Patent application number | Description | Published |
20090062935 | Automatic Generation Of PID Parameters For An Atomic Force Microscope - Linear PID controllers have a transfer function that resembles the frequency response of a notch filter. The PID parameters, K | 03-05-2009 |
20100128342 | Coherent Demodulation with Reduced Latency Adapted for use in Scanning Probe Microscopes - A signal demodulator and the method of using the same in a scanning probe microscope or the like to provide a feedback path with reduced latency are disclosed. The demodulator includes an input port, a first mixer and a first integrator. The input port receives an input signal having a frequency component at a signal frequency. The input signal is characterized by a signal amplitude at that frequency. The first mixer mixes the input signal with a first local oscillator signal at the signal frequency to generate a first mixed signal. The first integrator integrates the first mixed signal for an integer number of periods of the signal frequency to provide a first output signal. | 05-27-2010 |
20100182893 | RE-WRITABLE OPTICAL DISK HAVING REFERENCE CLOCK INFORMATION PERMANENTLY FORMED ON THE DISK - An optical disk structure and optical disk recorder which enables data to be re-written onto the recording layer of the optical disk. A clock reference structure is permanently formed along servo tracks of the optical disk. An optical transducer is coupled to the clock reference structure and generates a clock reference signal simultaneously with writing new data onto the recording layer of the optical disk. The data is written as data marks along the servo tracks. Each of the data marks includes edges. The edges of the data marks are recorded in synchronization with a write clock. The write clock is phase-locked with the clock reference signal. Therefore, the edges of the data marks are aligned with the clock reference structure with sub-bit accuracy. Standard DVD-ROM disk readers are not able to detect the high spatial frequency of the clock reference structure. Therefore, the optical disk structure and optical disk recorder of this invention allow production of re-writable optical disks which can be read by standard DVD-ROM disk readers. | 07-22-2010 |
20130110262 | AUTOMATIC TUNING OF ATOMIC FORCE MICROSCOPE | 05-02-2013 |
20140040339 | Cascaded Digital Filters with Reduced Latency - A filter and method for filtering a signal are disclosed. The filter is equivalent to a plurality of bi-quad filters connected in series, and is implemented on a digital processor that receives a sequence of signal values at a sampling rate characterized by a sampling interval and generates a filtered signal value upon receiving each received signal value. The filter has a latency that is less than the sampling interval. The filtered values can be generated by adding a term to a received signal value and multiplying the sum by a gain constant that depends on the filter constants. The added term does not depend on the current received signal value. The filter can be implemented in fixed-point integer arithmetic. | 02-06-2014 |
Patent application number | Description | Published |
20090107222 | Scanning Probe Microscope with Improved Scanning Speed - A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electro-mechanical actuator, and a controller. The probe has a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The electro-mechanical actuator moves the sample relative to the probe tip in three dimensions. The controller maintains the probe tip in a fixed relationship with respect to the sample in one of the dimensions, and causes the electro-mechanical actuator to move the sample relative to the probe tip in the other two of the dimensions along a smooth path to generate an image of an object in the sample in an area sampled along the smooth path. | 04-30-2009 |
20090112957 | System and methods for data sample decimation and display of scanning probe microscope images - Methods, systems and components for producing a scanning probe microscope (SPM) image. One method embodiment includes receiving sample data from a scanning probe microscope wherein said sample data comprises data sample many times per pixel of the SPM image to be displayed; selecting at least one decimation scheme from a plurality of different decimation schemes, for decimating the sample data to provide a single data value per pixel; and decimating the sample data, using the at least one selected decimation scheme. A method of decimating sample data scanned along scan lines from a surface of an object to be imaged includes at least temporarily storing multiple adjacent scan lines of the sample data prior to decimating at least a portion of the sample data; correlating adjacent samples of the sample data; and selecting a decimation scheme different from a decimation scheme previously selected to be applied to sample data within a pixel pertaining to an image to be formed from the sample data, when correlating provides results in which a value from one line of comparison is different from a value from another line of comparison by at least a predetermined value, but otherwise maintaining the previously selected decimation scheme for decimating the sample data pertaining to that pixel. | 04-30-2009 |
20090122439 | Mitigating the effects of disturbances of a disk drive - Embodiments of mitigating the effects of disturbances of a disk drive are disclosed. One method includes sensing a position error signal of a transducer coupled to a surface of the disk drive, wherein the position error signal aids in control of an actuator of the disk drive. A first disturbance signal is generated by sensing a disturbance of a first sensor attached to the disk drive, wherein the first disturbance signal aids in control of the actuator. A second disturbance signal is generated by sensing a disturbance of a second sensor attached to the disk drive, wherein the second disturbance signal aids in control of the actuator. Effects of the disturbances on the position error signal are reduced by adaptively adjusting a gain of the first disturbance signal and a gain of the second disturbance signal. | 05-14-2009 |