10th week of 2015 patent applcation highlights part 27 |
Patent application number | Title | Published |
20150061645 | SENSOR DEVICE - This invention provides a sensor device at reduced cost. The sensor device includes a printed circuit board, a first terminal, a second terminal, an interconnect line, and a semiconductor device. The first terminal and second terminal are provided on the printed circuit board and coupled to a power line. The second terminal is coupled to a downstream part of the power line with respect to the first terminal. The interconnect line is disposed on the printed circuit board to couple the first terminal and second terminal to each other. In other words, the interconnect line is coupled to the power line in parallel. The semiconductor device is mounted on the printed circuit board and includes an interconnect layer and an inductor formed in the interconnect layer. | 2015-03-05 |
20150061646 | ADAPTABLE VOLTAGE LEVEL DETECTION WITH RESISTIVE LADDER - A switch actuation detection unit has a switch actuation voltage reception terminal and a logic circuit. The logic circuit includes a first port, a second port, a zener diode, and a signal port. The switch actuation voltage reception terminal receives a switch actuation voltage. The first port is connected to the switch actuation voltage reception terminal. A first terminal of the zener diode is connected to the switch actuation voltage reception terminal while a second terminal of the zener diode is connected to the second port. The signal port provides a plurality of pre-determined switch state signals. | 2015-03-05 |
20150061647 | METHOD FOR CALIBRATING A MEASURING DEVICE FOR INSPECTING SURFACES ON THE BASIS OF BARKHAUSEN NOISES FOR A SPECIFIED COMPONENT GEOMETRY - A method for enhancing inspection of components of specific geometry based on Barkhausen noises. The method includes specifying a first calibration curve that is independent of the component geometry, which describes the relationship between surface hardness values and measured Barkhausen noise signals. A first noise signal is determined by the measuring device for a reference component having the specified geometry and a first hardness value. A second noise signal is determined for a second reference component, having the specified geometry and a second hardness value lower than the first. A second calibration curve is determined, in which the first calibration curve is fitted to the first noise signal at the first hardness value and to the second noise signal at the second hardness value, such that using the second calibration curve, the measured noise signal of a component having the specified geometry relates with a surface hardness value. | 2015-03-05 |
20150061648 | METHOD OF SENSING SLIDING BY HALL SENSOR AND SENSING SYSTEM USING THE SAME - A method of sensing a sliding by a sensor including grouping one or more Hall elements into one or more groups, measuring magnetic field strength generated by a magnetic field source, and comparing the magnetic field strength at the one or more Hall elements to determine whether a horizontal sliding occurs. | 2015-03-05 |
20150061649 | MOVING MAGNETIC FIELD GENERATING APPARATUS - A moving magnetic field generating apparatus includes a magnet array including magnets disposed at a first pitch such that N and S poles of adjacent magnets in the magnet array are alternated, and first and second magnetic pole piece arrays extending along the magnet array to interpose the magnet array therebetween with a gap from the magnet array. The first and second magnetic pole piece arrays are disposed with a predetermined phase difference therebetween. The first magnetic pole piece array includes first magnetic pole pieces disposed at a second pitch in an array and each having a length enough to face at least two adjacent magnets in the magnet array. The second magnetic pole piece array is configured similarly to the first magnetic pole piece array. One of the first and second magnetic pole piece arrays and the magnet array is relatively moved to the other at a predetermined speed. | 2015-03-05 |
20150061650 | METHOD AND ARRANGEMENT AND SENSOR FOR DETERMING THE POSTION OF A COMPONENT - The invention relates to a method and an arrangement for determining a position of a first component ( | 2015-03-05 |
20150061651 | STATOR OF RESOLVER AND METHOD FOR MANUFACTURING STATOR ASSEMBLY - A stator of a resolver includes a stator body including multiple magnetic pole portions; multiple stator windings respectively wound around the magnetic pole portions; multiple terminal pins each including a stator winding connecting portion around which the corresponding stator winding is wound; and an external cable connecting portion to be connected with an external cable; and a terminal pin holding portion that holds the terminal pins. The stator winding connecting portion of each terminal pin is formed in a double layer by folding a metal piece and has a fold formed when the metal piece is folded. The fold of the stator winding connecting portion of each terminal pin is formed along a longitudinal direction of the stator winding connecting portion. | 2015-03-05 |
20150061652 | RESOLVER - A resolver has a stator includes a circular yoke, multiple salient poles radially projecting inward from the yoke, and winding wires wound around the salient poles via an insulator; a rotor disposed inside the stator; a wire outgoing portion arranged with plural terminal pins, the terminal pins being connected to end portions of the winding wires; and a terminal pin cover attached to the wire outgoing portion and covering the terminal pins. The terminal pin cover includes multiple spaces that individually contain one of the terminal pins. A filler is filled in each space, whereby the end portion of the winding wire electrically connected to the terminal pin is sealed in the filler. | 2015-03-05 |
20150061653 | ANGLE DETECTION DEVICE - Outputs from first and second magnetic detection units are applied to first to fourth output circuits, each being a differential amplifier, and therefore detection outputs S | 2015-03-05 |
20150061654 | ROTATION DETECTOR - A rod-shaped magnet is mounted on a rotating unit. The rod-shaped magnet has end surfaces which are oriented in a rotating direction and are magnetized to different magnetic poles. An angle detecting unit including magnetoresistive elements is disposed so as to be offset in a radial direction of a revolution path of the magnet from the revolution path and is configured to detect a change in angle of rotation of the rotating unit by detecting a leakage magnetic field in the vicinity of a side surface of the magnet. Two position detecting units each include magnetoresistive elements and are configured to detect a change in orientation of a magnetic field in the direction of a tangent to the revolution path when facing the rod-shaped magnet and produce a switch output. | 2015-03-05 |
20150061655 | MAGNETIC SENSING DEVICE USING MAGNETISM TO DETECT POSITION - A position signal generating part | 2015-03-05 |
20150061656 | Circuits and Methods for Generating a Threshold Signal Used in a Motion Detector In Accordance With a Least Common Multiple of a Set of Possible Quantities of Features Upon a Target - A circuit to detect a movement of an object provides a threshold selection module or a peak identifier module that uses one or more threshold signals identified prior to a present cycle of magnetic field signal in order to establish a threshold signal used for a present cycle of the magnetic field signal. A method associated with the circuit is also described. The circuit and method can be tailored to store values associated with a least common multiple of a set of possible quantities of detectable features on target objects. | 2015-03-05 |
20150061657 | POSITION DETECTOR APPARATUS - A position detector apparatus includes a detector part, wiring, a resin part, a resin body, a terminal, and a lead frame. The resin part has a thickness at a wiring side portion of the detector part that is greater than a thickness on a side opposite to the wiring side portion. Therefore, when injection-molding the resin part, due to a thickness change of the resin part, the detector part is pressed against a metal mold and a position of the detecting part is fixed. Further, the resin body has a thick-resin portion and a thin-resin portion. The thickness of the thin-resin portion allows a predetermined amount of dislocation of the detector part. Therefore, if the detector part is exposed, water is prevented from intruding the lead frame and the terminal. | 2015-03-05 |
