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24th week of 2018 patent applcation highlights part 57
Patent application number
Title
Published
20180166235
INPUT DEVICE INCLUDING A RATCHET SYSTEM WITH AN ELECTROMAGNETIC ACTUATOR
2018-06-14
20180166236
SWITCHING SYSTEM
2018-06-14
20180166237
Force Switch
2018-06-14
20180166238
ELECTRONIC CIGARETTE
2018-06-14
20180166239
MULTIFUNCTION WIRELESS RELAY
2018-06-14
20180166240
ELECTROMAGNETIC RELAY
2018-06-14
20180166241
ELECTRICAL SWITCHING APPARATUS AND SHUNT TAB ASSEMBLY THEREFOR
2018-06-14
20180166242
LEAKAGE CURRENT PROTECTION DEVICE
2018-06-14
20180166243
ELECTRICAL APPARATUS FOR DISCONNECTING AN ELECTRICAL CURRENT
2018-06-14
20180166244
ELECTROMAGNETIC RELAY
2018-06-14
20180166245
CIRCUIT BREAKER
2018-06-14
20180166246
MECHANICAL FUSE DEVICE
2018-06-14
20180166247
METHOD AND APPARATUS FOR ALIGNMENT OF OPTICAL AND CHARGED-PARTICLE BEAMS IN AN ELECTRON MICROSCOPE
2018-06-14
20180166248
BLANKING DEFLECTOR, AND MULTI CHARGED PARTICLE BEAM WRITING APPARATUS
2018-06-14
20180166249
CREATING ION ENERGY DISTRIBUTION FUNCTIONS (IEDF)
2018-06-14
20180166250
High Brightness Ion Beam Extraction
2018-06-14
20180166251
THREE-DIMENSIONAL LAYER-BY-LAYER SHAPING APPARATUS, THREE-DIMENSIONAL LAYER-BY-LAYER SHAPING APPARATUS CONTROL METHOD, AND THREE-DIMENSIONAL LAYER-BY-LAYER SHAPING APPARATUS CONTROL PROGRAM
2018-06-14
20180166252
Liner Tube and Electron Microscope
2018-06-14
20180166253
Image Capture Assembly and Method for Electron Back Scatter Diffraction
2018-06-14
20180166254
MULTI CHARGED PARTICLE BEAM EXPOSURE METHOD AND MULTI CHARGED PARTICLE BEAM EXPOSURE APPARATUS
2018-06-14
20180166255
THERMAL ATOMIC LAYER ETCHING PROCESSES
2018-06-14
20180166256
MULTI-RADIOFREQUENCY IMPEDANCE CONTROL FOR PLASMA UNIFORMITY TUNING
2018-06-14
20180166257
METHOD FOR SUPPLYING GAS, AND PLASMA PROCESSING APPARATUS
2018-06-14
20180166258
SUBSTRATE PROCESSING APPARATUS
2018-06-14
20180166259
MOUNTING TABLE AND PLASMA PROCESSING APPARATUS
2018-06-14
20180166260
VIRTUAL SENSOR FOR CHAMBER CLEANING ENDPOINT
2018-06-14
20180166262
A METHOD OF MASS ANALYSIS USING ION FILTERING
2018-06-14
20180166263
Method for Deconvolution
2018-06-14
20180166264
Probability-Based Library Search Algorithm (ProLS)
2018-06-14
20180166265
TECHNIQUES FOR PROCESSING OF MASS SPECTRAL DATA
2018-06-14
20180166266
DEVICE AND METHOD FOR THE PREPARATION OF SAMPLES FOR IONIZATION BY LASER DESORPTION IN A MASS SPECTROMETER
2018-06-14
20180166267
SAMPLE PLATE, METHOD OF FABRICATING THE SAME AND MASS SPECTROMETER ANALYSIS BY USING THE SAME
2018-06-14
20180166268
IONIZATION AND ION INTRODUCTION DEVICE FOR MASS SPECTROMETER
2018-06-14
20180166269
REAL TIME MEASUREMENT TECHNIQUES COMBINING LIGHT SOURCES AND MASS SPECTROMETER
