Entries |
Document | Title | Date |
20080201005 | MACHINE TOOL HAVING WORKPIECE REFERENCE POSITION SETTING FUNCTION BY CONTACT DETECTION - A machine tool having a function of setting a workpiece reference position to a central position of a workpiece. The workpiece has a machining surface symmetrical with respect to two orthogonal lines and is mounted on the machine tool having movable axes supported by fluid bearings so that the two lines extend parallel to axes of a machine coordinate system. A distal end of a stylus of a probe of an on-machine measuring device is brought into contact with the workpiece along first and second lines respectively parallel to the two lines from opposite sides of the workpiece. The contact is detected based on an increase of a position deviation and coordinate values at the time of the contact are stored. Coordinate values of a central position of the workpiece are obtained based on stored coordinate values and the central position is set as a reference position of the workpiece. | 08-21-2008 |
20080221720 | Manufacturing Process End Point Detection - A method for identifying a predetermined state of a manufacturing process by monitoring the process which involves, monitoring a plurality of variables that vary in value during the manufacturing process. The method also involves mapping as points in a hyperspace the values of each variable at a plurality of times, where the hyperspace has a number of dimensions equal to the number of variables and the number of points is equal to the plurality of times. The method also involves identifying that a manufacturing process has reached the predetermined state when one of the points reaches a closed volume in the hyperspace that is located within a predefined distance from a predefined location in the hyperspace. | 09-11-2008 |
20080221721 | Automated Sputtering Target Production - A system and method are provided for manufacturing workpieces, such as metal articles like sputtering target, the system comprising: comparing one or more physical or chemical values of a respective one of a plurality of metal target blanks to one or more comparable values of at least one desired criterion; selecting one of the metal target blanks from a plurality of metal target blanks as a work-in-progress; assigning a serial route for the work-in-progress; processing the work-in-progress by translating the work-in-progress from note to node with an automated transport, after completion of the events at each node; rejecting or accepting the work-in-progress as a metal target by evaluating a result of at least one event of the one or more respective events to be completed at, at least one of the plurality of nodes. | 09-11-2008 |
20080228305 | SYSTEM AND METHOD FOR CONTROLLING PRODUCT QUALITY - A computer-based method for controlling product quality is disclosed. The method includes the steps of: detecting whether a quality of raw materials bought from at least one supplier are acceptable; detecting whether a quality of using materials used at a processing procedure are acceptable; detecting whether a quality of products being manufactured at the processing procedure are acceptable; receiving and storing a post-procedure report obtained by sampling the products after the processing procedure; repeating steps of detecting materials used at a processing procedure, detecting products being manufactured at the processing procedure, detecting the sampling products after the processing procedure, and completing the manufacturing if all the products are finished. A related system is also disclosed. | 09-18-2008 |
20080228306 | DATA COLLECTION AND ANALYSIS SYSTEM - A sensor network collects time-series data from a process tool and supplies the data to an analysis system where pattern analysis techniques are used to identify structures and to monitor subsequent data based on analysis instructions or a composite model. Time-series data from multiple process runs are used to form a composite model of a data structure including variation. Comparison with the composite model gives an indication of tool health. A sensor network may have distributed memory for easy configuration. | 09-18-2008 |
20080243288 | Method for the Production of a Fancy Yarn - A method which improves the correspondence between the produced fancy yarn and the predetermined configuration of said fancy yarn. The fancy yarn is guided through a sensor device in a spinning device after it is formed and the diameter of the fancy yarn is continuously measured by the sensor device. The fancy configuration of the produced yarn is determined on the basis of the measured values of the diameter and is compared with the predetermined fancy configuration. The comparison is carried out until sufficient correspondence between the predetermined fancy configuration and the fancy configuration of the optimized, produced yarn is achieved. | 10-02-2008 |
20080243289 | Model maintenance architecture for advanced process control - A system and method modifies a dynamic model of a process in a plant for an advanced process control controller wherein the model includes sub models. Performance of the controller is monitored and performance degradation is quantified as the process changes. It is then determined whether a selected number of sub models need updating or the entire model dynamics need updating as a function of the quantified controller performance degradation If a selected number of sub models need updating, an excitation signal is initiated for such sub models to identify new sub models. If the entire model dynamics need updating, a complete perturbation signal is initiated and triggers exhaustive closed-loop identification of entire model. The newly identified model or sub models is incorporated in the controller. | 10-02-2008 |
20080249647 | System and Method of Data Harvesting - Data harvesting can be carried out relative to performance or reliability information associated with one or more groups of electrical units. Ambient condition detectors associated with a variety of industrial or commercial installations and subject to a variety of different conditions can be returned for performance and reliability testing after predetermined usage intervals. Analysis of test results can be maintained in a database. Customers can be provided multilevel access to the information in the database. Reliability and test results for a class of detectors can be provided to a number of customers that have provided samples for evaluation. Application specific information can be limited to a particular customer or customers. | 10-09-2008 |
20080269935 | METHOD AND APPARATUS FOR QUALITY CONTROL OF MECHANICAL PIECES - Method for quality control of mechanical pieces, such as screws, pins, pivots and similar, intended for mass-production mechanical industries such as automobile and household appliances industries and similar, by means of an apparatus comprising in casings a plurality of operation stations and a piece-holder table which is pitched revolving to convey the pieces to the operation stations. The method comprises: subdividing the operation stations into two groups, a first group comprising fast operation stations with operation times shorter than a predetermined time, and a second group comprising slow operation stations With operation times longer than a predetermined time; providing, for each slow operation station of the second group of slow stations an equal slow operation station angularly distanced by an uneven number of pitches; stopping the piece-holder table at each pitch alternately with said operation times shorter or longer than said predetermined time; deactivating all the slow operation stations during the operation time shorter than the predetermined time. Also a quality control apparatus is disclosed. | 10-30-2008 |
20080269936 | METHOD AND PROGRAM FOR SELECTING PRODUCT TO BE INSPECTED - An inspection-required product selection method and program for minimizing the number of investigation steps at the time of occurrence of a defect of a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection. | 10-30-2008 |
20080275585 | EXTRACTION OF KEY PROCESS PARAMETER - A system, method, and computer readable medium for extracting a key process parameter correlative to a selected device parameter are provided. In an embodiment, the key process parameter is determined using a gene map analysis. The gene map analysis includes grouping highly correlative process parameter and determining the correlation of a group to the selected device parameter. In an embodiment, the groups having greatest correlation to the selected device parameter are displayed in a correlation matrix and/or a gene map. | 11-06-2008 |
