provided in one or more windows. When a user selects one of the edge feature representation, the corresponding combination of edge detection parameters is set as the parameters for the edge location video tool. | 05-08-2014 |
20140133734 | APPARATUS, SYSTEM, AND PROCESS FOR DETERMINING CHARACTERISTICS OF A SURFACE OF A PAPERMAKING FABRIC - Apparatuses, processes, and systems for implementing techniques for determining characteristics of a papermaking fabric. The techniques include forming a representation of a portion of the surface of the fabric, with the representation showing the knuckles and pockets in the surface. The representation can be formed, for example, in pressure measurement film, in wax paper, or as a photograph. An image is generated from the representation, and the image is analyzed to determine characteristics of the surface of the fabric, such as knuckle sizes and pocket sizes. The depth of pockets in the fabric can also be determined. The techniques can be used in processes for analysing wear of a fabric, and for obtaining a fabric for making a paper product with a particular three-dimensional structure. | 05-15-2014 |
20140153813 | Dough Forming Pressing Plate with Spacers - In some embodiments, a dough pressing system includes means for coupling a cover to a pressing platen, wherein the cover can reduce the wear caused to the pressing platen by the heat and pressure used to process one or more products. The cover optionally can be configured to be removably attached to the pressing platen with vacuum pressure. | 06-05-2014 |
20140177936 | SYSTEM AND METHOD FOR INSPECTING STRUCTURES FORMED OF COMPOSITE MATERIALS DURING THE FABRICATION THEREOF - A method for inspecting structures formed of composite materials during the fabrication thereof including imaging multiple individual plies of a structure, whereby the locations and orientations of edge joints between adjacent courses of each ply are recorded, ascertaining mutual offsets in the locations of mutually parallel ones of the edge joints in the multiple individual plies and providing an output indication when at least one mutual offset of the edge joints is less than a predetermined minimum offset. | 06-26-2014 |
20140177937 | HARDNESS TESTER AND METHOD FOR HARDNESS TEST - The hardness tester includes a data obtainer obtaining sample shape data that can specify a shape of a sample; an image capture controller controlling a CCD camera to capture an image of the surface of the sample and obtaining image data of the sample; a matching performer associating the sample shape data obtained by the data obtainer with the image data of the sample obtained by the CCD camera; an indentation former forming an indentation with an indenter in a test position set on the sample shape data after the sample shape data and the image data of the sample have been associated by the matching performer; and a hardness value calculator calculating a hardness value of the sample based on the indentation captured with the CCD camera after the indentation has been formed by the indentation former. | 06-26-2014 |
20140177938 | System and Method for Identifying Defects in a Material - Described are computer-based methods and apparatuses, including computer program products, for identifying defects in a material. A set of features is identified based on an image of a material, wherein each feature in the set of features is a candidate portion of a defect in the material. A set of chained features is selected based on the set of features, wherein each chained feature comprises one or more features that represent candidate portions of a same defect in the material. A defect in the material is identified based on the set of chained features and the image. | 06-26-2014 |
20140185910 | METHOD FOR IMPROVING REPEATABILITY IN EDGE LOCATION RESULTS OF A MACHINE VISION INSPECTION SYSTEM - A method for improving repeatability in edge location measurement results of a machine vision inspection system comprises: placing a workpiece in a field of view of the machine vision inspection system; providing an edge measurement video tool comprising an edge-referenced alignment compensation defining portion; operating the edge measurement video tool to define a region of interest of the video tool which includes an edge feature of the workpiece; operating the edge measurement video tool to automatically perform scan line direction alignment operations such that the scan line direction of the edge measurement video tool is aligned along a first direction relative to the edge feature, wherein the first direction is defined by predetermined alignment operations of the edge-referenced alignment compensation defining portion; and performing edge location measurement operations with the region of interest in that position. | 07-03-2014 |
20140185911 | VISUAL INSPECTION APPARATUS, SECURE ONE-WAY DATA TRANSFER DEVICE AND METHODS THEREFOR - A visual inspection system includes a database storing a wireframe model of an object and a portable electronic device equipped with an imaging device and a display. The portable electronic device is in communication with the database. The portable electronic device is configured to show on the display the wireframe model as an overlay to an image of the object taken by the imaging device. The display is configured to accept input of a trace of a defect on the display, and displays the trace on the image. A method of transmitting electronic data from an unsecure device to a secure database is also described. | 07-03-2014 |
20140185912 | Methods and Systems for Enhanced Automated Visual Inspection of a Physical Asset - A computer-implemented system for enhanced automated visual inspection of a physical asset includes a visual inspection device capable of generating images of the physical asset and a computing device including a processor and a memory device coupled to the processor. The computing device includes a storage device coupled to the memory device and coupled to the processor. The storage device includes at least one historic image of the physical asset and at least one engineering model substantially representing the physical asset. The computing device is configured to receive, from a present image source, at least one present image of the physical asset captured by the visual inspection device. The computing device is configured to identify at least one matching historic image corresponding to the at least one present image. The computing device is configured to identify at least one matching engineering model corresponding to the at least one present image. | 07-03-2014 |
20140185913 | SYSTEMS AND METHODS FOR DATA ENTRY IN A NON-DESTRUCTIVE TESTING SYSTEM - Systems and methods for entering data acquired from a non-destructive testing (NDT) system may include obtaining information related to an inspection using a non-destructive testing (NDT) inspection device. After obtaining the information, the method may include generating an inspection template, a report, metadata, or any combination thereof based on the information related to the inspection. | 07-03-2014 |
20140185914 | DEVICE FOR DETERMINING SURFACE DEFECTS - A device for determining the existence or absence of surface defects of a product includes a base, a rotatable platform, a support member, an image capturing unit, a light source unit, and a processing unit. The rotatable platform includes a main body supporting the product and a driving unit rotating the main body with respect to the base, thereby orienting the product placed thereon in different orientations. The support member carries an image capturing unit which captures different orientations of the rotating product as images. The light source unit illuminates the rotating product. The captured images of the product are analyzed and matched against similar orientations of a defect-free model product, any discrepancies leading to a determination that the product has surface defects. | 07-03-2014 |
20140185915 | DEVICE FOR DETERMINING SURFACE DEFECTS - A device for determining the existence or absence of surface defects includes a base, a movable platform, a support member, an image capturing unit, a light source unit, and a processing unit. The movable platform includes a main body for supporting the product, and a driving unit for moving the main body in six degrees of freedom, thereby orienting the product placed on the main body in different orientations. The support member carries an image capturing unit, which captures images of the product in the different orientations. The light source unit illuminates the product. The captured images of the product are analyzed and compared to reference images of a blemish-free standard product. If there is any discrepancy between the captured images and the reference images, the processing unit determines that the product has one or more surface defects. | 07-03-2014 |
