03rd week of 2017 patent applcation highlights part 47 |
Patent application number | Title | Published |
20170018378 | CONTACT MEMS ARCHITECTURE FOR IMPROVED CYCLE COUNT AND HOT-SWITCHING AND ESD | 2017-01-19 |
20170018379 | OPERATING DEVICE AND IMAGE FORMING APPARATUS | 2017-01-19 |
20170018380 | SWITCH DEVICE | 2017-01-19 |
20170018381 | COMPONENT FOR ELECTRIC POWER SYSTEM, AND CONTACT ASSEMBLY AND OPEN AIR ARCING ELIMINATION METHOD THEREFOR | 2017-01-19 |
20170018382 | OPTICALLY TRANSMISSIVE KEY ASSEMBLIES FOR DISPLAY-CAPABLE KEYBOARDS, KEYPADS, OR OTHER USER INPUT DEVICES | 2017-01-19 |
20170018383 | Safety-Oriented Load Switching Device and Method for Operating a Safety-Oriented Load Switching Device | 2017-01-19 |
20170018384 | METHOD FOR MONITORING THE STATE OF THE EARTHING CONTACTS OF A CONTACTOR CONTROLLABLE BY MEANS OF AN EXCITER COIL | 2017-01-19 |
20170018385 | LATCH RELAY | 2017-01-19 |
20170018386 | RELAY FOR ELECTRONIC VEHICLE INCLUDING PERMANENT MAGNET AND METHOD OF FABRICATING THEREOF | 2017-01-19 |
20170018387 | OPERATION DEVICE | 2017-01-19 |
20170018388 | PROTECTIVE CIRCUIT BREAKER | 2017-01-19 |
20170018389 | CIRCUIT PROTECTION ASSEMBLY | 2017-01-19 |
20170018390 | SWITCHING DEVICE AND SWITCH-OFF METHOD FOR OPERATING A SWITCHING DEVICE | 2017-01-19 |
20170018391 | IMAGE INTENSIFIER WITH INDEXED COMPLIANT ANODE ASSEMBLY | 2017-01-19 |
20170018392 | COMPOSITE TARGET AND X-RAY TUBE WITH THE COMPOSITE TARGET | 2017-01-19 |
20170018393 | MAGNETIC SHIELDING OF AN X-RAY EMITTER | 2017-01-19 |
20170018394 | Scanning Electron Microscope | 2017-01-19 |
20170018395 | Nano-Patterned System And Magnetic-Field Applying Device Thereof | 2017-01-19 |
20170018396 | METHOD FOR AUTOMATIC CORRECTION OF ASTIGMATISM | 2017-01-19 |
20170018397 | SAMPLE HOLDER FOR CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICLE BEAM DEVICE | 2017-01-19 |
20170018398 | REVIEW OF SUSPECTED DEFECTS USING ONE OR MORE REFERENCE DIES | 2017-01-19 |
20170018399 | DEVICE FOR CORRELATIVE SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM) AND LIGHT MICROSCOPY | 2017-01-19 |
20170018400 | SEMICONDUCTOR PLASMA ANTENNA APPARATUS | 2017-01-19 |
20170018401 | Methods And Systems For Determining A Fault In A Gas Heater Channel | 2017-01-19 |
20170018402 | METHOD OF REDUCING COMA AND CHROMATIC ABBERATION IN A CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICLE BEAM DEVICE | 2017-01-19 |
20170018403 | METHOD AND SYSTEM FOR OPTIMIZING CONFIGURABLE PARAMETERS OF INSPECTION TOOLS | 2017-01-19 |
20170018404 | DRAWING DATA CREATION METHOD AND CHARGED PARTICLE BEAM DRAWING APPARATUS | 2017-01-19 |
20170018405 | PLASMA PROCESSING APPARATUS | 2017-01-19 |
20170018406 | Method for Activating an Inner Surface of a Substrate Tube for the Manufacturing of an Optical-Fiber Preform | 2017-01-19 |
20170018407 | PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD | 2017-01-19 |
20170018408 | USE OF SINTERED NANOGRAINED YTTRIUM-BASED CERAMICS AS ETCH CHAMBER COMPONENTS | 2017-01-19 |
20170018409 | PLASMA INDUCED FLOW ELECTRODE STRUCTURE, PLASMA INDUCED FLOW GENERATION DEVICE, AND METHOD OF MANUFACTURING PLASMA INDUCED FLOW ELECTRODE STRUCTURE | 2017-01-19 |
20170018410 | APPARATUS AND METHODS FOR GENERATING REACTIVE GAS WITH GLOW DISCHARGES | 2017-01-19 |
