44th week of 2008 patent applcation highlights part 22 |
Patent application number | Title | Published |
20080265841 | Method of testing cycle life of lithium rechargeable battery - The provided are two test methods for the cycle life test of a lithium rechargeable battery, which measures charge/discharge capacity by repeating charging and discharging lithium rechargeable battery. In one method, a constant current-constant voltage of charge rate of 1.5C and 4.2V, and a cut-off current of 0.1C are set to charge the battery, and a discharge rate of 1.0C and a cut-off voltage of 3.0V are set to discharge the battery, and there is no rest period between the charging and discharging. In another method, a constant current-constant voltage charge condition of charge rate of 1.0C and 4.2V, and a cut-off current of 0.1C are set to charge the battery, and a discharge rate of 1.3C and a cut-off voltage of 3.3V are set to discharge the battery, and there is no rest period between the charging and discharging. The present invention is appropriate to the cycle life test method of 500 cycles. | 2008-10-30 |
20080265842 | Method and apparatus to provide fixed frequency charging signals to a battery at or near resonance - A battery charger with a fixed frequency charging signal at or near the resonant frequency of the battery to be charged is presented. The present invention utilizes a microprocessor to modulate a current source at or near the resonant frequency of the battery to be charged without the use of a PLL. To simplify conventional modulated battery chargers, the PLL or other methods of phase correction are removed, reducing most of the calculation requirements for adjusting the phase angle, thereby reducing the piece count and ultimately cost and complexity. The result is a solution wherein charging occurs at or near the resonant frequency of the battery, and although suboptimal, the results are superior to traditional charging methods. | 2008-10-30 |
20080265843 | CONSERVATION OF ELECTRICAL ENERGY AND ELECTRO-MAGNETIC POWER IN BATTERY CHARGER - The present disclosure is an energy-efficient rapid battery charger, using inductive windings rather than transformer to charge a battery. The apparatus operates with an AC power source rectifying a high voltage DC output or AC source transformed to a low DC voltage output. The control driver frequencies vary from several hundred Hz to thousand of Hz. A capacitor, inductor, and power line are arranged in a series parallel combination tank circuit that operates over the on and off time of a complete cycle. During on-time, the inductor is charged with electromagnetic power. During off-time, the electromagnetic power in the inductor discharges into the battery. | 2008-10-30 |
20080265844 | STARTER SYSTEM FOR PORTABLE INTERNAL COMBUSTION ENGINE ELECTRIC GENERATORS USING A PORTABLE UNIVERSAL BATTERY PACK - A portable power driven system has a manually movable frame. In one example, an internal combustion engine and a generator device that generates AC power are supported on the frame. The internal combustion engine drives the generator device. An electrically powered starting device is coupled to the internal combustion engine and is controllable by a remote ignition system to enable the start-up of the internal combustion engine from a remote location. A control panel is coupled to the frame and includes at least one AC outlet and a battery receptacle that is electrically coupled to the starting device. The battery receptacle is materially the same as a foot of a cordless power tool that receives a battery pack. | 2008-10-30 |
20080265845 | Specially improved automotive replacement voltage regulator - This device is A Specially Improved Automotive Replacement Voltage Regulator for use in the automotive components remanufacturing and original equipment alternator product. Particularly this device has additional transient suppression means for the loads; “high side drive” of the rotor field to eliminate corrosion from the low side short condition; full passivation around the monolithic chip; and a monolithic chip that contains both the power and control devices which permits a simplified heat sink for thermal dissipation. | 2008-10-30 |
20080265846 | METHOD FOR THE ACTIVE DAMPING OF THE DRIVE TRAIN IN A WIND ENERGY PLANT - A method for the active damping of a drive train in wind energy plant, with the following steps: the actual value of the generator rotational speed is acquired and amplified via an oscillatory delay element, the oscillatory delay element has a predetermined natural oscillation frequency (ω | 2008-10-30 |
20080265847 | SATURATION PREVENTING POWER FACTOR IMPROVING METHOD AND APPARATUS - Provided are a method and apparatus for improving the power factor of an input power. The apparatus includes an input unit receiving the input power, a power factor correction unit correcting the power factor of the input power applied to the input unit, and a saturation prevention unit controlling the power factor correction unit such that the corrected power does not exceed a set power limit. | 2008-10-30 |
20080265848 | Electric Power Flow Control - An apparatus for controlling a power flow in a high voltage network. A phase shifting transformer includes a tap changer. | 2008-10-30 |
20080265849 | CONTROL APPARATUS OF POWER CONVERSION CIRCUIT AND CONTROL METHOD THEREOF - A control apparatus for a power conversion circuit and a control method thereof are provided. The method of the control apparatus includes producing a first control signal and a second control signal; modulating the first control signal according to an output voltage of the power conversion circuit; detecting the output voltage of the power conversion circuit to attain a detecting result; if the detecting result exhibits the input voltage of the power conversion circuit below a normal operating level, using the second control signal to control the power conversion circuit; or if the detecting result exhibits the input voltage of the power conversion circuit above the normal operating level, using the first control signal to control the power conversion circuit. The duty cycle of the fist control signal is greater than that of the second control signal. | 2008-10-30 |
20080265850 | CURRENT SENSOR DEVICE - A current sensor senses the current at a sense transistor and generates an output current that is an accurate proportional representation of the current at the sense transistor. Furthermore, the sensed current is relatively independent of the resistive load of the feedback path at feedback control module to which it is applied. In one embodiment, the feedback control module uses the sensed current in a DC-DC voltage converter to regulate a voltage. The current sensor employs a pair of operational amplifiers to match a voltage at a current electrode of a transistor that generates the output current to a voltage at a current electrode of the sense transistor, such that an effective resistance of the transistor generating the output current is significantly higher than the resistive load of the feedback control module, thereby ensuring that the output current is relatively independent of the resistive load of the feedback control module. | 2008-10-30 |
20080265851 | POWER SWITCH-MODE CIRCUIT WITH DEVICES OF DIFFERENT THRESHOLD VOLTAGES - The high side or low side FET of a buck converter, or both, are replaced by plural parallel devices of different threshold voltage and are turned on and off in a sequence which offers the best turn on and turn off characteristics related to high and low threshold voltages. The parallel devices can have the same or different active areas. | 2008-10-30 |
20080265852 | VOLTAGE REGULATOR - Provided is a voltage regulator having an overcurrent protective circuit, which is excellent in detection precision and small in current consumption. The voltage regulator having the overcurrent protective circuit which detects that overcurrent flows in an output transistor, and limits the current of the output transistor, includes a regulated cascode circuit that makes a voltage at a source of the output transistor equal to a voltage at a source of the output current detection transistor, in which the operating current of the regulated cascode circuit is supplied by a transistor that is controlled by the output voltage of an error amplifier circuit. | 2008-10-30 |
20080265853 | LINEAR VOLTAGE REGULATING CIRCUIT WITH UNDERSHOOT MINIMIZATION AND METHOD THEREOF - A voltage regulating circuit for providing a regulated output voltage. The voltage regulating circuit includes a voltage regulator, a converting circuit, a capacitive device, a first current mirror module, and a second current mirror module. The voltage regulator has a first output producing the regulated output voltage and a second output producing a pass voltage. The converting circuit converts the pass voltage into a first current and a second current passing through a first converting node and a second converting node respectively, where the first current charges/discharges the capacitive device. The first current mirror module has a first current mirror path coupled to the first converting node and a second current mirror path coupled to the second converting node. The second current mirror module has a first current mirror path coupled to the second converting node and a second current mirror path coupled to the first output. | 2008-10-30 |