20150061658 | XMR ANGLE SENSORS - Embodiments relate to xMR sensors, in particular AMR and/or TMR angle sensors with an angle range of 360 degrees. In embodiments, AMR angle sensors with a range of 360 degrees combine conventional, highly accurate AMR angle structures with structures in which an AMR layer is continuously magnetically biased by an exchange bias coupling effect. The equivalent bias field is lower than the external rotating magnetic field and is applied continuously to separate sensor structures. Thus, in contrast with conventional solutions, no temporary, auxiliary magnetic field need be generated, and embodiments are suitable for magnetic fields up to about 100 mT or more. Additional embodiments relate to combined TMR and AMR structures. In such embodiments, a TMR stack with a free layer functioning as an AMR structure is used. With a single such stack, contacted in different modes, a high-precision angle sensor with 360 degrees of uniqueness can be realized. | 2015-03-05 |
20150061659 | FAULT DETECTION FOR PIPELINES - The invention concerns a structural integrity assessment system and method for determining stress concentration zones in a structure, such as a pipeline. The invention comprises a magnetic field sensor array arranged to be moved relative to the structure in a known direction. A controller is provided for recording one or more magnetic field readings taken by the magnetic field sensor array at different locations in the direction of movement thereof. A processor is arranged to identify one or more feature within said values, said feature being indicative of a region of reduced structural integrity in the structure. The processor also receives a data input for a further parameter corresponding to the location of the sensor array and compares the feature with the further parameter in order to verify that said feature corresponds to a region of reduced structural integrity for the structure. | 2015-03-05 |
20150061660 | SENSOR DEVICE - A sensor device includes a power line and a semiconductor device. The semiconductor device includes an inductor. The inductor is formed using an interconnect layer (to be described later using FIG. | 2015-03-05 |
20150061661 | LOW OFFSET VERTICAL HALL DEVICE AND CURRENT SPINNING METHOD - One embodiment of the present invention relates to a vertical Hall-effect device. The device includes at least two supply terminals arranged to supply electrical energy to the first Hall-effect region; and at least one Hall signal terminal arranged to provide a first Hall signal from the first Hall-effect region. The first Hall signal is indicative of a magnetic field which is parallel to the surface of the semiconductor substrate and which acts on the first Hall-effect region. One or more of the at least two supply terminals or one or more of the at least one Hall signal terminal comprises a force contact and a sense contact. | 2015-03-05 |
20150061662 | Current Sensor - Embodiments of the disclosure provide a current sensor including a conductive element and at least two magnetic field sensors. The conductive element includes at least three separate terminal areas, a common conductive area and at least three separate intermediate areas connecting the respective separate terminal areas to the common conductive area. Each of the terminal areas is connected separately via a respective separate intermediate area of the at least three separate intermediate areas to the common conductive area to guide a current applied to the respective terminal area into the common conductive area. The at least two magnetic field sensors are arranged at different geometric positions adjacent to the at least three separate intermediate areas, wherein each of the magnetic field sensors is configured to sense a magnetic field component of each current flowing into the common conductive area to provide a sensor signal based thereon. | 2015-03-05 |
20150061663 | APPARATUS AND METHOD FOR SEQUENTIALLY RESETTING ELEMENTS OF A MAGNETIC SENSOR ARRAY - A semiconductor process and apparatus provide a high-performance magnetic field sensor with three differential sensor configurations which require only two distinct pinning axes, where each differential sensor is formed from a Wheatstone bridge structure with four unshielded magnetic tunnel junction sensor arrays, each of which includes a magnetic field pulse generator for selectively applying a field pulse to stabilize or restore the easy axis magnetization of the sense layers to orient the magnetization in the correct configuration prior to measurements of small magnetic fields. The field pulse is sequentially applied to groups of the sense layers of the Wheatstone bridge structures, thereby allowing for a higher current pulse or larger sensor array size for maximal signal to noise ratio. | 2015-03-05 |
20150061664 | Downhole Nuclear Magnetic Resonance (NMR) Tool with Transversal-Dipole Antenna Configuration - In some aspects, a downhole nuclear magnetic resonance (NMR) tool includes a magnet assembly and an antenna assembly. The NMR tool can operate in a wellbore in a subterranean region to obtain NMR data from the subterranean region. The magnet assembly produces a magnetic field in a volume about the wellbore. The magnet assembly includes a central magnet, a first end piece magnet spaced apart from a first axial end of the central magnet, and a second end piece magnet spaced apart from a second axial end of the central magnet. The antenna assembly includes a transversal-dipole antenna. In some cases, orthogonal transversal-dipole antennas produce circular-polarized excitation in the volume about the wellbore, and acquire a response from the volume by quadrature coil detection. | 2015-03-05 |
20150061665 | Azimuthally-Selective Downhole Nuclear Magnetic Resonance (NMR) Tool - In some aspects, a downhole nuclear magnetic resonance (NMR) tool includes a magnet assembly and an antenna assembly. The NMR tool can operate in a wellbore in a subterranean region to obtain NMR data from the subterranean region. The magnet assembly produces a magnetic field in a volume about the wellbore. The antenna assembly produces excitation in the volume and acquires an azimuthally-selective response from the volume based on the excitation. The antenna assembly can include a transversal-dipole antenna and a monopole antenna. | 2015-03-05 |
20150061666 | SAMPLE-PREPARATION METHOD TO MANIPULATE NUCLEAR SPIN-RELAXATION TIMES, INCLUDING TO FACILITATE ULTRALOW TEMPERATURE HYPERPOLARIZATION - A method of providing a material sample in a state favorable to retaining spin polarization includes cooling a material sample from a temperature above a freezing point of the material sample down to a second temperature below the freezing point of the material sample; maintaining the sample at about the second temperature for a period of about several hours; and reducing temperature of the material sample to a third temperature lower than the second temperature to provide the material sample in a state favorable to retaining spin polarization, where the steps of cooling, maintaining and reducing are performed in the absence of an adulterant material. The method of providing a sample of pyruvic acid in a state favorable to retaining spin polarization may include cooling the sample of pyruvic acid in the absence of an adulterant material from a temperature above a freezing point of the sample of pyruvic acid down to less than about 200 Kelvin to provide the sample. | 2015-03-05 |
20150061667 | METHOD AND APPARATUS FOR ACQUIRING MAGNETIC RESONANCE DATA AND GENERATING IMAGES THEREFROM USING A TWO-POINT DIXON TECHNIQUE - Magnetic resonance (MR) data are acquired with a two-point Dixon technique in which a first spectral component and a second spectral component, for example, a water component and a fat component, are determined. A computation grid of lower resolution in comparison to the MR data is determined, wherein each grid point of the computation grid encompasses a predetermined number of adjacent image points of the MR data. A numerical optimization is implemented for each image point of the MR data, and the first spectral component and the second spectral component are calculated analytically based on the result of the numerical optimization. | 2015-03-05 |
20150061668 | MRI GHOSTING CORRECTION USING UNEQUAL MAGNITUDES RATIO - A magnetic resonance imaging (MRI) system, method and/or computer readable medium is configured to effect MR imaging with reduced ghosting artifacts by operations including determining spatially varying signal magnitude differences associated with first and second parts of a reference MR data, and reconstructing a diagnostic image based upon a first and a second parts of main scan data and the determined spatially varying signal magnitude differences. The first parts of the reference data and main scan data is acquired using a first readout gradient, and the second parts of the reference data and main scan data is acquired using a second readout gradient that is different from the first readout gradient. | 2015-03-05 |
