10th week of 2020 patent applcation highlights part 66 |
Patent application number | Title | Published |
20200075284 | DISC FUSE | 2020-03-05 |
20200075285 | ELECTRON EMISSION ELEMENT AND METHOD FOR SAME | 2020-03-05 |
20200075286 | Suspended Grid Structures For Electrodes In Vacuum Electronics | 2020-03-05 |
20200075287 | TIME-DEPENDENT DEFECT INSPECTION APPARATUS | 2020-03-05 |
20200075288 | TREATING BIOMASS | 2020-03-05 |
20200075289 | Modular Recipe Controlled Calibration (MRCC) Apparatus Used to Balance Plasma in Multiple Station System | 2020-03-05 |
20200075290 | RADIO FREQUENCY (RF) PULSING IMPEDANCE TUNING WITH MULTIPLIER MODE | 2020-03-05 |
20200075291 | IMPEDANCE MATCHING METHOD AND IMPEDANCE MATCHING DEVICE | 2020-03-05 |
20200075292 | ANTENNA DEVICE, RADIATION METHOD OF ELECTROMAGNETIC WAVES, PLASMA PROCESSING APPARATUS, AND PLASMA PROCESSING METHOD | 2020-03-05 |
20200075293 | METHOD AND APPARATUS FOR PLASMA PROCESSING | 2020-03-05 |
20200075294 | BAFFLE PLATE FOR CONTROLLING WAFER UNIFORMITY AND METHODS FOR MAKING THE SAME | 2020-03-05 |
20200075295 | CONFINEMENT RING WITH EXTENDED LIFE | 2020-03-05 |
20200075296 | PLASMA PROCESSING DEVICE AND SEMICONDUCTOR DEVICE PRODUCTION METHOD | 2020-03-05 |
20200075297 | EXHAUST PIPE DEVICE AND CLEANING DEVICE | 2020-03-05 |
20200075298 | Method and Apparatus for Deposition Cleaning in a Pumping Line | 2020-03-05 |
20200075299 | Method for Improving Deposition Process | 2020-03-05 |
20200075300 | METHODS AND APPARATUSES FOR DECONVOLUTION OF MASS SPECTROMETRY DATA | 2020-03-05 |
20200075301 | INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE IONISATION MASS SPECTROMETRY ("REIMS") DEVICE | 2020-03-05 |
20200075302 | Ion Entry/Exit Device | 2020-03-05 |
20200075303 | DEVICE AND METHOD FOR GENERATING, STORING AND TRANSMITTING POSITIVE AND NEGATIVE IONS | 2020-03-05 |
20200075304 | Molecular Imaging of Biological Samples with Sub-Cellular Spatial Resolution and High Sensitivity | 2020-03-05 |
20200075305 | MASS SPECTROMETER | 2020-03-05 |
20200075306 | MICROSCALE MASS SPECTROMETRY SYSTEMS, DEVICES AND RELATED METHODS | 2020-03-05 |
20200075307 | MASS SPECTROMETRY WITH INCREASED DUTY CYCLE | 2020-03-05 |
20200075308 | MASS FILTER HAVING EXTENDED OPERATIONAL LIFETIME | 2020-03-05 |
20200075309 | Spectrometry method and device for detecting ionising radiation for the implementation thereof | 2020-03-05 |
20200075310 | BONDED WAFER, A METHOD OF MANUFACTURING THE SAME, AND A METHOD OF FORMING THROUGH HOLE | 2020-03-05 |
20200075311 | SEMICONDUCTOR MANUFACTURING METHOD | 2020-03-05 |
20200075312 | Methods For Making Silicon And Nitrogen Containing Films | 2020-03-05 |
20200075313 | Oxide Removal From Titanium Nitride Surfaces | 2020-03-05 |
20200075314 | DOPED BUFFER LAYER FOR GROUP III-V DEVICES ON SILICON | 2020-03-05 |
20200075315 | SUBSTRATE TREATING METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD | 2020-03-05 |
20200075316 | USING SACRIFICIAL POLYMER MATERIALS IN SEMICONDUCTOR PROCESSING | 2020-03-05 |