20080265854 | Low Drop Out Voltage Regulator Circuit Assembly - An integrated circuit assembly includes a voltage level generator, a level shifter, a bandgap reference generator and a voltage regulator. The voltage level generator generates output voltage level signals in response to a supply voltage. The level shifter receives the output voltage level signals from the voltage level generator and generates first and second sets of control signals. The bandgap reference generator receives a reference voltage input and generates a bandgap reference signal. The voltage regulator receives a supply voltage, the bandgap reference signal the first and second sets of control signals from the level shifter and generates a constant output voltage under varying circuit conditions. | 2008-10-30 |
20080265855 | Power regulator circuitry for programmable logic device memory elements - Power regulator circuitry for programmable memory elements on programmable logic device integrated circuits is provided. The programmable memory elements may each include a storage element formed from cross-coupled inverters and an address transistor. Address drivers may be used to supply address signals to the address transistors. The power regulator circuitry may include an address power supply circuit that produces a time-varying address power supply voltage to the address drivers and storage element power supply circuits that provide time-varying storage element power supply voltages to the cross-coupled inverters in the storage elements. Unity gain buffers may be used to distribute a reference voltage from a bandgap voltage reference to the power supply circuits. The power supply circuits may use voltage dividers and p-channel metal-oxide-semiconductor control transistors. | 2008-10-30 |
20080265856 | CONSTANT-VOLTAGE POWER CIRCUIT - A differential amplifier receives a reference voltage and a divided voltage dividing an output voltage, and outputs a control voltage in accordance with the difference between the reference voltage and the divided voltage. The control voltage output from the differential amplifier is supplied to an output amplifier. The output amplifier generates a stabilized output voltage from a high-potential-side power supply voltage in accordance with the control voltage. A P-type MOS transistor is connected to a node of the output voltage, and the MOS transistor carries a current from the node of the output voltage. A current control circuit controls a gate of the P-type MOS transistor so that the current flowing through the P-type MOS transistor becomes a constant value. | 2008-10-30 |
20080265857 | INTEGRATED FET SYNCHRONOUS MULTIPHASE BUCK CONVERTER WITH INNOVATIVE OSCILLATOR - A power conversion system, preferably a buck converter, having (i) an oscillator, (ii) a pulse width modulator, (iii) and a nonoverlap clock generator and level shifter, wherein the improvement comprises the elimination of an external resistor divider is described. The buck converter can convert input voltage ranging from approximately 3V to 5V down to approximately 0.7-1.0V, 1.2V, 1.5V, 1.8V, 2.5V, and 3.3V without the use of resistor dividers. The voltage input identifiers select one of the possible output settings for flexibility and accuracy. The integrated field emitting transistors can provide a continuous current of at least 6 A. Additionally, peak current mode and an oscillator enable multiphase operation, up to ten buck converters, for up to 60 A output current. The multiphase operation reduces the output inductor size, and number of bulk capacitors. Moreover, the multiphase operation yields higher efficiency and provides high transient response for demanding applications. | 2008-10-30 |
20080265858 | Inductive element for a multi-phase interleaved power supply and apparatus and method using the same - An inductive element for transforming and/or regulating voltage input from a multi-phase, interleaved power supply system into an output voltage to a load is disclosed. The multi-phase, interleaved power supply system includes a plurality of pulsed power sources, each of which is adapted to provide voltage at a discrete phase. The inductive element includes a magnetic core having, for each power supply, a distinct area of relatively-high magnetic reluctance, which is surrounded by areas of relatively-low magnetic reluctance, and a pair of windings. Each of the pair of windings includes a first, phase winding that is electrically coupled to an output of one of the pulsed power source and to the load, and a second, loop winding that is operatively coupled and proximate to the first, phase winding. Each of the second, loop windings is disposed serially on a closed loop. | 2008-10-30 |
20080265859 | ELECTRONIC DEVICE FOR CONTROLLED FAILURE - A selectively protected electrical system includes or operates with a power source, a load, a power driver circuit for controllably transferring power from the power source to the load, the power driver circuit being encapsulated in a potting material, and a controller for enabling and disabling the power driver circuit, the controller being un-encapsulated by the potting material. If a contaminant induced electrical fault occurs in the selectively protected electrical system, the electrical fault is more likely to occur in the un-encapsulated controller, such that the selectively protected electrical system is disabled. The contaminant is inhibited from contacting and inducing an electrical fault in the power driver circuit, thus providing for a controlled failure of the selectively protected electrical system. | 2008-10-30 |
20080265860 | Low voltage bandgap reference source - A bandgap voltage reference circuit is described. By providing first and second bipolar devices that are operable with different current densities a base emitter voltage difference is created. This voltage difference is increased by coupling first and second cascode circuits to the first and second bipolars, the cascode circuits also being scaled relative to one another. | 2008-10-30 |
20080265861 | VOLTAGE PROVIDING CIRCUIT AND RELATED METHOD THEREOF - A voltage providing circuit for generating an output voltage, which includes: a plurality of oscillating circuits, for providing clock signals with different frequencies; a detection circuit, for generating a detection result according to a reference voltage and the output voltage; a selecting unit, coupled to the oscillating circuits and the detection circuit, for selecting one of the clock signals according to the detection result; and a charge pump circuit, for controlling a charge pump according to the clock signal selected by the selecting unit to generate the output voltage. | 2008-10-30 |
20080265862 | Parallell Arranged Power Supplies - A power supply system comprises a parallel arrangement of a first switched mode power supply ( | 2008-10-30 |
20080265863 | REFERENCE CURRENT CIRCUIT FOR ADJUSTING ITS OUTPUT CURRENT AT A LOW POWER-SUPPLY VOLTAGE - A reference current circuit includes a differential amplifier amplifying a difference in potential between a reference voltage and a first node and outputting the amplified potential difference to a second node, and adjusting transistors connected between a supply voltage and the first node. The reference current circuit further includes switches provided correspondingly to the adjusting transistors to apply a voltage of the second node to control electrodes of the adjusting transistors in response to control signals that are respectively input to the switches. The reference current circuit further includes a resistance connected between the first node and a common potential, and an output transistor having its conduction state responsive to the voltage of the second node for controlling a current supplied from the supply voltage to a load. | 2008-10-30 |
20080265864 | Phase Identification Systems and Methods - A system and method for determining the relative phase between current-carrying conductors. A reference unit samples and digitizes a voltage waveform at a reference location and transmits the digitized voltage waveform. A field sampling unit is placed on or directly adjacent a field conductor at a field location and transmits a signal representative of the voltage waveform of the field conductor. A field unit receives and digitizes the waveform received from the field sampling unit, receives the digitized voltage waveform from the reference unit, and compares the digitized field waveform and the digitized reference waveform. Also provided are methods for commissioning the phase identification system and calibrating the reference unit. | 2008-10-30 |
20080265865 | SYSTEM AND METHOD FOR ADAPTIVELY DETERMINING THE TRANSITION RATE OF A QUANTIZED SIGNAL - An adaptive measurement system measures a transition rate associated with an output of a device. An input signal that is characteristic of the output of the device is received by an input signal-to-frequency converter, which changes state based upon a characteristic of the input signal. The input signal-to-frequency converter provides a second signal, which reflects the state changes of the input signal-to-frequency converter. The second signal is sampled over a sample period and an instance of average transition rate is determined. A control subsystem may use the instance of average transition rate for regulating the device. | 2008-10-30 |