20140185916 | METHOD OF DETERMINING THE APPEARANCE OF LOSSES OF COHESION IN A TRANSPARENT CERAMIC COATING LAYER FORMED ON A SUBSTRATE - A method of determining the appearance of losses of cohesion in a transparent ceramic coating layer ( | 07-03-2014 |
20140193064 | Optical Measurement Method and Apparatus for Fuel Cell Components - Methods and systems for measuring a property of a component of a fuel cell system include performing a three-dimensional optical scan of at least a portion of a surface of the component to produce a three-dimensional representation of the topography of the at least a portion of the surface and measuring at least one property of the component based on the three-dimensional representation. Further embodiments include systems and methods for measuring dimensions of a fuel cell component using a line scan imaging device and/or a matrix camera. | 07-10-2014 |
20140198970 | EDGE DETECTION DEVICE AND EDGE DETECTION METHOD - An edge detection device includes: an image capturing mechanism configured to image-capture an edge of an optical joining block; and a control unit configured to control the image capturing mechanism, wherein the control unit: determines, based on image data of the edge, whether a plurality of regions included in the edge have a defective region including a defect or a non-defective region including no defect; determines whether or not first regions which are included in the plurality of regions and is determined to be the non-defective region satisfy a first condition; calculates a first straight line based on the first regions; and determines the first straight line as a position of the edge when the first regions has satisfied a first condition. | 07-17-2014 |
20140205178 | ELECTRONIC DEVICE AND METHOD FOR ANALYZING IMAGE NOISE - Analyzation of image noise using an electronic device. The electronic device and method operating thereon can obtain an initial image captured by an image capturing device of an image measuring machine using an image capturing card of the electronic device when a lighting device of the image measuring machine is shut down, and magnifies an initial gray value of each pixel in the initial image to obtain an updated image. The electronic device and method operating thereon can further determine whether image noise in the updated image complies with a preset condition by analyzing an updated gray value of each pixel in the updated image, and displays the updated image and analysis results on a display device of the electronic device. | 07-24-2014 |
20140212019 | METHOD FOR DETECTING ALIGNMENT FILM AND DEVICE FOR THE SAME - The embodiments of the present disclosure provide a method for detecting alignment film and device for the same. The method comprises: obtaining an image of an alignment film test region of a substrate; and analyzing continuity of the alignment film along an internal boundary of the alignment film test region in the image obtained. since the alignment film test region is located outside an active display area of the substrate, when the alignment film along the internal boundary of the alignment film test region is determined as continuous, it can be determined that all the edges of the alignment film are outside the active display area, then a Haro region which might appear on the edge of the alignment film may also be located outside the active display area, so as to ensure uniform thickness of the alignment film in the active display area of the substrate. | 07-31-2014 |
20140219541 | METHOD FOR DETERMINING MARKINGS IN RELIEF ON THE OUTER SURFACE OF THE SIDEWALL OF A TYRE - A method of determining relief markings on a tyre's sidewall surface includes assigning, to each pixel of a three-dimensional image of the surface, a grey-level value proportional to an elevation point corresponding to the pixel, to obtain a starting image. Using linear structuring elements of successively increasing sizes and oriented circumferentially, a series of successive morphological openings is performed iteratively on the starting surface. An image value obtained after a morphological opening using a structuring element is subtracted from an image value obtained after a morphological opening using a structuring element of an immediately lower size, to obtain a succession of images flattened by differencing. A thresholding operation is performed on the images flattened by differencing, to obtain binary images. A set-theoretic union of values of each of the binary images is performed, to obtain a final binary image in which markings appear in relief. | 08-07-2014 |
20140233838 | METHOD, SYSTEM, AND COMPUTER PROGRAM PRODUCT FOR DETECTION OF DEFECTS BASED ON MULTIPLE REFERENCES - A defect detection system for computerized detection of defects in an inspected object based on processing of an inspection image generated by collecting signals arriving from the inspected object, the system including: an interface for obtaining an inspected noise-indicative value and multiple reference noise-indicative values, the inspected noise-indicative value representative of an analyzed pixel and each of the reference noise-indicative values representative of a reference pixel among a plurality of reference pixels; and a processor, including: a noise analysis module, configured to compute a representative noise-indicative value based on a plurality of noise-indicative values which includes the inspected noise-indicative value and the multiple reference noise-indicative values; and a defect analysis module, configured to calculate a defect-indicative value based on an inspected value representative of the analyzed pixel, and to determine a presence of a defect in the analyzed pixel based on the representative noise-indicative value and the defect-indicative value. | 08-21-2014 |
20140233839 | INTERFERENCE CHECKING DEVICE AND NUMERICAL CONTROL APPARATUS - An interference checking device includes a contour shape analyzing unit that extracts a contour shape of a tool cross section and a tool length by analyzing a two-dimensional image of a rotating tool, a rotation center analyzing unit that obtains a rotation center of the rotating tool by analyzing the contour shape, a three-dimensional-rotation-shape generating unit that generates a three-dimensional shape of the rotating tool on the basis of the contour shape, the tool length, and the rotation center, and an interference check processing unit that checks whether the rotating tool and a component other than the rotating tool interfere with each other when numerical control machining is performed on a workpiece by using the rotating tool, by using the three-dimensional shape, in which the three-dimensional-rotation-shape generating unit generates the three-dimensional shape by using a left-side contour shape. | 08-21-2014 |
20140233840 | METHODS FOR ANALYZING ABSORBENT ARTICLES - A method for analyzing an absorbent article may include providing a three-dimensional computed tomography data set comprising a mannequin image and an article image. The article image may be constructed from projections collected while the absorbent article is fitted to a mannequin. An outer surface of the mannequin image may be identified. A desired distance may be provided. A volumetric demarcation may be spaced the desired distance away from the outer surface of the mannequin image. An image volume may be disposed between the outer surface of the mannequin image and the volumetric demarcation. A relevant portion of the article image may be enhanced using a processor. The relevant portion of the article image may be coincident with the image volume. | 08-21-2014 |
20140233841 | METHOD OF CHEKCING THE APPEARANCE OF THE SURFACE OF A TYRE - Detection method according to Claim | 08-21-2014 |
