20th week of 2019 patent applcation highlights part 63 |
Patent application number | Title | Published |
20190148094 | ELECTROMAGNETIC RELAY | 2019-05-16 |
20190148095 | CONTACT SWITCHING DEVICE AND ELECTROMAGNETIC RELAY USING SAME | 2019-05-16 |
20190148096 | Double Breaker Switch | 2019-05-16 |
20190148097 | APPARATUS, SYSTEM AND METHOD FOR ALARM TRIGGERED ELECTRICAL SUPPLY DISCONNECTION | 2019-05-16 |
20190148098 | HIGH-CURRENT FUSE WITH ENDBELL ASSEMBLY | 2019-05-16 |
20190148099 | ELECTRONIC ASSEMBLY WITH THERMAL FUSE, AN ELECTRIC MOTOR AND A DRIVE OF A MOTOR VEHICLE | 2019-05-16 |
20190148100 | HIGH VOLTAGE COMPACT FUSIBLE DISCONNECT SWITCH DEVICE WITH MAGNETIC ARC DEFLECTION ASSEMBLY | 2019-05-16 |
20190148101 | MICROELECTROMECHANICAL LIGHT EMITTER COMPONENT, LIGHT EMITTER COMPONENT AND METHOD FOR PRODUCING A MICROELECTROMECHANICAL LIGHT EMITTER COMPONENT | 2019-05-16 |
20190148102 | TARGET ASSEMBLY, APPARATUS INCORPORATING SAME, AND METHOD FOR MANUFACTURING SAME | 2019-05-16 |
20190148103 | SYSTEM AND METHOD FOR RECIPROCATING AN ANODE IN AN X-RAY DEVICE | 2019-05-16 |
20190148104 | METHOD FOR ADJUSTING A PARTICLE BEAM MICROSCOPE | 2019-05-16 |
20190148105 | Charged Particle Beam Apparatus | 2019-05-16 |
20190148106 | Charged Particle Beam Device | 2019-05-16 |
20190148107 | REFERENCE SAMPLE WITH INCLINED SUPPORT BASE, METHOD FOR EVALUATING SCANNING ELECTRON MICROSCOPE, AND METHOD FOR EVALUATING SIC SUBSTRATE | 2019-05-16 |
20190148108 | SYSTEM AND METHOD FOR MEASURING PATTERNS | 2019-05-16 |
20190148109 | Method and Apparatus for Anisotropic Pattern Etching and Treatment | 2019-05-16 |
20190148110 | METHOD OF MANUFACTURING PHOTO MASKS | 2019-05-16 |
20190148111 | GROUNDING CAP MODULE, GAS INJECTION DEVICE AND ETCHING APPARATUS | 2019-05-16 |
20190148112 | PULSE MONITOR DEVICE AND PLASMA PROCESSING APPARATUS | 2019-05-16 |
20190148113 | PLASMA PROCESSING SYSTEM WITH SYNCHRONIZED SIGNAL MODULATION | 2019-05-16 |
20190148114 | Systems and Methods for Applying Frequency and Match Tuning in a Non-Overlapping Manner for Processing Substrate | 2019-05-16 |
20190148115 | PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD | 2019-05-16 |
20190148116 | ETCH PROCESS WITH ROTATABLE SHOWER HEAD | 2019-05-16 |
20190148117 | MULTI-SOURCE LOW-POWER LOW-TEMPERATURE PLASMA POLYMERIZED COATING DEVICE AND METHOD | 2019-05-16 |
20190148118 | Multi-Zone Cooling Of Plasma Heated Window | 2019-05-16 |
20190148119 | PLASMA PROCESSING APPARATUS | 2019-05-16 |
20190148120 | PLASMA PROCESSING APPARATUS, TEMPERATURE CONTROL METHOD, AND TEMPERATURE CONTROL PROGRAM | 2019-05-16 |
20190148121 | INLINE DPS CHAMBER HARDWARE DESIGN TO ENABLE AXIS SYMMETRY FOR IMPROVED FLOW CONDUCTANCE AND UNIFORMITY | 2019-05-16 |
20190148122 | ION GUIDE AND MASS SPECTROMETER USING SAME | 2019-05-16 |
20190148123 | OVERLAY-SHIFT MEASUREMENT SYSTEM AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE AND MEASURING ALIGNMENT MARK OF SEMICONDUCTOR STRUCTURE | 2019-05-16 |
20190148124 | IMPRINT APPARATUS, AND PRODUCT MANUFACTURING METHOD | 2019-05-16 |
20190148125 | APPARATUS AND METHOD FOR PROCESSING A SURFACE OF A SUBSTRATE | 2019-05-16 |