20200075317 | Method Of Reducing Lift-Off Related Redeposit Defects On Semiconductor Wafers | 2020-03-05 |
20200075318 | METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE | 2020-03-05 |
20200075319 | Morphology of Resist Mask Prior to Etching | 2020-03-05 |
20200075320 | Semiconductor Device and Method | 2020-03-05 |
20200075321 | NON-UV HIGH HARDNESS LOW K FILM DEPOSITION | 2020-03-05 |
20200075322 | FORMATION OF SiOCN THIN FILMS | 2020-03-05 |
20200075323 | Silacycloalkane Compounds And Methods For Depositing Silicon Containing Films Using Same | 2020-03-05 |
20200075324 | PLASMA DEPOSITION METHOD, PLASMA DEPOSITION APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2020-03-05 |
20200075325 | FILM FORMING METHOD | 2020-03-05 |
20200075326 | SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | 2020-03-05 |
20200075327 | SEMICONDUCTOR DEVICE INCLUDING SUPERLATTICE STRUCTURES WITH REDUCED DEFECT DENSITIES | 2020-03-05 |
20200075328 | EPITAXY SUBSTRATE AND METHOD OF MANUFACTURING THE SAME | 2020-03-05 |
20200075329 | SURFACE MODIFICATION TO IMPROVE AMORPHOUS SILICON GAPFILL | 2020-03-05 |
20200075330 | SEMICONDUCTOR STRUCTURES, MEMORY DEVICES AND SYSTEMS, AND METHODS OF FORMING SAME | 2020-03-05 |
20200075331 | SEMICONDUCTOR DEVICES | 2020-03-05 |
20200075332 | Methods Of Forming Silicon-Containing Layers | 2020-03-05 |
20200075333 | PECVD Tungsten Containing Hardmask Films And Methods Of Making | 2020-03-05 |
20200075334 | COLORED SELF-ALIGNED SUBTRACTIVE PATTERNING BY ASYMMETRIC SPACER FORMATION | 2020-03-05 |
20200075335 | Patterning Method | 2020-03-05 |
20200075336 | SELF ALIGNED PATTERN FORMATION POST SPACER ETCHBACK IN TIGHT PITCH CONFIGURATIONS | 2020-03-05 |
20200075337 | System, Semiconductor Device and Method | 2020-03-05 |
20200075338 | MONITORING DEVICE, MONITORING METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2020-03-05 |
20200075339 | Methods of Forming Contact Features in Semiconductor Devices | 2020-03-05 |
20200075340 | HYDROSILYLATION IN SEMICONDUCTOR PROCESSING | 2020-03-05 |
20200075341 | MASK MEMBER AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE | 2020-03-05 |
20200075342 | Surface Treatment for Etch Tuning | 2020-03-05 |
20200075343 | METHOD FOR PROCESSING TARGET OBJECT | 2020-03-05 |
20200075344 | LIGHT IRRADIATION TYPE HEAT TREATMENT METHOD | 2020-03-05 |
20200075345 | PROCESS MONITOR FOR WAFER THINNING | 2020-03-05 |
20200075346 | APPARATUS AND PROCESS FOR ELECTRON BEAM MEDIATED PLASMA ETCH AND DEPOSITION PROCESSES | 2020-03-05 |
20200075347 | SEMICONDUCTOR DEVICE FABRICATION WITH REMOVAL OF ACCUMULATION OF MATERIAL FROM SIDEWALL | 2020-03-05 |
20200075348 | WAVELIKE HARD NANOMASK ON A TOPOGRAPHIC FEATURE AND METHODS OF MAKING AND USING | 2020-03-05 |
20200075349 | UNDER-FILL DEFLASH FOR A DUAL-SIDED BALL GRID ARRAY PACKAGE | 2020-03-05 |
20200075350 | CHIP PACKAGE STRUCTURE AND METHOD FOR FORMING THE SAME | 2020-03-05 |
20200075351 | PROCESSING SYSTEMS AND PLATFORMS FOR ROUGHNESS REDUCTION OF MATERIALS USING ILLUMINATED ETCH SOLUTIONS | 2020-03-05 |
