Patent application number | Description | Published |
20090249363 | HOLDOFF ALGORITHM FOR NO DEAD TIME ACQUISITION - An improved hold-off algorithm that assures that all data associated with all trigger events in a data signal are displayed uses a designated interval starting with a first trigger event to determine whether any subsequent trigger events occurred within the designated interval. A first display frame is drawn based upon the first trigger event. A next display frame is drawn based either on a next trigger event that occurs outside the designated interval, or based on the last trigger event that occurred within the designated interval. In the latter case the two display frames provide an overlap to assure that no data related to the trigger events is lost on the display. | 10-01-2009 |
20090261814 | DRAWING WAVEFORMS IN NO DEAD TIME ACQUISITION SYSTEM - A method of drawing a waveform image in a no dead time acquisition system, where consecutive drawing frames overlap, uses a master/slave relationship between two fast rasterizers. The master rasterizer draws a first display frame in response to a first trigger event in a trigger signal derived from an input signal. The slave rasterizer draws a second display frame in response to a subsequent trigger event in the trigger signal. The portion of the second display frame that duplicates data contained in the first display frame is either (a) suppressed when the first and second display frames are combined to form the waveform image or (b) displayed in a different shade/color. Alternatively the first display frame may be compressed by 50% to form a first portion of the waveform image and the non-duplicative portion of the second display frame is compressed by 50% to form a second portion of the waveform image, the first and second portions being drawn contiguously when the first and second display frames are combined to form the waveform image. | 10-22-2009 |
20110066402 | MIXED SIGNAL ACQUISITION SYSTEM FOR A MEASUREMENT INSTRUMENT - A mixed signal acquisition system for a test and measurement instrument allows configuring of the number of analog and digital channels in use. The instrument includes an analog input interface and an N-channel logic input interface for receiving an analog signal and an N-channel logic signal, respectively. An ND converter converts the analog input signal into an N-bit digital signal, and N latch circuits latch the N-bit logic signal. A multiplexer selects either the N-bit digital signal from the A/D converter, or the N-bit logic signals from the N latch circuits, and the selected signal at the output of the multiplexer is stored in an acquisition memory. By controlling the multiplexer selection, the number of analog channels and the digital channels can be controlled. | 03-17-2011 |
20110071795 | Test and Measurement Instrument Using Combined Signals - A test and measurement instrument including a plurality of digitizers, each digitizer configured to digitize an input signal to generate a digitized signal; a signal processor configured to combine at least two of the digitized signals from the digitizers into a combined signal; and a circuit configured to receive the combined signal. | 03-24-2011 |
20110074390 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074391 | Signal Acquisition System Having a Compensation Digital Filter - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074392 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074441 | Low Capacitance Signal Acquisition System - A low capacitance signal acquisition system has a signal acquisition probe having a low capacitance input circuit coupled to a compensation amplifier in a signal processing instrument via a signal cable. The low capacitance input circuit, the signal cable and the signal processing instrument input have mismatched time constants with the compensation amplifier having feedback loop circuitry providing adjustable gain and pole-zero pairs for maintaining flatness over the low capacitance signal acquisition system frequency bandwidth. | 03-31-2011 |
20120036947 | MULTI-CHANNEL FREQUENCY DOMAIN TEST AND MEASUREMENT INSTRUMENT - A test and measurement instrument including a plurality of input ports; an acquisition system coupled to the input ports and configured to acquire frequency domain data from the input ports; a user interface configured to present frequency domain controls for at least two of the input ports; and a controller configured to adjust frequency domain acquisition parameters of the acquisition system in response to the frequency domain controls such that frequency domain acquisition parameters associated with a first input port can be different from frequency domain acquisition parameters associated with a second input port. | 02-16-2012 |
20120038369 | TIME-DOMAIN MEASUREMENTS IN A TEST AND MEASUREMENT INSTRUMENT - A test and measurement instrument and method for receiving a radio frequency (RF) signal, digitizing the RF signal using an analog-to-digital converter, downconverting the digitized signal to produce I (in-phase) and Q (quadrature) baseband component information, generating one or more IQ-based time-domain traces using the I and Q baseband component information, and measuring and displaying a variety of measurement values of the IQ-based time-domain traces. The IQ-based time-domain measurement values can be automatically generated and displayed, and/or transmitted to an external device. | 02-16-2012 |
20120039374 | TIME-DOMAIN SEARCHING IN A TEST AND MEASUREMENT INSTRUMENT - Embodiments of the invention include devices and methods for searching IQ-based time-domain traces for events, marking the events, and analyzing intervals of interest at or around the events on a display unit of a test and measurement instrument. The test and measurement instrument can include an input terminal to receive an RF signal, an ADC to digitize the RF signal, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized RF signal, an acquisition memory to acquire and store a record, a trace generation section to generate one or more IQ-based time-domain traces, and a search unit to scan the IQ-based time-domain traces for one or more events. The search unit can locate and mark the events for display on a display unit of the test and measurement instrument. | 02-16-2012 |
