Patent application number | Description | Published |
20080296977 | SEMICONDUCTOR DEVICE - A semiconductor device includes that a first power line supplied with first power supply voltage, a second power line supplied with second power supply voltage, a third power line electrically connected to a internal circuit; a first switch configured to electrically connect or disconnect the first power line and the third power line, a second switch configured to electrically connect or disconnect the second power line and the third power line, and a control circuit controlling the second switch to electrically connect the first power line and the third power line following a predetermined period after the first power line and the third power line are electrically connected each other based on the first switch. | 12-04-2008 |
20090045833 | SEMICONDUCTOR DEVICE - A first power-cutoff switch is disposed between a power line and an internal power line dedicated for a circuit block, and has a current supply capacity having the level at which ON-current can protect an external examination environment. A second power-cutoff switch is disposed between a power line and an internal power line, and has a current supply capacity having the level at which ON-current can supply consumed current of the circuit block. A detecting circuit detects that a voltage of the internal power line matches a reference voltage. The first power-cutoff switch is ON/OFF by an operation state of the circuit block. The second power-cutoff switch is ON by detecting the matching of the volumes with the detecting circuit and is OFF by the ON/OFF operation of the first power-cutoff switch. | 02-19-2009 |
20090051406 | SEMICONDUCTOR DEVICE - A semiconductor device whose operational state is switched between a test state and a normal operational state according to a logical value of a signal input from the outside is provided. The semiconductor device includes a first power line, a second power line, a switch that is controlled by a signal line to couple/isolate the first power line to/from the second power line, a control circuit that outputs a control signal, and a state switching circuit that drives the signal line to couple/isolate the first power line to/from the second power line according to a logical value of the control signal when the input signal is one of logical values, whereas the state switching circuit drives the signal line to couple the first power line to the second power line when the first signal is the other logical value. | 02-26-2009 |
20090072885 | Semiconductor Device - A semiconductor device includes a plurality of circuits each independently conducting a predetermined process, and a circuit operation control part controlling operation start timings and operation suspend timings so as to mutually interfere with power voltage fluctuations caused by a state transition between an operation start and an operation suspend for each of the plurality of circuits. | 03-19-2009 |
20090091370 | LARGE SCALE INTEGRATED CIRCUIT FOR DYNAMICALLY CHANGING RESONANT POINT - The semiconductor intergrated circuit comprises: a circuit that executes a predetermined process and a switching circuit that selects a power impedance, The switching circuit selects the power impedance, in accordance with a variation in voltage supplied to the circuit, so that a resonant frequency of the semiconductor integrated circuit is different from a operation frequency of the circuit. | 04-09-2009 |
20090127931 | ELECTRONIC CIRCUIT DEVICE - An electric circuit device operable under a first power supply includes: a first circuit; a switch connecting the first circuit with the first power supply; a second circuit for producing a signal output; a control signal output unit for outputting a control signal in accordance with the signal output of the second circuit, wherein while the first circuit is supplied with a first power supply voltage via the switch by supplying of a driving voltage to the switch, the supply of the driving voltage is temporality cut off in response to the control signal. | 05-21-2009 |
20090219083 | ELECTRIC CIRCUIT DEVICE - An electric circuit device includes: a power supply line; a load circuit; a current supply controller which compares a voltage of the power supply line with a certain voltage; and a current supply circuit which supplies a electric current from the power supply line to the load circuit and changes the electric current during a supply of the electric current. | 09-03-2009 |
20090322406 | SEMICONDUCTOR INTEGRATED CIRCUIT - A semiconductor integrated circuit includes a core circuit, a power supply switch situated on a path providing a current to the core circuit and configured to control a state of current supply to the core circuit in response to a control signal applied to a control node, a clamp circuit configured to clamp a voltage of the control signal, and a switching circuit configured to control whether to enable or disable a clamp operation of the clamp circuit. | 12-31-2009 |
20100176838 | SEMICONDUCTOR DEVICE AND TEST METHOD - A semiconductor device includes a first circuit block, a second circuit block, a first lead-out line coupled to the first circuit block, a second lead-out line coupled to the second circuit block, a first pad coupled to the first lead-out line, a second pad coupled to the second lead-out line, and a shielding line provided between the first lead-out line and the second lead-out line. | 07-15-2010 |
20110074472 | SEMICONDUCTOR DEVICE AND POWER CONTROL METHOD USED FOR SAME - A semiconductor device includes an internal circuit; a plurality of power switches arranged in parallel configured to supply a current to the internal circuit; an instruction circuit configured to output a instruction signal for controlling power supply to the internal circuit; a variation detection circuit configured to detect the current and to output a detection result; and a logic circuit configured to control a timing when the plurality of power switches becomes a conducting state in accordance with the detection result and the instruction signal. | 03-31-2011 |
20110141795 | MULTI-PORT MEMORY BASED ON DRAM CORE - A semiconductor memory device includes a plurality of N external ports, each of which receives commands, and an internal circuit which performs at least N access operations during a minimum interval of the commands that are input into one of the external ports. | 06-16-2011 |
20110227634 | SEMICONDUCTOR CIRCUIT DEVICE - The semiconductor circuit device includes a power line receiving first voltage; each of internal circuits being provided with different operating voltages by the operation mode; a power supply circuit connected with one of internal circuits and the power line to provide second voltage lower than the first voltage to the one of internal circuits; and a control circuit controlling the power supply circuit in accordance with each of the operation modes, wherein when a change of a operation mode is performed, if a operating voltage after the change of a operation mode is higher than a operating voltage before the change of a operation mode, firstly the control circuit controls the power supply circuit to supply a second voltage higher than the operating voltage and secondly the control circuit controls the power supply circuit to supply the operation voltage after the change of a operation mode to the internal circuit. | 09-22-2011 |
