Patent application number | Description | Published |
20130208361 | OPTICAL CROSS-COUPLING MITIGATION SYSTEM FOR MULTI-WAVELENGTH BEAM COMBINING SYSTEMS - A system and method for increasing efficiency and power output of a multi-wavelength beam combining system through providing a common output coupler to reflect feedback that stabilizes or individually seeds each emitter, and wherein the individual feedback is preserved by mitigating cross-coupling, wherein a multi-wavelength beam comprised of radiation having a plurality of wavelengths, high brightness and power. | 08-15-2013 |
20130215517 | Multi-Wavelength Beam Combining System and Method - A system and method for decreasing the optical pathway length, varying brightness output quality, and stabilizing beams along the non-beam combining dimension in a WBC system. | 08-22-2013 |
20130287058 | System and Method for Wavelength Beam Combination on a Single Laser Emitter - A system and method for reducing the M | 10-31-2013 |
20130314694 | ATMOSPHERIC MEASUREMENT SYSTEM AND METHOD - One of first and second beams ( | 11-28-2013 |
20150229099 | Method for Improving Performance of Wavelength Beam Combining Diode Laser Systems - A method for optimizing startup time and efficiency for a WBC laser diode system having numerous diode elements, wherein each diode element is measured, an optimal band region is determined for each diode element, and placed in an optimal placement within an array of diode elements. | 08-13-2015 |
20150241632 | SYSTEMS AND METHODS FOR MULTIPLE-BEAM LASER ARRANGEMENTS WITH VARIABLE BEAM PARAMETER PRODUCT - In various embodiments, a beam-parameter adjustment system and focusing system alters a spatial power distribution of a plurality of radiation beams before the beams are coupled into an optical fiber. | 08-27-2015 |
20150251273 | POLARIZATION-ADJUSTED BEAM OPERATION FOR MATERIALS PROCESSING - Systems and techniques for optimizing the operation of a beam emitter during material processing maintain an optimal polarization of the beam with respect to the material throughout processing—e.g., even as the beam path varies or the nature or thickness of the material changes. | 09-10-2015 |
20150276381 | FEATURE AND DEPTH MEASUREMENT USING MULTIPLE BEAM SOURCES AND INTERFEROMETRY - Systems and techniques for processing materials using wavelength beam combining for high-power operation in concert with interferometry to detect the depth or height of features as they are created. | 10-01-2015 |
20150280396 | HIGH-POWER LASER DIODE ISOLATION AND THERMAL MANAGEMENT - In various embodiments, a laser apparatus includes a beam emitter, first and second mounts disposed on opposing sides of the beam emitter and in electrical and thermal contact therewith, and a housing body for conducting heat away from the beam emitter. | 10-01-2015 |