20140254912 | METHOD OF FAST ANALYSIS OF THE RELIEF ELEMENTS FEATURING ON THE INTERNAL SURFACE OF A TYRE - In a method of fast analysis of relief elements featuring on an inner surface of a tyre, a three-dimensional image of the surface is captured, and each pixel of the image is assigned a greyscale value proportional to a topographical elevation of a point corresponding to the pixel, so as to obtain a starting image. The image is transformed into an orthogonal reference frame (OXY) in which an abscissa axis (OX) represents circumferential values and an ordinate axis (OY) represents radial values. Each point of the surface, i.e., each pixel, is assigned an altitude gradient value (f(p)) by comparing an elevation of the point with an elevation of a discrete and reduced number of points arranged on a straight line passing through a pixel being considered (p) and oriented in a circumferential direction. | 09-11-2014 |
20140270466 | SYSTEM AND METHODS FOR INSPECTING TIRE WHEEL ASSEMBLIES - A system includes a tire inspection station configured to inspect a tire of a tire wheel assembly. The tire inspection station includes a lifting assembly configured to lift and rotate a tire wheel assembly disposed in the tire inspection station, movable centering arms adjustably positionable to center a hub of a tire wheel assembly relative to the lifting assembly, and top and bottom camera assemblies configured to image sidewalls of the tire wheel assembly when it is lifted. The system further includes software configured to process images from the camera assemblies and display results of the processing. The system additionally includes a wheel inspection station comprising a camera. The system further includes software configured to process images from the camera to verify wheel properties. | 09-18-2014 |
20140286563 | ACCURATE DETECTION OF LOW-CONTRAST DEFECTS IN TRANSPARENT MATERIAL - This invention relates to a method and apparatus for detection of low-contrast defects in transparent materials such as plastics or glass. The method relies on the illumination of the material with a light producing a contrasting pattern, which accentuates defects. The method also includes the removal of the contrasting pattern either digitally with a pattern filtering algorithm or by the specific placement of the camera view. The apparatus involves one or many cameras positioned on one side of the material, one or many lights producing the desired pattern and positioned on the other of the material, and a computer or other computing device using an algorithm to process the image. | 09-25-2014 |
20140286564 | METHOD AND A DEVICE FOR ESTIMATING A POROSITY RATIO OF A SAMPLE OF MATERIAL FROM AT LEAST ONE GRAY-SCALE CODED IMAGE - A method and device for estimating a porosity ratio of a sample of material from at least one gray-scale coded image. The method includes: evaluating an intermediate ratio of a sample for each value of a plurality of gray-scale threshold values lying between two determined limit values, the intermediate ratio being equal to a ratio of a number of pixels of the at least one image having a gray-scale value bounded by the threshold value to a total number of pixels of the at least one image; and estimating the porosity ratio of the sample by analyzing variations in the intermediate ratio as a function of the threshold value. | 09-25-2014 |
20140294282 | METHOD AND APPARATUS FOR HARDNESS TESTER - A hardness tester has an indentation former forming an indentation by pressing an indenter against a surface of a sample; an image capture controller controlling a CCD camera to capture an image of the surface of the sample and obtain image data; an indentation area extractor extracting an indentation area based on the obtained image data; and a hardness calculator calculating hardness of the sample based on the extracted indentation area. The indentation area extractor has a reduced image generator reducing the image obtained from the image data of the surface of the sample at a scale ratio selected from a plurality of predetermined scale ratios and generating a reduced image; and a pattern matcher performing pattern matching with respect to the generated reduced image and extracting the indentation area. | 10-02-2014 |
20140301627 | METHODS AND SYSTEMS FOR PRODUCING AN IMPLANT - A computer implemented method for determining the 3-dimensional shape of an implant to be implanted into a subject includes obtaining a computer readable image including a defective portion and a non-defective portion of tissue in the subject, superimposing on the image a shape to span the defective portion, and determining the 3-dimensional shape of the implant based on the shape that spans the defective portion. | 10-09-2014 |
20140301628 | METHOD FOR MEASURING THE ABSORPTION OF FLUID IN AN ABSORBENT PRODUCT - A method for measuring the absorption of fluid in an absorbent product includes at least the following steps performed by a mobile device having an image capturing device: capturing at least one image of a used absorbent product; determining a measure of absorption of fluid by the product based on image information in the captured image; and displaying information relating to the use of the absorbent product based the measure of absorption of fluid on the mobile device. The method can aid a user of absorbent product to choose the right type of product for the user's individual needs. | 10-09-2014 |
20140307941 | ANALYSIS OF THE DIGITAL IMAGE OF THE EXTERNAL SURFACE OF A TYRE AND PROCESSING OF FALSE MEASUREMENT POINTS - Method for processing the three-dimensional digital image of the surface of a tyre in which the three-dimensional image of the said surface is captured while assigning to each pixel of the plane of the image an item of information relating to the elevation of this point with respect to the surface to be inspected, characterized in that, with the aid of a morphological operator using a structuring element, a first transformation of the image of the surface is performed with the aid of an opening and then of a closing, so as to tailor the grey level of the pixels situated abnormally above or below the surface to be inspected. | 10-16-2014 |
20140307942 | DEVICE FOR AUTOMATICALLY INSPECTING LENS ELEMENTS OF OPTICAL CONNECTORS - A device includes a holding device, a first camera module, a second camera module, a driving device, and an image processor. The holding device is configured for holding a plurality of lens elements, each of which includes lenses. The driving device is connected to the first camera module and the second camera module and configured for driving the first camera module and the second camera module to move such that the first camera module and the second camera module aim at and capture an image of each lens. The image processor is in communication with the first camera module and the second camera module and configured for processing the images to detect defects of the lenses, if any. | 10-16-2014 |
20140314302 | INSPECTION AREA SETTING METHOD FOR IMAGE INSPECTING DEVICE - An inspection area setting method for setting inspection area-defining information defining an inspection area to an image inspecting device, the image inspecting device being configured to extract a portion constituting the inspection area as an inspection area image from an original image obtained by taking an image of an inspection object, and to inspect the inspection object by analyzing the inspection area image, includes an acquisition step of acquiring a sample image obtained by taking an image of a sample of the inspection object, an inspection area searching step, and a setting step. | 10-23-2014 |
20140321729 | METHOD AND SYSTEM FOR PERFORMING X-RAY INSPECTION OF A PRODUCT AT A SECURITY CHECKPOINT USING SIMULATION - A method, an apparatus and a system are provided for deriving a characteristic of a product using X-rays. X-ray image data derived by performing an X-ray scan of the product and conveying attenuation information is received. A response of a reference product to X-rays is then simulated to generate simulated X-ray image data. The simulated X-ray image data and the received X-ray image data are then processed to derive one or more characteristics of the product. In a specific implementation, the product is a liquid product comprised of a bottle at least partially filled with liquid and the derived characteristic is a threat status assessment associated with the liquid in the bottle. In another aspect, a simulation engine for simulating interactions between X-rays and objects is also provided. | 10-30-2014 |