20080265866 | METHOD AND SYSTEM FOR ION BEAM PROFILING - One embodiment of the invention relates to an apparatus for profiling an ion beam. The apparatus includes a current measuring device having a measurement region, wherein a cross-sectional area of the ion beam enters the measurement region. The apparatus also includes a controller configured to periodically take beam current measurements of the ion beam and to determine a two dimensional profile of the ion beam by relating the beam current measurements to sub-regions within the current measuring device. Other apparatus and methods are also disclosed. | 2008-10-30 |
20080265867 | PROCESS FOR MEASURING BOND-LINE THICKNESS - A process for measuring the thickness of an insulating material. The process includes providing a device used to measure capacitance, and electrically connecting the capacitance measuring device to a heat sink and an electrical, heat-generating component. The thickness of the insulating material is determined by measuring the capacitance of the insulating material according to the formula; | 2008-10-30 |
20080265868 | Measurement Of Distortion In An Amplifier - Parametric measurement of first- and second-generation telecommunications equipment has been relatively straightforward. The evolution to more complex transmission schemes such as those proposed for third-generation (3G) telecommunications devices can employ the subject methods and apparatus and apply AM-PM test procedures to a multicarrier amplifier RF environment to properly characterize the parametric performance of these transmission systems, particularly those operating in a multicarrier environment. | 2008-10-30 |
20080265869 | SWITCHING POWER SUPPLY PERFORMANCE TESTING - One embodiment includes a system comprising a switching power supply comprising at least one switching phase configured to provide a corresponding phase output at a respective phase node thereof, the respective phase node being coupled to an output through a filter for providing a corresponding output signal. At least one resistor interconnects the respective phase node of each of the at least one switching phase with a test node, the test node being configured to provide a test signal representing the phase output at each phase node. | 2008-10-30 |
20080265870 | Particulate Matter Sensor - A sensor apparatus to burn off contaminating particulate matter from a sensor. The sensor apparatus includes a signal electrode assembly, a detector electrode assembly, and an electrical heater. The signal electrode assembly includes a signal electrode coupled to a signal electrode insulating substrate. The detector electrode assembly includes a detector electrode coupled to a detector electrode insulating substrate. The detector electrode is positioned relative to the sensor electrode to generate a measurement of an ambient condition. The electrical heater is positioned relative to the signal and detector electrode assemblies to burn off an accumulation of contaminating particles from at least one electrode assembly of the signal and detector electrode assemblies. | 2008-10-30 |
20080265871 | CURRENT MEASUREMENT APPARATUS - Apparatus and methods are provided for a system for measurement of a current in a conductor such that the conductor current may be momentarily directed to a current measurement element in order to maintain proper current without significantly increasing an amount of power dissipation attributable to the current measurement element or adding resistance to assist in current measurement. The apparatus and methods described herein are useful in superconducting circuits where it is necessary to monitor current carried by the superconducting elements while minimizing the effects of power dissipation attributable to the current measurement element.” | 2008-10-30 |
20080265872 | WIRING SUBSTRATE AND CURRENT DETECTION DEVICE - An object of the present invention is to provide a wiring substrate capable of accurately detecting a potential difference in a shunt resistor and a current to be detected without being influenced by soldering, and a current detection device. A land mounted with a rectangular surface at each end of a shunt resistor is configured by first and second lands each having a rectangular portion and being arranged at a predetermined interval with a central line as a center, and third and fourth lands each having an area smaller than those of the first and second lands and being arranged at one end of the first and second lands to be connected respectively to the first and second lands. A wiring pattern for detecting a potential difference between the both ends of the shunt resistor is configured by a first wiring pattern connected to the third land and pulled out from the third land towards the fourth land, a second wiring pattern connected to the fourth land and pulled out from the fourth land towards the third land, and third and fourth wiring patterns connected respectively to the first and second wiring patterns and pulled out into one direction. | 2008-10-30 |
20080265873 | Low profile probe having improved mechanical scrub and reduced contact inductance - A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance. | 2008-10-30 |
20080265874 | TEST HANDLER - A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing the test tray located in the test chamber to be tested, and a press unit for operating the pushing member; a position control unit for adjusting a position of the pushing member to compensate a deviation between the pushing member and the test tray due to a thermal expansion or contraction of any one of the pushing member and the test tray; and an unloading unit for unloading the semiconductor devices loaded on the test tray onto the customer trays after a test for the semiconductor devices is completed. | 2008-10-30 |
20080265875 | Fluid production computation apparatus using electromagnetic induction theory and fluid producing apparatus capable of computing fluid production - A fluid production computation apparatus using the electromagnetic induction theory is disclosed. In accordance with an embodiment of the present invention, the fluid production computation apparatus includes a line through which a current flows according to fluid production; a magnetic sensor, measuring magnetism induced by the current; and a fluid production computation unit, computing the fluid production through magnetism measured by the magnetic sensor. The conventional flow measurement apparatus measures the flow by measuring a current or a voltage induced by magnetism formed by a fluid or by using a fluid measurement sensor. However, with the present invention, an apparatus can be miniaturized and the measurement can be precisely performed by measuring a magnetic field induced by a current flowing according to fluid production. | 2008-10-30 |
20080265876 | SENSOR MODULE FOR DETECTING RELATIVE DISPLACEMENT AND METHOD OF DETECTING MOVING DIRECTION USING THE SAME - The present invention relates to a sensor module for detecting a relative displacement of an object having a groove pattern with alternately formed projection and depression, which comprises a magnet for generating a magnetic field; a giant magneto resistance (GMR) sensor installed between the magnet and the object to detect a variation in the magnetic field and output an electric signal; a signal processing part for processing the output signal from the GMR sensor to output a square wave; and a housing for supporting the magnet the GMR sensor and the signal processing part, and a method of detecting a moving direction using the same. | 2008-10-30 |
20080265877 | Angle detecting apparatus - An angle detection apparatus includes a rotation member including at least one north magnetic polar region and at least one south magnetic polar region alternately arranged around a rotation center, a magnetic field detecting portion having a magnetic plate and detecting elements detecting magnitudes of magnetic components in a direction perpendicular to the magnetic plate, and a computing unit determining a rotation angle of the rotation member, wherein the magnetic field detecting portion is disposed so that the magnetic plate is oriented perpendicular to a first direction, where magnetic field intensity is at its maximum, and the magnetic field detecting portion detects the magnitudes of the magnetic components in the first direction and a second direction corresponding to a direction that the north and south magnetic polar regions are circumferentially arranged. | 2008-10-30 |
20080265878 | METHOD AND AN INSTALLATION FOR USING EDDY CURRENTS FOR NON-DESTRUCTIVE INSPECTION WITH AUTOMATIC CALIBRATION - Using eddy currents for automatic inspection of a rectilinear hole formed in a metal part. An eddy-current probe is carried by a drive system associated with a positioning baseplate that carries a calibration part including a hole similar to the hole for inspection and in alignment with an orifice thereof. | 2008-10-30 |