20150061669 | Tri-Axial NMR Test Instrument - The invention provides a tri-axial nuclear magnetic resonance apparatus for testing of petro-physical properties and gathering of geo-mechanical information and methods of using the same. The tri-axial nuclear magnetic resonance apparatus includes a tri-axial load frame encasing a tri-axial load cell that includes a tri-axial sample holder, at least one electrical sensor, at least one acoustic sensor, and a nuclear magnetic resonance instrument. | 2015-03-05 |
20150061670 | NMR Analysis of A Core Sample Employing An Open Permanent Magnet Removable from A Core Holder - An apparatus and method for NMR analysis of a plurality of core samples includes a core holder ( | 2015-03-05 |
20150061671 | PHASE-CONTRAST MR IMAGING WITH SPEED ENCODING - MR signals are acquired with a method for phase contrast magnetic resonance (MR) imaging with speed encoding, in order to acquire raw data for multiple MR images. The multiple MR images are reconstructed. For this purpose, matrix elements are determined for numerous matrices, wherein the sum of the numerous matrices results in a pixel matrix. The pixel matrix has matrix elements that represent the pixel values for a reference MR image with flow compensation. The pixel matrix has further matrix elements that represent the pixel values for the at least one MR image with speed encoding. The matrix elements of the numerous matrices are determined such that a first matrix of the numerous matrices fulfills a first condition. | 2015-03-05 |
20150061672 | METHOD AND APPARATUS FOR MAGNETIC RESONANCE DATA ACQUISITION USING A MULTIPOINT DIXON TECHNIQUE - In a method and magnetic resonance (MR) apparatus to acquire MR data from a subject, a predetermined spectral model of a multipoint Dixon technique is used that includes at least two spectral components with respective associated relaxation rates, a first phase due to field inhomogeneities; and a second phase due to eddy current effects. MR data are acquired using a bipolar multi-echo MR measurement sequence for multiple image points wherein, for each image point, the multi-echo MR measurement sequence alternately uses positive and negative readout gradient fields for the readout of MR signals of the MR data at at least three echo times. The at least two spectral components are determined based on the MR data. | 2015-03-05 |
20150061673 | CONTROL UNIT AND METHOD TO MONITOR A DATA ACQUISITION OF MAGNETIC RESONANCE IMAGE DATA - In a control method and control unit to monitor a data acquisition of magnetic resonance image data of an imaging area located in a measurement volume of a magnetic resonance apparatus, an RF excitation pulse is radiated by an RF transmission/reception device of the magnetic resonance apparatus, raw data are acquired after a time after the radiated excitation pulse, by means of the RF transmission/reception device, and store the raw data, the raw data are transmitted to a monitoring unit and (a) through (c) are repeated while switching different gradients for spatial coding by readout of k-space corresponding to the imaging area along trajectories that are predetermined by the switched gradients, up to a termination criterion that is predetermined by the monitoring unit. | 2015-03-05 |
20150061674 | MAGNETIC RESONANCE IMAGING SYSTEM INCLUDING RADIO FREQUENCY COIL - A magnetic resonance imaging (MRI) system comprises, a main magnet, a gradient coil and an RF coil. The main magnet generates a static magnetic field, the gradient coil which is formed inside the main magnet and generates a gradient magnetic field and the RF coil. The RF coil is formed inside the gradient coil and comprises a plurality of different components including: a former supporting the plurality of different components including windings and having a first area and a second area and a groove formed in the second area and in which a component of the RF coil is installed and inset, reducing thickness of the RF coil. | 2015-03-05 |
20150061675 | MAGNETIC RESONANCE IMAGING APPARATUS - A magnetic resonance imaging apparatus according to an embodiment includes an execution unit and a generation unit. The execution unit executes first data collection of collecting a data after a predetermined inversion time elapses from a timing in which a labeling pulse is applied to a fluid flowing into an imaging region of a subject and a second data collection of collecting a data without the application of the labeling pulse. The generation unit generates a differential image by using the first data collected by the first data collection and the second data collected by the second data collection. Here, the generation unit generates the differential image by a different differential method according to a relation between the inversion time and a longitudinal relaxation time of the fluid. | 2015-03-05 |
20150061676 | Combined Shim and RF Coil Arrangement - A coil arrangement for a magnetic resonance tomography device includes at least two antennas connected in parallel to one another for RF signals and connected in series with one another for direct current signals. | 2015-03-05 |
20150061677 | MAGNETIC RESONANCE IMAGING APPARATUS - A magnetic resonance imaging apparatus includes: a magnetostatic field magnet that is formed in the shape of a cylinder and generates a magnetostatic field in a space inside the cylinder; a gradient coil that is formed in the shape of a cylinder, is disposed in the cylinder of the magnetostatic field magnet, and applies a gradient magnetic field to the magnetostatic field; a bore tube that is formed in the shape of a cylinder and is disposed in the cylinder of the gradient coil; and an elastic member that is loop-shaped and hollow, is disposed in at least one selected from: a space between an inner circumferential side of the magnetostatic field magnet and an outer circumferential side of the gradient coil; and a space between an inner circumferential side of the gradient coil and an outer circumferential side of the bore tube, and thereby seals the space hermetically. | 2015-03-05 |
20150061678 | NMR spectrometer with ergonomically advantageous sample changer - An NMR spectrometer ( | 2015-03-05 |
20150061679 | Patient Support Apparatus - A patient support apparatus configured to support a patient is provided. The patient support apparatus includes a table having a support surface to support the patient. The table includes a patient support assistance unit with at least one handle element. | 2015-03-05 |
20150061680 | MAGNET ASSEMBLIES - There are disclosed magnet arrays and methods for generating magnetic fields. In embodiments magnet arrays comprise a plurality of polyhedral magnets arranged in a lattice configuration and at least partly enclosing a testing volume, the magnet array having an associated magnetic field with a designated field direction {circumflex over (v)}, wherein the magnetization direction {circumflex over (m)} of an individual polyhedral magnet located at a displacement vector {right arrow over (r)} from an origin point in the testing volume is determined by the formula: {circumflex over (m)}=( | 2015-03-05 |
20150061681 | Local Specific Absorption Rate Reduction - The embodiments relate to a method, a MRI device, and a circuit for an imaging magnetic resonance imaging device that includes at least one transmission coil for transmitting a magnetic field, where the circuit includes a hybrid coupler and at least one phase shifter that may be or are arranged in the transmission path between an amplifier and at least one transmission coil of the magnetic resonance imaging device. | 2015-03-05 |
20150061682 | Shielded Antenna For A Downhole Logging Tool - A downhole logging tool includes a tool body having a co-located set of antennas located on the tool body and first and second antennas formed from respective first and second pairs of coil windings having a closed-loop pattern. Both the first and second pair of coil windings are arranged on diametrically opposed antenna sections. A cylindrical shield is disposed over the co-located set of antennas and has a first set of vertical slots arranged interposed between each of the underlying antenna sections, a second set of vertical slots arranged over each of the underlying antenna sections, with each of the second set of vertical slots being perpendicular to a portion of the coil winding in the underlying antenna section, and a set of non-vertical slots arranged over each the underlying antenna sections. Each of non-vertical slots is perpendicular to a portion of the coil winding in the underlying antenna section. | 2015-03-05 |