20190148126 | PVDF-TrFE Co-Polymer Having Improved Ferroelectric Properties, Methods of Making a PVDF-TrFE Co-Polymer Having Improved Ferroelectric Properties and Methods of Changing the End Group of a PVDF-TrFE Co-Polymer | 2019-05-16 |
20190148127 | SEMICONDUCTOR WAFER AND SEMICONDUCTOR WAFER FABRICATION METHOD | 2019-05-16 |
20190148128 | SELECTIVE DEPOSITION OF SILICON NITRIDE ON SILICON OXIDE USING CATALYTIC CONTROL | 2019-05-16 |
20190148129 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD | 2019-05-16 |
20190148130 | WAFER STRUCTURE AND TRIMMING METHOD THEREOF | 2019-05-16 |
20190148131 | APPARATUS AND METHOD FOR SELECTIVE DEPOSITION | 2019-05-16 |
20190148132 | METHOD OF MANUFACTURING SMALL-DIAMETER WAFER | 2019-05-16 |
20190148133 | SEMICONDUCTOR CLEANER SYSTEMS AND METHODS | 2019-05-16 |
20190148134 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD | 2019-05-16 |
20190148135 | METHODS FOR DEVICE FABRICATION USING PITCH REDUCTION | 2019-05-16 |
20190148136 | CELL CONTACT | 2019-05-16 |
20190148137 | METHOD FOR PROCESSING SUBSTRATE | 2019-05-16 |
20190148138 | MICROELECTRONIC SYSTEMS CONTAINING EMBEDDED HEAT DISSIPATION STRUCTURES AND METHODS FOR THE FABRICATION THEREOF | 2019-05-16 |
20190148139 | INSULATOR, CAPACITOR WITH THE SAME AND FABRICATION METHOD THEREOF, AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE | 2019-05-16 |
20190148140 | DRY AND WET ETCH RESISTANCE FOR ATOMIC LAYER DEPOSITED TIO2 FOR SIT SPACER APPLICATION | 2019-05-16 |
20190148141 | SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME | 2019-05-16 |
20190148142 | METHOD FOR PRODUCING GLASS SUBSTRATE WITH THROUGH GLASS VIAS AND GLASS SUBSTRATE | 2019-05-16 |
20190148143 | A METHOD OF FORMING AN APPARATUS COMPRISING QUANTUM DOTS | 2019-05-16 |
20190148144 | ENHANCED SELECTIVE DEPOSITION PROCESS | 2019-05-16 |
20190148145 | DIRECTIONAL PROCESSING TO REMOVE A LAYER OR A MATERIAL FORMED OVER A SUBSTRATE | 2019-05-16 |
20190148146 | METHOD OF FORMING SEMICONDUCTOR STRUCTURE | 2019-05-16 |
20190148147 | FINE LINE PATTERNING METHODS | 2019-05-16 |
20190148148 | METHOD AND DEVICE FOR BONDING OF SUBSTRATES | 2019-05-16 |
20190148149 | TECHNIQUE AND RELATED SEMICONDUCTOR DEVICES BASED ON CRYSTALLINE SEMICONDUCTOR MATERIAL FORMED ON THE BASIS OF DEPOSITED AMORPHOUS SEMICONDUCTOR MATERIAL | 2019-05-16 |
20190148150 | METHODS FOR FORMING CAPPING PROTECTION FOR AN INTERCONNECTION STRUCTURE | 2019-05-16 |
20190148151 | Selective High-K Formation in Gate-Last Process | 2019-05-16 |
20190148152 | METHOD OF FORMING SEMICONDUCTOR DEVICE USING TITANIUM-CONTAINING LAYER AND DEVICE FORMED | 2019-05-16 |
20190148153 | Atomic Layer Deposition Based Process for Contact Barrier Layer | 2019-05-16 |
20190148154 | CONTACTLESS ELECTRIC POWER SUPPLY MECHANISM AND METHOD FOR ROTARY TABLE, AND WAFER ROTATING AND HOLDING DEVICE | 2019-05-16 |
20190148155 | SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS | 2019-05-16 |
20190148156 | PHOTO MASK AND METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT USING PHOTO MASK | 2019-05-16 |
20190148157 | SEMICONDUCTOR STRUCTURES | 2019-05-16 |
20190148158 | ETCHING AND STRUCTURES FORMED THEREBY | 2019-05-16 |
20190148159 | Etching and Structures Formed Thereby | 2019-05-16 |
20190148160 | CLOG DETECTION IN A MULTI-PORT FLUID DELIVERY SYSTEM | 2019-05-16 |