2018-06-14
20180166270
METHOD OF DEPOSITING A THIN FILM
2018-06-14
20180166271
METHOD FOR MANUFACTURING GROUP III-V NITRIDE SEMICONDUCTOR EPITAXIAL WAFER
2018-06-14
20180166272
ENHANCED CHARGED PARTICLE BEAM PROCESSES FOR CARBON REMOVAL
2018-06-14
20180166273
COMPOSITION AND METHOD FOR REMOVING RESIDUE FROM CHEMICAL-MECHANICAL PLANARIZATION SUBSTRATE
2018-06-14
20180166274
METAL GATE STRUCTURE AND MANUFACTURING METHOD THEREOF
2018-06-14
20180166275
SEMICONDUCTOR TEMPLATES AND FABRICATION METHODS
2018-06-14
20180166276
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
2018-06-14
20180166277
Resist Having Tuned Interface Hardmask Layer For EUV Exposure
2018-06-14
20180166278
Resist Having Tuned Interface Hardmask Layer For EUV Exposure
2018-06-14
20180166279
SEMICONDUCTOR DEVICE
2018-06-14
20180166280
Methods and Apparatus for Preventing Counter-Doping During High Temperature Processing
2018-06-14
20180166281
DOPANT INTRODUCTION METHOD AND HEAT TREATMENT METHOD
2018-06-14
20180166282
WAFER PROCESSING METHOD
2018-06-14
20180166283
SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF
2018-06-14
20180166284
METHOD FOR MANUFACTURING BUMP STRUCTURE
2018-06-14
20180166285
METHOD FOR FORMING SEMICONDUCTOR DEVICE STRUCTURE WITH ETCH STOP LAYER
2018-06-14
20180166286
ELECTROLYTIC PLATING APPARATUS
2018-06-14
20180166287
METHOD OF FORMING SEMICONDUCTOR DEVICE USING TITANIUM-CONTAINING LAYER AND DEVICE FORMED
2018-06-14
20180166288
METHODS FOR SILICIDE FORMATION
2018-06-14
20180166289
SUPER HYDROPHOBIC SURFACE FABRICATION METHOD
2018-06-14
20180166290
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
2018-06-14
20180166291
SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD THEREOF
2018-06-14
20180166292
INDIUM PHOSPHIDE SMOOTHING AND CHEMICAL MECHANICAL PLANARIZATION PROCESSES
2018-06-14
20180166293
METHOD FOR FORMING DEEP TRENCH STRUCTURE
2018-06-14
20180166294
APPARATUS AND METHODS TO ACHIEVE UNIFORM PACKAGE THICKNESS
2018-06-14
20180166295
ETCHING METHOD AND SUBSTRATE PROCESSING SYSTEM
2018-06-14
20180166296
Atomic Layer Etch Process Using Plasma In Conjunction With A Rapid Thermal Activation Process
2018-06-14
20180166297
SEMICONDUCTOR PACKAGE AND METHOD FOR FABRICATING BASE FOR SEMICONDUCTOR PACKAGE
2018-06-14
20180166298
SUBSTRATE PROCESSING APPARATUS
2018-06-14
20180166299
MONOCRYSTAL AND POLYCRYSTAL TEXTURING DEVICE
2018-06-14
20180166300
POINT-OF-USE MIXING SYSTEMS AND METHODS FOR CONTROLLING TEMPERATURES OF LIQUIDS DISPENSED AT A SUBSTRATE
2018-06-14
20180166301
SEMICONDUCTOR MANUFACTURING SYSTEM
2018-06-14
20180166302
METHOD OF FORMING A NITRIDE SEMICONDUCTOR SUBSTRATE
2018-06-14
20180166303
METHOD OF SELECTIVELY ETCHING FIRST REGION MADE OF SILICON NITRIDE AGAINST SECOND REGION MADE OF SILICON OXIDE
