Patent application number | Description | Published |
20090025244 | Articulating Probe Head Apparatus and Method - Apparatus for a co-ordinate positioning machine is described that comprises an articulating probe head for supporting a measurement probe. The articulating probe head comprises at least one electric motor. Heating means are provided for generating heat in the articulating probe head. The heating means may be the motors or discrete heating elements. Temperature sensing means, such as one or more temperature sensors, is also provided for determining the temperature at the articulating probe head. The apparatus allows the temperature of the articulating probe head to be controlled. | 01-29-2009 |
20090025463 | Method for Scanning the Surface of a Workpiece - A measurement system has a surface sensing device mounted on an articulating probe head, which in turn is mounted on a coordinate positioning apparatus. The surface sensing device is moved relative to a surface by driving at least one of the coordinate positioning apparatus and probe head in at least one axis to scan the surface. The surface sensing device measures its distance from the surface and the probe head is driven to rotate the surface sensing device about at least one axis in order to control the relative position of the surface sensing device from the surface to within a predetermined range in real time. | 01-29-2009 |
20090100693 | Contact Sensing Probe - A contact sensing probe having a stylus which is vibrated longitudinally by a piezoelectric transducer. Contact with a workpiece is detected from damping of the vibration. The stylus is mounted to a probe body via parallel diaphragm springs. These cooperate with a counter mass to form a mechanical low pass filter, which isolates the stylus vibrations from influences caused by the mounting or handling of the probe body. | 04-23-2009 |
20090165318 | Contact Sensing Probe - Contact sensing probe apparatus includes a workpiece contacting stylus, a transducer mechanically coupled to the stylus and an oscillator for supplying an alternating current to the transducer to induce vibration of the stylus. A contact sensor is also provided for monitoring the phase difference between the voltage supplied to the transducer and the current flow to the transducer. The oscillator is arranged to supply the transducer with an alternating current of a first frequency during contact sensing. This first frequency is selected to induce mechanical resonance but to be away from the maximum of the mechanical resonance peak. The probe may be used with co-ordinate positioning machines, such as portable articulated measuring arms, co-ordinate measuring machines (CMM) and the like. | 07-02-2009 |
20090307916 | Method for scanning the surface of a workpiece - A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised. | 12-17-2009 |
20090320553 | Surface Measurement Probe - Apparatus and method of determining drift for a surface measurement probe. The surface measurement probe has a housing, a surface contacting stylus, a vibration generator which causes vibration of the stylus, a sensing device for determining a parameter related to change in vibration of the stylus, and a comparator for determining the relationship of the parameter with a threshold. Readings of the parameter are taken when the stylus is not in contact with a surface and average over a time t, which is significantly larger than the transition time when touching a surface. The average of the readings of the parameter is compared to a reference parameter. The comparison is used to determine whether there has been significant drift of the parameters. Thus drift due to temperature change is corrected. | 12-31-2009 |
20100005852 | Method of error compensation in a coordinate measuring machine - A method of calibrating an articulating probe head comprising the steps of measuring an artefact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artefact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artefact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head. | 01-14-2010 |
20100072456 | OPTO-ELECTRONIC READ HEAD - A read head for a scale reading apparatus, the head including a light source and an array of photodetector elements, wherein said light source and array of photodetector elements are fabricated in a lattice matched semiconductor compound. | 03-25-2010 |
20100135534 | NON-CONTACT PROBE - A non-contact measurement apparatus and method. A probe is provided for mounting on a coordinate positioning apparatus, comprising at least one imaging device for capturing an image of an object to be measured. Also provided is an image analyser configured to analyse at least one first image of an object obtained by the probe from a first perspective and at least one second image of the object obtained by the probe from a second perspective so as to identify at least one target feature on the object to be measured. The image analyser is further configured to obtain topographical data regarding a surface of the object via analysis of an image, obtained by the probe, of the object on which an optical pattern is projected. | 06-03-2010 |
20100142798 | NON-CONTACT MEASUREMENT APPARATUS AND METHOD - A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images. | 06-10-2010 |
20100158322 | PHASE ANALYSIS MEASUREMENT APPARATUS AND METHOD - A non-contact method and apparatus for inspecting an object via phase analysis. A projector projects an optical pattern onto the surface of an object to be inspected. At least first and second images of the surface on which the optical pattern is projected are then obtained. The phase of the optical pattern at the surface is changed between the first and second image by moving the projector relative to the object. | 06-24-2010 |
20110058159 | OPTICAL INSPECTION PROBE - An optical inspection probe for obtaining and providing images of an object to be inspected. The optical inspection probe comprises an imaging assembly for capturing an image of an object and an illumination assembly for producing a light beam directed toward the object. The optical inspection probe is configured such that the light beam converges to a focal point at a first focal plane. | 03-10-2011 |
20110061253 | Articulating probe head apparatus and method - Apparatus for a co-ordinate positioning machine is described that comprises an articulating probe head for supporting a measurement probe. The articulating probe head comprises at least one electric motor. Heating means are provided for generating heat in the articulating probe head. The heating means may be the motors or discrete heating elements. Temperature sensing means, such as one or more temperature sensors, is also provided for determining the temperature at the articulating probe head. The apparatus allows the temperature of the articulating probe head to be controlled. | 03-17-2011 |
20110277534 | Method of error compensation in a coordinate measuring machine - A method of calibrating an articulating probe head comprising the steps of measuring an artefact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artefact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artefact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head. | 11-17-2011 |
20110283553 | Method for scanning the surface of a workpiece - A measurement system has a surface sensing device mounted on an articulating probe head, which in turn is mounted on a coordinate positioning apparatus. The surface sensing device is moved relative to a surface by driving at least one of the coordinate positioning apparatus and probe head in at least one axis to scan the surface. The surface sensing device measures its distance from the surface and the probe head is driven to rotate the surface sensing device about at least one axis in order to control the relative position of the surface sensing device from the surface to within a predetermined range in real time. | 11-24-2011 |
20120072170 | VISION MEASUREMENT PROBE AND METHOD OF OPERATION - A method of operating a vision measurement probe for obtaining and supplying images of an object to be measured. The vision measurement probe is mounted on a continuous articulating head of a coordinate positioning apparatus, and the continuous articulating head having at least one rotational axis. The object and vision measurement probe can be moved relative to each other about the at least one rotational axis and in at least one linear degree of freedom during a measuring operation. The method includes: processing at least one image obtained by the vision measurement probe to obtain feedback data; and controlling the physical relationship between the vision measurement probe and the object based on said feedback data. | 03-22-2012 |
20120154576 | NON-CONTACT OBJECT INSPECTION - A non-contact method of inspecting the topography of an area of an object via analysis of the phase of a pattern projected on the object. The method includes taking a first image of the object, obtained from a first perspective, on which an optical pattern is projected, and taking a second image of the object, obtained from a second perspective, on which an optical pattern is projected but in which the optical pattern, as it falls on the object, in the second image differs to that in the first image. The method further includes determining data describing the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image. Phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image. | 06-21-2012 |
20130180959 | METHOD OF FORMING AN OPTICAL DEVICE - A method of forming an optical device comprises applying a laser beam to a target area of the surface so as to selectively heat material of the surface thereby to provide transfer of material due to a surface tension gradient, wherein the surface is such that, when liquid, parts of the surface at higher temperatures have a higher surface tension than adjacent parts of the surface at lower temperatures. | 07-18-2013 |