20150061683 | MAPPING RESISTIVITY DISTRIBUTION WITHIN THE EARTH - Resistivity in subsurface earth at locations kilometers away from wells in the reservoirs is mapped and monitored. An electromagnetic source with an electrode is deployed a borehole in the reservoir, and a group of sensors at counter electrodes is deployed at a number of other locations radially spaced at some distance from the well. The source transmits a current which flows to the counter electrodes causing an electromagnetic field which is sensed at the sensors. The source is activated at different depths in the well and ratios of the electromagnetic field sensed with the source at different depths used to obtain data to map the resistivity. The sensors are capable of sensing electromagnetic fields along two orthogonal axes, and the measurements at a sensor along these axes used to reduce undesirable effects of noise and other factors on the data measurements. | 2015-03-05 |
20150061684 | BOREHOLE ELECTRIC FIELD SURVEY WITH IMPROVED DISCRIMINATION OF SUBSURFACE FEATURES - Errors produced in a borehole to surface electromagnetic (BSEM) survey by near surface electrical anomalies on the estimates of formation properties are reduced. The effects of variations in subsurface electrical resistivity near the surface are separated from electrical resistivity changes at locations in the formations of interest far from the measurement region. A survey system includes one or more electrodes to inject electrical current at formation depth within a borehole, one or more counter electrodes which collect such current on the surface of the earth, and one or more electrodes to inject current on the surface. A transmitter is selectively connectable to different sets of the electrodes to cause a current to flow between the selected electrode sets. The resultant fields from the current flow are sensed and processed. The effects of near surface anomalies are detectable in the data and removable from the survey data of interest regarding the formations. The survey data more accurately indicates formation features or properties of interest. | 2015-03-05 |
20150061685 | BUOYANT MARINE ELECTROMAGNETIC CABLE ASSEMBLY - Embodiments described herein provide an EM source cable assembly with a buoyant member having first and second ends, and a longitudinal axis connecting the first end to the second end, and a plurality of indentations disposed along a surface of the buoyant member between the first end and the second end, wherein the indentations are operable to receive corresponding cables. The indentations extend along the longitudinal axis, and may be arranged helically about the longitudinal axis. The buoyant member may have a low density core material and a dense outer material, each of which may be a polymeric material. The low density material may be a foam, and the buoyant member may be formed by coextruding the low density material and the dense outer material. | 2015-03-05 |
20150061686 | Method for detecting lithium battery - The present invention relates to a method for detecting lithium battery. In the present invention, the method for detecting lithium battery is provided for executing the two pulse load test and AC impedance analysis to determine not only whether the state of health (SOH) of lithium battery is working or not, but also the SOH of battery would be precisely estimated to obtain the precise SOH and to avoid detection error resulted in substantial waste of resources. | 2015-03-05 |
20150061687 | BATTERY MANAGEMENT SYSTEM AND OPERATING METHOD THEREOF - A battery management system (BMS) is disclosed. In one aspect, the BMS includes a measuring unit, a pulse applying unit and a main controller unit (MCU). The measuring unit measures the voltage of a battery. The pulse applying unit applies a current pulse to the battery, the current pulse having a predetermined amplitude and period. The MCU calculates a polarization voltage based on the measured voltage and estimates a state of health (SOH) of the battery using a polarization voltage. | 2015-03-05 |
20150061688 | Vehicle High/Low Voltage Systems Isolation Testing - Systems or methods for testing performance of an isolation monitor for a vehicle having a high voltage traction battery electrical system isolated from a low voltage electrical system include a device for connecting to an isolation/leakage monitor under test. The device includes a current leakage bus, a current leakage array, and a current leakage destination with associated switching elements automatically controlled by a programmed microprocessor to introduce various leakage impedances to a second voltage source or ground and to evaluate performance of the isolation/leakage monitor under test. | 2015-03-05 |
20150061689 | MULTI-FREQUENCY GROUND MONITOR CURRENT SENSING - A signal generation module injects a signal in a pilot conductor with a DC component and one or more AC components. Pilot conductor current is injected in a grounding conductor of power cables connecting power source to load. A current monitor module monitors current in the pilot conductor or ground return, a DC detection module determines DC current present in the monitored current, an AC detection module determines AC current corresponding to each frequency of the AC components in the monitored current, a DC minimum threshold module determines if the DC current is below a DC current minimum threshold, an AC threshold module determines if any of the AC currents is below an AC threshold, and a trip module opens a contact after determining that the DC current is below the DC current minimum threshold or that at least one of the AC currents is below an AC threshold. | 2015-03-05 |
20150061690 | WATCHDOG CIRCUIT FOR GROUND MONITOR CURRENT SENSING - A watchdog apparatus for monitoring ground current is disclosed. A system and method also perform the functions of the apparatus. The watchdog apparatus includes a watchdog signal module that generates a watchdog signal. The watchdog signal is generated at a specific interval and includes an identifiable characteristic. The watchdog signal module is part of a device being monitored for functionality. The apparatus, in some embodiments, includes a signal monitoring module that determines if the watchdog signal includes the identifiable characteristic, and an alert module that sends and alert signal in response to the signal monitoring module determining that the watchdog signal does not include the identifiable characteristic. | 2015-03-05 |
20150061691 | Method and Apparatus for Estimating the Noise Introduced by a Device - An apparatus and method for measuring the properties of a DUT characterized by a signal gain applied to an input signal to that DUT and a DUT noise spectrum introduced by that DUT is disclosed. An apparatus includes first and second measurement channels and a controller. The first and second measurement channels are characterized by gains and noise spectrums that are different for the different channels and generate first and second measurement signals. The controller measures an average value of a product of the first and second measurement signals when an input signal is applied to the input of the DUT, the controller providing a measure of the signal to noise ratio of the output of the DUT, independent of the noise spectrums in the first and second measurement channels. Four channel embodiments reduce the amount of calibration needed to measure the gain and noise spectrum of the DUT. | 2015-03-05 |
20150061692 | Devices and Methods for Providing an Impulse Circuit - Devices include an impulse current generator that is configured to provide a direct impulse current (DIC) that includes a specified waveform to a test load during a test duration, a continuous power supply that is configured to provide a continuous power to the test load during the test duration, a trigger circuit that is configured to determine a trigger condition that corresponds to the DIC and to generate a trigger signal responsive to determining the trigger condition, and a current bypass circuit that is configured to receive the trigger signal generated by the trigger circuit and to conduct a majority portion of the DIC being conducted by the load responsive to the trigger signal. | 2015-03-05 |
20150061693 | APPARATUS AND METHOD - Apparatus and method for assessing the quality of membrane electrode assemblies. | 2015-03-05 |
20150061694 | METHOD OF DETECTING STATE OF POWER CABLE IN INVERTER SYSTEM - A method of detecting the states of power cables in an inverter system supplying power generated from an inverter to a motor by using three phase power cables is provided. The method includes: calculating the location of a current space vector for a first period when the first period arrives; using the calculated location of the current space vector for the first period to calculate the predicted location of the current space vector for a second period; calculating the actual location of the current space vector for the second period when the second period arrives; comparing the calculated predicted location with the actual location; and detecting the states of the three phase power cables according to a comparison result. | 2015-03-05 |