20170018411 | EXTREME EDGE SHEATH AND WAFER PROFILE TUNING THROUGH EDGE-LOCALIZED ION TRAJECTORY CONTROL AND PLASMA OPERATION | 2017-01-19 |
20170018412 | Sputtering Apparatus | 2017-01-19 |
20170018413 | ADJUSTABLE PROCESS SPACING, CENTERING, AND IMPROVED GAS CONDUCTANCE | 2017-01-19 |
20170018414 | Microwave Cavity Resonator Detector | 2017-01-19 |
20170018415 | DIVIDED-APERTURE LASER DIFFERENTIAL CONFOCAL LIBS AND RAMAN SPECTRUM-MASS SPECTRUM MICROSCOPIC IMAGING METHOD AND DEVICE | 2017-01-19 |
20170018416 | CONTROL OF GAS FLOW | 2017-01-19 |
20170018417 | PROCESS AND APPARATUS FOR MEASURING AN ORGANIC SOLID SAMPLE BY GLOW DISCHARGE SPECTROMETRY | 2017-01-19 |
20170018418 | AN ELECTROSTATIC ION TRAP MASS SPECTROMETER UTILIZING AUTORESONANT ION EXCITATION AND METHODS OF USING THE SAME | 2017-01-19 |
20170018419 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS AND RECORDING MEDIUM | 2017-01-19 |
20170018420 | METHOD FOR PROTECTING LAYER BY FORMING HYDROCARBON-BASED EXTEMELY THIN FILM | 2017-01-19 |
20170018421 | STRESS RELAXED BUFFER LAYER ON TEXTURED SILICON SURFACE | 2017-01-19 |
20170018422 | NODULE RATIOS FOR TARGETED ENHANCED CLEANING PERFORMANCE | 2017-01-19 |
20170018423 | Apparatus and Method for Processing the Surface of a Workpiece Comprised of Sensitive Materials with an Ozone and Carbon Dioxide Treating Fluid | 2017-01-19 |
20170018424 | METHOD FOR CLEANING LANTHANUM GALLIUM SILICATE WAFER | 2017-01-19 |
20170018425 | HETEROLEPTIC DIAZADIENYL GROUP 4 TRANSITION METAL-CONTAINING COMPOUNDS FOR VAPOR DEPOSITION OF GROUP 4 TRANSITION METAL-CONTAINING FILMS | 2017-01-19 |
20170018426 | SEMICONDUCTOR SUBSTRATES AND METHODS FOR PROCESSING SEMICONDUCTOR SUBSTRATES | 2017-01-19 |
20170018427 | METHOD OF SELECTIVE EPITAXY | 2017-01-19 |
20170018428 | LITHOGRAPHY PROCESS FOR THE ENCAPSULATION OF PATTERNED THIN FILM COATINGS | 2017-01-19 |
20170018429 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | 2017-01-19 |
20170018430 | SEMICONDUCTOR STRUCTURE AND MANUFACTURE METHOD THEREOF | 2017-01-19 |
20170018431 | SEMICONDUCTOR MANUFACTURING APPARATUS AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | 2017-01-19 |
20170018432 | MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE | 2017-01-19 |
20170018433 | METHODS FOR DEPOSITING NICKEL FILMS AND FOR MAKING NICKEL SILICIDE AND NICKEL GERMANIDE | 2017-01-19 |
20170018434 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD | 2017-01-19 |
20170018435 | Semiconductor Device and Method of Manufacture | 2017-01-19 |
20170018436 | RESIST UNDERLAYER FILM COMPOSTION, PATTERNING PROCESS, AND COMPOUND | 2017-01-19 |
20170018437 | GATE CUT WITH HIGH SELECTIVITY TO PRESERVE INTERLEVEL DIELECTRIC LAYER | 2017-01-19 |
20170018438 | PATTERN FORMING METHOD AND BAKE CONDITION DETERMINING METHOD | 2017-01-19 |
20170018439 | METAL REMOVAL WITH REDUCED SURFACE ROUGHNESS | 2017-01-19 |
20170018440 | ROBUST MULTI-LAYER WIRING ELEMENTS AND ASSEMBLIES WITH EMBEDDED MICROELECTRONIC ELEMENTS | 2017-01-19 |
20170018441 | METHODS AND APPARATUS FOR SUBSTRATE EDGE CLEANING | 2017-01-19 |
20170018442 | UNIT FOR SUPPLYING TREATMENT LIQUID AND APPARATUS FOR TREATING SUBSTRATE | 2017-01-19 |
20170018443 | CLUSTER TOOL TECHNIQUES WITH IMPROVED EFFICIENCY | 2017-01-19 |
20170018444 | SUBSTRATE TRANSFER APPARATUS, SUBSTRATE TRANSFER METHOD, AND NON-TRANSITORY STORAGE MEDIUM | 2017-01-19 |
