Patent application number | Description | Published |
20080285035 | Information maintenance during intensity attenuation in focused beams - Maintenance of information content in a focused beam of electromagnetic radiation when the intensity thereof is attenuated by application of an aperture-like element. | 11-20-2008 |
20090073449 | Application of digital light processor in scanning spectrometer and imaging ellipsometer and the like systems - Application of digital light processor (DLP) systems in monochromator, spectrophotometer or the like systems to mediate selection of individual wavelengths, and/or to image elected regions of a sample in an imaging ellipsometer, imaging polarimeter, imaging reflectometer, imaging spectrophotometer, and/or to provide chopped beams. | 03-19-2009 |
20090103093 | Fast sample height, AOI and POI alignment in mapping ellipsometer or the like - A sample investigation system (ES) in functional combination with an alignment system (AS), and methodology of enabling very fast, (eg. seconds), sample height, angle-of-incidence and plane-of-incidence adjustments, with application in mapping ellipsometer or the like systems. | 04-23-2009 |
20090103094 | Ellipsometric investigation and analysis of textured samples - System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures. | 04-23-2009 |
20090231700 | System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers and polarimeters - An ellipsometer or polarimeter system and method for controlling intensity of an electromagnetic beam over a spectrum of wavelengths by applying control (P | 09-17-2009 |
20100220313 | Terahertz-infrared ellipsometer system, and method of use - The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz, including:
| 09-02-2010 |
20110109906 | Fast sample height, AOI and POI alignment in mapping ellipsometer or the like - A sample investigation system (ES) in functional combination with an alignment system (AS), and methodology of enabling calibration and very fast, (eg. seconds), sample height, angle-of-incidence and plane-of-incidence adjustments, with application in mapping ellipsometer or the like systems. | 05-12-2011 |
20110188040 | Mounting for deviation angle self compensating substantially achromatic retarder - A system, method of configuring, and application a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems. | 08-04-2011 |
20120057158 | Ellipsometric investigation and analysis of textured samples - System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures. | 03-08-2012 |
20120092653 | System and method of aligning a sample - A system and method of use thereof that enables determining and setting sample alignment based on the location of, and geometric attributes of a monitored image formed by reflection of an electromagnetic beam from a sample and into an image monitor, which beam is directed to be incident onto the sample along a locus which is substantially normal to the surface of the sample. | 04-19-2012 |
20120206724 | Terahertz-infrared ellipsometer system, and method of use - The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz, including:
| 08-16-2012 |
20120261580 | Terahertz-infrared ellipsometer system, and method of use - The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz, including:
| 10-18-2012 |
20120314218 | View-finder in ellipsometer or the like systems - A system for and method of allowing visual observation of a sample being subject to investigation by an electromagnetic beam, to identify where thereupon a beam of sample investigating electromagnetic radiation is caused to impinge, in combination with a data detector of the beam of sample investigating electromagnetic radiation after it interacts with the sample. | 12-13-2012 |
20130163099 | Operation of an electromagnetic radiation focusing element - A combination of a focusing element, and a filtering element which naturally adjusts the cross-sectional area of a beam of electromagnetic radiation passed through the focusing element as a function of wavelength, optionally as an element of an ellipsometer or polarimeter system. | 06-27-2013 |
20140027644 | Terahertz-infrared ellipsometer system, and method of use - The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz, including:
| 01-30-2014 |