20110260783 | SEMICONDUCTOR DEVICE - A semiconductor device includes a plurality of internal circuits, a plurality of low drop output regulators, and a power management unit. The plurality of low drop output regulators are configured to reduce a power source voltage applied from an outside and generate supply voltages which are to be supplied to the plurality of internal circuits. The power management unit is configured to change a voltage value of the power source voltage in accordance with a state of combination of voltage values of the plurality of supply voltages generated by the plurality of low drop output regulators. | 10-27-2011 |
20110267097 | SEMICONDUCTOR DEVICE INCLUDING SWITCH FOR COUPLING POWER LINE - A semiconductor device whose operational state is switched between a test state and a normal operational state according to a logical value of a signal input from the outside is provided. The semiconductor device includes a first power line, a second power line, a switch that is controlled by a signal line to couple/isolate the first power line to/from the second power line, a control circuit that outputs a control signal, and a state switching circuit that drives the signal line to couple/isolate the first power line to/from the second power line according to a logical value of the control signal when the input signal is one of logical values, whereas the state switching circuit drives the signal line to couple the first power line to the second power line when the first signal is the other logical value. | 11-03-2011 |
20110285418 | SEMICONDUCTOR DEVICE - A first power-cutoff switch is disposed between a power line and an internal power line dedicated for a circuit block, and has a current supply capacity having the level at which ON-current can protect an external examination environment. A second power-cutoff switch is disposed between a power line and an internal power line, and has a current supply capacity having the level at which ON-current can supply consumed current of the circuit block. A detecting circuit detects that a voltage of the internal power line matches a reference voltage. The first power-cutoff switch is ON/OFF by an operation state of the circuit block. The second power-cutoff switch is ON by detecting the matching of the volumes with the detecting circuit and is OFF by the ON/OFF operation of the first power-cutoff switch. | 11-24-2011 |
20110304380 | SEMICONDUCTOR DEVICE - A semiconductor device includes: a first power line to supply a first voltage to a plurality of internal circuits; a second power line to supply the first voltage to the plurality of internal circuits; a first switch provided between said first power line and each of the plurality of internal circuits; a second switch provided between said second power line and each of the plurality of internal circuits; and a control circuit to control the first switch of a second internal circuit included in the plurality of the internal circuits based on the amounts of noise and voltage drop at power-on in a first circuit included in the plurality of internal circuits. | 12-15-2011 |
20140070878 | SEMICONDUCTOR DEVICE - A semiconductor device includes: a plurality of circuit parts; a global power source; a plurality of power source supply circuits; and a plurality of local power source control circuits provided in correspondence to the plurality of circuit parts, wherein each of the plurality of power source supply circuits includes a plurality of discrete supply switches, each of the plurality of local power source control circuits includes: a voltage monitor circuit; a storage circuit storing an output target characteristic value of the voltage monitor circuit; a comparator configured to compare the output characteristic value of the voltage monitor circuit and the target characteristic value; and a switch control circuit configured to control the number of the plurality of turned-on discrete supply switches based on the comparison result of the comparator. | 03-13-2014 |
20140070879 | SEMICONDUCTOR DEVICE - A semiconductor device includes: a plurality of circuit parts; a global power source; a plurality of power source supply circuits; and a plurality of local power source control circuits provided in correspondence to the plurality of circuit parts, wherein each of the plurality of power source supply circuits includes a plurality of discrete supply switches, each of the plurality of local power source control circuits includes: a delay monitor circuit having a delay path whose amount of delay changes in accordance with a change in the voltage value of the local power source, and whose output logical value changes in accordance with the amount of delay of the delay path; and a switch control circuit configured to control the number of the plurality of discrete supply switches based on the output logical value of the delay monitor circuit. | 03-13-2014 |
20140145707 | VOLTAGE FLUCTUATION DETECTION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT - A voltage fluctuation detection circuit includes an oscillation circuit configured to receive an operation voltage and perform an oscillation operation, an operation voltage generation unit configured to reduce a detection target voltage and generate the operation voltage, and a fluctuation detection unit configured to measure an oscillation frequency of the oscillation circuit and detect a fluctuation of the detection target voltage. | 05-29-2014 |
20140312950 | DATA HOLDING CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE - A circuit including: an input stage that includes a first input unit into which input data is input and a pair of first output units and is driven by a first power-supply voltage; a pair of first gate elements that includes first transistors, and is driven by a clock that includes a second power-supply voltage that is lower than the first power-supply voltage; a first latch circuit that includes a pair of second input units, and is driven by the first power-supply voltage; a pair of second gate elements that includes second transistors, and is driven by an inverted clock of the clock; and a second latch circuit that includes a pair of third input units, and a third output unit that outputs one of a pair of pieces of data, and is driven by the first power-supply voltage. | 10-23-2014 |
20150028909 | SEMICONDUCTOR DEVICE - A semiconductor device includes: a first circuit; a first power switch provided either between a power supply potential terminal and a power supply potential node of the first circuit or between a reference potential terminal and a reference potential node of the first circuit; a power switch control circuit configured to control a voltage of a control terminal of the first power switch; a test terminal; and a first test control circuit configured to control connection of the test terminal and the control terminal of the first power switch. | 01-29-2015 |