20080265879 | DEVICE FOR INSPECTING A RECTILINEAR CAVITY WITH EDDY CURRENTS - Inspecting an open cavity by successive broaching movements of an eddy-current sensor. The inspection device comprises a probe body including the sensor installed laterally in the vicinity of the end of a rod and in line with a ramp, together with resilient bias means acting on the probe body. | 2008-10-30 |
20080265880 | Magnetic Sensor Circuit and Portable Terminal Provided With Such Magnetic Sensor Circuit - A Hall element ( | 2008-10-30 |
20080265881 | Direction Control Apparatus - A direction control apparatus is provided. The direction control apparatus includes an input unit, and a magnetic sensing unit. The input unit includes an operation member, a magnetic member, an elastic member, and a base. The elastic member is an elastic structure. The magnetic sensing unit includes a magnetic sensor, and a magnetic signal processing device. The magnetic sensor is a device for sensing a distribution of a magnetic field, and the magnetic signal processing device is an electronic calculating device. The elastic member is provided for restricting the operation member at either a first status position or a second status position. When at the first status position, the operation member is positioned at balanced position where the elastic member achieves an elastic balance. | 2008-10-30 |
20080265882 | Phantom for use in magnetic resonance imaging studies - A phantom for use in an MRI or MRS system includes an array of subresolvable compartments that are each connected to receive fluid from one of a plurality of fluid reservoirs. The array of compartments is divided into sub-arrays which differ from each other by the mix of compartments in each sub-array receiving fluids from the different reservoirs. Studies can be performed with the phantom by filling the compartments with selected fluids from the reservoirs, disconnecting the reservoirs and placing the phantom in the system bore. The phantom can be reused in other studies by replacing the fluids with different fluids. | 2008-10-30 |
20080265883 | MRI Method for Reducing Artifacts Using RF Pulse at Offset Frequency - A method for magnetic resonance imaging includes performing a preparatory stage of a MR pulse sequence with an MRI system in which a non-selective RF preparatory pulse is used having a bandwidth such that any spin species having corresponding Larmor frequencies within that bandwidth are affected and the bandwidth is centered at a selected frequency which is offset from a nominal Larmor frequency of the desired spin species being imaged. A time period (TI) elapses during which longitudinal spin magnetization recovers; and then an imaging stage is performed in which an RF excitation pulse is generated to produce transverse spin magnetization of the desired spin species, and in which a set of NMR signals are acquired. An image is reconstructed using the acquired set of NMR signals, and the reconstructed image has reduced artifacts due to B | 2008-10-30 |
20080265884 | Magnetic resonance imaging apparatus and magnetic resonance imaging method - A magnetic resonance imaging apparatus includes an imaging condition setting unit and an image acquisition unit. The imaging condition setting unit includes an input part for inputting an imaging condition with applying plural pre-pulses. The image acquisition unit performs imaging according to the imaging condition and generates an image based on data acquired by the imaging. The imaging condition setting unit includes a display part configured to display an application region and attribute information of at least one pre-pulse of the plural pre-pulses together with a position of the imaging. | 2008-10-30 |
20080265885 | Magnetic Resonance Imaging with Short Echo Times - In a magnetic resonance imaging method, inner radial readout lines ( | 2008-10-30 |
20080265886 | MAGNETIC RESONANCE IMAGING METHOD AND APPARATUS - In a magnetic resonance imaging (MRI) method, in the form of an MRI pulse sequence, and an apparatus for acquiring MRI data from an object, a contrast preparation module is applied to the object for preparing a contrast in the magnetization of nuclear spins of the object, and an imaging module is applied to the object after the contrast preparation module for acquisition of magnetic resonance image data reflecting the prepared contrast. The contrast preparation module includes a train of radio-frequency pulses with the same flip angle magnitude α, the respective signs of the flip angles alternating from radio-frequency pulse to radio-frequency pulse. | 2008-10-30 |
20080265887 | SYSTEM AND APPARATUS FOR DETECTING GAMMA RAYS IN A PET/MRI SCANNER - A gamma ray detector ring for a combined positron emission tomography (PET) and magnetic resonance imaging (MRI) system is integrated into a radio frequency (RF) coil assembly such that the detector ring is integrated with a RF shield. Each gamma ray detector in the detector ring includes a scintillator component that emits light when a gamma ray is detected and a photodetector component designed to be sensitive to the frequency of light produced by the scintillator. A RF shield may be integrated into a detector ring such that the RF shield is positioned between the scintillator and photodetector components of each detector, thereby saving valuable radial space within the imaging system. Multiple such detector rings may be located adjacent to one another to increase axial coverage and enable three-dimensional PET imaging techniques. | 2008-10-30 |
20080265888 | MAGNETIC RESONANCE APPARATUS WITH A SUPERCONDUCTING BASIC FIELD MAGNET WITH AN ELECTRICALLY CONDUCTIVE COATING ON THE OUTER VACUUM CHAMBER - In an arrangement with a basic field magnet and with a gradient coil of a magnetic resonance apparatus, the basic field magnet includes superconducting coils that are arranged in a reservoir with liquid helium for cooling. The helium reservoir is surrounded by a further reservoir, designated as an outer vacuum chamber. A vacuum exists between the outer vacuum chamber and the helium reservoir. A cryoshield is arranged between the outer vacuum chamber and the helium reservoir. The gradient coil is arranged in the inner chamber of the basic field magnet. The outer vacuum chamber has an additional coating with a high electrical conductivity. | 2008-10-30 |
20080265889 | Multiple-Channel Transmit Magnetic Resonance - In a transmit apparatus, a multi-channel radio frequency transmitter ( | 2008-10-30 |
20080265890 | Simultaneous Mr-Excitation of Multiple Nuclei with a Single Rf Amplifier - A medical imaging system ( | 2008-10-30 |
20080265891 | BODY COIL FOR MAGNETIC RESONANCE IMAGING APPARATUS - To reduce high SAR values in the field of magnetic resonance imaging, and particularly with a body coil for an MRI apparatus, at least a bracket is added between the supporting tube of a body coil and the connecting copper sheet in order to raise the connecting copper sheet and the capacitors away from the human body. In addition to effectively solving the problem of a high SAR value, at the same time no significant loss of the imaging performance occurs. Moreover, the structure is simple, so the costs of modification or production are low. | 2008-10-30 |
20080265892 | Externally Guided and Directed Field Induction Resistivity Tool - In one aspect an induction resistivity tool incorporated into a downhole tool string comprises an outer wall of a downhole component comprising an outer diameter and at least one induction transmitter assembly disposed along the outer diameter. The at least one transmitter assembly comprises at least one induction transmitter coil wound about at least one core. The at least one transmitter coil is adapted to project an induction signal outward from the outer wall when the at least one transmitter coil is carrying an electrical current. The transmitter assembly is adapted to create electromagnetic fields that originate the induction signal from outside the outer wall and substantially prevent the signal from entering the outer wall. | 2008-10-30 |
20080265893 | Externally Guided and Directed Field Induction Resistivity Tool - In one aspect an induction resistivity tool incorporated into a downhole tool string comprises an outer wall of a downhole component comprising an outer diameter and at least one induction transmitter assembly disposed along the outer diameter. The at least one transmitter assembly comprises at least one induction transmitter coil wound about at least one core. The at least one transmitter coil is adapted to project an induction signal outward from the outer wall when the at least one transmitter coil is carrying an electrical current. The transmitter assembly is adapted to create electromagnetic fields that originate the induction signal from outside the outer wall and substantially prevent the signal from entering the outer wall. | 2008-10-30 |