20150061695 | MICROMECHANICAL COMPONENT AND CORRESPONDING TEST METHOD FOR A MICROMECHANICAL COMPONENT - A micromechanical component and a corresponding test method for a micromechanical component are described. The micromechanical component includes at least one first region, which is elastically connected to a second region via a spring device, a resistor element, which is situated in and/or on the spring device and is at least partially interruptible in the event of damage to the spring device, and a detection device, which is electrically connected to the resistor element, for detecting an interruption in the resistor element and for generating a corresponding detection signal. | 2015-03-05 |
20150061696 | BATTERY PROTECTED AGAINST ELECTRIC ARCS - The invention relates to a DC electrical power supply source including
| 2015-03-05 |
20150061697 | IMPLANTABLE MEDICAL DEVICE AND METHOD FOR MONITORING THE INSULATION OF AN ELECTRODE LINE OF SUCH A MEDICAL DEVICE - An implantable medical device including at least one electrode line having an electrode pole, an electrode feed line, a counter electrode to the at least one electrode line, and an insulation sleeve. The insulation sleeve surrounds the electrode feed line and provides insulation between the electrode feed line and an electrolyte formed by bodily fluid. The electrode feed line and the electrode pole(s) include different materials, wherein the materials are different based on electrochemical series. The implantable medical device includes an insulation test unit having a DC voltage detector arranged between the electrode pole and the counter electrode, in order to detect an electrochemical voltage produced in the event of an insulation fault of the insulation sleeve due to defective contact between the electrolyte and the electrode feed line. | 2015-03-05 |
20150061698 | ELECTROMAGNETIC INTERFERENCE (EMI) TEST APPARATUS - A radio-frequency (RF) energy coupling apparatus for electromagnetic interference (EMI) susceptibility testing of a device. The apparatus includes a ground-plane, a micro-strip, a first dielectric layer, a coupling-strip, and a second dielectric layer. The micro-strip overlies the ground-plane. The first dielectric layer is interposed between the ground-plane and the micro-strip. The combination of the ground-plane, the micro-strip, and the first dielectric layer cooperate to form a micro-strip transmission line configured to propagate RF energy from a RF generator to a termination load. The coupling-strip overlies the micro-strip opposite the first dielectric layer. The coupling-strip is configured to couple RF energy from the micro-strip to a harness wire connected to the device. The second dielectric layer is interposed between the coupling-strip and the micro-strip. | 2015-03-05 |
20150061699 | POSITION DETECTION METHOD, POSITION DETECTION APPARATUS, ANTENNA APPARATUS, AND DISPLAY APPARATUS - Provided are a position detection method that selects one antenna at a time from a plurality of loop antennas, transmits, through the selected loop antenna, an electromagnetic signal to a pointer that indicates a screen unit, receives, from the pointer, a resonance signal corresponding to the electromagnetic signal transmitted through the selected loop antenna, and extracts polar coordinates including a distance value and an angle value of a point on a screen unit indicated by the pointer, based on a distribution of a signal strength of a resonance signal received through each of the plurality of loop antennas, a position detection apparatus, a display apparatus, and an antenna apparatus appropriate for extracting polar coordinates. | 2015-03-05 |
20150061700 | CAPACITIVE SENSOR - A capacitive sensor applies to a capacitive touch panel and includes a plurality of first electrodes, a plurality of second electrodes, and a plurality of virtual electrodes. The first electrodes each have a first wire portion. The second electrodes are disposed beneath and insulated from the first electrodes, and cross the first electrodes. The second electrodes each have a second wire portion. The virtual electrodes are each disposed between and spaced from two corresponding ones of the first electrodes. The virtual electrodes each include a plurality of continuous portions and a plurality of interrupted portions. The interrupted portions each overlap a corresponding one of the second wire portions of the second electrodes. The width of each of the interrupted portions is less than or equal to the width of the corresponding second wire portion. | 2015-03-05 |
20150061701 | TOUCH DETECTION DEVICE, TOUCH DETECTION SYSTEM AND TOUCH DETECTION METHOD - A touch detection device includes: a first sensor having a first capacitance; a monitoring unit configured to monitor the first capacitance of the first sensor at a first period; a determining unit configured to determine whether the first capacitance monitored by the monitoring unit exceeds a first threshold; and a period changing unit configured to change the first period into a second period that is shorter than the first period when the determining unit determines that the first capacitance exceeds the first threshold. | 2015-03-05 |
20150061702 | ELECTRO-MECHANICAL OSCILLATOR AND COMMON-MODE DETECTION CIRCUIT - A multi-mass resonator and a common-mode detection circuit are provided. The common-mode detection circuit, for example, may include a plurality of sensing electrodes, an interface circuit configured to interface with the plurality of sensing electrodes, and a common-mode capacitance extractor circuit electrically coupled in parallel to the interface circuit and configured to detect common-mode capacitance between the plurality of sensing electrodes and output a voltage representative the detected common-mode capacitance, and a differential-mode capacitance extractor circuit electrically coupled in parallel to the interface circuit and configured to detect differential-mode capacitance between the plurality of sensing electrodes and output a voltage representative the detected differential-mode capacitance. | 2015-03-05 |
20150061703 | ELECTROMECHANICAL POLYMER-BASED SENSOR - An electromechanical polymer (EMP) sensor includes (a) a first set of EMP layers provided between a first electrode and a second electrode forming a capacitor, the first set of EMP layers having one or more EMP layers capable of being activated by application of a voltage across the first and second electrodes; and (b) a sensing circuit coupled to the first electrode and the second electrode for detecting a change in capacitance or a change in voltage across the first and second electrodes. The EMP sensor may further include means for disconnecting the second electrode from a ground reference after the pre-determined voltage is applied, such that the sensing circuit senses a change in capacitance. The sensing circuit may be capable of detecting a noise portion of a voltage across the first and second electrode. | 2015-03-05 |
20150061704 | SENSING METHOD AND SENSING APPARATUS FOR SENSING ELECTRODE CLUSTER - A sensing method for a sensing electrode cluster is provided. The sensing electrode cluster includes a plurality of groups, each comprising a plurality of bars. The sensing method includes scanning each of the groups according to a first scanning sequence, and scanning each of the groups according to a second scanning sequence, and determining a sensing position according to the first position and the second position. The first scanning sequence is different from the second scanning sequence. | 2015-03-05 |
20150061705 | SLIP-RING UNIT AND METHOD FOR MONITORING THE CONDITION OF A SLIP-RING UNIT - A slip-ring unit for transmitting an electric current includes a first component group and a second component group arranged in a manner allowing rotation relative to each other. The slip-ring unit has a first track and a second track, a brush and a slip ring contacting each other over different rotational positions along one of the tracks. The first component group has a first connection terminal and an electric circuit for monitoring conditions, while the second component group has a second connection terminal The electric current is transmittable from the first connection terminal to the second connection terminal over the first track, and an electric voltage is transmittable over the second track to the circuit. The slip-ring unit is configured such that the first track and the second track are connected electrically. | 2015-03-05 |
20150061706 | RESISTIVE TYPE HUMIDITY SENSOR BASED ON POROUS MAGNESIUM FERRITE PELLET - The present invention relates to a process for preparing a humidity sensor based on resistive type porous Magnesium Ferrite (MgFe | 2015-03-05 |
