Patent application number | Description | Published |
20090025765 | APPARATUS AND METHOD FOR SENSING OF THREE-DIMENSIONAL ENVIRONMENTAL INFORMATION - An apparatus for providing information about a three-dimensional environment to a user includes; a handle, at least one sensor operatively coupled to the handle, a tactile pad disposed on the handle, a plurality of tactile buttons arrayed on the tactile pad, a plurality of actuators, wherein each actuator is operatively coupled to one of the plurality of tactile buttons to control a height thereof in relation to the tactile pad, and a processor which receives signals from the at least one sensor and controls positioning of the plurality of actuators to represent a physical environment sensed by the at least one sensor. | 01-29-2009 |
20090028003 | APPARATUS AND METHOD FOR SENSING OF THREE-DIMENSIONAL ENVIRONMENTAL INFORMATION - An apparatus for providing information about a three-dimensional environment to a user includes; a handle, at least one sensor operatively coupled to the handle, a tactile pad disposed on the handle, a plurality of tactile buttons arrayed on the tactile pad, a plurality of actuators, wherein each actuator is operatively coupled to one of the plurality of tactile buttons to control a height thereof in relation to the tactile pad, and a processor which receives signals from the at least one sensor and controls positioning of the plurality of actuators to represent a physical environment sensed by the at least one sensor. | 01-29-2009 |
20090118851 | FACTORY LEVEL AND TOOL LEVEL ADVANCED PROCESS CONTROL SYSTEMS INTEGRATION IMPLEMENTATION - Integration of factory level advanced process control (FL-APC) system and tool level advanced process control (TL-APC) system using selectable APC operation modes indicating different operational settings for the FL-APC system and at least one TL-APC system is disclosed. During operation, the FL-APC system controls operation of the TL-APC system. The invention allows a manufacturing execution system (MES) to have additional capability to run the process control functions at FL-APC system and/or TL-APC system, and allows integration of a variety of different tools with a TL-APC system. An implementation method, system and program product are also disclosed. | 05-07-2009 |
20090234485 | METHOD OF PERFORMING MEASUREMENT SAMPLING OF LOTS IN A MANUFACTURING PROCESS - A method of performing measurement sampling in a production process includes passing a lot through a manufacturing process, employing a set of combinational logistics to determine if sampling is indicated and, if sampling is indicated, establishing a sampling decision. The method further requires querying a set of lot sampling rules to evaluate the sampling decision, evaluating a statistical quality of the process if no lot sampling rules exist, and automatically determining whether the lot passing through the production process requires sampling based on the combinational logistics, statistical quality and lot sampling rules. | 09-17-2009 |
20090306803 | METHOD FOR USING REAL-TIME APC INFORMATION FOR AN ENHANCED LOT SAMPLING ENGINE - A method includes passing a lot through a production process and evaluating a statistical quality of the production process. Additionally, the method includes calculating an advanced process control (APC) recipe parameter adjustment (RPA) distribution value and determining if sampling is indicated. Furthermore, the method includes, if sampling is indicated, performing a measurement process of the lot. | 12-10-2009 |
20100007474 | METHOD AND APPARATUS FOR TACTILE HAPTIC DEVICE TO GUIDE USER IN REAL-TIME OBSTACLE AVOIDANCE - An apparatus for providing information about a physical surrounding environment to a user includes; a handle, at least one sensor operatively coupled to the handle, a plurality of dual purpose, bi-directional haptic force feedback devices coupled to the handle, and a processor which receives signals from the at least one sensor and controls force feedback of the plurality of dual purpose, bi-directional haptic force feedback devices to convey information about the physical surrounding environment sensed by the at least one sensor. | 01-14-2010 |
20100177179 | APPARATUS AND METHOD FOR ENHANCING FIELD OF VISION OF THE VISUALLY IMPAIRED - An apparatus and a method for enhancing a field of vision of a user with a visual impairment to help the user to navigate safely in the surroundings. The apparatus includes a body, at least one video device coupled to the body for recording a visual image of a physical environment surrounding the user, at least one monitor coupled to the body, a processor which receives signals from the at least one video device and operatively controls the at least one monitor to display the visual image recorded by the at least one video device, and a tunnel vision finder to determine the user's actual vision size. The method includes the step of determining the user's actual vision size, acquiring a visual image of a physical environment surrounding the user, processing the visual image, and displaying the visual image in the user's actual vision. | 07-15-2010 |
20100204839 | METHOD AND APPARATUS FOR THE MONITORING OF WATER USAGE WITH PATTERN RECOGNITION - A method for monitoring water usage in a home or business through the use of pattern recognition. Wherein the system monitors water flow through a valve and monitors usage over a period of time to determine normal usage. Once a normal pattern of usage is determined the system monitors pattern usage over time and determines if the pattern of usage exceeds cutoffs. In the event the usage exceeds the cutoffs the system produces an alarm and shuts off the valve. Once the cause for the system cutoff has been determined the cause may be corrected and the valve reopened. | 08-12-2010 |
20120203369 | MANUFACTURING EXECUTION SYSTEM (MES) INCLUDING A WAFER SAMPLING ENGINE (WSE) FOR A SEMICONDUCTOR MANUFACTURING PROCESS - A method of sampling semiconductor wafers includes passing a lot of semiconductor wafers into a semiconductor processing tool, processing a first portion of the lot in one process chamber of the semiconductor processing tool and a second portion of the lot in another process chamber of the semiconductor processing tool to produce processed semiconductor wafers, and initiating a wafer sampling engine to select at least one of the processed semiconductor wafers for sampling. The wafer sampling engine computes a long term process capability index for the processing tool and a short term process performance index for at least one of the processing tool and process chamber, identifies at least one desired sampling measurement type, selects the at least one of the processed semiconductor wafers for sampling, and collects the desired measurement types from the at least one of the processed semiconductor wafers selected for sampling. | 08-09-2012 |
20120215490 | METHOD FOR USING REAL-TIME APC INFORMATION FOR AN ENHANCED LOT SAMPLING ENGINE - A method includes passing a lot through a production process and evaluating a statistical quality of the production process. Additionally, the method includes calculating an advanced process control (APC) recipe parameter adjustment (RPA) distribution value and determining if sampling is indicated. Furthermore, the method includes, if sampling is indicated, performing a measurement process of the lot. | 08-23-2012 |