20170018445 | 3D IC BUMP HEIGHT METROLOGY APC | 2017-01-19 |
20170018446 | ON THE FLY AUTOMATIC WAFER CENTERING METHOD AND APPARATUS | 2017-01-19 |
20170018447 | MISALIGNMENT/ALIGNMENT COMPENSATION METHOD, SEMICONDUCTOR LITHOGRAPHY SYSTEM, AND METHOD OF SEMICONDUCTOR PATTERNING | 2017-01-19 |
20170018448 | SEMICONDUCTOR DEVICE AND METHOD | 2017-01-19 |
20170018449 | RELEASABLE CARRIER AND METHOD | 2017-01-19 |
20170018450 | PROCEDURE OF PROCESSING A WORKPIECE AND AN APPARATUS DESIGNED FOR THE PROCEDURE | 2017-01-19 |
20170018451 | WAFER CLAMPING APPARATUS | 2017-01-19 |
20170018452 | METHODS FOR FABRICATING INTEGRATED CIRCUITS USING FLOWABLE CHEMICAL VAPOR DEPOSITION TECHNIQUES WITH LOW-TEMPERATURE THERMAL ANNEALING | 2017-01-19 |
20170018453 | METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES INCLUDING ISOLATION LAYERS | 2017-01-19 |
20170018454 | METHOD FOR PREPARING LOW-WARPAGE SEMICONDUCTOR SUBSTRATE | 2017-01-19 |
20170018455 | UV-ASSISTED MATERIAL INJECTION INTO POROUS FILMS | 2017-01-19 |
20170018456 | Layered Benzocyclobutene Interconnected Circuit and Method of Manufacturing Same | 2017-01-19 |
20170018457 | Semiconductor Device Comprising an Oxygen Diffusion Barrier and Manufacturing Method | 2017-01-19 |
20170018458 | METHOD FOR CLEANING VIA OF INTERCONNECT STRUCTURE OF SEMICONDUCTOR DEVICE STRUCTURE | 2017-01-19 |
20170018459 | INTERCONNECT STRUCTURE INCLUDING MIDDLE OF LINE (MOL) METAL LAYER LOCAL INTERCONNECT ON ETCH STOP LAYER | 2017-01-19 |
20170018460 | SEMICONDUCTOR STRUCTURE WITH SELF-ALIGNED SPACERS AND METHOD OF FABRICATING THE SAME | 2017-01-19 |
20170018461 | Semiconductor Device Including at Least One Lateral IGFET and at Least One Vertical IGFET and Corresponding Manufacturing Method | 2017-01-19 |
20170018462 | SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF | 2017-01-19 |
20170018463 | Dipole-Based Contact Structure to Reduce Metal-Semiconductor Contact Resistance in MOSFETs | 2017-01-19 |
20170018464 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | 2017-01-19 |
20170018465 | SILICON GERMANIUM AND SILICON FINS ON OXIDE FROM BULK WAFER | 2017-01-19 |
20170018466 | SILICON-GERMANIUM FINFET DEVICE WITH CONTROLLED JUNCTION | 2017-01-19 |
20170018467 | X-RAY INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR WAFERS | 2017-01-19 |
20170018468 | METHODS FOR PRODUCING INTEGRATED CIRCUITS WITH INTERPOSERS AND INTEGRATED CIRCUITS PRODUCED FROM SUCH METHODS | 2017-01-19 |
20170018469 | APPARATUS, METHOD AND NONTRANSITORY COMPUTER READABLE MEDIUM FOR MANUFACTURING INTEGRATED CIRCUIT DEVICE | 2017-01-19 |
20170018470 | SEMICONDUCTOR DEVICE | 2017-01-19 |
20170018471 | Physical Quantity Sensor | 2017-01-19 |
20170018472 | Underfill Material, Laminated Sheet and Method for Producing Semiconductor Device | 2017-01-19 |
20170018473 | PHOSPHONIUM COMPOUND, EPOXY RESIN COMPOSITION INCLUDING THE SAME AND SEMICONDUCTOR DEVICE PREPARED USING THE SAME | 2017-01-19 |
20170018474 | ELECTRONIC COMPONENT PACKAGE | 2017-01-19 |
20170018475 | SEMICONDUCTOR DEVICE AND METHOD | 2017-01-19 |
20170018476 | Die Packages and Methods of Manufacture Thereof | 2017-01-19 |
20170018477 | METHOD FOR PROTECTING LAYER BY FORMING HYDROCARBON-BASED EXTREMELY THIN FILM | 2017-01-19 |