20080265894 | Externally Guided and Directed Halbach Array Field Induction Resistivity Tool - In one aspect of the invention an induction resistivity tool incorporated into a downhole tool string comprises an outer wall of a downhole component having an outer diameter. At least one induction transmitter assembly is disposed along the outer diameter. The transmitter assembly comprises at least one coil array and at least one induction transmitter coil wound about at least one core. The coil array comprises a plurality of magnetic units and each unit comprising a magnetic field orientation. The magnetic field orientations accumulatively form a Halbach array with an augmented field side and a canceled field side of the array. The transmitter assembly generates an induction signal from outside the outer wall and substantially prevents the signal from entering the outer wall when the transmitter assembly is carrying an electrical current. | 2008-10-30 |
20080265895 | MULTI-COMPONENT MARINE ELECTROMAGNETIC SIGNAL ACQUISITION CABLE AND SYSTEM - A marine electromagnetic sensor cable includes a plurality of sensor modules disposed at spaced apart locations along a cable. Each module includes at least one pair of electrodes associated with the module. The electrodes are arranged to measure electric field in a direction along the direction of the cable. The cable is arranged to form a closed pattern. Another marine electromagnetic sensor cable includes a plurality of sensor modules disposed at spaced apart locations along a cable. Each module includes at least one pair of electrodes associated therewith. The electrodes are arranged to measure electric field in a direction along the direction of the cable. A plurality of spaced apart magnetic field sensors is associated with each module and arranged to enable determining an electric field amplitude in a direction transverse to the direction of the cable from magnetic field gradient. | 2008-10-30 |
20080265896 | MULTI-COMPONENT MARINE ELECTROMAGNETIC SIGNAL ACQUISITION METHOD - A method for measuring magnetotelluric response of the Earth includes measuring transient controlled source electromagnetic response of the subsurface below a body of water over a plurality of actuations of an electromagnetic transmitter. The transient response measurements are stacked. The stacked transient responses are subtracted from measurements of total electromagnetic Earth response over a time period including the plurality of transient response measurements to generate the magnetotelluric response. A method for determining a component of electric field response to a time varying electromagnetic field induced in the Earth's subsurface, includes measuring magnetic field gradient in at least two orthogonal directions in response to the induced electromagnetic field and determining an electric field response in a direction normal to the magnetic field gradient measurements. | 2008-10-30 |
20080265897 | Method of Detecting Soil Structure Using Voltage Slope and Measuring Earth Resistance - Provided is a method of accurately measuring earth resistance even when the composition state of soil that affects the installation of a metering device for measuring earth resistance is unknown. The method comprises measuring a potential at a first potential electrode point, measuring a potential at a second potential electrode point, calculating a voltage slope corresponding to a change rate of potential difference, using a potential difference between the first and second potential electrode points, and setting a potential point according to voltage slope characteristics and measuring earth resistance. A measurement approximating an accurate value of earth resistance can be performed even when soil composition characteristics are unknown at a site. | 2008-10-30 |
20080265898 | DETERMINING ELECTRICAL CHARACTERISTICS OF AN ELECTRICAL CABLE - To characterize an electrical cable that is deployed in a well, a voltage input is applied to the electrical cable at an earth surface location, where the well extends from the earth surface location. A current response resulting from the voltage input is measured at the earth surface location. At least one parameter of the electrical cable is computed according to the measured current response. | 2008-10-30 |
20080265899 | Method and System for Visual Circuit Verification - A visual indicator system comprises a fuel injector pulse width signal generator in communication with an engine fuel injector by means of a circuit wire. A visual indicator is in circuit communication with the circuit wire and configured to light up in a first stage to indicate a good electrical connection of the fuel injector to the fuel injector pulse width signal generator to the engine fuel injector when the fuel injector signal generator, the engine fuel injector and the circuit wire are energized by a vehicle ignition system. The visual indicator is further configured to light up a second stage to indicate a good pulse width signal generator operation when an automobile engine is running through operation of the fuel injector signal generator, the engine fuel injector and the circuit wire. | 2008-10-30 |
20080265900 | Method and Apparatus for Monitoring the Operation of a Gas Discharge Lamp - For monitoring the operation of a gas discharge lamp operated with an AC voltage, a lamp voltage signal is generated which is dependent on the voltage dropped across the gas discharge lamp during operation. Said lamp voltage signal is filtered with an attenuation that is different for a DC component and for a component having the frequency of the AC voltage, whereupon a positive and negative peak value of the filtered lamp voltage signal are determined. For monitoring the gas discharge lamp, an average value of the two peak values is determined and compared with a limit value, and a difference value between the two peak values is determined and compared with a limit value. | 2008-10-30 |
20080265901 | Voltage measuring device - A pair of measuring switches S | 2008-10-30 |
20080265902 | SPECIFIC ABSORPTION RATE MEASUREMENT SYSTEM AND METHOD - A disclosed specific absorption rate measurement system according to an embodiment of the present invention measures a specific absorption rate of electromagnetic waves from a radiating source absorbed in a dielectric medium. The system includes a measurement portion that measures a first electric field vector on an observation surface which is a two-dimensional surface in the dielectric medium; an electric field calculation portion that calculates a second electric field vector in a point excluded from the observation surface in accordance with electric field components of the first electric field vector measured on the observation surface, the electric field components being parallel to the observation surface; and a calculation portion that calculates the specific absorption rate from the calculated second electric field vector. | 2008-10-30 |
20080265903 | Plasma Diagnostic Apparatus And Method - Provided is a plasma diagnostic apparatus includes a probe unit, which is inserted into a plasma or disposed at boundary of a plasma, the apparatus includes: a signal supplying unit having a signal supplying source; a current detecting/voltage converting unit for applying a periodic voltage signal applied from the signal supplying unit to the probe unit, detecting the magnitude of the current flowing through the probe unit, and converting the detected current into a voltage; and a by-frequency measurement unit for computing the magnitude and phase of individual frequency components of the current flowing through the probe unit by receiving the voltage output from the current detecting/voltage converting unit as an input. | 2008-10-30 |
20080265904 | Trailer check - An apparatus for checking lights on a tow trailer prior to connecting to a tow vehicle. The apparatus comprises a substantially hollow portable housing member. The portable member includes a turn signal switch for checking the status of such turn signals on such trailer, a brake light switch for checking the status of such brake lights, a tail light switch member for checking the status of tail lights on such trailer and a switch member for turning the portable housing member on and off. There is a power source for providing power to housing member disposed in the portable housing member. A communication means and is engageable with each of the power source, the turn signal switch, the brake light switch, the tail light switch and the switch means for providing electrical communication therein. A connection means is engageable with the communication means and is disposed on the housing member for connecting the housing member to a universal wiring harness of such trailer. | 2008-10-30 |
20080265905 | SYSTEM AND METHOD FOR DETECTION OF ENVIRONMENTALLY-INDUCED DAMAGE OF CONDUCTIVE ELEMENTS IN A CIRCUIT BOARD - A system and method for detection of environmentally-induced damage of conductive elements in a circuit board are disclosed. A system may include a test module and a detection module operably connected to the test module. The test module may comprise at least one conductive element. The detection module may be operable to detect a change in at least one electrical property associated with the at least one of conductive element, wherein the change occurs at least in part as a result of environmentally-induced damage to the at least one conductive element. | 2008-10-30 |
