Patent application number | Description | Published |
20080240204 | METHOD AND SYSTEM FOR CHANNEL ESTIMATION - The present invention is directed to a system and method for channel estimation for a communication channel such as, for example, that found in a wireless communication network. One or more synchronization and channel estimate symbols can be combined to compute a refined channel estimate. | 10-02-2008 |
20080240261 | METHOD AND SYSTEM FOR CHANNEL ESTIMATION IN BURST MODE - The present invention is directed to a system and method for channel estimation for a communication channel such as, for example, that found in a wireless communication network. One or more channel estimates or channel observables can be combined to compute a refined channel estimate, for example, when the channel estimates or channel observables are from the same channel. | 10-02-2008 |
20080247480 | METHODS AND SYSTEMS FOR DETECTING A NARROW-BAND INTERFERER - Various embodiments of the systems and methods described herein may be used to compute a minimum variance unbiased estimator by receiving a first OFDM signal at a pilot tone, receiving a second OFDM signal sent in the same frequency band and determining a differential phase metric between the first OFDM signal and the second OFDM signal. In some embodiments, the differential phase metric may be used to diversity combine synchronization statistics. In various embodiments, the differential phase metric may be used to detect a narrow-band interference. | 10-09-2008 |
20080247481 | METHODS AND SYSTEMS FOR COMPUTING A MINIMUM VARIANCE UNBIASED ESTIMATOR OF CARRIER AND SAMPLING CLOCK FREQUENCY - Various embodiments of the systems and methods described herein may be used to compute a minimum variance unbiased estimator by receiving a first OFDM signal at a pilot tone, receiving a second OFDM signal sent in the same frequency band and determining a differential phase metric between the first OFDM signal and the second OFDM signal. In some embodiments, the differential phase metric may be used to diversity combine synchronization statistics. In various embodiments, the differential phase metric may be used to detect a narrow-band interference. | 10-09-2008 |
20090067532 | METHODS AND SYSTEMS FOR DIVERSITY COMBINING OF SYNCHRONIZATION STATISTICS IN OFDM SYSTEMS - Various embodiments of the systems and methods described herein may be used to compute a minimum variance unbiased estimator by receiving a first OFDM signal at a pilot tone, receiving a second OFDM signal sent in the same frequency band and determining a differential phase metric between the first OFDM signal and the second OFDM signal. In some embodiments, the differential phase metric may be used to diversity combine synchronization statistics. In various embodiments, the differential phase metric may be used to detect a narrow-band interference. | 03-12-2009 |
20120307839 | METHOD FOR RECEIVING CHANNEL SELECTION INFORMATION - A master device selects a channel from a band of channels for communications with a slave device. The master transmits information identifying the selected to the slave device using a packet modulated as a series of energy pulses on the selected channel. The slave device performs wideband energy detection on the band of channels and receives the modulated pulses. The slave device decodes the modulated pulses to retrieve the selected channel, and tunes to the selected channel for further communications. | 12-06-2012 |
20140019828 | LOW-POWER TRANSMISSION SYSTEM - An efficient method and transceiver architecture combines elements to enable and facilitate the low power operation of a communications device; the combination of design elements, features, and functionalities are efficiently distributed among RF, APE, and baseband modules in order to exploit opportunities that can serve the goal of low or ultra low power consumption. | 01-16-2014 |
Patent application number | Description | Published |
20080246958 | Multiple surface inspection system and method - A system for inspecting components is provided. The system includes a prism having a first end, a second end, a first reflecting surface, and a second reflecting surface. The first end of the prism is located in a plane that is parallel to and axially separated from a plane of one or more of a plurality of inspection pieces. An image data system is disposed beyond the second end of the prism and generates image data of one or more of the inspection piece that includes a top surface of at least one of the inspection pieces and at least one side of at least one of the inspection pieces. An inspection piece transportation system, such as a pick and place tool or conveyor, moves a plurality of inspection pieces past the first end of the prism through an inspection area. | 10-09-2008 |
20090034831 | Patterned wafer defect inspection system and method - A system for inspecting semiconductor devices is provided. The system includes a region system selecting a plurality of regions from a semiconductor wafer. A golden template system generates a region golden template for each region, such as to allow a die image to be compared to golden templates from a plurality of regions. A group golden template system generates a plurality of group golden templates from the region golden templates, such as to allow the die image to be compared to golden templates from a plurality of group golden templates. | 02-05-2009 |
20090073426 | Multiple Surface Inspection System and Method - A system for on-the-fly inspection of components is provided. The system includes a prism structure disposed below an inspection item transit path. An image data system is disposed below the prism structure. A lighting assembly provides a first lighting source to illuminate a plurality of sides of an inspection item and a second lighting source to illuminate a bottom of the inspection item. | 03-19-2009 |