20080300711 | SYSTEM AND METHOD FOR TRANSLATING VARIATION INFORMATION BETWEEN COMPUTER 3D VARIATION MODELS AND GEOMETRIC DIMENSIONING & TOLERANCING CALLOUTS - Systems and methods are disclosed for consistently translating or converting between geometric dimensioning and tolerancing information and variation parameters for a three dimensional variation analysis tool. The methods and systems may receive geometric dimensioning and tolerancing information; translate, with a computer, the received geometric dimensioning and tolerancing information into variation parameters for a three dimensional variation analysis tool; and output the variation parameters. | 12-04-2008 |
20080306620 | Method for Machining a Workpiece - The invention relates to a method for machining a workpiece ( | 12-11-2008 |
20090062952 | Method and system for managing and validating product development - A method is provided for managing and validating product development. The method may include obtaining a product specification for a product and identifying prior products that have capabilities within a defined range of the product specifications. The method may also include developing a performance specification based on the product specification and the identified prior products. Further, the method may include obtaining approval for the performance specification, developing the product according to the performance specification, and validating that the product meets the performance specification. | 03-05-2009 |
20090093903 | METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCTS FOR AUTOMATING PROCESS AND EQUIPMENT QUALIFICATIONS IN A MANUFACTURING ENVIRONMENT - Methods, systems, and computer program products for automating process and equipment qualifications in a manufacturing environment are provided. A method includes defining a triggering event for initiating a qualification of an equipment, process module, or process. The qualification is configured to identify whether the equipment, process module, or process is operating according to specified criteria. The method also includes qualifying a monitor for use in the qualification. Upon the occurrence of the triggering event, the method includes running qualified monitors through the qualification. Based upon the results of qualifying the monitor for use in the qualification or the results of the execution of the qualification, the method includes determining and implementing a disposition for the monitor. | 04-09-2009 |
20090192644 | METHOD AND SYSTEM FOR MANUFACTURING AN ARTICLE USING PORTABLE HAND-HELD TOOLS - A method of manufacturing an article includes the steps of: establishing a defined location for a tool activity to occur; determining an actual location of the tool; comparing the actual location of the tool with the defined location; ascertaining an occurrence of the tool activity at the actual location; and verifying whether the tool activity occurred at the defined location. | 07-30-2009 |
20090204250 | SYSTEM AND METHOD FOR INTEGRATING RFID SENSORS IN MANUFACTURING SYSTEM COMPRISING SINGLE USE COMPONENTS - The present invention provides a system and method for measuring physical, chemical and biological properties of a manufacturing system comprising embedding a plurality of RFID sensors in a plurality of corresponding single use components wherein each of the plurality of RFID sensors is configured to provide multi-parameter measurements for at least one single use component from the plurality of single use components, and each of the plurality of RFID sensors is further configured to provide simultaneous digital identification for the single use component and for its respective RFID sensor and further comprises reading the multi-parameter measurements and the digital identification for the plurality of single use components using at least one RFID writer/reader, processing the measurements using a processor, and controlling subsequent process steps by comparing the measurements of at least one parameter to a predetermined value. | 08-13-2009 |
20090210083 | SYSTEM AND METHOD FOR ELECTRONIC INSPECTION AND RECORD CREATION OF ASSEMBLY, REPAIR AND MAINTENANCE OPERATIONS - A system and method for generating a real time electronic quality record of an assembly, test, and repair or maintenance operation. The method involves generating inputs from a plurality of information sources located within a manufacturing environment, the information sources providing information pertaining to at least a tool being used, an individual using the tool, and an operation that the tool is being used by the individual to perform. A locating system is in communication with the information sources to monitor a location and an operation of the tool. A processor is in communication with the locating system to receive the generated inputs, and to generate a real time electronic record upon completion of the operation that the tool is being used to perform. The electronic record shows that the operation has been performed by a given individual using the tool in accordance with a predefined standard. In various embodiments various databases containing tool calibration information, user training and/or certification information, and drawing or process information may be used by the processor in formulating the real time electronic record. | 08-20-2009 |
20090248189 | METHOD AND SYSTEM FOR AUTOMATIC GENERATION OF THROUGHPUT MODELS FOR SEMICONDUCTOR TOOLS - The throughput of complex cluster tools of a semiconductor manufacturing environment may be determined for a desired manufacturing scenario on the basis of automatically generated throughput models. The throughput models may be established on the basis of rule messages with high statistical relevance. | 10-01-2009 |
20090271020 | SYSTEM AND METHOD FOR ANALYZING PERFORMANCE OF AN INDUSTRIAL ROBOT - A computing system is communicated with a metal fabrication device for analyzing performance of an industrial robot. The metal fabrication device includes the industrial robot, and a plate bender. The computing system is operable to generate an analysis report of the performance of the industrial robot by providing section model creating function, bending point obtainting function, bending operation monitoring function, workpiece modeling function for the metal fabrication device. The quality of a finished workpiece bent by the industrial robot from a metal plate may be analyzed from the analysis report generated by the computing system. | 10-29-2009 |
20090292386 | System and Method for Automatic Virtual Metrology - A server, a system and a method for automatic virtual metrology (AVM) are disclosed. The AVM system comprises a model-creation server and a plurality of AVM servers. The model-creation server is used to construct the first set of virtual metrology (VM) models (of a certain equipment type) including a VM conjecture model, a RI (Reliance Index) model, a GSI (Global Similarity Index) model, a DQI | 11-26-2009 |
20090299515 | COATING AND DEVELOPING APPARATUS, COATING AND DEVELOPING METHOD, AND STORAGE MEDIUM - When a product substrate passes a reference module which is an n-th module ahead of an inspection module in a transfer path, an inspection reservation signal for performing an inspection to a lot to which the product substrate belongs is outputted to the inspection module. When the inspection module is in trouble, the output of an inspection reservation signal for a product substrate is forbidden, and the product substrates to be transferred to the inspection module are transferred to a module which is next to the inspection module in a transfer order. When the trouble of the inspection module has been resolved and a substrate for confirmation inspection is preferentially transferred to the inspection module, an inspection reservation signal for the substrate for confirmation inspection is outputted, the substrate for confirmation inspection is transferred to the inspection module, and the confirmation inspection for the inspection module is performed. | 12-03-2009 |
20090306803 | METHOD FOR USING REAL-TIME APC INFORMATION FOR AN ENHANCED LOT SAMPLING ENGINE - A method includes passing a lot through a production process and evaluating a statistical quality of the production process. Additionally, the method includes calculating an advanced process control (APC) recipe parameter adjustment (RPA) distribution value and determining if sampling is indicated. Furthermore, the method includes, if sampling is indicated, performing a measurement process of the lot. | 12-10-2009 |
20100010659 | Thin Films measurment method and system - A method and system are presented for use in controlling the processing of a structure. First measured data is provided being indicative of at least one of the following: a thickness (d | 01-14-2010 |