20200075352 | SYSTEMS AND METHODS FOR SHUTTERED WAFER CLEANING | 2020-03-05 |
20200075353 | GAS INPUT SYSTEM FOR A SUBSTRATE PROCESSING CHAMBER | 2020-03-05 |
20200075354 | DEVICE FOR APPLYING TO A SUBSTRATE A LIQUID MEDIUM WHICH IS EXPOSED TO UV RADIATION | 2020-03-05 |
20200075355 | APPARATUS AND METHOD FOR TREATING SUBSTRATE | 2020-03-05 |
20200075356 | SYSTEMS AND METHODS FOR IN-SITU MARANGONI CLEANING | 2020-03-05 |
20200075357 | METHOD OF STRIPPING A PHOTORESIST, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE | 2020-03-05 |
20200075358 | PHOTONICALLY TUNED ETCHANT REACTIVITY FOR WET ETCHING | 2020-03-05 |
20200075359 | WET ETCHING APPARATUS | 2020-03-05 |
20200075360 | APPARATUS FOR BONDING SUBSTRATES AND METHOD OF BONDING SUBSTRATES | 2020-03-05 |
20200075361 | CERAMIC HEATER AND MANUFACTURING METHOD FOR TUBULAR SHAFT | 2020-03-05 |
20200075362 | SUBSTRATE TREATING APPARATUS AND SUBSTRATE TREATING METHOD | 2020-03-05 |
20200075363 | SEMICONDUCTOR PACKAGE MOLDING DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2020-03-05 |
20200075364 | GLUE DISPENSING APPARATUS | 2020-03-05 |
20200075365 | HEATING PROCESSING APPARATUS AND HEATING PROCESSING METHOD | 2020-03-05 |
20200075366 | Thermal Management System | 2020-03-05 |
20200075367 | METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION FOR A MOVING PROCESS KIT | 2020-03-05 |
20200075368 | METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING | 2020-03-05 |
20200075369 | METHOD AND APPARATUS FOR MEASURING WAFER MOVEMENT AND PLACEMENT USING VIBRATION DATA | 2020-03-05 |
20200075370 | METHOD AND APPARATUS FOR MEASURING PLACEMENT OF A SUBSTRATE ON A HEATER PEDESTAL | 2020-03-05 |
20200075371 | INTEGRATED SEMICONDUCTOR DIE VESSEL PROCESSING WORKSTATIONS | 2020-03-05 |
20200075372 | WAFER BOAT, FURNACE APPARATUS USING THE SAME, AND METHOD FOR FORMING FILM | 2020-03-05 |
20200075373 | Optical Reticle Load Port | 2020-03-05 |
20200075374 | MEMBRANE DIFFUSER FOR A SUBSTRATE CONTAINER | 2020-03-05 |
20200075375 | SYSTEM FOR A SEMICONDUCTOR FABRICATION FACILITY AND METHOD FOR OPERATING THE SAME | 2020-03-05 |
20200075376 | SUBSTRATE TRANSFER MECHANISM, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE TRANSFER METHOD | 2020-03-05 |
20200075377 | SUBSTRATE TRANSFER MECHANISM, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE PROCESSING METHOD | 2020-03-05 |
20200075378 | WORKPIECE STORAGE SYSTEM, METHOD OF STORING WORKPIECE, AND METHOD OF TRANSFERRING WORKPIECE USING THE SAME | 2020-03-05 |
20200075379 | SYSTEM AND METHOD FOR ALIGNING LIGHT-TRANSMITTING BIREFRINGENT WORKPIECES | 2020-03-05 |
20200075380 | APPARATUS AND METHODS FOR DETERMINING WAFER CHARACTERS | 2020-03-05 |
20200075381 | DIE ATTACH SYSTEMS, AND METHODS FOR INTEGRATED ACCURACY VERIFICATION AND CALIBRATION USING SUCH SYSTEMS | 2020-03-05 |
20200075382 | COMPONENT-MANUFACTURING TOOL AND COMPONENT-MANUFACTURING METHOD | 2020-03-05 |
20200075383 | CERAMICS SUBSTRATE AND ELECTROSTATIC CHUCK | 2020-03-05 |