20100188486 | System and method for inspecting a wafer - An inspection system for inspecting a semiconductor wafer. The inspection system comprises an illumination setup for supplying broadband illumination. The broadband illumination can be of different contrasts, for example brightfield and darkfield broadband illumination. The inspection system further comprises a first image capture device and a second image capture device, each configured for receiving broadband illumination to capture images of the semiconductor wafer while the semiconductor wafer is in motion. The system comprises a number of tube lenses for enabling collimation of the broadband illumination. The system also comprises a stabilizing mechanism and an objective lens assembly. The system further comprises a thin line illumination emitter and a third image capture device for receiving thin line illumination to thereby capture three-dimensional images of the semiconductor wafer. The system comprises a reflector assembly for enabling the third image capture device to receive illumination reflected from the semiconductor wafer in multiple directions. | 07-29-2010 |
20100188499 | System and method for inspecting a wafer - A method and a system for inspecting a wafer. The system comprises an optical inspection head, a wafer table, a wafer stack, a XY table and vibration isolators. The optical inspection head comprises a number of illuminators, image capture devices, objective lens and other optical components. The system and method enables capture of brightfield images, darkfield images, 3D profile images and review images. Captured images are converted into image signals and transmitted to a programmable controller for processing. Inspection is performed while the wafer is in motion. Captured images are compared with reference images for detecting defects on the wafer. An exemplary reference creation process for creating reference images and an exemplary image inspection process is also provided by the present invention. The reference image creation process is an automated process. | 07-29-2010 |
20100189339 | System and method for inspecting a wafer - A method for inspecting a wafer. The method comprises a training process for creating reference images. The training process comprises capturing a number of images of a first wafer of unknown quality, each of the number of images of the first wafer being captured at a predetermined contrast illumination and each of the number of images of the first wafer comprising a plurality of pixels. The training process also comprises determining a plurality of reference intensities for each of the plurality of pixels of each of the number of images of the first wafer, calculating a plurality of statistical parameters for the plurality of reference intensities of each of the plurality of pixels of each of the number of images of the first wafer, and selecting a plurality of reference images from the plurality of images of the first wafer based on the calculated plurality of statistical parameters. The method for inspecting the wafer further comprises capturing an image of a second wafer, the second wafer being of an unknown quality, selecting a first reference image from the plurality of reference images, and comparing the captured image of the second wafer with the first reference image to thereby determine at least one of presence and type of defect on the second wafer. | 07-29-2010 |
20120013899 | System and Method for Capturing Illumination Reflected in Multiple Directions - An optical inspection system in accordance with the disclosure can be configured to simultaneously capture illumination reflected in multiple directions from the surface of a substrate, thereby overcoming inaccurate or incomplete characterization of substrate surface aspects as a result of reflected intensity variations that can arise when illumination is captured only from a single direction. Such a system includes a set of illuminators and an image capture device configured to simultaneously capture at least two beams of illumination that are reflected off the surface. The at least two beams of illumination that are simultaneously captured by the image capture device have different angular separations between their reflected paths of travel. The set of illuminators can include a set of thin line illuminators positioned and configured to supply one or more beams of thin line illumination incident to the surface. For instance, two beams of thin line illumination can be directed to the surface at different angles of incidence to a normal axis of the surface. | 01-19-2012 |
20150138341 | APPARATUS AND METHOD FOR SELECTIVELY INSPECTING COMPONENT SIDEWALLS - A component inspection process includes positioning a component (e.g., a semiconductor component or other object) such that component sidewalls are disposed along an optical path corresponding to sidewall beam splitters configured for receiving sidewall illumination provided by a set of sidewall illuminators, and transmitting this sidewall illumination therethrough, toward and to component sidewalls. Sidewall illumination incident upon component sidewalls is reflected from the component sidewalls back toward the sidewall beam splitters, which reflect or redirect this reflected sidewall illumination along an optical path corresponding to an image capture device for sidewall image capture to enable component sidewall inspection. Sidewall illuminators and sidewall beam splitters can form portions of a five sided inspection apparatus that includes a brightfield illuminator, a darkfield illuminator, and an image capture beam splitter such that the five sided inspection apparatus is configurable for inspecting component bottom surfaces and/or component sidewalls in a selective/selectable manner. | 05-21-2015 |