20100017009 | SYSTEM FOR MONITORING MULTI-ORDERABLE MEASUREMENT DATA - A computer-based measurement monitoring system and method for monitoring multi-stage processes capable of producing multi-orderable data and identifying, at any stage in the monitored process, unacceptable deviations from an expected value at particular stages of the process, and communicating same detected deviation to facilitate corrective action in the process. The system and method consolidate data obtained at various stages of the process, arrange the measurement data in a multi-orderable data framework, compare the multi-orderable framework data with expected parameter values corresponding to the various stages, and detects unacceptable deviations from the expected values. The unacceptable deviations are communicated to responsible personnel, and the system and method provides same personnel with supplemental information useful in diagnosing the root cause of the problem leading to the detected deviations. | 01-21-2010 |
20100161104 | Mode Based Metal Strip Stabilizer - A method for vibration damping and shape control of a suspended metal strip during continuous transport in a processing facility in a steel rolling line or surface treating line in a steel mill, where the method comprises the steps: measuring distance to the strip by a plurality of non-contact sensors; and generating a strip profile from distance measurements; decomposing the strip profile to a combination of mode shapes; determining coefficients for the contribution from each mode shape to the total strip profile; and controlling the strip profile by a plurality of non-contact actuators based on a combination of mode shapes. | 06-24-2010 |
20100185314 | GST Film Thickness Monitoring - In polishing a substrate having a layer of GST disposed over an underlying layer, during polishing, a non-polarized light beam is directed onto the layer of GST. The non-polarized light beam reflects from the first substrate to generate a reflected light beam having an infra-red component. A sequence of measurements of intensity of the infra-red component of the reflected light beam are generated, and, in a processor, a time at which the sequence of measurements exhibits a predefined feature is determined. | 07-22-2010 |
20100198387 | QUALITY CONTROL SYSTEM, QUALITY CONTROL APPARATUS, QUALITY CONTROL METHOD AND COMPUTER READABLE MEDIUM - A quality control method includes: extracting, from a time series distribution of troubles that have occurred in electronic equipments, a first characteristics of states of occurrence of the troubles; specifying one or more parts included in the electronic equipments, the parts being involved with the troubles; extracting, from another time series distribution of a rate of use corresponding to each of suppliers which supply the specified parts, a second characteristics of the parts; and specifying one or more of the suppliers supplying the parts correlated to the troubles based on a correlation between the extracted first characteristics and the extracted second characteristics. | 08-05-2010 |
20100211205 | METHOD FOR PROCESS DIAGNOSIS AND ROTARY ATOMIZER ARRANGEMENT - A rotary atomizer arrangement and methods for operating the same are disclosed. An exemplary atomizer may be used for the coating of work pieces, and may include a bell plate driven by an electric motor. The exemplary atomizer may further be configured for the detection of errors in the spraying process and/or the drive system of the bell plate, such as by analyzing corresponding parameters of typical values of the drive motor. | 08-19-2010 |
20100217423 | Method for Providing Functions in an Industrial Automation System, Control Program and Industrial Automation System - In order to provide functions in an industrial automation system having control units which are coupled via a communication network, functions of the automation system are made available by services. Components of a service are subdivided into service-specific components and into components which can be reused by a plurality of different services. Service-specific components and reusable components have a standard configuration interface. Service components are linked to a service by a service configuration unit via the standard configuration interface. Functions for monitoring and/or controlling a defined quality of service are assigned to the reusable components. | 08-26-2010 |
20100228374 | SEMICONDUCTOR SUBSTRATE PROCESSING METHOD AND APPARATUS - A semiconductor substrate processing apparatus and a method for processing semiconductor substrates are provided. The method may include providing a semiconductor substrate having a surface and a plurality of features on the surface, each feature being positioned on the surface at a first respective point in a first coordinate system, plotting the position of each feature at a second respective point in a second coordinate system; and generating a translation between the first and the second coordinate systems. The generating of the translation may include calculating an offset between the first and the second coordinate systems. The calculating of the offset may include calculating an offset distance between a reference point of the first coordinate system and a reference point of the second coordinate system and calculating an offset angle between an axis of the first coordinate system and an axis of the second coordinate system. | 09-09-2010 |
20100292826 | RETICLE MANIPULATION DEVICE - A reticle manipulating device comprising a housing capable of having a controlled environment wherein at least one processing module is connected to the housing and capable of processing a reticle. A transport apparatus is, connected to the housing for transporting the reticle between the at least one module to another portion of the housing. At least one module is removably connectable to the housing and at least one module has an interface adapted for removably coupling the module to the housing. One module being selectable for connection to the housing from a number of different interchangeable module each having a different predetermined characteristic and being capable of connection to the housing. | 11-18-2010 |
20100332011 | METHODS AND ARRANGEMENTS FOR IN-SITU PROCESS MONITORING AND CONTROL FOR PLASMA PROCESSING TOOLS - An arrangement for implementing an automatic in-situ process control scheme during execution of a recipe is provided. The arrangement includes control-loop sensors configured at least for collecting a first set of sensor data to facilitate monitoring set points during the recipe execution, wherein the control-loop sensors being part of a process control loop. The arrangement also includes independent sensors configured at least for collecting a second set of sensor data, which is not part of the process control loop. The arrangement yet also includes a hub configured for at least receiving at least one of the first set of sensor data and the second set of sensor data. The arrangement yet further includes an analysis computer communicably coupled with the hub and configured for performing analysis of at least one of the first set of sensor data and the second set of sensor data. | 12-30-2010 |
20110015773 | Semiconductor Wafer Monitoring Apparatus and Method - Metrology methods and apparatus for semiconductor wafer fabrication in which data for metrology is obtained by detecting a measurable property of a monitored entity, which is either (i) a wafer transporter (e.g. a FOUP) loaded with one or more wafers to be monitored, or (ii) a plurality of wafers. Performing metrology measurements on a loaded wafer transporter enables the step of extracting wafer (s) from the transporter for metrology measurements to be omitted. Moreover, metrology measurement may be obtained while transporting the wafer (s) between treatment locations. By considering a plurality of wafers as a unit, a single measurement representing a combination of individual wafer responses is obtained. All wafers contribute to the metrology measurement without the need to perform individual wafer measurements. | 01-20-2011 |
20110054659 | WAFER FABRICATION MONITORING SYSTEMS AND METHODS, INCLUDING EDGE BEAD REMOVAL PROCESSING - Systems and method for monitoring semiconductor wafer fabrication processing, for example based upon EBR line inspection, including capturing at least one image of a wafer at an intermediate stage of fabrication. The captured image(s) are compressed to generate a composite representation of at least an edge zone of the wafer. An edge bead removal area is identified in the representation, and at least one feature attribute is extracted from the identified area. The extracted feature attribute is automatically assessed, and information relating to a status of the fabrication processing in generated based upon the assessment. For example, recommended modifications to the fabrication processing, either upstream or downstream of the current stage of fabrication (or both) can be generated and implemented. | 03-03-2011 |
20110093109 | METHOD AND SYSTEM FOR CONTROLLING PRODUCTION OF ITEMS - The invention relates to a method for controlling a production of items on a production line, wherein a digital image of each of said items is processed so as to obtain at least identified product type data and identified item data, said identified product type data and identified item data being further used for determining a reliable production volume per product type and per associated item. | 04-21-2011 |