20080265906 | Ic Testing Methods and Apparatus - A method and apparatus for testing an integrated circuit core or circuitry external to an integrated circuit core using a testing circuit passes a test vector from a parallel input of the testing circuit along a shift register circuit. The shift register circuit is configured to bypass one or more cores not being tested and to provide the test vector to a core scan chain of the core being tested. The bypassed cores are configured such that the associated shift register circuit portion is driven to a hold mode in which storage elements of the shift register circuit portion have their outputs coupled to their inputs. This method provides holding of the shift register stages when a core is bypassed and in a test mode, and this means the shift register stages are less prone to errors resulting from changes in clock signals applied to the shift register stages. | 2008-10-30 |
20080265907 | Fuse Sensing Method and Apparatus - Fuse sensing is performed in an integrated circuit by selecting a reference voltage based on a temperature measurement acquired by the integrated circuit. A state of one or more fuses included in the integrated circuit is sensed based on the reference voltage during normal operation of the integrated circuit. The state of the one or more fuses may be sensed during testing of the integrated circuit based on a different reference voltage. | 2008-10-30 |
20080265908 | SHIELDING APPARATUS - A shielding apparatus for electromagnetic testing includes a platform, a lid forming a cavity, a driving unit, and an elastic gasket attached to a bottom of the lid around a rim adjacent the cavity. The platform is for placing an electronic device to be tested. The lid is for covering the platform to define a closed space. The driving unit is for lifting and lowering the lid. The gasket is for being compressed and filling gaps between the lid and the platform when the platform covers the lid. | 2008-10-30 |
20080265909 | Autosensitive Detector and Measurement System - This disclosure relates to an autosensitive detector and an autosensitive measurement system with a self-adjustable set-off value, and more specifically, to a probe for adaptation to an environmental parameter such as liquids adapted to reset its measured sensitivity each time the probe is enabled or turned on, which can be further desensitized by adjusting a sensitivity correction factor by a factor (F) within the range of 0.052008-10-30 | |
20080265910 | Line impedance measurement method and system - A technique is disclosed for determining capacitive, inductive, and resistive components of power line impedance. A measurement circuit switches a burden resistor between power line conductors to cause a droop in a voltage waveform. The voltage waveform is sampled prior to inclusion of the resistor in the circuit, as well as after to identify the droop. The short circuit between the power lines is then removed by opening the circuit and a first effective capacitance in the test circuitry causes a resonant ring due to the inductive component of the power line impedance. The process is repeated a second time with a second effective load capacitance enabled in the test circuitry to cause a second resonant ring. Based upon the frequency of the rings and the voltage measurements, the capacitive, inductive, and resistive components of power line impedance can be computed. | 2008-10-30 |
20080265911 | Power Sensing Module with Built-In Mismatch and Correction - A module determines the mismatch corrected power output of a generator. Loads within the module provide at least three different load values. At least one power sensor detects at least a portion of the power output by the generator for each of the load values. Input electrical paths transmit power from the generator to the loads. At least one output electrical path transmits signals from the at least one power sensor indicative of power received when the generator is electrically connected to the different load values. | 2008-10-30 |
20080265912 | Portable line impedance measurement method and system - A technique is disclosed for determining capacitive, inductive, and resistive components of power line impedance via a portable line impedance measurement system. The measurement system includes a circuit that switches a burden resistor between power line conductors to cause a droop in a voltage waveform. The voltage waveform is sampled prior to inclusion of the resistor in the circuit, as well as after to identify the droop. The short circuit between the power lines is then removed by opening the circuit and a first effective capacitance in the test circuitry causes a resonant ring due to the inductive component of the power line impedance. The process is repeated a second time with a second effective load capacitance enabled in the test circuitry to cause a second resonant ring. Based upon the frequency of the rings and the voltage measurements, the individual impedance components of power line impedance can be computed. | 2008-10-30 |
20080265913 | Sealed Capacitive Rain Sensor - A capacitive rain sensor for activating automotive window wipers includes: capacitive plates, electronic circuitry for sensing the capacitance between said plates, processing the sensed capacitance signal, and generating wipe commands. The capacitive plates are protected from water adsorption and condensation by means of a hermetic enclosure. The interconnection between the inside and outside of the enclosure is optionally implemented by means of conductors printed on the window. Wiper-induced and other parasitic signals are rejected by means of an adaptive filter Optional radiation sensor is utilized to suppress solar induced fast temperature variations. An optional far-field cancellation plate is utilized to minimize false wipes due to nearby objects. | 2008-10-30 |
20080265914 | Proximity detector and proximity detecting method - A differential electrode is charged and discharged in the opposite phases. By obtaining the sum of stray capacitances of the differential electrode from charge/discharge characteristics, the approach or the position of an object is detected based on the stray capacitances from which noise is cancelled. | 2008-10-30 |
20080265915 | METHOD OF DETECTING A NETWORK CABLING CHANGE - A system and method of detecting a network cabling change comprises measuring cable parameters of a cable to create a baseline signature of the cable and storing the baseline signature in a memory. The system and method is operable to detect a cable change based upon a comparison of the stored baseline signature and a subsequent cable measurement. A network device operable to perform the above method comprises a physical layer device that transmits signals into a coupled cable and receives return signals from the cable, a cable diagnostic module that measures cable parameters, a memory operable to store a baseline cable signature, and a controlling system that compares subsequently measured cable parameters to the baseline cable signatures to detect a cable change. | 2008-10-30 |
20080265916 | METHOD OF PERFORMING SIGNAL-MEASURED CALIBRATION - This present invention discloses a method for performing an accurate calibration of signal measurement by a light-driving system including an automatic power control (APC) circuit which is pre-calibrated for a signal measurement process. By enlarging at least one measured pad of the APC circuit, multiple grounding paths are established via a plurality of probes of a test instrument. An impedance effect predicted on the contact between the probes and the pad is diminished greatly. A voltage value on the pad can be accurately measured. Thus, a reference voltage value input to a first input of a comparator of the APC circuit can be determined on a basis of a specific condition when a ramping voltage value input to a second input of the comparator is substantially equal to a sum of a predetermined reference voltage value and the voltage value of the pad. | 2008-10-30 |
20080265917 | Return loss bridge circuit - A return loss bridge circuit for testing a balanced test impedance includes an input connector and a reflection connector. The input connector and the reflection connector are electrically connected to an output of a network analyzer and an input of the network analyzer, respectively. The return loss bridge circuit further includes a reference impedance connected between the input and reflection connectors, first and second transformers and a common mode choke. The common mode choke is electrically connectable to the balanced test impedance. | 2008-10-30 |
20080265918 | Object-clamping lid subassembly of a test socket for testing electrical characteristics of an object - The test-socket lid subassembly of the invention consists of a lid for locking the object in the socket unit and a pusher with a handle for clamping the object in the locked position. The pusher is separated from the lid and is inserted into the lid for pressing on the object to fix the latter in the socket only after the lid is locked in place. The pusher is made in the form of a threaded ring, which has an outer thread for engagement with the inner thread in the central opening of the lid member for movement in the direction perpendicular to the contact surface of the object. This provides uniform distribution of pressure on the test object that is locked in the socket subassembly. | 2008-10-30 |