20150233840 | System and method for inspecting a wafer - An inspection system for inspecting a semiconductor wafer. The inspection system comprises an illumination setup for supplying broadband illumination. The broadband illumination can be of different contrasts, for example brightfield and darkfield broadband illumination. The inspection system further comprises a first image capture device and a second image capture device, each configured for receiving broadband illumination to capture images of the semiconductor wafer while the semiconductor wafer is in motion. The system comprises a number of tube lenses for enabling collimation of the broadband illumination. The system also comprises a stabilizing mechanism and an objective lens assembly. The system further comprises a thin line illumination emitter and a third image capture device for receiving thin line illumination to thereby capture three-dimensional images of the semiconductor wafer. The system comprises a reflector assembly for enabling the third image capture device to receive illumination reflected from the semiconductor wafer in multiple directions. | 08-20-2015 |
Patent application number | Description | Published |
20110312857 | Drilling, Drill-In and Completion Fluids Containing Nanoparticles for Use in Oil and Gas Field Applications and Methods Related Thereto - Drilling, drill-in and completion fluids containing nanoparticles for use in hydrocarbon drilling and recovery processes and methods related thereto are provided. The fluids also include a dual acting shield agent that shields the nanoparticles and also acts as a viscosifier. The fluids can be used in various types of hydrocarbon drilling and recovery processes, such as drilling, drill in, completion, and the like. | 12-22-2011 |
20120071369 | Environment Friendly Base Fluid to Replace the Toxic Mineral Oil-Based Base Fluids - Processes for producing alkyl esters useful as base fluids in oil-based mud compositions. The alkyl esters are produced from raw material waste oil that include vegetable oil. The raw material waste oil can be obtained from the food industry, such as from food chains. The raw material waste oil is purified by removing impurities from it. The raw material waste oil is then esterified with an alcohol in the presence of a catalyst. The resulting alkyl ester products are then separated from triglycerides. The alkyl ester products are then washed and dried. | 03-22-2012 |
20120079888 | Method and Apparatus for Quality Control and Quality Assurance of Sized Bridging Materials Used in Drill-In Fluid Formulation - Methods and apparatuses are provided for testing and quantifying structural durability characteristics of bridging materials. Embodiments include sieving bridging materials to create uniform batches having particles within a predefined range. Embodiments further include selecting a batch and drying the batch, separating the dried batch into dry samples, and selecting a test sample having an initial mass. Embodiments include sealing the test sample, a volume of liquid, and a rod in a cylindrical testing cell and rotating the cylindrical testing cell containing the rod such that the rod rolls in relation to an inner wall of the cylindrical testing cell and applies force partially crushing the test sample. Embodiments further include sieving a resulting sample to create a durable sample having particles within the predefined range and drying the durable sample. Embodiments of methods further include measuring a mass of the dried durable sample to define a durable mass and comparing the durable mass to the initial mass. | 04-05-2012 |
20120108471 | Volcanic Ash-Based Drilling Mud to Overcome Drilling Challenges - Drilling mud compositions and related methods are provided as embodiments of the present invention. The drilling mud compositions are water-based and contain volcanic ash. The compositions and methods of the present invention provide improved properties relative to tolerance of high salt content, cement, lime, and temperatures. | 05-03-2012 |
20130065798 | WATER-BASED DRILLING FLUID COMPOSITION HAVING A MULTIFUNCTIONAL MUD ADDITIVE FOR REDUCING FLUID LOSS DURING DRILLING - Embodiments of the invention provide a drilling, drill-in, and completion water-based mud composition containing micro or nanoparticles for use in hydrocarbon drilling. The water-based drilling mud composition includes water present in an amount sufficient to maintain flowability of the water-based drilling mud composition, and drilling mud, which includes particles. The particles are selected from microparticles, nanoparticles, and combinations thereof. The water-based drilling mud composition also includes an effective amount of a multi-functional mud additive, which includes psyllium seed husk powder. The water-based drilling mud composition is operable to keep the particles stabilized and dispersed throughout the drilling mud composition in the absence of a surfactant. | 03-14-2013 |
20130081485 | AUTOMATED METHOD FOR QUALITY CONTROL AND QUALITY ASSURANCE OF SIZED BRIDGING MATERIAL - A method for quality control and quality assurance of sized bridging materials rotates a control sample having a fluid portion and a solids portion of sized bridging materials in a tubular container for a predetermined period of time. The control sample is then analyzed in a laser particle size analyzer to determine a particle size distribution for the control sample. A wet grinding sample having a fluid portion and a solids portion of the sized bridging materials is then rotated in the tubular container with a loose cylinder rod for a predetermined time to simulate borehole conditions. The wet grinding sample is then analyzed in the laser particle size analyzer to determine a particle size distribution for the wet grinding sample. The two particle size distributions are used to define a shift factor that represents the relative strength of the sized bridging materials. | 04-04-2013 |