20110178627 | INTEGRATED MENU-DRIVEN MANUFACTURING METHOD AND SYSTEM - A menu-driven manufacturing technique includes determining a product and product configuration, along with process steps to be carried out in manufacturing workstations. Display screens corresponding to the particular manufacturing process steps are accessed and displayed on monitors at the workstations to lead operators through the processes. Control circuitry may verify that the correct components and tools are utilized as called for by the various process steps. Powered tools and test setups may be integrated with the system to enable improved quality control. | 07-21-2011 |
20110208342 | Inspection Method and Apparatus, and Lithographic Apparatus - A metrology device for inspecting a substrate is provided. In an embodiment, the metrology device includes a remote radiation source device, an optical system for creating a radiation beam, and an optical fibre for transferring radiation from the optical system to the location where the metrology operations are performed. The optical system includes a control system that includes a deformable mirror, a detector that detects the position of a radiation beam, and a controller that produces a control signal for input into the deformable mirror, the control signal being based on the detected position of the radiation. In this way, the shape of the deformable mirror can be used to control the position of the radiation beam output by the optical system into the optical fibre. | 08-25-2011 |
20110213488 | PLANT MONITORING CONTROL DEVICE AND EVENT ANALYSIS SUPPORT METHOD - A plant monitoring control device ( | 09-01-2011 |
20110213489 | MANUFACTURING OF INTEGRATED CIRCUIT DEVICES USING A GLOBAL PREDICTIVE MONITORING SYSTEM - A global predictive monitoring system for a manufacturing facility. The system may be employed in an integrated circuit (IC) device fabrication facility to monitor processing of semiconductor wafers. The system may include deployment of a swarm of individually separate agents running in computers in the facility. Each agent may comprise a genetic algorithm and use several neural networks for computation. Each agent may be configured to receive a limited set of inputs, such as defectivity data and WIP information, and calculate a risk from the inputs. A risk may be a value indicative of a production yield. Each agent may also generate a quality value indicative of a reliability of the risk value. New agents may be generated from the initial population of agents. Outputs from the agents may be collected and used to calculate projections indicative of a trend of the production yield. | 09-01-2011 |
20110238199 | MEASUREMENT METHOD AND DEVICE FOR THREAD PARAMETERS - A measurement method for thread parameters for a threaded object ( | 09-29-2011 |
20110276169 | BATCH CONTROL USING BANG-BANG CONTROL - A method for batch control in a system. The system comprises at least two batch processing sets that share at least one shared equipment. A batch is initiated in each processing set. Process variables from each batch are monitored. At least one process variable from at least one batch are adjusted using bang-bang control to prevent conflicts. | 11-10-2011 |
20120041582 | WIRELESS ADAPTER WITH PROCESS DIAGNOSTICS - A process device with diagnostics for use in an industrial process includes a process variable sensor or controller element which is configured to sense or control a process variable of a process fluid of the industrial process. Circuitry is coupled to the process variable sensor or control element and configured to measure or control a process variable of the industrial process. A wireless communication adapter includes wireless communication circuitry configured to communicate in the industrial process. The wireless communication circuitry is further configured to receive a process signal from another process device. Diagnostic circuitry is configured to diagnose operation of the industrial process as a function of the sensed process variable and the received process signal. | 02-16-2012 |
20120078409 | Electronic Supervisor - Electronic supervision may be provided. First, a stock number may be sent to a database server. The stock number may correspond to a product comprising, for example, an electrical cable. In response to sending the database server the stock number, specification information corresponding to the product may be received from a database stored on the database server. The specification information may comprise, for an electrical cable, a number of wires, a weight per thousand feet, and a diameter. Next, product production may be monitored to determine faults occurring during production. Monitoring the production may comprise displaying a data monitoring screen to production personnel. The data monitoring screen may provide data regarding the product and product comparison against a standard maintained within the database for the product. Fault data corresponding to the determined faults occurring during the production may be saved to the database. | 03-29-2012 |
20120095585 | System and Method for Workflow Integration - A system is provided. The system comprises a computer system, an at least one memory; and a first application stored in the at least one memory. When executed by the computer system, the first application automatically executes a workflow that receives a first input from a human machine interface (HMI) in a first plant, in response to the first input generates a first event that assigns a first task associated to a first functional role performed at the first plant, receives a second input associated with the first task, in response to the second input generates a second event that assigns a second task associated to a second functional role, receives a third input associated with the second task, in response to the third input transmits information to the human machine interface that changes the process mediated by the human machine interface in the first plant. | 04-19-2012 |
20120101620 | Apparatus and Operating Systems for Manufacturing Impregnated Wood - Furfurylated wood produced in a two-chamber system in which monomer/oligomer impregnation in an impregnation chamber is followed by successive stages of drying and curing. Physical properties of wood under treatment are measured, recorded and referenced into a database that accumulates wood species data relating to applied temperature and pressure profiles, physical properties and appearance of intermediate and finished samples of wood and also chemical treatment regimes, including soak time and monomer/oligomer concentrations. During drying and curing, monitoring of process parameters, including water removal and/or atmospheric conditions, are used by a controller both to control and determine a state of process completion by comparing recorded data with historically accumulated data or process set point conditions. Physical and/or chemical attributes of finally processed wood are used in an automated control loop to modify, reactively or in real time, applied treatment regimes for specific wood species and wood profiles. | 04-26-2012 |
20120101621 | Plasma Processing Apparatus - A plasma processing apparatus includes a detector for detecting interference light of multiple wavelengths from a surface of a sample during processing, a pattern comparator for comparing actual deviation pattern data on the interference light obtained at a given time during processing and a plurality of standard deviation patterns corresponding to two or more thicknesses of the film, and calculating a deviation, the standard deviation patterns corresponding to interference light data of multiple wavelengths obtained, before the processing of the sample, for processing of another sample, a deviation comparator for comparing the deviation between the data and a predetermined deviation and outputting data on a thickness of the film of the sample at that time, a recorder for recording, as time series data, the data on the thickness of the film, and an endpoint decision unit. | 04-26-2012 |
20120136468 | Apparatus and Method for Testing Electromigration in Semiconductor Devices - An apparatus and method for testing electromigration in semiconductor devices includes providing an electromigration test structure, where the electromigration test structure includes a first metal line; a metal bridge operatively coupled to the first metal line; a second metal line operatively coupled to the metal bridge; a barrier layer surrounding the electromigration test structure; current contact pads; and voltage contact pads. The current contact pads are connected to a current source and the voltage contact pads are connected to a voltage source. The barrier layer is exposed to the elevated current density as current travels from the first metal line across the barrier layer through the metal bridge to the second metal line. | 05-31-2012 |