20080265919 | SCALABLE WIDEBAND PROBES, FIXTURES, AND SOCKETS FOR HIGH SPEED IC TESTING AND INTERCONNECTS - We introduce a new Periodic micro coaxial transmission line (PMTL) that is capable of sustaining a TEM propagation mode up to THz band. The PMTL can be manufactured using the current photolithographic processes. This transmission line can be embedded in microscopic layers that allow many new applications. We use the PMTL to develop a wideband highly scalable connector that is then used in a Probe that can be used for connecting to microscopic scale Integrated Circuits with picoseconds High Speed Digital and near THz Analogue performance in various stages of development from R&D to production testing. These probes, in one embodiment, provide a thin pen-like vertical probe tip that matches the die pad pattern precisely that can be as agile as a high speed plotter pen, connecting on the fly to any die pattern on a wafer. This approach allows the most valuable part of the test, namely the wafer to remain stationary and safe, and the least costly part of the test, namely the probe to take most of the wear and tear. We further use the embedded PMTL to develop a modular, scaleable and fully automated Universal Test Fixture for testing chips in various stages of development mainly for digital IC chips that can be utilized in production lines with pick and place of chips on tape to test every chip before insertion into circuits. One embodiment includes a low profile wideband Signal Launcher and an alligator type RF Clip that can be used at the edge of PCB's directly for validation broads. The Signal Launcher is used to develop a new versatile Flush Top Test Fixtures for individual device testing in various stages of development from die, to packaged, to Module, to Circuit Boards. The PMTL can also provide Confined Field Interconnects (CFI) between various elements on semiconductor wafers to reduce parasitic and radiation losses and practically eliminating cross talk, thus, increasing the speed of digital IC's. The PMTL is also used to develop a Universal Test Socket, and a Hand Probe with performance up to 220 GHz. | 2008-10-30 |
20080265920 | PROBE CARD - Disclosed is a probe card providing an upper structure formed to be separatable from a lower structure and a lower structure including a lower substrate electrically connected with a plurality of the needles and a plurality of the lower terminals independently connected with the needles formed above the lower substrate. In particular, the lower structure of the probe card includes a needle fixing structure, a plurality of the needles fixed on the needle fixing structure, a lower substrate provided on the needle fixing structure while electrically connecting with the needles, and a plurality of the lower terminals formed on the upper surface of the lower substrate in order to be independently connected with the each needle. Meanwhile, the upper structure separatable from the lower structure includes a main substrate and a plurality of the upper terminals formed on the lower surface corresponding to the lower terminals. | 2008-10-30 |
20080265921 | PROBE CARD - A probe card includes a base wiring layer, a rewiring layer, and a contactor. The base wiring layer has a non-contactor area and a contactor area that projects to a higher level than the non-contactor area. The rewiring layer is formed on a surface of the base wiring layer so that the contactor area is higher than the non-contactor area. The contactor is provided on a surface of the rewiring layer in a contactor area thereof. | 2008-10-30 |
20080265922 | WAFER LEVEL INTERPOSER - Double-sided interposer assemblies and methods for forming and using them. In one example of the invention, an interposer comprises a substrate having a first surface and a second surface opposite of said first surface, a first plurality of contact elements disposed on said first side of said substrate, and a second plurality of contact elements disposed on said second surface of said substrate, wherein said interposer connects electronic devices via said first and said second plurality of contact elements. | 2008-10-30 |
20080265923 | Leadframe Configuration to Enable Strip Testing of SOT-23 Packages and the Like - A reduced width tie bar and a common lead hold a die paddle of each integrated circuit SOT-23 package to a leadframe within a strip of leadframes after isolating signal leads from the leadframe. Strip testing of most devices in the SOT-23 lead packages may then be performed. The common lead may be at the center of an edge of the SOT-23 package. Also the common lead may be any one of the leads of the SOT-23 package. The reduced width tie bar may be downstream of the epoxy encapsulation flow for better package integrity. | 2008-10-30 |
20080265924 | Contactor nest for an IC device and method - An improved contactor nest for receiving and holding IC devices against a pin board interposer during the test or burn-in of the devices includes a frame having an IC pocket with a top opening, which is oversized in relation to the footprint of the IC device for which the contactor is designed, and centering guide walls for guiding an IC device to be tested into the pocket from the oversized top opening to the IC device seating plane. The centering guide walls have a gradual angle relative to the insertion axis of the IC pocket, and extend down to a bottom perimeter portion of the IC pocket immediately adjacent the IC seating plane for gradually centering the IC device in the pocket as the IC device approaches the seating plane. Preferably, the angled guide walls extend far enough into the IC pocket to allow the spring pins of the pin board interposer to scrub the contact pads of the IC devices as the IC device is being centered. | 2008-10-30 |
20080265925 | Double sided probing structures - A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test. | 2008-10-30 |
20080265926 | TEST HEAD - Disclosed is a test head comprising: a supporting member configured on an end face of a test head housing on a side of connection with a device under test; a pin electronics circuit disposed in the test head housing, the pin electronics circuit outputting a test signal; flexible wiring including one end connected to the pin electronics circuit and another end provided to elongate onto the supporting member on an outside of the test head housing; and a connection section with a side of the device under test, the connection section annexed on the other end of the flexible wiring, wherein a load loaded at a time of connection of the device under test to the connection section is supported by the supporting member. | 2008-10-30 |
20080265927 | TESTER ON A PROBE CARD - A probe card assembly used to test electronic devices in an automated test equipment system. The probe card assembly includes a substrate having a plurality of through-holes contained therein and a plurality of electrical contact elements. Each of the plurality of electrical contact elements has characteristics of both a torsional beam and a cantilever beam design and is configured to scrub a test pad associated with the electronic device in two directions concurrently. The plurality of electrical contacts is configured to be magnetically aligned to the substrate. Each of the plurality of electrical contact elements is further configured to be removably adhered to the substrate thus allowing easy field replacement of individual electrical contact elements. | 2008-10-30 |
20080265928 | Semiconductor device and test method therefor - A semiconductor device, in which a test element group (TEG) including check patterns is formed together with a chip on a wafer so as to measure electric characteristics thereof, includes an interface circuit for selecting the check pattern from the test element group, a protection resistor connected in series with the test element group so as to protect the test element group, and a dummy element connected in series with the test element group. It allows the TEG test, which can be performed after packaging, to be easily performed at a high precision irrespective of dispersions of parasitic resistances and protection resistors. The test result is corrected based on the calculated values of the parasitic resistance and protection resistor and is then stored in a specific table form, wherein a pass/fail decision is made as to whether or not the test result falls within the prescribed range. | 2008-10-30 |
20080265929 | Process Monitor for Monitoring and Compensating Circuit Performance - A method and system for monitoring and compensating the performance of an operational circuit is provided. The system includes one or more integrated circuit chips and a controller. Each integrated circuit chip includes one or more operational circuits, each operational circuit having at least one controllable circuit parameter. Each integrated circuit chip also includes a process monitor module at least partially constructed thereon. The controller is coupled to each process monitor module and to each operational circuit. The controller includes logic for evaluating the performance of an operational circuit based on data obtained from process monitor module and operational circuit related data stored in a memory. Based on the evaluation, the controller determines whether any deviations from desired or optimal performance of the circuit exist. If deviations exist, the controller generates a control signal to initiate adjustments to the operational circuit to compensate for the deviations. | 2008-10-30 |