2018-06-14
20180166304
ION INJECTOR AND LENS SYSTEM FOR ION BEAM MILLING
2018-06-14
20180166305
METHOD AND APPARATUS FOR WAFER BACKSIDE COOLING
2018-06-14
20180166306
QUARTZ CRYSTAL MICROBALANCE UTILIZATION FOR FORELINE SOLIDS FORMATION QUANTIFICATION
2018-06-14
20180166307
INTEGRATED SUBSTRATE DEFECT DETECTION USING PRECISION COATING
2018-06-14
20180166308
SEMICONDUCTOR PROCESSING BOAT DESIGN WITH PRESSURE SENSOR
2018-06-14
20180166309
METHOD AND SYSTEM FOR MONITORING TEMPERATURE OF WAFER
2018-06-14
20180166310
SUBSTRATE PROCESSING APPARATUS
2018-06-14
20180166311
NEW REPAIR METHOD FOR ELECTROSTATIC CHUCK
2018-06-14
20180166312
ELECTROSTATICALLY CLAMPED EDGE RING
2018-06-14
20180166313
THERMOPLASTIC ELASTOMER (TPE) ADHESIVE CARRIER TAPE
2018-06-14
20180166314
Wafer Chuck Apparatus With Contractible Sealing Devices For Securing Warped Wafers
2018-06-14
20180166315
VARIABLE ADJUSTMENT FOR PRECISE MATCHING OF MULTIPLE CHAMBER CAVITY HOUSINGS
2018-06-14
20180166316
SUBSTRATE CARRIER SYSTEM WITH PROTECTIVE COVERING
2018-06-14
20180166317
SEMICONDUCTOR WITH THROUGH-SUBSTRATE INTERCONNECT
2018-06-14
20180166318
METHOD FOR MANUFACTURE OF A SEMICONDUCTOR WAFER SUITABLE FOR THE MANUFACTURE OF AN SOI SUBSTRATE, AND SOI SUBSTRATE WAFER THUS OBTAINED
2018-06-14
20180166319
AIR-GAP SPACERS FOR FIELD-EFFECT TRANSISTORS
2018-06-14
20180166320
SEMICONDUCTOR DEVICES
2018-06-14
20180166321
SEMICONDUCTOR DEVICE WITH REDUCED TRENCH LOADING EFFECT
2018-06-14
20180166322
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
2018-06-14
20180166323
SELF-ALIGNED TRENCH ISOLATION IN INTEGRATED CIRCUITS
2018-06-14
20180166324
Buried Insulator Regions and Methods of Formation Thereof
2018-06-14
20180166325
GROUP III NITRIDE COMPOSITE SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME, AND METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR DEVICE
2018-06-14
20180166326
STRUCTURE AND METHOD FOR HIGH PERFORMANCE LARGE-GRAIN-POLY SILICON BACKPLANE FOR OLED APPLICATIONS
2018-06-14
20180166327
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
2018-06-14
20180166328
SEMICONDUCTOR DIE HAVING EDGE WITH MULTIPLE GRADIENTS AND METHOD FOR FORMING THE SAME
2018-06-14
20180166329
METHOD FOR FORMING SEMICONDUCTOR DEVICE CONTACT
2018-06-14
20180166330
MULTI-METAL FILL WITH SELF-ALIGN PATTERNING
2018-06-14
20180166331
METHOD FOR FORMING SEMICONDUCTOR STRUCTURE USING POLISHING PROCESS
2018-06-14
20180166332
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
2018-06-14
20180166333
SEMICONDUCTOR INTERCONNECT STRUCTURE HAVING A GRAPHENE BARRIER LAYER
2018-06-14
20180166334
SEMICONDUCTOR DEVICE
2018-06-14
20180166335
SELF-ALIGNED MIDDLE OF THE LINE (MOL) CONTACTS
2018-06-14