20150061707 | INTEGRATED CIRCUIT PROVIDING FAULT PREDICTION - The prediction of hardware failure is obtained by operating two redundant circuit modules while one circuit module is artificially aged. The output of the two circuit modules is compared and a discrepancy between outputs indicates a projected failure of the aged modules. Aging may be accomplished by one or a combination of lowering operating voltages and re-phasing a sampling clock to reduce slack time both of which provide increased sensitivity to gate delay. | 2015-03-05 |
20150061708 | Detection Method of Current Sensor Faults in the E-Drive System By Using the Voltage Command Error - Systems, apparatus, and methods detect a current sensor error in an FOC electric machine system. A voltage command is monitored to detect the presence of an ac component can indicate that an error has occurred at a current sensor. By way of example, a sensor fault detection module can be configured to determine the deviation between an actual voltage command and an ideal voltage command to provide a complex deviation vector. By transforming the deviation vector to a reference frame rotating at the fundamental frequency of the command voltage, a dc component of the positive and negative sequences can be filtered, and their amplitudes determined. Error detection can be based on the total amplitude of the fundamental component, determined by positive and negative component amplitudes. The invention enables an FOC system to operate with two current sensors, rather than three, and provides a dedicated fault diagnostic for a current sensor. | 2015-03-05 |
20150061709 | METHOD FOR FORMING A PACKAGED SEMICONDUCTOR DEVICE - A method of fabricating a packaged semiconductor device includes integrating a plurality of singulated semiconductor die in a die carrier, and forming one or more interconnect layers on the die carrier. The interconnect layers include at least one of conductive intra-layer structures and inter-layer structures coupled to contact pads on the plurality of singulated semiconductor die. A set of landing pads is formed coupled to a first subset of the contact pads via a first set of the conductive intra-layer structures and inter-layer structures. A set of probe pads is formed coupled to a second subset of the contact pads via a second set of the conductive intra-layer structures and inter-layer structures. The die carrier is singulated to form a plurality of packaged semiconductor devices. The set of probe pads is removed during the singulating the die carrier. | 2015-03-05 |
20150061710 | SEMICONDUCTOR APPARATUS AND TEST METHOD - A test driver selection unit configured to enable a plurality of test driver selection signals in response to a test pulse and a test clock, and a plurality of drivers configured to receive the plurality of test driver selection signals, wherein each of the plurality of drivers is configured to output an output signal to a data bump in response to a test driver selection signal, data, and an output enable signal, and to receive a first driving voltage and a second driving voltage. | 2015-03-05 |
20150061711 | Overclocking as a Method for Determining Age in Microelectronics for Counterfeit Device Screening - An invention employing testing, e.g., overclocking, to determine undesirable conditions in a device under test (DUT) is provided. An exemplary apparatus and method includes artificially aging a known sample microelectronic device (SMD); overclocking the known SMD to specification and/or maximum performance; and collecting a plurality of device data associated with overclocking of each SMD at multiple ageing data points over a predicted aging progression. Another exemplary next step includes overclocking a DUT and collecting device data associated with the overclocked DUT. Another exemplary next step includes comparing the DUT device data with SMD device data to determine, for example, if the DUT has an anomaly or undesirable condition, if the DUT conforms to a manufacturer's specification, if the DUT was made by an original equipment manufacturer, if the DUT is used but represented as new, and/or the DUT has been subjected to damage or stress events exceeding acceptable limits. | 2015-03-05 |
20150061712 | IMPLEMENTING LOW TEMPERATURE WAFER TEST - A method and structure are provided for implementing low temperature wafer testing of a completed wafer. A coolant gel is applied to the completed wafer, the gel coated wafer is cooled and one or more electrical test probes are applied through the gel to electrical contacts of the cooled wafer, and testing is performed. | 2015-03-05 |
20150061713 | ANTI-ROTATION FOR WIRE PROBES IN A PROBE HEAD OF A DIE TESTER - Wire probes are described that resist rotation during assembly into a probe head of a die tester. One example includes probe wires with a protrusion at a pre-determined position along the length of the wire. A probe substrate with pads on one side each to attach to and electrically connect with a probe wire and a pads on the opposite side to connect to test equipment and a probe holder above the substrate with holes. Each hole holds a respective one of the probe wires against the probe substrate. Each hole also has a key to mate with a protrusion of a respective probe wire so that the protrusions engage the keys to prevent rotation of the respective wire. | 2015-03-05 |
20150061714 | Apparatus and Method for Accurate Measurement and Mapping of Forward and Reverse-Bias Current-Voltage Characteristics of Large Area Lateral P-N Junctions - Methods and apparatus for providing measurements in p-n junctions and taking into account the lateral current for improved accuracy are disclosed. The lateral current may be controlled, allowing the spreading of the current to be reduced or substantially eliminated. Alternatively or additionally, the lateral current may be measured, allowing a more accurate normal current to be calculated by compensating for the measured spreading. In addition, the techniques utilized for controlling the lateral current and the techniques utilized for measuring the lateral current may also be implemented jointly. | 2015-03-05 |
20150061715 | Method and Apparatus for Non-Contact Measurement of Forward Voltage, Saturation Current Density, Ideality Factor and I-V Curves in P-N Junctions - Non-contact measurement of one or more electrical response characteristics of a p-n junction includes illuminating a surface of the p-n junction with light of a first intensity having a modulation or pulsed characteristic sufficient to establish a steady-state condition in a junction photovoltage (JPV) of the p-n junction, measuring a first JPV from the p-n junction within the illumination area, illuminating the surface of the p-n junction with light of an additional intensity, measuring an additional photovoltage from the portion of the p-n junction within the illumination area, determining a photocurrent density of the p-n junction at the first intensity. The non-contact measurement further includes determining the forward voltage, the saturation current density, the ideality factor or one or more I-V curves with the measured first photovoltage, the measured additional photovoltage and/or the determined photocurrent density of the p-n junction. | 2015-03-05 |
20150061716 | TESTING FINGER - A testing finger ( | 2015-03-05 |
20150061717 | TEST CARRIER, DEFECT DETERMINATION APPARATUS, AND DEFECT DETERMINATION METHOD - A test carrier that temporarily accommodates a die includes: a first wiring pattern that electrically connects an external terminal of the test carrier and a TSV of the die; and a second wiring pattern that electrically connects the TSVs. | 2015-03-05 |
20150061718 | WAFER-LEVEL TESTING METHOD FOR SINGULATED 3D-STACKED CHIP CUBES - Disclosed is a wafer level testing method for testing a plurality of singulated 3D-stacked chip cubes by utilizing adjustable wafer maps to adjust the pick-and-place positions of the cubes on a carrier wafer. The wafer maps have a plurality of probe-card activated regions each including a plurality of component-attaching regions. Two wafer-level testing steps are performed on the cubes disposed on the carrier wafer according to the wafer maps. By analyzing the electrical testing results of the trial-run wafer-level testing step from the original wafer map, some prone-to-overkill component-attaching regions are confirmed and to create a corrected wafer map which the prone-to-overkill component-attaching regions are excluded from probe-card activated regions. Then, according to the corrected wafer map, cubes are disposed on the carrier wafer without disposing in the prone-to-overkill component-attaching regions. Accordingly, the real-production wafer-level testing step can be run smoothly without unnecessary shut down of adjustment or repair leading to the maximum productivity without overkill issues. | 2015-03-05 |
20150061719 | VERTICAL PROBE CARD FOR MICRO-BUMP PROBING - The present invention relates to a probe card, and more particularly a probe card that can provide fine pitch for micro-bump probing, can be manufactured at a low cost for a short time through a simple manufacturing process, and can have excellent electric characteristics because it can have the components and a thin film resistance therein. | 2015-03-05 |