20080265930 | Semiconductor device including analog voltage output driver LSI chip having test circuit - An LSI chip includes a plurality of output terminals and a test circuit. The test circuit includes a single test signal input terminal, a single test signal output terminal, a shift register, and a plurality of switches. The shift register includes an input terminal, which is connected to the test signal input terminal, output bits of the shift register being equal to a number of the output terminals of the LSI chip, and a voltage level of one of the output bits of the shift register being different from these of other output bits of the shift register in response to a clock pulse. Each switch includes an input terminal, an output terminal and a control terminal. A number of the switches is equal to the number of the output terminals of the LSI chip, each input terminal of the switches is connected to one of the output terminals of the LSI chip, the output terminals of the switches is commonly connected to the test signal output terminal, and each control terminal of each switch is connected to one of the output bits of the shift register. | 2008-10-30 |
20080265931 | On-chip electromigration monitoring - A method is provided for monitoring interconnect resistance within a semiconductor chip assembly. A semiconductor chip assembly can include a semiconductor chip having contacts exposed at a surface of the semiconductor chip and a substrate having exposed terminals in conductive communication with the contacts. A plurality of monitored elements of the semiconductor chip can include conductive interconnects, each interconnecting a respective pair of nodes of the semiconductor chip through wiring within the semiconductor chip. In an example of such method, a voltage drop across each monitored element is compared with a reference voltage drop across a respective reference element on the semiconductor chip at a plurality of different times during a lifetime of the semiconductor chip assembly. In that way, it can be detected when a resistance of such monitored element is over threshold. Based on a result of such comparison, a decision can be made whether to indicate an action condition. | 2008-10-30 |
20080265932 | SEMICONDUCTOR TEST APPARATUS - A semiconductor test apparatus including a test apparatus body generating a test pattern supplied to a semiconductor device; a test head directly contacting the semiconductor device and supplying to the semiconductor device the generated test pattern; a cable passing the test pattern from the test apparatus body to the test head; a holding platform holding the test head in a movable manner; and a movable support section holding the cable, moving in a direction to release tension on a side closer to the test head than the test apparatus body in a case where tension arises in the cable because the test head moves on the holding platform, and moving in a direction to pull the cable on a side closer to the test head than the test apparatus body in a case where slack arises in the cable because the test head moves on the holding platform is provided. | 2008-10-30 |
20080265933 | Semiconductor Device Testing Apparatus and Power Supply Unit - The semiconductor device testing apparatus according to the present invention has a testing LSI; a power supply unit; and an intermediate substrate provided so that there is a connection between the testing LSI, and the power supply unit and tester. The testing LSI has a testing circuit and a waveform shaping circuit; a dielectric material layer disposed so as to face a tested semiconductor device; an electrode disposed in a position that corresponds to a position of an external terminal electrode of the tested semiconductor device on a surface of the dielectric material layer facing the tested semiconductor device; and a first penetrating electrode that passes completely through the dielectric material layer, is connected to the electrode, and is used for exchanging signals with the exterior. The power supply unit has mutually independent elastic probe pins that are disposed in positions that correspond to power electrodes of the tested semiconductor device, and that are provided with a metal protrusion at the distal ends thereof; a substrate that is electrically connected to the probe pins and on which a first wiring layer is formed; and a second penetrating electrode that passes through the substrate. | 2008-10-30 |
20080265934 | Semiconductor integrated circuit and method of testing same - A semiconductor integrated circuit includes S PLLs (S is an integer satisfying S≧2), and the (k−1)th PLL 12 | 2008-10-30 |
20080265935 | INTEGRATED MULTI-FUNCTION ANALOG CIRCUIT INCLUDING VOLTAGE, CURRENT, AND TEMPERATURE MONITOR AND GATE-DRIVER CIRCUIT BLOCKS - An integrated multi-function analog circuit includes at least one MOSFET gate-drive circuit coupled to a first I/O pad. At least one voltage-sensing circuit is coupled to a second I/O pad. At least one current-sensing circuit is coupled to the second I/O pad and a third I/O pad. At least one temperature-sensing circuit is coupled to a fourth I/O pad. | 2008-10-30 |
20080265936 | Integrated circuit switching device, structure and method of manufacture - An integrated circuit device can include a plurality of field effect transistors (FETs) having channel depths no greater than a first depth, and at least a first switch junction FET (JFET) having a source coupled to a signal transmission input node, a drain coupled to a signal transmission output node, and a gate. The first switch JFET has a channel depth greater than the first depth. Switch JFETs can enable low resistance configurable switch paths to be created for interconnecting different portions of a same integrated circuit device. | 2008-10-30 |
20080265937 | LEVEL-RESTORING BUFFERS FOR PROGRAMMABLE INTERCONNECT CIRCUITS AND METHOD FOR BUILDING THE SAME - A technique that unfolds the nMOS-tree multiplexer to improve the propagation delay and/or active power consumption is provided. The main idea is to replicate the nMOS element of the downstream buffer, where each replica is driven by a signal that originates from earlier stages of the nMOS-tree multiplexer. This way, when passing high logic values, signals from earlier stages directly drive the downstream buffer improving the delay or the slope of the transition edge (with beneficial effects for power consumption). The passing of low logic values is still performed in the original way by the nMOS tree and the pMOS element of the downstream buffer. | 2008-10-30 |
20080265938 | Architecture and interconnect scheme for programmable logic circuits - An architecture of hierarchical interconnect scheme for field programmable gate arrays (FPGAs). A first layer of routing network lines is used to provide connections amongst sets of block connectors where block connectors are used to provide connectability between logical cells and accessibility to the hierarchical routing network. A second layer of routing network lines provides connectability between different first layers of routing network lines. Additional layers of routing network lines are implemented to provide connectability between different prior layers of routing network lines. An additional routing layer is added when the number of cells is increased as the prior cell count in the array increases while the length of the routing lines and the number of routing lines also increases. Switching networks are used to provide connectability among same and different layers of routing network lines, each switching network composed primarily of program controlled passgates and, when needed, drivers. | 2008-10-30 |
20080265939 | INTERFACE CIRCUIT AND ELECTRONIC DEVICE - An interface circuit and an electronic device are used for expanding an output port of a micro processing unit. The interface circuit includes an input port electrically connected to the output port of the micro processing unit for receiving a control signals, and a plurality of output ports selectively driven to control external circuits by inputting different values of the control signal at the input port. | 2008-10-30 |
20080265940 | INTERFACE CIRCUIT - An interface circuit according to one aspect of the present invention may includes a receiving circuit operating on a supply voltage lower than a high-level voltage value of an input binary signal, an input level determination circuit generating an input level determination signal having a frequency higher than a frequency of the binary signal and controls whether to output the input level determination signal or not, based on a voltage level of the binary signal, and an AC coupling element connected between an output terminal of the input level determination circuit and an input terminal of the receiving circuit. | 2008-10-30 |