20120150333 | Automated monitoring and control of contamination activity in a production area - An automated process for monitoring and controlling contamination activity in a production area comprises capturing image from the production area over a period of time, processing the image data with a computer to determine whether a contamination event has occurred in the production area, and activating a contamination control device in accordance with the processing of the image data. The contamination event can be a germ-releasing event from an individual in the production area, a pipe leaking fluid into the production area, etc. The automated monitoring and control may also determine whether an article of contamination control equipment (e.g., face mask, glove, etc) is properly positioned on the individual to prevent the contamination from entering the production area in a form that could contaminate product, equipment, or the production area itself. An automated system for monitoring and controlling contamination includes a computer, an imaging sensor in communication with the computer, and a computer-readable program code disposed on the computer. | 06-14-2012 |
20120158169 | CLOSED-LOOP SILICON ETCHING CONTROL METHOD AND SYSTEM - A closed-loop etching control system controls exposure of a silicon workpiece to a spontaneous etchant. The system determines an amount of material to be removed from the silicon workpiece, based on metrology information corresponding to the silicon workpiece. The mass of the material to be removed is calculated, and the silicon workpiece is exposed to the spontaneous etchant to remove the material. The system monitors a change in mass of the silicon workpiece caused by exposure of the silicon workpiece to the spontaneous etchant to determine when the amount of the material has been removed from the silicon workpiece. Exposure of the silicon workpiece to the spontaneous etchant is stopped when the change in the mass of the silicon workpiece indicates that the amount of the material has been removed. | 06-21-2012 |
20120209415 | Quality Control System And Method For Manufactured Parts - A system and method for production of manufactured parts including a production process having at least one industrial robot equipped with a handling tool for picking up the manufactured part. The robot is arranged in a quality inspection cell and the robot is programmed to hold the manufactured part in at least one known position in the quality inspection cell and present the part for a quality inspection. The quality inspection may be made visually by an operator or with the aid of a tool or sensor or by means of automatic sensors. In other aspects of the invention a method, system and a computer program for carrying out the method are described. | 08-16-2012 |
20120226375 | DUAL LOOP CONTROL OF CERAMIC PRECURSOR EXTRUSION BATCH - A control strategy for producing high quality extrudates, including the steps of monitoring the temperature of a ceramic precursor batch by measuring the temperature of the batch material either directly or indirectly by measuring the temperature of a component of the extruder proximate to the die and transmitting the temperature data to an extrusion control system which comprises a master controller ( | 09-06-2012 |
20120226376 | METHOD AND DEVICE FOR BLOW MOLDING CONTAINERS - Method and device for blow molding containers, wherein a preform made of a thermoplastic material is shaped to give a container using blow molding pressure in a blow mold once the preform has been subjected to a thermal conditioning step in the region of a heating section along a transport path, and wherein at least one parameter characterizing the blow molding process is measured and supplied to a control device which acts upon at least one adjusting element to change at least one parameter influencing the blow molding process. The control device ( | 09-06-2012 |
20120239179 | WORK SUPPORT SYSTEM, WORK SUPPORT METHOD, AND STORAGE MEDIUM - The content of an operating instruction to each worker in a manufacturing process is controlled in the following way based on a manufacturing direction to the worker and on manufacturing achievement, work proficiency, and the like of the worker for the manufacturing direction. A deviation between a manufacturing direction and manufacturing achievement is calculated. Manufacturing direction parameters acting as factors of the calculated deviation are specified for each product to be manufactured. The above information is stored in a deviation factor database. For a new manufacturing direction, manufacturing direction parameters therein are checked against the deviation factor database to determine alarm information to be given to a worker on a manufacturing line, and the determined alarm information is outputted. | 09-20-2012 |
20120253498 | METHOD FOR PRODUCING METAL INGOT, METHOD FOR CONTROLLING LIQUID SURFACE, AND ULTRAFINE COPPER ALLOY WIRE | 10-04-2012 |
20120323355 | SPECTROGRAPHIC MONITORING OF A SUBSTRATE DURING PROCESSING USING INDEX VALUES - Methods, systems, and apparatus for spectrographic monitoring of a substrate during chemical mechanical polishing are described. In one aspect, a computer-implemented method includes storing a library having a plurality of reference spectra, each reference spectrum of the plurality of reference spectra having a stored associated index value, measuring a sequence of spectra in-situ during polishing to obtain measured spectra, for each measured spectrum of the sequence of spectra, finding a best matching reference spectrum to generate a sequence of best matching reference spectra, determining the associated index value for each best matching spectrum from the sequence of best matching reference spectra to generate a sequence of index values, fitting a linear function to the sequence of index values, and halting the polishing either when the linear function matches or exceeds a target index or when the associated index value from the determining step matches or exceeds the target index. | 12-20-2012 |
20130150996 | MACHINE FOR ASSEMBLING VEHICLES AND METHODS OF ASSEMBLING VEHICLES - A machine for use in assembling a vehicle is described herein. The vehicle includes at least a first component and a second component adapted to be coupled to the first component to form a component assembly. The machine includes at least one component tooling apparatus that is configured to selectively adjust an orientation of the second component with respect to the first component. A control system is coupled to the at least one component tooling apparatus. The control system includes a processor that is configured to receive a unique vehicle identifier associated with the component assembly, and determine a design orientation of the second component with respect to the first component based at least in part on the received unique vehicle identifier. | 06-13-2013 |
20130184847 | SYSTEMS AND METHODS FOR ENABLING AND DISABLING OPERATION OF MANUFACTURING MACHINES - A system for enabling and disabling operation of manufacturing machines provides a manufacturing machine user interface that facilitates receiving quality control information regarding the manufacturing machine from a user. For quality assurance purposes, the computer system of the manufacturing machine may decide whether to enable operation of the manufacturing machine based on the received quality control information. The computer system of the manufacturing machine may also decide to disable operation of the manufacturing machine if the quality control information provided is incomplete, out of date, or otherwise insufficient to indicate the manufacturing machine is ready for safe and effective operation. In some embodiments, one or more client systems, telecommunications devices, and/or personal digital assistant (PDA) devices on which the user interface is displayed and with which the manufacturing machine is in communication may enable operation of the manufacturing machine based on the received quality control information. | 07-18-2013 |
20130282159 | TABLET-INSPECTING DEVICE - The present invention provides a tablet-inspecting device in which the control unit gives, to the continuous drug packet-driving unit, operation instructions to move the continuous drug packet from an upstream side to a downstream side of the conveyor path, and reciprocating operation instructions to alternately move the continuous drug packet to the upstream side and the downstream side of the conveyor path, the control unit gives, to the rod control unit, rod unit pressing operation instructions to press the rod unit against the side portion of the drug packet, and when the control unit gives the reciprocating operation instructions, the rod unit pressing operation instructions has been given, it is possible to enhance determining precision of the number of tablets or the kinds of tablet, and to stably inspect drugs. | 10-24-2013 |