20190148161 | METHOD OF FABRICATING SEMICONDUCTOR STRUCUTRE | 2019-05-16 |
20190148162 | Mechanisms for Forming Patterns Using Multiple Lithography Processes | 2019-05-16 |
20190148163 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2019-05-16 |
20190148164 | WAFER PRODUCING METHOD AND WAFER PRODUCING APPARATUS | 2019-05-16 |
20190148165 | SEMICONDUCTOR DEVICE HAVING ONE OR MORE TITANIUM INTERLAYERS AND METHOD OF MAKING THE SAME | 2019-05-16 |
20190148166 | Semiconductor Device and Method of Manufacture | 2019-05-16 |
20190148167 | ETCHING GAS MIXTURE, METHOD OF FORMING PATTERN BY USING THE SAME, AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT DEVICE BY USING THE ETCHING GAS MIXTURE | 2019-05-16 |
20190148168 | METHOD FOR MANUFACTURING A FIELD-EFFECT TRANSISTOR | 2019-05-16 |
20190148169 | METHOD FOR MANUFACTURING PACKAGE SUBSTRATE FOR MOUNTING A SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE MOUNTING SUBSTRATE | 2019-05-16 |
20190148170 | DECAL ELECTRONICS FOR PRINTED HIGH PERFORMANCE CMOS ELECTRONIC SYSTEMS | 2019-05-16 |
20190148171 | Stacked Semiconductor Devices and Methods of Forming Same | 2019-05-16 |
20190148172 | SEMICONDUCTOR CHIP | 2019-05-16 |
20190148173 | RESIN ENCAPSULATING MOLD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2019-05-16 |
20190148174 | SEMICONDUCTOR SENSOR AND METHOD FOR MANUFACTURING THE SAME | 2019-05-16 |
20190148175 | SUPPORT FOR MANUFACTURING SEMICONDUCTOR PACKAGES, USE OF SUPPORT FOR MANUFACTURING SEMICONDUCTOR PACKAGES, AND METHOD FOR MANUFACTURING SEMICONDUCTOR PACKAGES | 2019-05-16 |
20190148176 | SUBSTRATE PROCESSING APPARATUS | 2019-05-16 |
20190148177 | APPARATUS FOR PROCESSING SUBSTRATES OR WAFERS | 2019-05-16 |
20190148178 | GAS DELIVERY SYSTEM FOR HIGH PRESSURE PROCESSING CHAMBER | 2019-05-16 |
20190148179 | SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD AND RECORDING MEDIUM | 2019-05-16 |
20190148180 | SELF-CONTAINED METROLOGY WAFER CARRIER SYSTEMS | 2019-05-16 |
20190148181 | WAFER CLEANING APPARATUS AND METHOD | 2019-05-16 |
20190148182 | CLEANING APPARATUS AND CLEANING METHOD OF SUBSTRATE PROCESSING APPARATUS | 2019-05-16 |
20190148183 | SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM | 2019-05-16 |
20190148184 | STACKED SUBSTRATE MANUFACTURING METHOD, STACKED SUBSTRATE MANUFACTURING APPARATUS, STACKED SUBSTRATE MANUFACTURING SYSTEM, AND SUBSTRATE PROCESSING APPARATUS | 2019-05-16 |
20190148185 | HEATING PLATFORM, THERMAL TREATMENT AND MANUFACTURING METHOD | 2019-05-16 |
20190148186 | HIGH PRESSURE STEAM ANNEAL PROCESSING APPARATUS | 2019-05-16 |
20190148187 | DETAPING MACHINE AND DETAPING METHOD | 2019-05-16 |
20190148188 | MICRO PICK AND BOND ASSEMBLY | 2019-05-16 |
20190148189 | MULTIPLE MINIATURE PICK UP ELEMENTS FOR A COMPONENT STACKING AND/OR PICK-AND-PLACE PROCESS | 2019-05-16 |
20190148190 | Substrate Holder Having Integrated Temperature Measurement Electrical Devices | 2019-05-16 |
20190148191 | SYSTEM AND METHOD FOR MONITORING OPERATION CONDITIONS OF SEMICONDUCTOR MANUFACTURING APPARATUS | 2019-05-16 |
20190148192 | SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS | 2019-05-16 |
20190148193 | CORRELATION BETWEEN CONDUCTIVITY AND PH MEASUREMENTS FOR KOH TEXTURING SOLUTIONS AND ADDITIVES | 2019-05-16 |