20120041701 | TIME-DOMAIN TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT - Embodiments of this invention provide enhanced triggering capabilities such as frequency and phase triggering in a test and measurement instrument, such as a Real-Time Spectrum Analyzer (RTSA) or oscilloscope. A test and measurement instrument can include input terminals to receive RF signals, an ADC to digitize the RF signals, a digital downconverter to produce I and Q baseband component information, and a power detector to determine a power level using the I and Q information. A comparator compares the power level received from the power detector with a user-definable power threshold, and produces a logic signal for enabling one or more phase or frequency demodulators. The one or more demodulators produce IQ-based time-domain traces derived from the I and Q component information when the power level determined by the power detector exceeds the power threshold. Trigger circuitry is configured to trigger on an event responsive to a delayed trigger enable signal. | 02-16-2012 |
20120076187 | MULTI-DOMAIN TEST AND MEASUREMENT INSTRUMENT - A test and measurement instrument including a time domain channel configured to process a first input signal for analysis in a time domain; a frequency domain channel configured to process a second input signal for analysis in a frequency domain; and an acquisition system coupled to the time domain channel and the frequency domain channel. The acquisition system is configured to acquire data from the time domain channel and the frequency domain channel. Time domain and frequency domain data can be time aligned. | 03-29-2012 |
20120078557 | MULTI-DOMAIN TEST AND MEASUREMENT INSTRUMENT - A test and measurement instrument including an input port configured to receive an input signal; a digitizer configured to digitize the input signal; a decimator coupled to the digitizer and configured to decimate the digitized input signal to generate a decimated input signal; a digital downconverter coupled to the digitizer and configured to frequency shift the digitized input signal to generate a frequency shifted input signal; and a memory configured to store the decimated input signal and the frequency shifted input signal. | 03-29-2012 |
20120197598 | TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DOMAIN DATA - A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user interface. The test and measurement instrument can include, for example, one or more input terminals to receive an electrical signal under test, an analog-to-digital converter (ADC) to digitize the signal under test, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal, a memory configured to store the IQ baseband component information, a user interface, and a controller. The controller can be configured to generate an IQ-based time domain waveform using the IQ baseband component information, and present the IQ-based time domain waveform and a second time domain waveform on a common axis through the user interface. | 08-02-2012 |
20130044112 | APPARATUS AND METHOD FOR PROVIDING FREQUENCY DOMAIN DISPLAY WITH VISUAL INDICATION OF FFT WINDOW SHAPE - A test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to process an input signal to generate a time domain waveform for display in the time domain graticule, the input signal being correlated to a time base. The processor is also configured to process a second input signal and generate a frequency domain waveform for display in the frequency domain graticule, the second input signal being correlated to the same time base. The frequency domain waveform is correlated to a selected time period of the time base. The processor is also configured to generate a spectrum time indicator configured to graphically illustrate a transform parameter, a location and the selected time period in the time domain graticule with respect to the frequency domain waveform. | 02-21-2013 |
20130221985 | SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE UNDER TEST - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 08-29-2013 |
20130317776 | TIME-DOMAIN DENSITY TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT - A test and measurement instrument according to an embodiment of the present invention converts digital data that represents an analog input signal into a time-domain bitmap, and then compares a region of that time-domain bitmap to a density threshold. When the density value violates the density threshold, a trigger signal is generated that causes digital data to be stored into a memory. | 11-28-2013 |
20140002508 | SELECTIVE DISPLAY OF WAVEFORMS GOVERNED BY MEASURED PARAMETERS | 01-02-2014 |
20140032149 | CROSS DOMAIN TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT - An apparatus and method for triggering an oscilloscope is disclosed. The oscilloscope is configured to process a first signal in a first domain and a second signal in a second domain. The method includes choosing a different domain for processing each of the first and second signals, respectively. A desired trigger type is selected for one of the chosen domains. The first and second signals are acquired in response to an occurrence of a trigger of the selected trigger type. The first and second signals are processed according to the selected different chosen domains. The method may also include displaying a result of said processing on a display screen. | 01-30-2014 |
20140064346 | MULTI-DOMAIN TEST AND MEASUREMENT INSTRUMENT - A test and measurement instrument including a time domain channel configured to process a first input signal for analysis in a time domain; a frequency domain channel configured to process a second input signal for analysis in a frequency domain; and an acquisition system coupled to the time domain channel and the frequency domain channel. The acquisition system is configured to acquire data from the time domain channel and the frequency domain channel. Time domain and frequency domain data can be time aligned. | 03-06-2014 |
20140142880 | COMBINATORIAL MASK TRIGGERING IN TIME OR FREQUENCY DOMAIN - Embodiments of the invention include methods and instruments for performing combinatorial mask triggering. One or more mask triggers can be configured. Combinatorial mask triggering logic can make various determinations about the relationship between a digitized signal and the one or more mask triggers. The various determinations about the relationship can include considerations of both space and time. When the combinatorial trigger criteria have been satisfied, a trigger signal is generated, and the digital data associated with an incoming signal is stored to memory. The combinatorial mask triggering logic can operate on signals in the frequency domain, the time domain, or both. | 05-22-2014 |