20130304245 | PRODUCTION LINE QUALITY PROCESSES - Methods, systems, and software for improving the product quality of a production line having multiple production steps, at least some of which employ multiple individual tools, including producing product lots using different combinations of tools, setting a quality benchmark for the resulting product lots, identifying product lots that meet the quality benchmark, identifying the tools used to produce the identified quality product lots, and producing additional product lots using at least substantially the identified quality tools. | 11-14-2013 |
20130317639 | AUTOMATIC CHECKING, VALIDATION, AND POST-PROCESSING OF A BATTERY OBJECT - A machine such as an industrial robot operates either in a stand-alone or in-production mode to perform a number of tests on a battery object having one of several different assembly levels and packaging geometries. The machine has selectable testing programs that correspond to various combinations of object assembly levels and geometries. The machine performs the tests either by coming into contact with a predetermined location on the conductive material of the object or viewing that location. The test results are analyzed to determining if retesting is necessary. After all of the tests are completed on an object, the tested object is assigned a grade and then sorted by grade. The tested objects may be kept at the machine location or sent on for further processing based on the assigned grade. After the testing is completed on one object, the machine tests the next object to be tested. | 11-28-2013 |
20140039660 | SPECTROGRAPHIC MONITORING OF A SUBSTRATE DURING PROCESSING USING INDEX VALUES - Methods, systems, and apparatus for spectrographic monitoring of a substrate during chemical mechanical polishing are described. In one aspect, a computer-implemented method includes storing a library having a plurality of reference spectra, each reference spectrum of the plurality of reference spectra having a stored associated index value, measuring a sequence of spectra in-situ during polishing to obtain measured spectra, for each measured spectrum of the sequence of spectra, finding a best matching reference spectrum to generate a sequence of best matching reference spectra, determining the associated index value for each best matching spectrum from the sequence of best matching reference spectra to generate a sequence of index values, fitting a linear function to the sequence of index values, and halting the polishing either when the linear function matches or exceeds a target index or when the associated index value from the determining step matches or exceeds the target index. | 02-06-2014 |
20140046470 | METHOD OF CONTROLLING SUBSTRATE PROCESSING APPARATUS, MAINTENANCE METHOD OF SUBSTRATE PROCESSING APPARATUS AND TRANSFER METHOD PERFORMED IN SUBSTRATE PROCESSING APPARATUS - Only a wafer for QC check may be transferred and a production wafer may prevent from being transferred into an assigned process chamber whose QC check is not completed after a maintenance task, and the production wafer may be processed the assigned process chamber after the completion of the QC check. The wafer for QC check is transferred while inhibiting a transfer of the production wafer into the assigned process chamber, and the production wafer is transferred into each of the process chambers of the plurality except the assigned process chamber. | 02-13-2014 |
20140088747 | Near Non-Adaptive Virtual Metrology and Chamber Control - Embodiments of the present invention relate to a method for a near non-adaptive virtual metrology for wafer processing control. In accordance with an embodiment of the present invention, a method for processing control comprises diagnosing a chamber of a processing tool that processes a wafer to identify a key chamber parameter, and controlling the chamber based on the key chamber parameter if the key chamber parameter can be controlled, or compensating a prediction model by changing to a secondary prediction model if the key chamber parameter cannot be sufficiently controlled. | 03-27-2014 |
20140107824 | Method and System for Wafer Quality Predictive Modeling based on Multi-Source Information with Heterogeneous Relatedness - The present invention generally relates to the monitoring and controlling of a semiconductor manufacturing environment and, more particularly, to methods and systems for virtual meteorology (VM) applications based on data from multiple tools having heterogeneous relatedness. The methods and systems leverage the natural relationship of the multiple tools and take advantage of the relationship embedded in process variables to improve the prediction performance of the VM predictive wafer quality modeling. The prediction results of the methods and systems can be used as a substitute for or in conjunction with actual metrology samples in order to monitor and control a semiconductor manufacturing environment, and thus reduce delays and costs associated with obtaining actual physical measurements. | 04-17-2014 |
20140121805 | AUTOMATED DATA-DRIVEN CLOSED-LOOP-FEEDBACK METHOD FOR ADAPTIVE & COMPARATIVE QUALITY CONTROL IN A DISCRETE DATA AGGREGATION ENVIRONMENT - A method for determining quality includes receiving supplier quality data from a supplier. The supplier quality data includes discrete quality data. The supplier quality data is for a quantity of a component supplied to a company or for a service provided on behalf of the company over a supplier measurement period. The method includes aggregating quality data from two or more suppliers. The quality data is for the supplied component or provided service over a baseline time period. The method includes determining a quality benchmark using the aggregated quality data and setting one or more alarm levels. The alarm levels are based on the quality benchmark of the aggregated quality data. The method includes determining supplier quality level for the supplier for the supplier measurement time period. The supplier quality is based on the supplier quality data. The method includes determining if the supplier quality data exceeds an alarm level. | 05-01-2014 |
20140156050 | MICROBIAL MONITORING AND PREDICTION - Aspects describe capturing various bacteria levels within a process affected by microbial agents. A model of the process and a model of expected bacteria growth are analyzed and, based on the analysis, at least one process parameter is automatically modified to improve or optimize the product or process or other business or operational objectives. Also provided are at least two autonomous agents within the process. The at least two autonomous agents communicate and autonomously implement an action in an upstream stage and/or downstream stage within the process, wherein the at least two autonomous agents access the representation of the process and the biological representation and/or bio-chemical representation to implement the action. | 06-05-2014 |
20140163714 | THERMOELECTRIC EVALUATION AND MANUFACTURING METHODS - A means for determining the electrical resistance and resistivity of thermoelectric material allows quality control at all steps in the construction of a bismuth telluride and antimony telluride thermoelectric generator. The method involves measuring negative thermoelectric voltage with no current flowing and then a measure of negative thermoelectric voltage while forcing known current through the material in the same direction as shorted to accurately determine thermoelectric resistance. A manual and automatic method of manufacturing thermoelectric rings using forcing current for in-process testing means. | 06-12-2014 |
20140236336 | Process Control for Post-Form Heat Treating Parts for an Assembly Operation - A manufacturing process including a quality control procedure for verifying the completion of forming processes, heat treating and chemically treating parts. Sheet formed blanks, tubular blanks, extrusions and casting are traced through a manufacturing process from the time the parts are received. Metallurgical data relating to parts as received is recorded and marked on the parts. Forming data, heat treating data and chemical treating data may also be recorded by scanning and marking parts throughout the manufacturing process. | 08-21-2014 |
20140249663 | SYSTEM AND METHOD FOR CONTROLLING THE QUALITY OF AN OBJECT - A system for controlling the quality of an object leaving a production facility. The system includes a chamber including an inlet port through which the object to be inspected is inserted into the chamber and at least one outlet port, the chamber having an inspection zone, a transport device for conveying the object to be inspected into the inspection zone and for releasing same through the at least one outlet port, a weighing apparatus for weighing the object in the inspection zone, an assembly for the contact-free dimensional measuring of the object in the inspection zone, and an assembly for analysing the structure of the object in the inspection zone by means of laser beams and/or X-rays. The chamber is made from a material that is opaque for the wavelengths of the laser beams during operation and the X-rays, in order to prevent any radiation leakage. | 09-04-2014 |