20140328533 | Device And Method For Analysis Of Coating Additive Performance - A product testing apparatus is described as having one or more imager configured to capture one or more images of a sample having a substrate coating applied to a substrate, a processor in communication with the imager, and a non-transitory processor readable medium, in communication with the processor. The non-transitory processor readable medium stores processor executable instructions that when executed cause the processor to receive the one or more images from the one or more imager. The processor then processes the one or more image by filtering lighting variations in the pixels of the one or more images to identify one or more objects of interest in the one or more images of the cured/uncured substrate coating. The processor quantifies one or more property of the one or more objects of interest. The processor executable instructions then cause the processor to generate one or more signal indicative of the quantification of the one or more objects of interest. | 11-06-2014 |
20140341460 | METHOD FOR CONTROLLING THE DEPOSITION OF ELEMENTARY SEMIFINISHED PRODUCTS IN A PROCESS FOR BUILDING TYRES FOR VEHICLE WHEELS - A method and apparatus for controlling the deposition of elementary semifinished products in a process for building tyres for vehicle wheels includes: driving in rotation, around a rotation axis, at a rotation speed between about π/8 raft and about 6 π rad/s, a tyre being processed which tyre has a radially external surface including one or more elementary semifinished products; sending a first electromagnetic radiation to the radially external surface, the latter generating a corresponding first reflected radiation; detecting, through a first detecting device, at least one first image representative of the first reflected radiation; controlling the first detecting device in such a manner that a first exposure time for detecting the at least one first image is included between about 0.1 s and about 10 s; carrying out a first comparison between the at least one first image and one or more reference data; and generating a first notification signal as a function of the first comparison. | 11-20-2014 |
20140355866 | METHOD AND APPARATUS FOR IDENTIFYING ROOT CAUSE OF DEFECT USING COMPOSITE DEFECT MAP - Provided are a method and apparatus for automatically determining defective equipment by using a sample defect map showing defect distribution in each cell of a defective sample and production history information of each product, wherein the defective sample is a set of products, each being divided into a plurality of cells. According to this invention, the method of determining defective equipment is provided. The method comprises, generating a sample defect map which shows defect distribution in each cell of a defective sample, generating an equipment defect map for at least one of pieces of equipment through which each product of the defective sample passed, calculating, for each piece of equipment whose equipment defect map has been generated, map similarity between the sample defect map and the equipment defect map, and determining one or more defective pieces of equipment, which are the cause of the defective sample, based on the map similarity for each piece of equipment whose equipment defect map has been generated, wherein the defective sample is a set of products, each being divided into a plurality of cells, and the equipment defect map for a specific piece of equipment shows defect distribution in each cell of products that passed through the specific piece of equipment among the products of the defective sample. | 12-04-2014 |
20140363072 | SELF-ASSEMBLABLE POLYMER AND METHODS FOR USE IN LITHOGRAPHY - A method and system to analyze various dimensional parameters of a structure, such as a self-assembled block copolymer structure whether formed by graphoepitaxy or chemical epitaxy. The method involves image processing including median filtering and feature detection to determine critical dimension information, and optionally the use of a Hough transform to find periodicity values and to determine placement errors. | 12-11-2014 |
20140369591 | MAINTAINING REGISTRATION OF SPATIALLY SYNCHRONIZED DATA FOR WEB PRODUCTS - Techniques are described for maintaining synchronization of inspection data when a web roll is converted into intermediate smaller rolls prior to cutting the web into individual parts. A system comprises a database that stores anomaly data acquired from a manufactured web. The anomaly data specifies positions anomalies within a manufactured web relative to a set of fiducial marks on the manufactured web. A conversion processing line comprises a fiducial mark reader to output position information for the set of fiducial marks on the manufactured web, a slitter that cuts the manufactured web into slit rolls, and a fiducial mark printer to print a set of fiducial marks on each slit roll. A position monitoring system maintains spatial synchronization of the anomaly data by computing an updated position for the anomalies relative to the set of fiducial marks printed on the slit rolls. | 12-18-2014 |
20140376799 | SYSTEM AND METHOD FOR DETECTING NUMBER OF LAYERS OF A FEW-LAYER GRAPHENE - Provided are a system and a method for detecting a number of layers of few-layer graphene employing multispectral image reproduction process to provide rapid detection of numbers of layers of few-layer graphenes on transparent or non-transparent substrates. The application of the system and method in relevant industries expedites validation and/or verification of the number of layers of an FLG product and improves the quality control efficiency thereof. | 12-25-2014 |
20140376800 | DISPLAY ANALYSIS USING SCANNED IMAGES - A method for analyzing displays is described. A processing device receives a first scanned image of a first display and determines a first characteristic of the first display by analyzing the first scanned image. The processing device also receives a second scanned image of a second display and determines a second characteristic of the second display by analyzing the second scanned image. The processing device compares the first characteristic and the second characteristic to determine a third characteristic of the second display. | 12-25-2014 |
20150010228 | TARGET MARKING FOR SECURE LOGO VALIDATION PROCESS - The instant application describes a method for acquiring via a vehicle wheel alignment system an image of a target including a validation logo, the validation logo being used for recognition by the vehicle wheel alignment system and determination of authenticity of the validation logo by the vehicle wheel alignment system; identifying the validation logo within the image of the target; comparing the identified validation logo with a reference validation logo; computing a similarity metric based on a result of a comparison between the identified validation logo and the reference validation logo; and based on the computed similarity metric, enabling or disabling the vehicle wheel alignment system. | 01-08-2015 |
20150036913 | METHOD, APPARATUS AND EQUIPMENT OF INSPECTING QUALITY OF LCD - A method, an apparatus and an equipment of inspecting the quality of an LCD are provided, the method includes: obtaining optical parameters of the LCD; capturing images of the LCD; and determining that the LCD is defective after determining that the optical parameters are not in the range of the preset optical parameters and/or the captured images of the LCD are not consistent with the pre-stored images. Through the technical solution of the present invention, it can effectively differentiate the defect types of a product and record the defect position of the product, thereby it can effectively reduce misjudgment or miss test caused by the visual differences between operators to improve the quality and yield of manufactured LCD. | 02-05-2015 |
20150055851 | METHODS AND SYSTEMS FOR AUTOMATED SELECTION OF REGIONS OF AN IMAGE FOR SECONDARY FINISHING AND GENERATION OF MASK IMAGE OF SAME - Automated systems, methods and tools that automatically extract and select portions of an image to automatically generate a premium finish mask specific to the image which require little or no human intervention are presented. Graphical user interface tools allowing a user to provide an image and to indicate regions of the image for application of premium finish are also presented. | 02-26-2015 |
20150055852 | ACCURACY COMPENSATION METHOD, SYSTEM, AND DEVICE - A method for applying accuracy compensation to a computer numerically controlled (CNC) machine can compensate control program that controls the CNC machine. The method recognizes an actual outline of the product using an image of product produced by the CNC machine controlled by the control program, and further obtains an ideal outline of the product. The method obtains compensation values by computing coordinate differences between points of the actual outline and points on the ideal outline, and compensates the control program using the compensation values. | 02-26-2015 |