20130125677 | Classification Scheme of Sized Bridging Materials For Superior Drill-In Fluid Design - A classification scheme for classifying sized bridging materials is disclosed. The scheme identifies a durability metric for the sized bridging materials. The scheme then identifies a value range having a higher relative strength and a lower relative strength. The sized bridging materials may then be tested according to the durability metric and associated with a relative strength based on the durability metric determined during the test. | 05-23-2013 |
20130316936 | VOLCANIC ASH-BASED DRILLING MUD TO OVERCOME DRILLING CHALLENGES - Drilling mud compositions and related methods are provided as embodiments of the present invention. The drilling mud compositions are water-based and contain volcanic ash. The compositions and methods of the present invention provide improved properties relative to tolerance of high salt content, cement, lime, and temperatures. | 11-28-2013 |
20140174168 | METHOD FOR ASSESSING ABLATION MODULAI OF MUDCAKES TO PREDICT EASE OF MUDCAKE REMOVAL OR CLEANING EFFICIENCY OF CLEANING/WASHING/SPACER FLUIDS - Disclosed is a method and apparatus for determining an ablation modulus of a mudcake on a wellbore wall. According to various embodiments of the invention, the method includes preparing a mudcake, forming a mudcake assemblage comprising the prepared mudcake, screen, and a filter paper, and submerging and securing the mudcake assemblage in a container filled with a fluid. The fluid includes one of a native fluid and a foreign fluid to the mudcake. The method further includes agitating the fluid for a plurality of time intervals, removing the mudcake assemblage from the container after expiration of each time interval, and drying the mudcake assemblage. Further, the method includes weighing the mudcake assemblage to determine an interval weight for each time interval, and determining the ablation modulus of the mudcake on the wellbore wall by graphically correlating the determined interval weights of the remaining mudcake in the mudcake assemblage as a function of time. The ablation modulus of the mudcake is defined by a slope of a tangent of an initial portion of the graphical correlation between the determine interval weights and cumulative time. | 06-26-2014 |
20140295559 | METHOD FOR PREDICTION OF INHIBITION DURABILITY INDEX OF SHALE INHIBITORS AND INHIBITIVE DRILLING MUD SYSTEMS - Embodiments of a method used for determination of inhibition durability index (IDI) of an inhibitive mud system can include multiple stages, with each stage including specific steps. The first stage can include a dispersion test that evaluates the inhibition effects of a stability inhibitor after exposing the test material to the inhibitor. The second stage can include a durability inhibition assessment, which includes assessing the longevity of the effect of the inhibitor. A third stage can be used to graph or otherwise evaluate the results of the second stage or the first and second stages. | 10-02-2014 |
20140353043 | Method of Conversion of a Drilling Mud to a Gel-Based Lost Circulation Material to Combat Lost Circulation During Continuous Drilling - A method of conversion of a water-based mud to a gel-based LCM quickly to control lost circulation in a lost circulation zone in a wellbore during continuous drilling with a drilling mud, the drilling mud comprises a volcanic ash, water, a de-foamer, a pH buffer, and a polymer. The method comprises the steps of entering the lost circulation zone, determining a lost circulation volumetric flow rate, metering a first amount of a binder into the drilling mud to create a binder containing mud, pumping the binder containing drilling mud into the wellbore, and suspending metering of the first amount of the binder to the drilling mud after a pre-defined regulating period of time effective to permit the binder containing drilling mud to create a gel-based LCM operable to alter the lost circulation zone. | 12-04-2014 |
20150210912 | METHOD FOR REDUCING FLUID LOSS DURING DRILLING OF A HYDROCARBON FORMATION USING A WATER-BASED DRILLING FLUID COMPOSITION HAVING A MULTIFUNCTIONAL MUD ADDITIVE - Embodiments of the invention provide a drilling, drill-in, and completion water-based mud composition containing micro or nanoparticles for use in hydrocarbon drilling. In accordance with at least one embodiment, there is provided a method of drilling a hydrocarbon formation, including contacting the hydrocarbon formation with a water-based drilling mud composition while drilling or completing a well. In accordance with at least one embodiment, the water-based drilling mud composition includes water, the water being present in an amount greater than about 90 wt % of the water-based drilling mud composition to maintain flowability of the water-based drilling mud composition; drilling mud, the drilling mud comprising particles, wherein the particles are selected from the group consisting of microparticles, nanoparticles, and combinations thereof; and a multi-functional mud additive in an amount of 0.8 wt % of the water-based drilling mud composition, the multi-functional mud additive comprising psyllium husk powder, such that the water-based drilling mud composition is operable to keep the particles stabilized and dispersed throughout the drilling mud composition in the absence of a surfactant. | 07-30-2015 |