20140277673 | PRODUCTION FAILURE ANALYSIS SYSTEM - A production failure analysis system including a factory quality control unit configured to transmit a trigger signal when a production failure is detected, and an analytics unit. The analytics unit is configured to determine a root cause of the production failure by at least receiving the trigger signal from a factory quality control unit, extracting production data from a database when the trigger signal is received, wherein the production data includes process input variables, and identifying one or more potential root causes of the production failure based in part on an analysis of the process input variables. | 09-18-2014 |
20140277674 | SENSOR SYSTEM AND METHOD FOR DETERMINING PAPER SHEET QUALITY PARAMETERS - A non-contact sensor system and method are disclosed for determining paper sheet quality parameters such as caliper, basis weight and sheet moisture based on THz radiation. The method can include emitting, by an emitter system, a THz radiation signal towards paper sheet material such that the THz radiation interacts with the paper sheet material; detecting, by a detector system, a time and/or frequency dependent response of the THz radiation signal having interacted with the paper sheet material; determining model parameters of a physical model by optimizing the model parameters such that a predicted response of the physical model is fitted to the detected response, the model parameters being indicative of transmission and/or reflection coefficients at interfaces of the paper sheet material with surrounding media; and determining, from the determined model parameters, at least some of the paper sheet quality parameters. | 09-18-2014 |
20140297016 | EYEGLASS LENS PROCESSING APPARATUS - An eyeglass lens processing apparatus includes a lens chuck unit that holds an eyeglass lens; a processing unit that has a processing tool to process the eyeglass lens held by the lens chuck unit; and an adjustment unit that adjusts a relative distance between the eyeglass lens and the processing tool. The eyeglass lens processing apparatus operates the processing unit and processes the eyeglass lens by operating the adjustment unit based on processing data. The eyeglass lens processing apparatus includes a check unit that checks whether or not the eyeglass lens is properly processed in a state where the eyeglass lens is held by the lens chuck unit. | 10-02-2014 |
20140364986 | ROBOT SYSTEM - A robot system capable of accurately measuring assembly accuracy of a workpiece formed to include a rotation shaft is provided. To implement such a robot system, a robot system according to an aspect of the present embodiment includes a robot and an accuracy measurement device. The robot transfers a workpiece formed to include a rotation shaft. The accuracy measurement device holds the rotation shaft of the workpiece transferred by the robot to be substantially parallel to the vertical direction, and measures assembly accuracy of the workpiece while rotating the rotation shaft to rotate the whole of the workpiece. | 12-11-2014 |
20150018998 | VEHICLE WELDING QUALITY INSPECTION DEVICE AND THE METHOD THEREOF - A vehicle welding quality inspection device for checking welding parts of a vehicle body transferred along a transferring line may include a welding part shooting unit fixed on an outside of the transfer line, shoots a welding inspection part of the vehicle body, and outputs the shot data to the controller, and a welding part vision sensor disposed on a front end of an arm of a robot, is moved thereby toward the welding point of the welding inspection part that is recognized by the controller, shoots the welding point, and the vision data to the controller. | 01-15-2015 |
20150039117 | APPARATUS AND METHOD OF SEGMENTING SENSOR DATA OUTPUT FROM A SEMICONDUCTOR MANUFACTURING FACILITY - An apparatus and method of segmenting sensor data are provided. The apparatus includes a sensor, a first segmentation unit, a continuity evaluation unit, a second segmentation unit, and a segmentation determination unit. The sensor collects sensor data for a process of the semiconductor manufacturing facility. The first segmentation unit extracts a variation point of the sensor data to perform an abnormal difference (AD) segmentation on the sensor data based on the at least one variation point. The continuity evaluation unit evaluates a continuity ratio of the sensor data. The second segmentation unit performs a free-knot spline (FS) segmentation on the sensor data when the continuity ratio exceeds a reference ratio. The segmentation determination unit compares the AD segmentation result with the PS segmentation result and to select one of the results on the comparison result. | 02-05-2015 |
20150045927 | STENCIL PROGRAMMING AND INSPECTION USING SOLDER PASTE INSPECTION SYSTEM - A system for generating a program used to direct the operation of a solder paste inspection machine is provided. The system includes a solder paste inspection system having a stencil mounting bracket located therein and configured to hold a solder paste printing stencil in position within an inspection region of the solder paste inspection system. An image sensor is mounted in the solder paste inspection system and is configured to acquire images of a stencil mounted on the stencil mounting bracket. A controller is coupled to the image sensor and is configured to generate a solder paste inspection program using the acquired images of the stencil. | 02-12-2015 |
20150066187 | Systems and Methods for Adjusting Target Manufacturing Parameters on an Absorbent Product Converting Line - Systems and processes herein may be configured to correlate manufacturing parameters and performance feedback parameters with individual absorbent articles manufactured by a converting apparatus. Embodiments of the systems herein may include inspection sensors configured to inspect substrates and/or component parts advancing along the converting line and communicate inspection parameters to a controller and historian. The systems may also include process sensors configured to monitor equipment on the converting line and communicate process parameters to the controller and historian. The systems herein may also be adapted to receive performance feedback parameters based on the packaged absorbent articles. The systems may correlate inspection parameters, process parameters, and/or performance feedback parameters with individual absorbent articles produced on the converting line. The controller may also be configured to perform various functions based on the performance feedback parameters. | 03-05-2015 |
20150112470 | COMPUTING DEVICE AND METHOD FOR IMAGE MEASUREMENT - A computing device measures an object using images of the object. The computing device processes the images to obtain a focus of a lens of the CNC machine. A second image of the object is captured at a focus of the lens of the CNC machine. The computing device obtains measurement points according to the second image. The computing device calculates a difference between determined coordinates of each measurement point and reference coordinates of a reference point corresponding to each measurement point. | 04-23-2015 |
20150134098 | MANUFACTURING PROCESS MANAGEMENT SUPPORT DEVICE - There is a provided manufacturing process management support device that has an input means for inputting information indicative of the fact that work related to a manufacturing process is performed, and is capable of increasing the reliability of result information. A handy terminal | 05-14-2015 |
20150142154 | MODULAR SYSTEM FOR REAL-TIME EVALUATION AND MONITORING OF A MACHINING PRODUCTION-LINE OVERALL PERFORMANCES CALCULATED FROM EACH GIVEN WORKPIECE, TOOL AND MACHINE - The present invention provides a modular system and method for real-time evaluation and monitoring of a machining production line overall performances, calculated from each given metal workpiece, consumable tool and machine. The present invention is configured for an iterative and incremental calculation and evaluation of the machining production-line overall performances, by incrementally evaluating individual workpiece's performances, consumable tools' performances and machine's performances, extracted from the data of a plurality of workpieces and machines. The present invention is further configured for comparing the workpiece's performances to a similar workpiece's best performance, extracted from the evaluation of a plurality of the data similar workpieces. The present invention is further configured for the identification of significant process faults and their cause. The present invention is further configured for the analysis of the applied engineering-plan effectiveness, using a defined engineering score. | 05-21-2015 |