20150063674 | PROFILING A MANUFACTURED PART DURING ITS SERVICE LIFE - Profiling a manufactured part during its service life, including capturing by an optical scanner images of the part, the part characterized by an expected service life and by attributes with specifications of design values, including capturing the images at more than one time during an actual service life of the part; measuring by a data processor operatively coupled to the scanner, based upon the captured images, actual values of one or more of the attributes when the images are captured; storing, in a database by the data processor operatively coupled to the scanner, the measurements of the actual values of the attributes; and making a determination, from the stored actual values by a data processor operatively coupled to the database, whether the part continues to comply with its specification during the actual service life of the part. | 03-05-2015 |
20150063675 | METHOD AND APPARATUS FOR DETECTING DEFECT OF BACKLIGHT MODULE - According to embodiments of the invention, there are disclosed a method and an apparatus for detecting defect of a backlight module. Images that show components in the backlight module are acquired with a plurality of preset angles relative to a surface of the backlight module. The acquired images that show the components in the backlight module are analyzed, so as to determine whether a defect presents in the components in the backlight module. | 03-05-2015 |
20150063676 | System and Method for Package Dimensioning - A system and method for package dimensioning is provided. The package-dimensioning system includes an image capturing subsystem for acquiring information about an object within the image-capturing subsystem's field of view. A features-computation module analyzes object information and compiles a feature set describing the object's surface features. A classification module analyzes the feature set and categorizes the object's shape. A shape-estimation module estimates the dimensions of the object. | 03-05-2015 |
20150078650 | Block-to-Block Reticle Inspection - Block-to-block reticle inspection includes acquiring a swath image of a portion of a reticle with a reticle inspection sub-system, identifying a first occurrence of a block in the swatch image and at least a second occurrence of the block in the swath image substantially similar to the first occurrence of the block and determining at least one of a location, one or more geometrical characteristics of the block and a spatial offset between the first occurrence of the block and the at least a second occurrence of the block. | 03-19-2015 |
20150086105 | PERSISTENT FEATURE DETECTION - Methods are presented for improved detection of persistent or systematic defects induced during the manufacture of a product. In particular, the methods are directed to the detection of defects induced systematically in the manufacture of photovoltaic cells and modules. Images acquired from a number of samples are combined, enhancing the systematic defects and suppressing random features such as variations in material quality. Once a systematic defect is identified, steps can be taken to locate and rectify its cause. | 03-26-2015 |
20150117750 | IMAGE EXAMINATION METHOD AND IMAGE EXAMINATION APPARATUS - An image examination method includes an acquisition step of acquiring a to-be-examined object image obtained by capturing an image of a to-be-examined object, a setting reading step of reading an examination region definition information from a storage device in which the examination region definition information is previously stored, an examination region extracting step of extracting a portion constituting the examination region as an examination region image from the to-be-examined object image based on the examination region definition information, and an examination process step of examining the to-be-examined object by analyzing the examination region image. The examination region definition information is a parameter used as a constraint condition in an optimum solution search process. | 04-30-2015 |
20150117751 | METHOD OF INSPECTING IMAGES OF CONNECTORS OF OPTICAL CABLES BY USING LIVE, STILL OR STORED IMAGES - A method for inspecting connectors of multi-fiber optical cables is disclosed. The method may include receiving a plurality of images of a plurality of areas of a connector and determining, via at least a processor, matching features in two or more images according to unique visual characteristics of the images. The method further may include aligning the images, according to unique matching features of the images, and combining the images such as to obtain a combined-image of the full connector or a desired area of the connector. The combined-image of the connector may be displayed on a monitor or a display. | 04-30-2015 |
20150117752 | GUIDING METHOD AND INFORMATION PROCESSING APPARATUS - A guiding method includes obtaining data of a first image, detecting with a computer reference image data corresponding to a reference object in the data of the first image, calculating with the computer a first condition based on an appearance of the reference object in the first image, the first condition indicating an operational condition of an imaging apparatus when first image was captured, and for a second image to be captured, outputting guide information that indicates how to adjust the first condition to match a reference condition, the reference condition corresponds to an appearance of the reference object in a reference image captured under the reference condition. | 04-30-2015 |
20150117753 | COMPUTING DEVICE AND METHOD FOR DEBUGGING COMPUTERIZED NUMERICAL CONTROL MACHINE - A computing device debugs a computerized numerical control (CNC) machine. The computing device generates an average contour of a product. The computing device generates a reference contour according to the path points of a CNC program. The computing device calculates a coordinate difference between each path point of the reference contour and the corresponding contour point of the average contour. The computing device compensates each coordinate of the path points using the coordinate difference. | 04-30-2015 |
20150117754 | APPARATUS AND METHODS FOR INSPECTING EXTREME ULTRA VIOLET RETICLES - Disclosed are methods and apparatus for inspecting an extreme ultraviolet (EUV) reticle is disclosed. An inspection tool for detecting electromagnetic waveforms is used to obtain a phase defect map for the EUV reticle before a pattern is formed on the EUV reticle, and the phase defect map identifies a position of each phase defect on the EUV reticle. After the pattern is formed on the EUV reticle, a charged particle tool is used to obtain an image of each reticle portion that is proximate to each position of each phase defect as identified in the phase defect map. The phase defect map and one or images of each reticle portion that is proximate to each position of each phase defect are displayed or stored so as to facilitate analysis of whether to repair or discard the EUV reticle. | 04-30-2015 |
20150146964 | INSPECTION APPARATUS, METHOD, AND COMPUTER PROGRAM PRODUCT FOR MACHINE VISION INSPECTION - A method for vision machine inspection comprises providing depth information of a target acquired by an image capturing system, determining real-time three-dimensional information of a target object in a predetermined inspecting area based on depth information of at least one real-time image of the target. The method further comprises projecting color pixel information of a real-time color image of the target object to a three-dimensional virtual model based on the real-time three-dimensional information. The real-time color image may be acquired by a color camera system. The method further comprises generating a color three-dimensional virtual model. The color three-dimensional virtual model may comprise the color pixel information. | 05-28-2015 |
