05th week of 2012 patent applcation highlights part 73 |
Patent application number | Title | Published |
20120030845 | SCANNING PROBE MICROSCOPE - An atomic force microscope (AFM) ( | 2012-02-02 |
20120030846 | Atomic Force Microscopy System and Method for Nanoscale Measurement - An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both. | 2012-02-02 |
20120030847 | Cranberry variety named WI92-A-X15 - A new and distinct cranberry variety “W198-A-X15” is described. The variety is distinguished by significantly higher yields, larger fruit size, more favorable bud set traits, tolerance to high levels of fertilizer, higher and earlier red pigmentation, and ability to set excellent crops at an early age as compared to ‘Stevens’, the most widely grown cranberry cultivar. “W198-A-X15” was derived from a controlled cross of the variety ‘Stevens’ and an open-pollinated seedling selection of the variety ‘Ben Lear’ designated as “Boone's BL8”. | 2012-02-02 |
20120030848 | Salvia plant named 'DANSALFN13' - A new and distinct | 2012-02-02 |
20120030849 | Sanvitalia plant named ' DANVITAL4' - A new distinct cultivar of | 2012-02-02 |