20150148932 | DEVICE FOR CHECKING THE CONSTRUCTION OF AN EXTRUDER SCREW - A device for checking the construction of an extruder screw having a shaft and screw elements that are to be pushed or have been pushed one after the other onto the shaft in a defined sequence. Each screw element has an element-specific external geometry. A recording device being provided for determining information concerning the sequence of the screw elements that are to be pushed on or have been pushed on and for comparing the information determined with target information, which directly or indirectly describes the target sequence. | 05-28-2015 |
20150331414 | Dynamically Calculated Refractive Index for Determining the Thickness of Roofing Materials - Disclosed is a system for measuring and controlling the thickness of asphalt roofing materials during manufacturing. Light beams are used to generate a time of flight signal that is used to determine the thickness of the asphalt roofing layer. A controller generates a thickness control signal that controls a coater to modify parameters of the coater to produce the asphalt roofing layer with a desired thickness. | 11-19-2015 |
20150367961 | COMPUTER-ASSISTED METHODS OF QUALITY CONTROL AND CORRESPONDING QUALITY CONTROL SYSTEMS - The disclosure herein relates to a quality control method and system in aeronautical manufacturing. The system comprises a tablet connected to a concession management server, the server being itself linked to an aircraft configuration database, a three-dimensional digital model of the aircraft and a fault database. The element to be inspected is identified using the digital model and the fault is characterized by browsing a predetermined decision tree associated with the element. | 12-24-2015 |
20150370248 | System, Methods and Apparatus Using Virtual Appliances in a Semiconductor Test Environment - In one embodiment, a semiconductor test control system includes a computer system having a plurality of hardware resources; a hypervisor installed on the computer system; and a test floor controller installed on the computer system. The hypervisor virtualizes the hardware resources and provides each of at least one virtual appliance with access to a respective virtual set of hardware resources. Each virtual set of hardware resources places its respective virtual appliance in controlling communication with at least a first aspect of a semiconductor test system, thereby enabling the respective virtual appliance to test a respective type of semiconductor device. The test floor controller is in controlling communication with i) at least a second aspect of the semiconductor test system, and ii) each of the at least one virtual appliance. | 12-24-2015 |
20160026177 | PRODUCTION LINE QUALITY PROCESSES - The embodiments described herein relate to methods, systems, and computer program products for improving the product quality of product lots produced on a production line. A quality value for each product lot is determined, and a quality benchmark is established. Each product lot is classified based on the quality benchmark. Product lots that have a quality value meeting the quality benchmark are classified as quality lots, and product lots having a quality value failing to meet the quality benchmark are classified as failing lots. Tools used in the production of the product lots are identified, which includes identifying a set of quality tools and a set of failing tools. Routing of additional product lots is directed by shifting production at least substantially to the set of quality tools. | 01-28-2016 |
20160033961 | Production Control Support Apparatus and Production Control Support Method - A production control support apparatus according to one embodiment includes processing circuitry. The processing circuitry calculates a plurality of different functions depending on respective regions of the upper bound value based on: a number of machines existing in each process; a time interval of the semi-finished products arriving at the production line; a statistical dispersion of the time interval; a time necessary for one machine in each process to process one semi-finished product; and a statistical dispersion of the necessary time; and thereby obtains a relationship between the upper bound value and the blocking probability for each of the regions, and an association of the functions of the respective regions is a function where the blocking probability monotonically decreases depending on an increase of the upper bound value. | 02-04-2016 |
20160048111 | METHOD OF REAL TIME IN-SITU CHAMBER CONDITION MONITORING USING SENSORS AND RF COMMUNICATION - Plural sensors on an interior surface of a reactor chamber are linked by respective RF communication channels to a hub inside the reactor chamber, which in turn is linked to a process controller outside of the chamber. | 02-18-2016 |
20160054724 | METHOD OF EVALUATING A MACHINED SURFACE OF A WORKPIECE, A CONTROLLING APPARATUS AND A MACHINE TOOL - A worked surface of a workpiece is evaluated on the basis of how the surface is actually perceived by a person's (observer's) eyes (vision) or fingers (touch), and a work process whereby a workpiece is worked is changed on the basis of the evaluation. | 02-25-2016 |
20160077520 | QUALITY CONTROLLING DEVICE AND CONTROL METHOD THEREOF - According to one embodiment, there is provided a quality controlling device including: a predictor, a frequency calculator, and an implementing signal creator. The predictor employs a prediction model that associates an inspection result value of a first inspection with a predicted value being a value relating to a possibility of pass or failure in a second inspection and calculates the predicted value from an inspection result value that is obtained for an inspection target in the first inspection. The frequency calculator calculates, for the inspection target, an implementation frequency to implement the second inspection in accordance with the predicted value calculated by the predictor. The implementing signal creator creates a signal that indicates, for the inspection target, necessity of implementing the second inspection in accordance with the implementation frequency. | 03-17-2016 |
20160098029 | PORTABLE DEVICE AND METHOD FOR PRODUCTION CONTROL AND QUALITY CONTROL - A system and method is for production control, and comprises an electronic device, and one or more network connectors associated with the electronic device configured to connect to a server computer. The server computer contains a database of one or more work instructions that are downloadable to the electronic device through the network connector. The one or more work instructions are configured to provide operation instructions for one or more tools and the one or more network connectors are further configured to provide work instructions to the one or more tools. | 04-07-2016 |
20160139593 | SYSTEMS AND METHODS FOR ASSURING AND IMPROVING PROCESS QUALITY - A system for evaluating at least one state of a process is provided the system having means for segmenting the process into a plurality of process segments, one or more sensors configured to capture information related to each process segment of the plurality of process segments generated by the segmenting means, the information comprising a plurality of samples, and processing means configured to process the plurality of samples related to each process segment of the plurality of segments, and, based on the processing, provide an indication associated with the at least one state of the process. | 05-19-2016 |
20160202692 | SYSTEM AND METHOD FOR USING AN INTERNET OF THINGS NETWORK FOR MANAGING FACTORY PRODUCTION | 07-14-2016 |
20160378094 | ONLINE REAL-TIME CONTROL METHOD FOR PRODUCT MANUFACTURING PROCESS - The invention provides an online real-time control method for a product manufacturing process and includes: (A) establishing a monitoring equation for estimating a product attribute in view of production line parameters corresponding to respective steps in a manufacturing process of a product; (B) when each of the steps is finished, updating the calculation result according to an online feedback value(s) of the production line parameter(s) corresponding to the finished step; (C) when the updated calculation result in the step (B) indicates that the quality of the product does not meet a required quality specification, adjusting the production line parameter(s) corresponding to the step(s) after the finished step to make the quality of the product meet the required quality specification. According to the method, a key attribute(s) of the display device can be kept within an acceptable specification by adjusting the production line parameter(s) of subsequent step(s). | 12-29-2016 |
20190146448 | QUALITY CONTROL ISOMETRIC FOR INSPECTION OF FIELD WELDS AND FLANGE BOLT-UP CONNECTIONS | 05-16-2019 |
20190146466 | METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER | 05-16-2019 |