20150146965 | OPTICAL METHOD FOR INSPECTING TRANSPARENT OR TRANSLUCENT CONTAINERS BEARING VISUAL - An optical method of inspecting containers comprises taking an image of each container and determining a search zone in each image of the container, a visible pattern appearing in the search zone. A digital mask is prepared for a treatment zone of the images including the visible pattern and at least each pixel of the treatment zone of the images is compared with a digital mask. A visible pattern is selected belonging to the container and the position and the orientation of the selected visible pattern in said search zone is determined. A geometrical transformation is applied to the digital mask or to the treatment zone to place the mask and the treatment zone in a position in which they coincide. Image treatment is applied to each pixel of the treatment zone, which treatment depends on the intensity value of the coincident pixel of the digital mask. | 05-28-2015 |
20150294448 | METHOD TO DETERMINE SKIN-LAYER THICKNESS IN HIGH PRESSURE DIE CASTINGS - A quantitative metallographic method to measure skin layer thickness in high pressure die cast aluminum components. Because the faster-cooling skin layer region exhibits a higher volume fraction of eutectic phases than that of a slower-cooling inner region, measurements showing such higher eutectic phases can be used to quantify such layer thickness. An image at various thicknesses of a location of interest in a cast component sample is first obtained using an image analyzer, from which eutectic volume fractions within each of the received images may be determined. Comparisons of the determined volume fractions can be made against a known or predicted quantity for a particular alloy composition, and then correlated to the skin layer thickness via differences between the received or measured quantities and those of the known standard. | 10-15-2015 |
20150294452 | IMAGE PROCESSING METHOD, IMAGE PROCESSING DEVICE AND AUTOMATED OPTICAL INSPECTION MACHINE - The present disclosure relates to an image processing method, an image processing device, and an automated optical inspection machine. The method includes: an inspection area determining step for determining a rectangular inspection area in an inspected image; a definition threshold determining step for calculating an image definition threshold according to the gray values of pixels of a plurality of sample images in the inspection area; a product image definition determining step for calculating a product image definition according to the gray values of pixels of a product image in the inspection area; and a comparison step for comparing the product image definition with the image definition threshold; and a product image selecting step for selecting the current product image as an image to be inspected. | 10-15-2015 |
20150310604 | SYSTEM AND METHOD FOR IMAGE BASED INSPECTION OF AN OBJECT - A method for image based inspection of an object includes receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision. The method further includes projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature and an existing measurement feature on the 3D model; and sending a notification including the difference between the projected measurement feature and the existing measurement feature. | 10-29-2015 |
20150339812 | SYSTEM AND METHOD OF DISTRIBUTED PROCESSING FOR MACHINE-VISION ANALYSIS - A computer-implemented method for designating a portion of a machine-vision analysis to be performed on a worker. A set of machine-vision algorithms is obtained for analyzing a digital image of a product. An overall time estimate is determined that represents the processing time to analyze the digital image using the entire set of machine-vision algorithms. If the overall time estimate is greater than a threshold value, then an algorithm time estimate for each of two or more algorithms of the set of machine-vision algorithms is obtained. A rank associated with each of the two or more algorithms is computed based on the algorithm time estimates. A designated algorithm to be performed on the worker is selected based on the rank associated with each of the two or more algorithms. The digital image may then be analyzed on the worker using the designated algorithm. | 11-26-2015 |
20150355625 | SYSTEMS AND METHODS FOR POSITIONING DEVICES FOR DISPENSINGMATERIALS - Systems and methods for freeform additive manufacturing are disclosed. A system includes a positioning device configured to alter location during a manufacturing process of an object. The positioning device includes at least one nozzle configured to dispense a material to create the object. The material can include at least one position code. The positioning device further includes an image sensor configured to create an image of the object and a processor configured to identify the position code based on the image of the object and determine a position of the object based on the position code. | 12-10-2015 |
20150356720 | EQUIPMENT AND METHOD FOR THREE-DIMENSIONAL RADIANCE AND GAS SPECIES FIELD ESTIMATION - A process is provided for estimating a three-dimensional (3D) radiance field of a combustion process in an enclosure. An on-line intensity-temperature calibration is performed based on an association between an intensity of an image pixel and an actual temperature associated with a selected region in the enclosure. The intensity of the corresponding image is transformed to a radiance image based on settings of an image-capturing device and the on-line calibration. A registration and alignment estimation of the image is performed based on positional information of the enclosure. The radiance image is aligned based on the registration estimation. The 3D radiance field having voxels of the enclosure is estimated based on a two-dimensional to 3D transforming of the aligned radiance images. | 12-10-2015 |
20150363924 | METHOD FOR INSPECTION OF ELECTRICAL EQUIPMENT - Exemplary methods for inspecting electrical equipment in a power distribution network can include the steps of recording, by a mobile device, a photograph with a view of the object, transmitting recording information of the mobile device and the photograph to a computer server hosting a power network description database; generating, from a model stored in the power network description database of a candidate object and based on the recording information of the mobile device, a representation of the candidate object, and comparing the transmitted photograph and the generated representation to identify and characterize the object in the photograph as the candidate object. | 12-17-2015 |
20150371391 | 2D/3D Localization and Pose Estimation of Harness Cables Using A Configurable Structure Representation for Robot Operations - A robot is made to recognize and manipulate different types of cable harnesses in an assembly line. This is achieved by using a stereo camera system to define a 3D cloud of a given cable harness. Pose information of specific parts of the cable harness are determined from the 3D point cloud, and the cable harness is then re-presented as a collection of primitive geometric shapes of known dimensions, whose positions and orientations follow the spatial position of the represented cable harness. The robot can then manipulate the cable harness by using the simplified representation as a reference. | 12-24-2015 |
20160019685 | Method for Performing a Cosmetic Evaluation of a Used Electronic Device - A system and method for cosmetic evaluation of an electronic device, using the device's own camera or cameras to take photos of the device itself using a mirror or mirrors. | 01-21-2016 |
20160042517 | DETECTION AND TRACKING OF ITEM FEATURES - Technologies are generally described for detection and tracking of item features. In some examples, features of an object may be initially found through detection of one or more edges and one or more corners of the object from a first perspective. In addition, determination may be made whether the detected edges and corners of the object are also detectable from one or more other perspectives. In response to an affirmative determination the detected edges and of the object may be marked as features to be tracked, for example, in subsequent frames of a camera feed. The perspectives may correspond to distributed locations in a substantially umbrella-shaped formation centered over the object. In other examples, lighting conditions of an environment where the object is being tracked may be programmatically controlled. | 02-11-2016 |