20150061720 | SYSTEM AND APPARATUS FOR MEASURING CAPACITANCE - Systems and methods for determining a capacitance on a device-under-test (“DUT”). An example implementation includes a voltage signal generator that generates a voltage signal alternating between a high voltage and a low voltage at regular time intervals. The voltage signal generator causes a DUT current to flow in the DUT. The DUT current comprises a leakage current and a capacitance measurement current in response to the voltage signal. A current signal generator receives the DUT current from the DUT. The current signal generator generates a cancellation current signal alternating between high and low values at the regular time intervals of the voltage signal such that the cancellation current signal cancels the leakage current through the DUT. A signal measurement circuit receives the capacitance measurement current remaining after the leakage current is canceled to generate an output voltage having an output voltage value used to determine a capacitance of the DUT. | 2015-03-05 |
20150061721 | SEMICONDUCTOR DEVICE AND OPERATING METHOD OF SEMICONDUCTOR DEVICE - A semiconductor device includes a plurality of stacked chips, a reference through silicon via (TSV) set passing through the plurality of stacked chips, a plurality of TSVs passing through the plurality of stacked chips, a reference delay information generation unit suitable for generating a reference delay information indicating an amount of delay of the reference TSV set and a determination unit suitable for determining abnormality of the plurality of TSVs by comparing a first test signal with each of a plurality of second test signals, wherein the first test signal is an initial test signal delayed by an amount of delay corresponding to the reference delay information, and wherein each of the plurality of second test signals is the initial test signal delayed by corresponding one of the plurality of TSVs. | 2015-03-05 |
20150061722 | SEMICONDUCTOR DEVICE - Disclosed herein is an apparatus that includes a first internal-potential generation circuit that generates a first internal potential from a power supply potential and that outputs the first internal potential to a first node, and an internal-potential force circuit that includes a first switch element provided between the first node and a second external terminal. The internal-potential force circuit causes the first switch element to enter into an off-state when the test signal supplied to a third external terminal is activated and a potential level of a first external terminal is a first level, and causes the first switch element to enter into an on-state when the test signal supplied to the third external terminal is activated and the potential level of the first external terminal is a second level different from the first level. | 2015-03-05 |
20150061723 | DRIVER IC, DISPLAY DEVICE, AND INSPECTION SYSTEM - A display device includes, on a TFT substrate, a driver IC having a first bump and a second bump, a first terminal and a second terminal connecting respectively to the first bump and the second bump, and wiring interconnecting the first terminal and the second terminal. The driver IC also includes a resistance detection circuit that detects resistance between the first bump and the second bump. | 2015-03-05 |
20150061724 | CORRECTION FOR STRESS INDUCED LEAKAGE CURRENT IN DIELECTRIC RELIABILITY EVALUATIONS - Methods, apparatus, and computer program products for evaluating current transients measured during an electrical stress evaluation of a dielectric layer in a semiconductor device. Measured current transients are fit to an equation representing a time dependence for stress induced leakage currents. The measured current transients are corrected based upon stress currents computed from the equation to define corrected current transients. | 2015-03-05 |
20150061725 | SEMICONDUCTOR INTEGRATED CIRCUIT - A semiconductor integrated circuit includes a test bump pad, a first bump pad coupled to a first through-silicon-via (TSV), a second bump pad coupled to a second TSV, a latching unit, coupled between the test bump pad and the first bump pad, suitable for storing data, and a switching unit suitable for selectively coupling the first bump pad to the second bump pad in response to a test operation control signal. | 2015-03-05 |
20150061726 | NEGATIVE BIAS THERMAL INSTABILITY STRESS TESTING OF TRANSISTORS - A circuit is powered through a P-type transistor whose thermal instability behavior is to be evaluated. The threshold of the P-type transistor under evaluation and consequently the saturation current of the transistor are reflected in the frequency of the circuit, which in one embodiment is a ring oscillator. Additional circuitry is connected to the P-type transistor and the ring oscillator to ensure the proper stress conditions for the transistor and consequently to the evaluation of the P-type transistor. | 2015-03-05 |
20150061727 | Analog Signal Compatible CMOS Switch as an Integrated Peripheral to a Standard Microcontroller - At least one analog signal compatible complementary metal oxide semiconductor (CMOS) switch circuit is incorporated with digital logic circuits in an integrated circuit. The integrated circuit may further comprise a digital processor and memory, e.g., microcontroller, microprocessor, digital signal processor (DSP), programmable logic array (PLA), application specific integrated circuit (ASIC), etc., for controlling operation of the at least one analog signal compatible CMOS switch for switching analog signals, e.g., audio, video, serial communications, etc. The at least one analog signal compatible CMOS switch may have first and second states, e.g., single throw “on” or “off”, or double throw common to a or b, controlled by a single digital control signal of either a logic “0” or a logic “1”. | 2015-03-05 |
20150061728 | ELECTRONIC DEVICE AND METHOD FOR MAINTAINING FUNCTIONALITY OF AN INTEGRATED CIRCUIT DURING ELECTRICAL AGGRESSIONS - An electronic device for generating an error signal in response to an electrostatic discharge perturbation is described. The device may comprise: a detection unit for generating a detection signal in response to said electrostatic discharge perturbation, said detection signal correlating in time with said electrostatic discharge perturbation; a clock for generating a clock signal having a clock period; and a protection unit for generating an error signal in response to said detection signal only when a duration of said detection signal exceeds a predefined multiple of said clock period. A method of generating an error signal in response to an electrostatic discharge perturbation, for protecting electronic circuitry, is also disclosed. | 2015-03-05 |
20150061729 | Method and Apparatus for Sub-Hysteresis Discrimination - Embodiments of comparator circuits are disclosed. A comparator circuit may include a differential input circuit, an output circuit, a positive feedback circuit operably coupled between the differential input circuit and the output circuit, and a hysteresis control circuit operably coupled with the positive feedback circuit. The hysteresis control circuit includes a switching device and a transistor. The comparator circuit provides sub-hysteresis discrimination and high speed discrimination. | 2015-03-05 |
20150061730 | LATCH AND OPERATION METHOD THEREOF AND COMPARATOR - A latch, an operation method of the latch, and a comparator using the latch are disclosed. The latch includes first and second cross-coupled pairs and first and second transistor pairs. First terminals of the first and second current paths of the first cross-coupled pair are respectively coupled to first terminals of the first and second transistors of the first transistor pair. First terminals of the third and fourth current paths of the second cross-coupled pair are respectively coupled to first terminals of the third and fourth transistors of the second transistor pair. Control terminals of the third and fourth transistors are respectively coupled to the first and second current paths. Control terminals of the first and second transistors are respectively coupled to the third and fourth current paths. | 2015-03-05 |
20150061731 | DRIVING CIRCUIT AND SEMICONDUCTOR DEVICE - A driving circuit of the present invention drives a switching element connected to a main current circuit. The driving circuit includes a driving potion applying on/off-voltage to a gate of the switching element, a common inductor disposed in an interconnection part commonly connected to the driving circuit and a source side of the switching element in a loop formed of the main current circuit and the switching element, and a capacitor connected between the gate side and the source side on the driving portion side with respect to the common inductor. | 2015-03-05 |
