Yavor
Gabriel Yavor, Rehovot IL
Patent application number | Description | Published |
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20130328504 | OPTICAL WAVEFORM GENERATOR - An optical high speed Arbitrary Waveform Generator (AWG) comprising a trigger module configured to receive binary signals and generate a trigger output in response, a digital waveform shaper (DWS) module configured to be programmed by a digital waveform and convert it to analog waveform, an amplifier module configured to amplify the analog waveform, a load adapter module configured to match the electrical impedance of the amplifier module to the electrical impedance of a light source, a TEC controller and a voltage supply module adapted to supply voltage to the trigger module, the digital waveform shaper module, the amplifier module, and the load adapter and the TEC controller. | 12-12-2013 |
Mikhail Yavor, Saint-Petersbourg RU
Patent application number | Description | Published |
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20100223698 | High Resolution Wide Angle Tomographic Probe - The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes. | 09-02-2010 |
20110303841 | MASS ANALYSIS DEVICE WITH WIDE ANGULAR ACCEPTANCE INCLUDING A REFLECTRON - A mass analysis device with wide angular acceptance, notably of the mass spectrometer or atom probe microscope type, includes means for receiving a sample, means for extracting ions from the surface of the sample, and a reflectron producing a torroidal electrostatic field whose equipotential lines are defined by a first curvature in a first direction and a first center of curvature, and a second curvature in a second direction perpendicular to the first direction and a second center of curvature, the sample being positioned close to the first center of curvature. | 12-15-2011 |
Mikhail Yavor, St. Petersburg RU
Patent application number | Description | Published |
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20140312221 | Electrostatic Ion Mirrors - An electrostatic ion mirror is disclosed providing fifth order time-per-energy focusing. The improved ion mirror has up to 18% energy acceptance at resolving power above 100,000. Multiple sets of ion mirror parameters (shape, length, and voltage of electrodes) are disclosed. Highly isochronous fields are formed with improved (above 10%) potential penetration from at least three electrodes into a region of ion turning. Cross-term spatial-energy time-of-flight aberrations of such mirrors are further improved by elongation of electrode with attracting potential or by adding a second electrode with an attracting potential. | 10-23-2014 |