Patent application number | Description | Published |
20120274371 | METHOD FOR ENCODER FREQUENCY SHIFT COMPENSATION - The embodiments disclose a method for encoder frequency-shift compensation, including, determining frequency values of an input encoder signal, analyzing an encoder index clock signal and the input encoder signal to determine values of frequency-shifts and compensating for the values of the frequency-shifts to generate a frequency-shift compensated clock. | 11-01-2012 |
20130169315 | METHOD FOR ENCODER FREQUENCY-SHIFT COMPENSATION - A method for encoder frequency-shift compensation includes determining frequency values of an input encoder signal, determining repeatable frequency-shifts of the frequency values and generating a frequency-shift compensated clock using the repeatable frequency-shifts. A frequency-shift compensated clock includes a synthesizer configured to generate a frequency-shift compensated clock signal using repeatable frequency shifts and encoder clock signals. | 07-04-2013 |
20140098217 | APPARATUS FOR IMAGING A UNIFORMLY IRRADIATED ARTICLE - Provided herein is an apparatus, including a reflective surface configured to reflect photons onto a surface of an article, a stage configured to support the article, and an assembly. In some embodiments, the assembly configured to radiate photons through the article to the reflective surface. The assembly is further configured to image the article with irradiance of the photons. | 04-10-2014 |
20140098364 | CLASSIFICATION OF SURFACE FEATURES USING FLUORESENCE - Provided herein is an apparatus, including a photon emitter configured to emit photons onto a surface of an article, a photon detector array configured to receive photons from surface features of the article; and a processing means configured for processing photon-detector-array signals corresponding to photons scattered from the surface features and photons fluoresced from the surface features, wherein the processing means is further configured for classifying the surface features of the article. | 04-10-2014 |
20140098368 | CHEMICAL CHARACTERIZATION OF SURFACE FEATURES - Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array. | 04-10-2014 |
20140098370 | IMAGING A TRANSPARENT ARTICLE - Provided herein is an apparatus, comprising a first photon emitter configured to emit photons into an article from a circumferential edge of the article, and a photon detector array configured to detect photons scattered from features of the article. | 04-10-2014 |
20140104603 | FEATURE DETECTION WITH LIGHT TRANSMITTING MEDIUM - An apparatus for detecting surface features is disclosed. The apparatus may include a plurality of strands configured to contain light and further configured to transmit light from a light source to a surface of an article. The apparatus may also include a detector configured to receive light reflected from the surface of the article via the plurality of strands, wherein the detector is further configured to detect features associated with the article. | 04-17-2014 |
20140104604 | DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES - Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article. | 04-17-2014 |
20140160481 | REFLECTIVE SURFACES FOR SURFACE FEATURES OF AN ARTICLE - Provided herein is an apparatus, including a photon emitter configured for emitting photons onto a surface of an article; a first reflective surface and a second reflective surface configured to reflect the photons onto the surface of the article; and a processing means configured for processing signals from a photon detector array corresponding to photons scattered from surface features of the article. | 06-12-2014 |
20140354980 | ARTICLE EDGE INSPECTION - Provided herein is an apparatus, including a photon emitting means for emitting photons onto surface edges of an article, a photon detecting means for detecting photons scattered from particles on the surface edges of the article, and a mapping means for mapping a particle or a defect of the surface of the article. | 12-04-2014 |
20140354981 | SURFACE FEATURE MANAGER - Provided herein is an apparatus, including a mapping means for generating a map of locations of surface features of an article based on photon-detector signals corresponding to photons scattered from the surface features of the article, and a surface feature manager. The surface manager is configured to locate a predetermined surface feature of the surface features of the article based, at least in part, on the map of the surface features locations, irradiate photons of a first power onto the location of the predetermined surface feature to analyze the predetermined surface feature, and irradiate photons of a second power onto the location of the predetermined surface feature to remove the predetermined surface feature. | 12-04-2014 |
20140354982 | APPARATUSES AND METHODS FOR MAGNETIC FEATURES OF ARTICLES - Provided herein are apparatuses and methods related thereto, wherein at least one apparatus includes: a photon emitting means configured to emit photons, wherein the photons are scattered from magnetic features of an article; a photon detector array configured to receive scattered photons; and a processing means configured to differentiate the magnetic features from the scattered photons. | 12-04-2014 |
20140354984 | SURFACE FEATURES BY AZIMUTHAL ANGLE - Provided herein is an apparatus, including a photon emitting means configured to emit photons onto a surface of an article at a number of azimuthal angles; and a processing means configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article and generate one or more surface features maps for the article from the photon-detector-array signals corresponding to the photons scattered from the surface features of the article. | 12-04-2014 |
20140354994 | PHOTON EMITTER ARRAY - Provided herein is an apparatus, including at least two photon emitters, each with a preselected polarization orientation, and configured to emit polarized photons onto a surface of an article, and a processing means configured to process photon-detector-array signals corresponding to photons scattered from surface features of the article, and generate one or more surface features maps for the article from the photon-detector-array signals corresponding to the photons scattered from the surface features of the article. | 12-04-2014 |