20150061732 | SYSTEMS, CIRCUITS, DEVICES, AND METHODS WITH BIDIRECTIONAL BIPOLAR TRANSISTORS - Methods, systems, circuits, and devices for power-packet-switching power converters using bidirectional bipolar transistors (BTRANs) for switching. Four-terminal three-layer BTRANs provide substantially identical operation in either direction with forward voltages of less than a diode drop. BTRANs are fully symmetric merged double-base bidirectional bipolar opposite-faced devices which operate under conditions of high non-equilibrium carrier concentration, and which can have surprising synergies when used as bidirectional switches for power-packet-switching power converters. BTRANs are driven into a state of high carrier concentration, making the on-state voltage drop very low. | 2015-03-05 |
20150061733 | FREQUENCY DIVIDING SYSTEM AND INPUT LEVEL TRIGGERING DEVICE - A frequency dividing system, which comprises a control circuit, a first multiple input sharing input level triggering device, a first input level triggering group and a second input level triggering group. The first multiple input sharing input level triggering device receives a first frequency dividing signal to generate a feedback signal according to a level of a first clock signal, or receives a second frequency dividing signal to generate the feedback signal according to a level of a second clock signal. The first/second input level triggering group generates the first/second frequency dividing signal to the first multiple input sharing input level triggering device according to the feedback signal if active; and outputs a fixed voltage to the first multiple input sharing input level triggering device if non-active. | 2015-03-05 |
20150061734 | INTERFACE CIRCUIT - According to one embodiment, a first pull-down transistor, a mode switching circuit, and a leak-cut circuit are provided. The first pull-down transistor pulls down an input/output terminal. The mode switching circuit controls on and off of the first pull-down transistor based on an enable signal. The leak-cut circuit turns off the first pull-down transistor when a power supply of the mode switching circuit is shut down. | 2015-03-05 |
20150061735 | METHODS AND APPARATUSES FOR ADAPTIVELY DETERMINING VOLTAGE RESET TIMING - A voltage reset method may include: acquiring a voltage that is changed with time by using an input photon; determining a timing for resetting the acquired voltage by using time information in a period where the acquired voltage increases; and/or resetting the acquired voltage on a basis of the determined voltage reset timing. A voltage reset apparatus may include: an acquisition unit configured to acquire a voltage that is changed with time by using an input photon; a determination unit configured to determine a timing for resetting the acquired voltage by using time information in a period where the acquired voltage increases; and/or a reset unit configured to reset the acquired voltage on a basis of the determined voltage reset timing. | 2015-03-05 |
20150061736 | SPREAD-SPECTRUM PHASE LOCKED LOOP CIRCUIT AND METHOD - A phase locked loop (PLL) circuit and a method thereof are provided. In an embodiment, the PLL circuit includes: a switched capacitor circuit, in which the switched capacitor circuit generates a modulation waveform, and the modulation waveform is injected into the PLL circuit in a current form, so that a PLL output frequency is modulated. Compared with the spread spectrum phase locked loop (SS-PLL) in the prior art, the SS-PLL in embodiments of the present invention is simple in structure, low in power consumption, low in silicon overhead, and flexible both in spreading factor and modulation frequency. | 2015-03-05 |
20150061737 | PHASE LOCKED LOOP WITH BANDWIDTH CONTROL - A phase locked loop (PLL) includes a first loop, a second loop, and a lock detector. The first loop locks a feedback signal having a frequency equal to a fraction of a frequency of an output signal to a reference signal in phase. The first loop has a first bandwidth. The second loop locks the feedback signal to the reference signal in frequency and has a second bandwidth. The first bandwidth is higher than the second bandwidth. The lock detector is coupled to the second loop and increases the second bandwidth in response to detecting that the feedback signal is not locked to the reference signal. | 2015-03-05 |
20150061738 | CHARGE PUMP CIRCUIT - There is provided a charge pump circuit, including: a step-up circuit unit stepping up an input voltage at least once, according to a frequency and a voltage level of a clock signal; and a control unit altering the voltage level of the clock signal according to an output voltage from the step-up circuit unit to regulate the output voltage from the step-up circuit. | 2015-03-05 |
20150061739 | DUAL-PORT NEGATIVE LEVEL SENSITIVE DATA RETENTION LATCH - In an embodiment of the invention, a dual-port negative level sensitive data retention latch contains a clocked inverter and a dual-port latch. Data is clocked through the clocked inverter when clock signal CKT goes high, CLKZ goes low and retention control signal RET is low. The dual-port latch is configured to receive the output of the clocked inverter, a second data bit D | 2015-03-05 |
20150061740 | SCANNABLE FLOP WITH A SINGLE STORAGE ELEMENT - In an embodiment, a flip flop circuit includes a master latch and a slave latch. The master latch comprises a storage element and at least two legs, including a data leg and at least one scan leg. The first node of the storage element may be driven by the data leg. The opposite node of the storage element may be driven by at least one of the scan legs. The slave latch may be coupled to the master latch. | 2015-03-05 |
20150061741 | MULTIPLEXER FLOP - In an embodiment, a flip flop circuit includes a master latch and a slave latch. The master latch comprises a storage element, a first data leg, and a second data leg. The first and second data legs may be coupled to the storage element. Clock selection logic may be coupled to the first and second data legs. The clock selection logic may have a select input for selecting between the first and second data legs. The slave latch may be coupled to the master latch. | 2015-03-05 |
20150061742 | Storage Circuit and Semiconductor Device - The storage circuit includes first and second logic circuits, first and second transistors whose channel formation regions include an oxide semiconductor, and a capacitor. The first and second transistors are connected to each other in series, and the capacitor is connected to a connection node of the first and second transistors. The first transistor functions as a switch that controls connection between an output terminal of the first logic circuit and the capacitor. The second transistor functions as a switch that controls connection between the capacitor and an input terminal of the second logic circuit. Clock signals whose phases are inverted from each other are input to gates of the first and second transistors. Since the storage circuit has a small number of transistors and a small number of transistors controlled by the clock signals, the storage circuit is a low-power circuit. | 2015-03-05 |
20150061743 | Clock Gated Delay Line Based On Setting Value - In an embodiment, a delay circuit includes a delay line with a clock input signal and a delayed clock output signal that is based on a setting value. Each delay element of the delay line receives one of several delay element select signals and outputs a delayed signal based on the delay element select signal. The setting value may be a binary encoded value representing the desired delay. The delay element select signals may correspond to a thermometer encoded value of the binary encoded setting value. | 2015-03-05 |
20150061744 | PASSGATE STRENGTH CALIBRATION TECHNIQUES FOR VOLTAGE REGULATORS - Systems and methods are provided to regulate a supply voltage of a load circuit. For example, a system includes a voltage regulator circuit that includes a passgate device. The system includes a passgate strength calibration control module which is configured to (i) obtain information which specifies operating conditions of the voltage regulator circuit, (ii) access entries of one or more look-up tables using the obtained information, (iii) use information within the accessed entries to determine a maximum load current that could be demanded by the load circuit under the operating conditions specified by the obtained information, and to predict a passgate device width which is sufficient to supply the determined maximum load current, and (iv) set an active width of the passgate device according to the predicted passgate device width. | 2015-03-05 |