20160049057 | SYSTEM FOR TAMPER INDENTIFICATION - A system is provided for tamper identification. At least one fastener is used to seal a compartment or secure a device. The fastener has a tamper identification surface with a unique grain structure that is altered if the fastener is removed or otherwise exposed to sufficient torque. After a period of time such as e.g., shipment and/or storage of the sealed container, a determination of whether tampering has occurred can be undertaken by examining the grain structure to determine if it has changed since the fastener was used to seal the container or secure the device. Tools and other components specifically designed to alter the grain structure of the tamper identification surface may be employed. A variety of fastener types may be used, and the fastener may be configured with one or more materials more susceptible to alteration of the grain structure along the tamper identification surface so as to enhance the ability to determine tampering. Authentication is also provided. | 02-18-2016 |
20160059375 | WAFER INSPECTION METHOD AND GRINDING AND POLISHING APPARATUS - Disclosed herein is a wafer inspection method of inspecting a wafer after polishing. The wafer inspection method includes the steps of polishing the wafer after grinding, imaging a polished surface of the wafer to thereby create image data including the characteristics of plural saw marks left on the polished surface of the wafer from a detected image, performing Fourier transform to the image data to thereby extract a frequency distribution corresponding to the saw marks, performing inverse Fourier transform to the frequency distribution extracted above to obtain an amplitude of each saw mark, and determining imperfect polishing of the wafer in the case that the amplitude is greater than a predetermined range. | 03-03-2016 |
20160063691 | PLENOPTIC CAMERAS IN MANUFACTURING SYSTEMS - The disclosed embodiments relate to using a plenoptic camera in a manufacturing system for various imaging operations. The embodiments include calculating a distance of a manufactured part from a light source or plenoptic camera for further use by a robotic device in the manufacturing system. The embodiments further include compiling a composite two-dimensional or three-dimensional image of a manufactured part in order to derive dimensions of the manufactured part for use by the manufacturing system. Additionally, the embodiments include performing a profile analysis of a surface of a manufactured part based on image data captured by the plenoptic camera. Furthermore, the embodiments discussed herein can be performed on a still or moving manufactured part in order to optimize one or more manufacturing processes. | 03-03-2016 |
20160071259 | Wearable device assembly inspection devices and methods - Automated optical inspection of a wearable device and/or sub-assemblies of the wearable device in-situ in an ambient environment where temperature and ambient lighting are need not be controlled are described. A key gold unit for the wearable device or a subassembly of the wearable device may be mounted to an automated optical inspections system that captures images of the key gold unit, converts the image from a color space it was captured in to a Hue, Saturation and Value/Brightness color space. Units under test are imaged while stationary or while being rotated (e.g., 360 degrees) and are imaged. Image data is converted into the Hue, Saturation and Value/Brightness color space and compared with the data from the key gold unit to determine if the unit under test is color matched with the key gold unit. Functionality such as near field communications, capacitive touch, display functionality and others may be tested. | 03-10-2016 |
20160086320 | INSPECTION APPARATUS - An inspection apparatus capable of preventing a conforming article from being judged as nonconforming when inspecting a molded object for acceptability by performing image processing on an image captured of the inspection object. The apparatus includes a means for positioning a model pattern in a position with a highest degree of agreement by matching the model pattern against the image captured of the inspection object, a model pattern dividing means for dividing the model pattern into a plurality of elements in such a manner as to have mutually overlapping regions, and a shape recognition means for recognizing a shape corresponding to the model pattern by positioning each of the elements divided by the model pattern dividing means in a position with a highest degree of agreement by performing pattern matching within a predetermined range with reference to the position where the model pattern has been positioned on the image. | 03-24-2016 |
20160098615 | APPARATUS AND METHOD FOR PRODUCING IMAGE PROCESSING FILTER - In order to produce an image processing filter by utilizing genetic programming, a taught parameter acquiring unit acquires a taught parameter indicating a feature shape in an input image before processing. A data processing unit creates an output image by processing the input image with an image processing filter, and subsequently a feature extracting unit extracts a detected parameter indicating a feature shape in the output image. An automatic configuring unit evaluates the image processing filter by calculating cosine similarity between the taught parameter and the detected parameter. | 04-07-2016 |
20160098826 | JOINT ASSEMBLIES AND METHOD OF INSPECTING THEREOF - A joint assembly is provided. The joint assembly includes a first component including a first bond surface and a second component including a second bond surface coupled to the first bond surface such that a bond line is defined therebetween. At least one of the first and second components includes a plurality of contrast particles that diffuse across the bond line when a predetermined amount of heat and pressure are applied to the first and second components. | 04-07-2016 |
20160104276 | IN-PROCESS FAULT INSPECTION USING AUGMENTED REALITY - An arrangement for visual fault inspection of at least one component includes a fault identification unit for identifying a structural fault of the component and for determining at least one piece of fault information, and an overlay device connected to the fault identification unit, configured for context-dependent overlay of the fault information in a component image in real-time. | 04-14-2016 |
20160110860 | METHOD AND DEVICE FOR DETERMINING A THREE-DIMENSIONAL DISTORTION - A method for determining a distortion of the image of an object formed by a reflection on a reflecting object includes capturing a reflected image of the reflecting object, determining, using the captured reflected image, a three-dimensional (3-D) shape of the surface of the reflecting object, calculating, based on the determined 3-D shape, distortion of the captured reflected image of the reflecting object from different viewing directions and using the calculated distortion from the different viewing directions, determining a three-dimensional (3-D) distortion of the surface of the reflecting object. | 04-21-2016 |
20160114925 | Medicine inspection device and medicine packaging system - A system for individually packaging medicine is provided with a medicine inspection device that is capable of performing inspection of medicine that is individually packaged using a device for individually packaging medicine or the like. The control device of the medicine inspection device is provided with an inspection database in which images of medicine are stored as master images and is capable of carrying out an inspection task using image matching processing that involves an image acquired by imaging. The control is also capable of performing similarity determination for determining whether a medicine that is similar to a medicine that is packaged in an individual wrapper is present in the inspection database in a state in which the reference scope of the inspection database is restricted. | 04-28-2016 |
20160125582 | QUALITY TEST DEVICE FOR INSPECTING VEHICULAR DISPLAY MODULE HAVING THIN-FILM TRANSISTORS - A quality test device tests a display device having a plurality of thin film transistors (TFTs). The quality test device includes a color analyzer for determining a color of an image displayed by the display device, and a quality inspection module. The quality inspection module controls a display state of the display device and determines whether the TFTs are adequately disposed within the display device based on a performance threshold. The quality inspection module determines that the display device is defective when a performance data of the display device is outside of the performance threshold, and determines that the display device is normal when the performance data is within the performance threshold. | 05-05-2016 |
20160125591 | PROTECTIVE FILM DETECTING APPARATUS AND PROTECTIVE FILM DETECTING METHOD - Disclosed herein is a protective film detecting method including the steps of supplying a mist to a work surface of a workpiece in the condition where the work surface is coated with a protective film, applying light to the work surface of the workpiece, imaging the work surface of the workpiece after supplying the mist, and detecting an uncoated area where the protective film is not formed, by using a difference in light intensity between a coated area where the protective film is formed and the uncoated area where the protective film is not formed to cause the formation of asperities due to droplets formed from the mist supplied to the work surface of the workpiece and the occurrence of Mie scattering of the light applied to the asperities, the difference in light intensity being detected from an image obtained in the imaging step. | 05-05-2016 |
20160133000 | METHOD FOR PROCESSING A DIGITAL IMAGE OF THE SURFACE OF A TYRE IN ORDER TO DETECT AN ANOMALY - To analyze a tyre surface, a 3D elevational image is captured, which is formed of pixels representing points on the surface. Each point is assigned a grey-level value proportional to its elevation relative to a surface level. Based on the elevations in the elevational image, an orientational image is formed showing elevation gradients of the surface. In the orientational image, which is formed of pixels representing points on the surface, each point is assigned a grey-level value proportional to an angle formed with a direction given by a projection in an image plane of a non-zero norm vector substantially corresponding, at this point, to a gradient vector tangent to the surface and oriented in a direction of greatest slope. A filtered image is determined by transforming the orientational image using a filter to select areas that include structures similar to those in a reference orientational image of a blow hole. | 05-12-2016 |
20160133004 | LIQUID CRYSTAL DISPLAY DEVICE HAVING MEASURING MARK FOR MEASURING SEAL LINE, APPARATUS AND METHOD OF MEASURING SEAL LINE - The present invention disposes a plurality of measuring marks on a dummy region having a seal line to detect a position and a width of the seal line during a fabrication process of a liquid crystal display device and then process can be terminated without further processes in case of bad quality of the seal line, thereby process delay and cost may be minimized. | 05-12-2016 |
20160133007 | CRACK DATA COLLECTION APPARATUS AND SERVER APPARATUS TO COLLECT CRACK DATA - According to one embodiment, a crack data collection apparatus includes an acquisition unit, a detector, a calculator and a storage unit. The acquisition unit acquires an image obtained by photographing an inspection object region for a crack in a structure. The detector detects a crack pixel group included in the inspection object region from the image. The calculator successively sets turning points from a starting point to an end point on a contour of the crack pixel group, and calculates positions of the starting point, the turning points, and the end point and a vector of each of the points as crack data, The storage unit stores the crack data. | 05-12-2016 |
20160133008 | CRACK DATA COLLECTION METHOD AND CRACK DATA COLLECTION PROGRAM - According to one embodiment, a crack data collection method includes acquiring an image obtained by photographing an inspection object region for a crack in a structure, detecting a crack pixel group included in the inspection object region from the image, successively setting turning points from a starting point to an end point on a contour of the crack pixel group, and analyzing and collecting positions of the starting point, the turning points, and the end point and a vector of each of the points, as crack data. | 05-12-2016 |
20160140705 | ROTARY ENCODER SYSTEM - A rotary encoder system for registering the rotary angle position and/or angular speed of a rotary shaft which extends along an axis of rotation, comprising at least two optical marks at the rotary shaft, an optical sensor with a pixel matrix having pixel points, an imaging device for imaging each mark in a substantially axial direction on the pixel matrix as a mark image, and an evaluation device for reading and evaluating the pixel matrix in order to determine data in relation to the rotary angle position and/or angular speed, wherein the marks, the imaging device and pixel points are embodied in such a way that the mark images on the pixel matrix have at least the area of a pixel point, wherein the evaluation device is embodied to establish the location of the centroids of the mark images on the pixel matrix. | 05-19-2016 |
20160148365 | ABNORMALITY DETECTION METHOD AND BLAST FURNACE OPERATION METHOD - An abnormality detection method of detecting abnormality of a blast furnace from tuyere images shot by cameras installed in vicinities of a plurality of tuyeres of the blast furnace includes: collecting, in a time-series manner, representative brightness vectors defined by representative brightnesses determined based on brightness values of respective pixels for each of the tuyeres image previously shot by the cameras at a same time; extracting a principal component vector by performing principal component analysis on the representative brightness vectors collected in the time-series manner; calculating, as an evaluation value, a length of a normal line drawn in a direction of the principal component vector from the representative brightness vector collected from the tuyere images shot by the cameras at the same time during an operation; and detecting the abnormality of the blast furnace by comparing the evaluation value with a predetermined threshold. | 05-26-2016 |
20160148368 | METHODS AND SYSTEMS FOR AUTOMATED SELECTION OF REGIONS OF AN IMAGE FOR SECONDARY FINISHING AND GENERATION OF MASK IMAGE OF SAME - Automated systems, methods and tools that automatically extract and select portions of an image to automatically generate a premium finish mask specific to the image which require little or no human intervention are presented. Graphical user interface tools allowing a user to provide an image and to indicate regions of the image for application of premium finish are also presented. | 05-26-2016 |
20160167266 | EJECTION CONTROLLER AND EJECTION CONTROL METHOD FOR INJECTION MOLDING MACHINE | 06-16-2016 |
20160205283 | METHOD AND APPARATUS FOR INSPECTING AN OBJECT EMPLOYING MACHINE VISION | 07-14-2016 |
20160253793 | Detecting Object Presence on a Target Surface | 09-01-2016 |
20160253794 | Distinguishing Between Stock Keeping Units Using Marker Based Methodology | 09-01-2016 |
20160379355 | METHOD FOR DETECTING FLAWS IN THE WALLS OF HOLLOW GLASS ITEMS - The invention relates to a method for detecting defects in the walls of hollow glass items that rotate about their longitudinal axis during inspection, which method is characterised by the production of an image series ( | 12-29-2016 |
20160379358 | MEANS FOR USING MICROSTRUCTURE OF MATERIALS SURFACE AS A UNIQUE IDENTIFIER - The present application concerns the visual identification of materials or documents for tracking or authentication purposes. | 12-29-2016 |
20170236035 | SYSTEM, APPARATUS AND METHOD FOR CONFIGURATION OF INDUSTRIAL VISION CONTROL MODULES | 08-17-2017 |
20170236264 | LUMINANCE-CHROMINANCE CALIBRATION PRODUCTION LINE OF LED DISPLAY MODULE | 08-17-2017 |
20180025479 | SYSTEMS AND METHODS FOR ALIGNING MEASUREMENT DATA TO REFERENCE DATA | 01-25-2018 |
20180025484 | SYSTEMS AND METHODS FOR PROVIDING A COMBINED VISUALIZABLE REPRESENTATION FOR EVALUATING A TARGET OBJECT | 01-25-2018 |
20180025485 | FACILITATING ANOMALY DETECTION FOR A PRODUCT HAVING A PATTERN | 01-25-2018 |
20190147575 | APPEARANCE INSPECTING APPARATUS FOR ARTICLE AND APPEARANCE INSPECTING METHOD FOR ARTICLE USING THE SAME | 05-16-2019 |
20190147585 | BUILD MATERIAL LAYER QUALITY LEVEL DETERMINATION | 05-16-2019 |
20220138928 | METHOD OF INSPECTING A FASTENER, AND A SYSTEM AND APPARATUS FOR INSPECTING A FASTENER - One or more methods of inspecting one or more structural features of an installed fastener in a structure or substructure, and a manually-operated or automated inspection apparatus and an inspection system for inspecting one or more structural features of a fastener in a structure or substructure. | 05-05-2022 |